Sensor Test
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Product
Imperial Test Executive
ITE
test
The Imperial Test Executive (iTE) is a UI shell that sits on top of National Instruments TestStand. It provides a simple but elegant interface to execute your NI TestStand sequences. The iTE software was designed to allow general operators to execute ATE testing software without requiring any knowledge of NI TestStand. Training an operator to use this system typically takes less then 5-minutes.
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Product
Regenerative Battery Pack Test System
17040E
Test System
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
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Product
Waveguide Power Sensor
R8486D
Power Sensor
Excellent SWR for reducing mismatch uncertainty50 MHz calibration port Accurate calibration and traceability to US National Institute of Standards and Technology (NIST) millimeter-wave sensor calibration Compatible with EPM (new N1913A/ 14A, E4418B/ 19B), EPM-P (E4416A/ 17A) and P-series (N1911A/ 12A) power meters, plus the E1416A VXI and discontinued 70100A and 43X power meter Accurate average power measurements over -70 to -20 dBm Frequency range 26.5 GHz to 40 GHz Diode power sensing element
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Product
T-Type Thermocouple, 32°F to 500°F Temperature Sensor
745685-T02
Temperature Sensor
T-Type Thermocouple, 32°F to 500°F Temperature Sensor - The T-Type Thermocouple works with NI measurement devices and software to help you acquire temperature data within a measurement system. You can use LabVIEW or FlexLogger software and NI-DAQmx driver software to configure … measurements and predefined scaling coefficients for the T-Type Thermocouple and acquire synchronized temperature data in units of degrees. The T-Type Thermocouple is available in various lengths and configurations including field-cuttable, ready-made sensors, and thermocouple wire extensions with a -20°F to 221°F temperature range.
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Product
Test System for High Volume Production Testing of Integrated Circuits
ETS-364
Test System
The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture.
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Product
Universal In-Line Test Platform
Test Platform
UniLine brings 20+ years of test & quality experience to your manufacturing floor and test automation delivers accurate results, without bias. By standardizing test, product quality improves as costs decrease. Equipment becomes understandable and manageable across departments and station support becomes simple.
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Product
Advanced SoC/Analog Test System
3650
Test System
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
BSD (Test Diagnostics)
test
BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
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Product
10 MHz – 18 GHz USB Power Sensor
U2000B
Power Sensor
U2000B USB Power Sensor measures average power over the frequency range 10 MHz to 18 GHz and power range -30 dBm to +44 dBm.
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Product
E-Series Average Power Sensor
E9301H
Power Sensor
Measure the average power of all modulation formats Wide dynamic range power measurements from -50 dBm to +30 dBm10 MHz to 6 GHz frequency coverage for Wireless Comms formatsLow SWR for reducing mismatch uncertainty Calibration factors, linearity and temperature compensation data stored in EEPROM Compatible with EPM (new N1913A/ 14A, E4418B/ 19B), EPM-P (E4416A/ 17A) and P-series (N1911A/ 12A) power meters
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Product
PCIe 2.0 Test Platform
PXP-100B
Test Platform
The Teledyne LeCroy PXP-100B Test Platform provides a convenient means for testing PCIe 2.0 add-in cards with a self-contained portable and powered passive backplane. The PXP-100B provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer. As an alternative to an interposer, the PXP-100B includes two mid-bus probe footprints to allow connection to an analyzer via a mid-bus probe.
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Product
EMI Test System
TS9975
Test System
The R&S®TS9975 is the base system for conducted and radiated EMI measurements. Due to its modular design, it covers a wide range of applications and can be very easily adapted to the measurement task at hand. Any configuration is possible – from conducted measurements and the small precompliance system with a compact test cell to the accredited test system for large equipment under test. Combinations of different applications or incremental expansion are easily possible.
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Product
EBIRST 50-pin D-type To 25-pin D-type Adapter
93-005-414
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Functional Test
cUTS
Functional Test
Get the essentials of measurement automation to power tests of simpler PCBAs and subassemblies. compactUTS (cUTS) is a cost-effective platform for automating manual tests of devices with fewer than fifty cable-accessible test points in manufacturing environments with moderate production volume. DUT-specific electrically keyed cables make changeover quick and easy.
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Product
E-Series Average Power Sensor
E9301B
Power Sensor
Measure the average power of all modulation formats Wide dynamic range power measurements from -30 dBm to +44 dBm10 MHz to 6 GHz frequency coverage for Wireless Comms formats Low SWR for reducing mismatch uncertainty Calibration factors, linearity and temperature compensation data stored in EEPROM Compatible with EPM (new N1913A/ 14A, E4418B/ 19B), EPM-P (E4416A/ 17A) and P-series (N1911A/ 12A) power meters
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Product
High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
Test Platform
Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
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Product
Multiple Module Serial Bus Test Instrument
Bi4-Series
Test Instrument
The wide variety of serial buses used in defense and aerospace applications typically requires multiple single-purpose instruments. Too often, they are difficult to reconfigure in order to test a different application.The Bi4-Series provides all the capabilities needed for complete communications bus access test for up to four serial buses used in board level (SRA/SRU) and box level (WRA/LRU) equipment—all in a single VXI module.The instrument includes test applications, industry-compliant software drivers and hardware enabling straightforward integration into automatic test systems.With the configuration flexibility needed to effectively test every bus format used in defense and aerospace applications, the Bi4-Series instrument plays a key role in reducing implementation time and test system cost.
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Product
S2 Ultra High Sensitivity Sensors
ULP-S2 UHS
LED Sensor
Universal LightProbe S2 Ultra-High Sensitivity Sensors are designed for the test of very dim LEDs, as low as 0.01 mcd minimum, and including very low light-level LED-illuminated action-indicator switches, controls and status indicators for night/dark viewing in automobile interiors. Recommend the use of wide-aperture stainless- steel encased Fiber- optic Probes with contacting tips.Operating temperature range: 0oC to 70oCPower consumption: Operates between +5 and 28 volts D.C., at 6mA max. Less than 4.75 volts is not recommendedVoltage protection: Withstands up to +40 volts, & reverse polarity to -18 voltsSignal Output Loads: 20 mA max. Non-inductive.Output Pins: 3 gold-plated standard wire-wrap pins (0.025 in. sq.)Sensor Size: 0.560 in. dia x 1.38 in. long.Typical response times: <190mSFiber-Optic Probes: Wide-Aperture Fiber-Optic Probe recommendedDesigned for the test of very dim LEDs, as low as 0.01 mcd minimum
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196A
Test Fixture
The 16196A surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
10 MHz to 18 GHz USB Wide Dynamic Range Average & Peak Power Sensor
U2062XA
Power Sensor
The Keysight U2062XA is a fast, accurate and wide dynamic range 10 MHz – 18 GHz USB peak power sensor.
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Product
High Throughput Test Platform for Multi-Site & Index Parallel Applications
ETS-88
Test Platform
The ETS-88 is an optimal test platform for testing a wide variety of devices including: simple analog, high precision, high voltage, high current / power, automotive, video, audio, complex mixed-signal, as well as emerging power processes like SiC and GaN.
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Product
In-Circuit Test
TestStation LH
Test System
The TestStation LH in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne's popular, award winning TestStation product family. TestStation LH features SafeTest protection technologies for accurate, reliable, and safe testing of the latest low-voltage technologies.
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Product
Scienlab Battery Test System - Cell Level
SL1007A
Test System
The SL1007A Scienlab Battery Test System – Cell Level enables you to accurately and productively test battery cells for automotive and industrial applications. The bidirectional power supply charges and discharges your cells under test with very high efficiency.
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Product
E-Series Average Power Sensor
E9301A
Power Sensor
Measure the average power of all modulation formats Wide dynamic range (-60 dBm to +20 dBm) and frequency range 10 MHz to 6 GHzHigh maximum power specification Low SWR for reducing mismatch uncertainty Calibration factors linearity and temperative compensation data stored in EEPROM Fast measurement speeds (up to 400 readings per second with the Keysight E4416A)Compatible with EPM (new N1913A/ 14A, E4418B/ 19B), EPM-P (E4416A/ 17A) and P-series (N1911A/ 12A) power meters
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Product
Wideband Power Sensor, 50 MHz To 18 GHz
N1923A
Power Sensor
The Keysight N1923A peak power sensor provides peak, peak-to-average ratio, average power, rise time, fall time, maximum power, minimum power and statistical data of peak signals.
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Product
50 MHz to 40 GHz USB Peak and Average Power Sensor
U2022XA
Power Sensor
Keysight U2020 X-series USB power sensors provides the peak and average power measurement capability of a power meter in a compact and portable form factor.
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Product
Power Sensor
8483A
Power Sensor
The 8483A diode power sensor measures average power over the frequency range 100 kHz to 2 GHz and power range -30 to +20 dBm (50 dB dynamic range).
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Product
Semi-Rigid Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131G
Test Port Cable
The Keysight 85131G is a 53 cm (21 in) long1 semi-rigid cable with a 3.5 mm female2 to 3.5 mm male connector. Cable frequency range is dc to 26.5 GHz with a return loss of 16 dB or better. Insertion loss is 0.3 * sqrt (f) + 0.2 dB (where f is frequency is GHz) for the test port connector, and 1.8 dB at maximum frequency for the device connector. Phase stability of semi-rigid/flexible cables is characterized with a 90 degree bend using a 4 inch radius. Stability1 of the Keysight 85131G is 0.06 dB and phase is 0.16o * f + 0.5o (where f is frequency in GHz).
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Product
10 MHz to 40 GHz USB Wide Dynamic Range Average Power Sensor
U2054XA
Power Sensor
The Keysight U2054XA is a fast, accurate and wide dynamic range 10 MHz – 40 GHz USB average power sensor.
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Product
Disk Drive Test System
Saturn
Test System
The Saturn HD is the industry leader in 3.5” Near-Line Hard Disk Drive (HDD) testing. It provides maximum throughput while minimizing factory floor space and power consumption. The system is designed to perform single insertion of SSW, BDSW and Burn-In as well as drive configuration. Using Saturn HD on the production floor will reduce drive build times, enable greater responsiveness to data center demands and lower test costs per HDD unit.
