Diode Test
See Also: Diode, Laser Diode, Zener Diode, Photodiode, Diode Testers
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Product
Schottky Mixer And Detector Diodes
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Majority carrier diodes formed by plating a layer of metal on a layer of doped semiconductor, which forms a rectifying junction.
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Product
High Power Laser Diode Drivers
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Lumina Power state-of the art laser diode drivers are designed for the emerging high power laser diode industry.
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Product
Laser Diode Driver
S-101
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LD Driver slot module of FOTS system is an efficient module that is user centered, which can drive various kinds of laser diode for the use of optical signal transmission or light source. The module has a built in LD socket, in which LD of 14 pin butterfly type is installed, which makes it possible for the user to change the LD he or she wants to drive when needed. It is leaded to get rid of the inefficiency of expense, at which various types of expensive united source module needed are purchased. By operating monitoring PD and high-performance processor that are installed inside the module, the output power and temperature of LD can be driven accurately and stably. The laser diodes can be modulated internally in square, sinusoidal, and triangular waves and its output power and temperature can also be maintained the level set by the user. In order to realize the various functions, the efficient and multi-functioned control programs with high speed processor, LCD monitor or GUI for remote control are available.
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Product
Test Management Software
ActivATE™
test
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Product
USHIO Red Laser Diodes (633nm - 690nm)
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The Optoelectronics Company Ltd
Features: 5.6 mm CAN package, Optical output power: 80 mW (CW), 300 mW (pulsed – pulse width: 10 ns, duty: 10%), Lasing wavelength: 658 nm, Wall-plug efficiency*: 33%, Operating temperature: -10° – +60° C (CW); -10° – +75° C (pulsed), Single transverse mode, TE mode oscillation, MTTF >10,000 hours
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Product
Photonics Wafer Probing Test System
58635
Test System
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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Product
High-Speed Switching Diodes 33 To 140 GHz
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Insight Product Company offers high-speed switching diodes with switching time up to 2 nsec and operating frequency range up to 140 GHz. Silicon p+-p-n-n+ high-speed switching diodes are designed to be used in mm-wave switching devices, phase changers, modulators, attenuators for the millimeter wavelength range. They are fabricated in the metal-ruby packages with hard-lead carrier (diameter 3.0 mm, 1.5 mm).
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Product
Parametric Test Fixture
U2941A
Test Fixture
The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
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Product
Scienlab Battery Test System – Pack Level, 330 KW
SL1740A
Test System
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Product
SPDT PIN Diode Switches
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Fairview offers a comprehensive selection of 23 different models of SPDT PIN diode switches that cover frequencies ranging from 10 MHz to 67 GHz. The high isolation levels up to 80 dB ensure that unwanted signals will not leak into the desired signal path. Other critical performance features include low insertion loss as low as 1.1 dB and fast switching speed performance as low as 50 nanoseconds. Both absorptive and reflective designs are available and every model utilizes integrated TTL compatible high speed driver logic circuitry. These SPDT switches are constructed using MIL-Grade rugged coaxial packages and several models support field replaceable connectors. All models are EAR99.
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Product
EMS Test System
TS9982
Test System
The R&S®TS9982 is the base system for conducted and radiated EMS measurements. Due to its modular design, it covers a wide range of applications and can be very easily adapted to the measurement task at hand. Any configuration is possible – from conducted measurements and the small precompliance system with a compact test cell to the accredited test system for complete motor vehicles with 200 V/m.
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Product
Diode Driver & Laser System Controllers
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The laser controllers provide a simple method of controlling Lumina and other popular laser diode drivers or full laser systems. They include the ability to easily control current levels, pulse modes, and interlock controls as well as monitor voltage and current levels as well as q-switch triggering, external triggering, sync output, and additional I/O signals.
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Product
Test Port Adapter Set, 2.4 Mm To 2.4 Mm
85130G
Test Port Adapter
The Keysight 85130G test port adapter protects the test set port from connecting directly with the device under test. It has a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a NMD-2.4 mm (f) to NMD-2.4 mm (m) adapter and a NMD-2.4 mm (f) to PSC-2.4 mm (f) adapter. The frequency range for these adapters is dc to 50 GHz with a return loss of 23 dB or better.
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Product
Laser Diode Modules
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Fiber-coupled laser diodes are finding more and more industrial applications, for example in printing technology, comparable graphic areas, material processing or sensor technology.
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Product
Display Driver Test System
T6391
Test System
High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.
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Product
Limiter Diodes
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The SemiGen SLP7100 series of Limiter Diodes are processed with a high-resistivity epi that have thin intrinsic layers. These devices are typically in the 2 to 20 micron range of epi thickness and can be gold doped to achieve specific performance goals. These diodes are used in passive or active limiter designs in the 100 MHz to 30 GHz frequency ranges. They are ideal for use in high-power applications and can be supplied in chip form or in your choice of packages below.
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Product
EBIRST 200-pin LFH To 96-pin SCSI Adapter Cable
93-002-226
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
6TL23 Off-Line Seat Operation Base Test Platform
H71002300
Test Platform
The 6TL23 is a bare rack for creating Off-Line, modular, flexible and reliable Base test platforms. The overall rack capacity is 18U (580mm depth). The rack is ideal for sit-down operation, since there’s space for the operator’s legs under the fixture receiver.
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Product
THz Diodes
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Macom Technology Solutions Holdings Inc.
The intrinsic cutoff frequencies of these Schottky junction devices exceed 1 THz, making them well-suited for use in mixers and detectors operating in the frequency bands from 60 GHz into the hundreds of GHz bands.
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Product
Fast Recovery Diodes
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We offer high-performance products with low forward voltage (VF) and high-speed reverse recovery time (trr) for increasing device efficiency.
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Product
SP3T RF Pin Diode Switches To 18 GHz
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Pulsar Microwave manufactures 3-way absorptive and reflective switches for use in 50-ohm systems. These SP3T switches operate from 100 MHz to 18 GHz and handle 200 mW input power. VSWR performance is often 1.6:1 or better with 100 ns switching time. Minimum isolation of 60 dB is specified for most units. Absorptive and reflective switches require +5V and -5V power supply to function. Control logic is from 0 to +5 volts. All voltage and ground connections are made by feed thru and turret terminals, respectively.
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Product
6TL19 Off-Line Base Test Platform
H71001900
Test Platform
The 6TL19 is a bare half-rack with castors for creating Off-Line, modular, flexible and reliable Base test platforms. The overall rack capacity is 11U (580mm depth).
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Product
MINIATURE SILICON DIODE TEMPERATURE SENSOR, 2 To 600 Degress Kelvin
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Insight Product Company offers SILICON DIODE TEMPERATURE SENSORS CAN BE USED FOR TEMPERATURE Â MEASUREMENTS IN DIFFERENT FIELDS OF CRYOGENIC ENGINEERING AND EXPERIMENTAL PHYSICS. THEY ARE MINIATURE AND OPERATE IN THE TEMPERATURE RANGE FROM 2 TO 600 K.
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Product
Laser Diode Reliability Burn-In / Life-Test System
58602
Test System
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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Product
PIN Limiter Diodes
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Macom Technology Solutions Holdings Inc.
MACOM’s PIN limiter diodes provide excellent broadband performance from 1 MHz to 20 GHz and higher for receiver protector circuits. Our PIN limiter diodes are available in die form, plastic and ceramic packaging. Our ceramic packaged diode series is ideal for waveguide, coaxial, and surface mount applications, while our die diode series is well suited for chip and wire high frequency microwave applications.
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Product
Low-Barrier Schottky Diode Detector, 10 MHz to 18 GHz
8472B
Diode Detector
The Keysight 8472B Low-Barrier Schottky Diode (LBSD) detector has been widely used for many years in a variety of applications including leveling and power sensing. It offers good performance and ruggedness. Matched pairs (Option 001) offer very good detector tracking. A video load (Option 002) extends the square-law region to at least 0.1 mW (-10 dBm).
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Product
Test Sets For Diagnostic Testing
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Test Sets For Diagnostic Testing are designed to test Oil Resistivity, Tan Delta, High Voltage Surge Comparison, etc. These test sets are automated instruments used to measure electrical features to insulate transformer oil, liquids and varied other insulating materials. They are ideal for revealing different localized problems and varied weak spots in the insulation. These modern testing sets are designed to provide high accuracy in results. In addition to this, they are easy to maintain testing sets available to ensure accurate readings.
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Product
Spectral Single-Mode Diode Laser
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The diode lasers are compact, single-mode light sources with a spectral width in the sub-MHz range (cw). A modulation input is optional. The wavelength for standard products is in the range 1530nm-1565nm (other wavelength can be tested).
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Product
High Speed Test Bench
AT444
Test Platform
AC motor with mechanical multiplying gearbox test benches allow precise programming of all drive parameters required for accurate rotating devices test.The use of special high-speed bearings, mechanical components and parts wear resistant leads to a large life. The supply includes the electronic drive and control as well as the entire oil cooling unit.
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Product
Test Automation
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Test automation can be the solution to releasing new features and functionality with reduced time to market and uncompromising quality. There will, however, always be times when manual testing is the most appropriate approach.
