Test Switches
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PXI Dual SPDT RF Switch 6GHz 50 SMA Terminated
40-880-001
A range of 50Ω SPDT RF switching with automatic termination of unused signals. Available as a dual switch in a 1 slot PXI module, a quad switch in a two slot PXI module or hex and octal switches in three slot PXI modules.
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In-Circuit Test
TestStation LH
The TestStation LH in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne's popular, award winning TestStation product family. TestStation LH features SafeTest protection technologies for accurate, reliable, and safe testing of the latest low-voltage technologies.
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PXI Hex SPDT RF Switch 3GHz 50 MCX
40-870-106
The 40-870 is a 50 RF Switch available with 3 or 6 separate SPDT relays in a single PXI slot. Both versions exhibit low insertion loss and VSWR through the use of modern RF relay technology at an affordable cost. The switch banks been carefully designed to ensure excellent and repeatable RF characteristics to frequencies of 3GHz. The injection of noise and unwanted signals into the signal paths of the 40-870 has been minimized by careful attention to the mechanical and electrical design.
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Parallel Electrode SMD Test Fixture
16192A
The 16192A test fixture is designed for impedance evaluations of side electrode SMD components. The minimum SMD size that this fixture is adapted to evaluate is 1(L)[mm].
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PXI Dual 2 x 2 Fibre Optic (M Mode) SC M62.5
40-860-222-M62.5
Pickering PXI Fiber Optic MEMS Switching cards are available in many high density formats with a choice of 5 different connector styles to suit most applications: FC/APC (for optimal performance), FC/PC and SC/PC for general applications and LC and MU for high density applications. Fiber optic multiplexers create a signal path by redirecting the optical signal into a selected output fiber. This is achieved using Micro-Mechanical Mirrors driven by a highly precise mechanism and activated via an electrical control signal.
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Alternate 1.10 (31.18) - 7.20 (204.00) Switch Probe
TSP100-F180-2
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,990Overall Length (mm): 50.60Switch Point (mil): 59Switch Point (mm): 1.50
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Isolated Digital I/O 60VDC, 150mA
OTP2 module no.186
The National Instruments PXI-6528, PCI-6528, and PXI-6529 Digital I/O Modules are isolated digital I/O interfaces for PCI and PXI. These modules can use inputs from NI 6528 and PXI 6529 devices to capture the status of sensors, actuators, and logic devices. NI 6528 devices have 24 SSR outputs for switching external devices with input currents up to 150 mA. The NI 6528 and PXI-6529 devices are suitable for a variety of applications, from automotive development and industrial factory automation to aerospace, laboratory research, and biomedical applications due to their high current handling capacity and isolation.
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EOL RF Functional Test
AS652
With this RF test platform, integrable according to the specific needs of the product, we cover a very wide range of test needs with manual feeding.Ergonomics have been fully observed in the design, including the option of servo adjustment of the working height according to the operator.
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PXI Digital Test Instrument
PXIe-6943
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.This instrument is TPS-compatible with the legacy VXI digital test instrument from Astronics as well as other instrument vendors.
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PXI/PXIe MEMS Optical Switch, Triple Insert/Bypass
40-860A-332
The 40/42-860A-332 is a PXI/PXIe triple insert/bypass switch with MU connectors and is part of Pickering's range of PXI Fiber Optic MEMS Switching modules. They are available in many high density formats with a choice of different connector styles to suit most applications: FC/APC (for optimal performance), FC/PC and SC/PC for general applications and LC and MU for high density applications. They are also available with an optional hardware interlock which, when activated, will return all optical switches to their default unpowered state.
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ESD Test System
58154 Series
ESD (Electrostatic Discharge) Test Systems are PXI/PCI controlled module to simulate electrostatic discharge pulse during electronic device testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD STM5.2-1999-Machine Model. The user friendly software offers programmable and flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity, ESD pulse interval in a sequence, and automatic testing function.
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PXIe Flexible Microwave Module, Dual SP4T Terminated 40 GHz, Single SPDT 40 GHz, 50 Ω, SMA
42-890-002
The 40-890 (PXI) and 42-890 (PXIe) range of PXI microwave modules allows users to specify the mix of relay types, frequencies and quantities based on the application requirements within the capabilities of the module driver card. Choose from the extensive relay selection already available in the Pickering microwave range to create a flexible solution.
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Application Software for Electronic Test & Instrumentation
Application software provides configuration-based workflows for electronic test and instrumentation applications. Application software is part of the NI software portfolio.
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PXI Triple SPDT RF Switch SMB 75 Ohm
40-830-003
The 40-830-003 is a 75Ω RF Switch with 3 separate SPDT relays in a single PXI slot. It has been designed to exhibit low insertion loss and VSWR through the use of modern RF relay technology at an affordable cost. The switch banks have been carefully designed to ensure excellent and repeatable RF characteristics to frequencies of 3GHz with each path having a nominally equal insertion loss.
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At-Speed Non-Intrusive Functional Testing
ScanExpress JET
Functional circuit board testing presents many challenges that are often costly and time consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.ScanExpress JET is a tool designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.
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PXIe Flexible Microwave Module, Dual SP4T 40 GHz, Single SPDT 40 GHz, 50 Ω, SMA
42-890-001
The 40-890 (PXI) and 42-890 (PXIe) range of PXI microwave modules allows users to specify the mix of relay types, frequencies and quantities based on the application requirements within the capabilities of the module driver card. Choose from the extensive relay selection already available in the Pickering microwave range to create a flexible solution.
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PXIe Flexible Microwave Module, Dual SP6T Terminated 26.5 GHz, Single SPDT 26.5 GHz, 50 Ω, SMA
42-890-004
The 40-890 (PXI) and 42-890 (PXIe) range of PXI microwave modules allows users to specify the mix of relay types, frequencies and quantities based on the application requirements within the capabilities of the module driver card. Choose from the extensive relay selection already available in the Pickering microwave range to create a flexible solution.
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Optimize Throughput And Cost For MmWave 5G Device Functional Test
Test engineers always have faced tough new test-coverage challenges. Those introduced by 5G measurements at mmWave are no exception, as they require over-the-air (OTA) radiated test solutions. But never have these pressures seen today’s intense time-to-market, manufacturing volume, and operational expectations! A solution that meets these demands must:
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PXI Single 2 x 2 Fibre Optic (M Mode)SCM62.5
40-860-212-M62.5
Pickering PXI Fiber Optic MEMS Switching cards are available in many high density formats with a choice of 5 different connector styles to suit most applications: FC/APC (for optimal performance), FC/PC and SC/PC for general applications and LC and MU for high density applications. Fiber optic multiplexers create a signal path by redirecting the optical signal into a selected output fiber.
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TSP100 Switch Probes
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,990Overall Length (mm): 50.60Switch Point (mil): 59Switch Point (mm): 1.50
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PXI Solid State Switch Module, 6xSPST, 10 A
40-182A-011
The 40-182A-011 has 6 off high current SPST switches in two PXI slots and is part of our range of high power solid state switching solutions. Each SPST switch uses a fully isolated solid state relay which has been designed to offer fast operation under hot switching conditions and high inrush current with no operational life degradation. Each SPST switch can support 10A of continuous current and switch up to 200V signals. The switch can sustain inrush currents in excess of 50A. AC or DC signals can be switched since the switch is polarity insensitive.
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SAS Protocol Test System
M124A
The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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NI Automated Test Software Suite
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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Push-Back & Push-Back Switch Probes
Connector assembly check - extreme spring force - used in test modules.
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NI Real-Time Test Cell Reference System
778820-35
DIAdem Advanced with DAC Bundle, Perpetual License, Include 1 Year SSP
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PXI/PXIe RF Switch, Triple SPDT, 3GHz, 50Ω, SMB
42-870A-003
The 40-870A-003 (PXI) and 42-870A-003 (PXIe) are 50Ω RF switches with 3 separate SPDT relays in a single slot. They have low insertion loss and VSWR through the use of modern RF relay technology at an affordable cost.
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PXI Single Microwave Transfer Switch 26.5GHz 50 SMA
40-782A-531
The 40-782A-531 is a single transfer switch and is part of our range of PXI microwave switching modules. It has a characteristic impedance of 50Ω and a maximum operating frequency of 26.5GHz. Connections are made via front panel mounted high quality SMA coaxial connectors.
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VXI Digital Multiplier
4152A
The 4152A’s advanced features like limit testing, averaging, speed/resolution trade-offs, and fast function changes provide the high “test system” throughput required in today’s production test environments.
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SMD Array Type LCR Test Fixture
16034H
The 16034H is designed for impedance evaluations of array-type SMD.The minimum SMD size that this fixture is adapted to evaluate is 1.6(L)x0.8(W)[mm]. Since the tip of the measurement electrodes are very thin and the device holder is extremely flat, the device can be shifted and the measurement electrodes can contact each of the elements of the array-type component.
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Standard 2.90 (82.20) - 5.40 (153.00) Switch Probe
TSP157-H200-1
Current Rating (Amps): 10Average DC Resistance lower than (mOhm): 20Test Center (mil): 157Test Center (mm): 3.99Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 984Overall Length (mm): 25.00Switch Point (mil): 67Switch Point (mm): 1.70
