Diode Test
See Also: Diode, Laser Diode, Zener Diode, Photodiode, Diode Testers
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Product
Semiconductor Testers
Test Instrument
Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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Product
Photovoltaic System Bypass Diode Tester
FT4310
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Hioki is pleased to announce the launch of the Bypass Diode Tester FT4310 for Photovoltaic Systems. The FT4310, which is designed to test bypass diodes in strings of crystalline photovoltaic cells, can be used to detect open and short-circuit faults in bypass diodes by string either in daylight or at night. The instrument is the first portable device capable of detecting bypass diode open faults in operating panels (without requiring the panels to be shielded from sunlight).
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Product
6TL36 Inline Handler
AM304
Test Handler
Test handler 6TL36 able to test DUTs inside Faraday ChamberDual line (bypass)
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Product
Diode Power probe
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The COMM-connect 3026 Diode based temperature compensated probe is designed for use with the COMM-connect range of Power Monitors. The probe will handle from 50µW to 100mW . Used with external couplers and the our measurement system application from 1W to 1MW, a high dynamic range can be configured. The 3026 Diode based probe gives excellent stable results along with the COMM-connect Power Monitor variants. This gives our customers a number of applications to monitor and control the last part of your RF network installation from transmitters to the antenna.
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Product
Repair of Six Diode Bridge Assemblies, P/N 5989C
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CEHCO is specialist in repair of various rectifier assemblies. One such assembly is shown below:Specifications:- Six Diode Bridge Assembly, P/N 5989C- AC input terminals: (3, 4 , 5)- DC output terminals: (1), POSITIVE and (2), NEGATIVE
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Product
Infrared Laser Diode Modules: 830nm-852nm, Elliptical Beam
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The Optoelectronics Company Ltd
Custom lasing wavelengths, from 405 nm to 852 nm, output power options and laser engraving are available to your specifications. Both standard and custom configurations provide OEMs, end-users and systems integrators with complete cost-effective laser solutions.
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Testing
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Apogee Labs offers a wide variety of modular chassis types used for test applications with various Data Link Test Modules.
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Product
SP5T RF Pin Diode Switches To 12 GHz
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Pulsar Microwave's 5-way RF switches cover bands from 300 MHz to 12 GHz in both absorptive and reflective configuration. These SP5T switches have a rating of 200 mW maximum input power and a switching time of 100 ns. They are specified with a minimum isolation of 60 dB and most models maintain a VSWR of 1.6:1 or better on all ports. The SP5T switches are driven by TTL logic control circuitry and require both positive and negative 5-volt supplies for operation. A 9-pin D-SUB connector provides the interface for the power and logic voltages.
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Silicon Carbide Diodes
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In addition to ensuring compliance with today's most stringent energy efficiency regulations (Energy Star, 80Plus, and European Efficiency), ST's silicon-carbide diodes show four times better dynamic characteristics with 15% less forward voltage (VF) than standard silicon diodes. Silicon-carbide diodes belong to our STPOWER family.
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Product
Display Driver Test System
T6391
Test System
High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.
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Product
In-Line Test System
Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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Laser Diode Drivers (LDD)
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LDD technology has evolved from driving DVD/CD/Blue-ray optical drives to include laser projection in smartphones, automotive head-up displays (HUDs) and pico projectors. Renesas has developed new LDDs for RGB scanning laser projection systems and laser-based pico projectors. Automotive HUDs are benefiting from big innovations in MEMS projection systems and are now central to advanced driver assistance systems (ADAS) and safety. The latest laser scanned-MEMS projection systems can provide higher resolution images and at a lower cost.
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Product
Osram High Power Blue Violet Laser Diodes (450-488nm)
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The Optoelectronics Company Ltd
OSRAM Opto Semiconductors is a key player in the field of visible InGaN (Indium Gallium Nitride) lasers. OSRAM Opto Semiconductors offer leading product performance and innovative packaging. Thanks to their excellent beam quality, OSRAM laser diodes are ideally suited for the optical imaging of light. Not only that, but their small package size is particularly beneficial to highly compact systems, such as pico projectors. OSRAM laser diodes offer high efficiency and long lifetime: due to their excellent efficiency (ratio of light produced compared to electric power consumed), the temperature increase experienced by blue InGaN lasers during operation is kept to an absolute minimum, allowing them to deliver a long life – up to 10,000 hours at 40 °C.
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THz Diodes
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Macom Technology Solutions Holdings Inc.
The intrinsic cutoff frequencies of these Schottky junction devices exceed 1 THz, making them well-suited for use in mixers and detectors operating in the frequency bands from 60 GHz into the hundreds of GHz bands.
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Silicon Diodes
DT-670 Series
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DT-670 Series silicon diodes offer better accuracy over a wider temperature range than any previously marketed silicon diodes. Conforming to the Curve DT-670 standard voltage versus temperature response curve, sensors within the DT-670 series are interchangeable and, for many applications, do not require individual calibration. DT-670 sensors in the SD package are available in four tolerance bands—three for general cryogenic use across the 1.4 K to 500 K temperature range and one that offers superior accuracy for applications from 30 K to room temperature. DT-670 sensors also come in a seventh tolerance band, B and E, which are available only as bare die. For applications requiring greater accuracy, DT-670-SD diodes are available with calibration across the full 1.4 K to 500 K temperature range.
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Product
Laser Diode Drivers
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Renesas offers a portfolio of laser diode driver (LDD) ICs for DVD/CD/Blue-ray optical drive and laser projection applications.
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Product
2.5G DFB Laser Diode Chips
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Guilin GLsun Science and Tech Group Co., LTD
2.5G DFB Laser Diode Chips by GLSN
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Product
Laser Diode Driver
S-101
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LD Driver slot module of FOTS system is an efficient module that is user centered, which can drive various kinds of laser diode for the use of optical signal transmission or light source. The module has a built in LD socket, in which LD of 14 pin butterfly type is installed, which makes it possible for the user to change the LD he or she wants to drive when needed. It is leaded to get rid of the inefficiency of expense, at which various types of expensive united source module needed are purchased. By operating monitoring PD and high-performance processor that are installed inside the module, the output power and temperature of LD can be driven accurately and stably. The laser diodes can be modulated internally in square, sinusoidal, and triangular waves and its output power and temperature can also be maintained the level set by the user. In order to realize the various functions, the efficient and multi-functioned control programs with high speed processor, LCD monitor or GUI for remote control are available.
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Product
Testing
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Underwriters Laboratories Inc.
Our independent, rigorous testing process helps ensure that your products align with applicable requirements and expectations. We deliver innovative, customized options that aim to streamline testing processes, reduce costs and help speed products to market around the world. And our global team’s knowledge helps you stay ahead of the curve on evolving requirements, materials and technologies.
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Custom Test System Solutions
Test System
No time to think about test? One-size-fits-all testers not ideal? Existing solution no longer fits your needs? Then count on integrated test solutions from Astronics. We’ll assist you with your test strategy and your test system, setting you on the path to market at a pace and ROI that ensures your program success.
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Product
Diode Arrays
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a silicon diode with minimal packaging overhead. The small signal 0603, 1005 and 1206 Chip Diodes are lead free with Cu/Ni/Au plated terminations while the other packages (SMA, SMB, SMC, 1408, 1607, 2010, 2419, 8L NSOIC, 16L NSOIC, SOT23, SOT23-6, 16L WSOIC) use 100 % Tin terminations. All Bourns® diodes are compatible with lead free manufacturing processes, conforming to many industry and government regulations on lead free components.
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Temperature shock test chambers test
TSS series
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The operating principle of Schocktestprfschrank based of two superposed test rooms (top hot chamber, cold chamber below), between which a car with the test specimens is moved up and down by the large thermal shock test equipment may be subjected
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Spectral Single-Mode Diode Laser
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The diode lasers are compact, single-mode light sources with a spectral width in the sub-MHz range (cw). A modulation input is optional. The wavelength for standard products is in the range 1530nm-1565nm (other wavelength can be tested).
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Package Testing
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AMERICAN TESTING LABORATORY tests all types of product packaging, from shipping crates to child resistant packaging. In addition, we test the effects of many types of physical and environmental shocks on products inside the packaging.
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Product
6TL60 Rotary Test Handler
H79006010
Test Platform
6TL60 has been designed according to the 6TL philosophy, following the concepts of flexibility, modularity and scalability, and with the aim of improving production efficiency as well as increase production capacity and reduce costs.The 6TL60 is the best production solution to automate test processes to reduce the cycle time and the footprint used in the manufacturing plan
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Semiconductor Test
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Tecap SPACE offers all the functions necessary to control test systems (ATE) for the semiconductor test. Tecap is hardware-independent and can be used with all customer-specific concepts.
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Schottky Mixer Diodes
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Teledyne Lincoln Microwave GaAs beam lead Schottky diodes for the up/down conversion of millimetre wave detected signals are designed for applications which demand ultimate performance. The device is easily assembled onto a wide variety of surface mount substrates using thermo-compression, thermo-sonic or epoxy bonding techniques.
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Hardness Testing
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Wilson® hardness testers include a comprehensive range of hardness testers from Rockwell®, Knoop/Vickers, and Brinell to fully automatic production systems. Our hardness testers are complemented by a range of ISO test blocks, accessories, and fixtures. Our calibration laboratory is recognized as the global leader in the production of premium ISO test blocks and indenters.
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Product
Shock Testing
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Shock testing typically involves calibrated, repeatable, violent events. The resulting energy is then absorbed transferred through the test specimen or Device Under Test (DUT)
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Product
Test System
LB302
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Computer Gesteuerte Systeme GmbH
The LB302 test system is the most used midsize range version of the LB-300 series. It is designed for development as well as for production. The ‘device under test’ (DUT) is connected with a G12 receiver (Virginia Panel Company), which has a high number of possible contacting and a low transition resistance.
