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Zener Diode
current flow from cathode to anode reverses when zener voltage reached.
See Also: Diode, Laser Diode, Diode Test, Photodiode
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Shunt Voltage References
Analog Devices offers a broad line of shunt precision voltage references that combine excellent accuracy and temperature stability with low noise and small packages. These devices operate in a manner that is functionally equivalent to a Zener diode. The bias current must be set higher than the sum of the maximum quiescent current of the voltage reference and the maximum expected load current. Since shunt voltage references are typically biased with a resistor, the voltage reference can operate on a wide range of input voltages.
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Rebuilt Testers
Lorlin® manufacturers New and Rebuilt Discrete Component Semiconductor Test Systems for Transistors, Diodes, Zeners, Fets, IGBTs, SCRs, Triacs, Optos, Small Signal and Power Semiconductors. We measure, screen, test, analyze, characterize and sort the critical parameters of semiconductors devices including Leakage Current, Breakdown Voltage, Gain, Saturation Voltages, and offer a comprehensive test parameter library with an easy to use Windows based applications software. The systems us a Windows 10® 64-BIT Operating System with a USB 2.0 Interface. Engineering excellence, innovation, creativity and cutting edge technology has made Lorlin equipment well known for testing discrete components.
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Atlas ZEN Zener Diode Analyser
ZEN50
The Atlas ZEN is ideal for testing Zener diodes (including avalanche diodes), transient suppressors, LEDs and LED strings.
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Signal Interface
Our signal interface products provide signal conversion and electrical isolation between sensors and other field devices and a control circuit. Intrinsic safety modules add Zener diodes, which limit the amount of electrical energy on intrinsically safe circuits.
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Capacitor Leakage Current/IR Meter
Chroma 11200
Chroma Systems Solutions, Inc.
The 11200 Capacitor Leakage Current / IR Meter is mainly used for electrolytic capacitor leakage current testing and aluminum-foil withstand voltage testing (EIAJ RC-2364A). The 11200 can also be used for active voltage checking or leakage current testing of absorber, Zener diode, and Neon lamp etc. With the standard RS232 interface, optional GPIB & Handler interfaces, high speed and stable measurement capabilities, the Chroma 11200 can be used for both component evaluation on the production line and for fundamental leakage current or IR testing for bench top applications.
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Shunt Regulators
These are the standard reference voltage source widely used by the feedback circuits of switching power supplies. Compared to the Zener diode, which is a discrete product, a shunt regulator has much better voltage precision because voltage control is carried out as an IC.
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Diode Tester
FEC VF40CM
Frothingham Electronics Corporation
The VF40CM is intended for testing VF, HALF CYCLE SURGE, and THERMAL RESPONSE/RESISTANCE on small- and medium-power diodes and rectifiers. It can also measure THERMAL RESPONSE/RESISTANCE on NPN and PNP bipolar transistors using an external user-supplied VCB supply.The VF40CM also is sometimes used to measure VZ of low-voltage zener diodes up to the compliance voltage limit of the tester. 20V at 20A is possible.
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SiC Diodes
ST’s silicon carbide diodes range from 600 to 1200 V – as single and dual diodes – and feature unbeatable reverse recovery characteristics and improved VF. Available in a wide variety of packages, from D²PAK to TO-247 and the insulated TO-220AB/AC, they offer great flexibility to designers looking for efficiency, robustness and fast time-to-market. ST’s SiC Schottky diodes show a significant power-loss reduction and are commonly used in hard-switching applications such as high-end-server and telecom power supplies, while also intended for solar inverters, motor drives and uninterruptible power supplies (UPS). ST’s automotive-grade 650 and 1200 V SiC diodes – AEC-Q101-qualified and PPAP capable – feature the lowest forward voltage drop (VF) on the market, for optimal efficiency in electric vehicle (EV) applications.
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Laser Diode Testing
The low power series of burn-in and life test systems are designed to test the reliability of low power laser diodes up to 1 Amp in current. The modular design means they can test up to 2,048 lasers, however due to the flexibility of the system, it can be adapted to suit both low volume R&D environments and high volume production environments.
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High Voltage Diode Assemblies
High voltage diode assemblies are built by adding diodes in series to yield a higher peak inverse voltage. For example, if each diode is rated for 1200 peak inverse voltage (PIV), then six diodes in series would have a total peak inverse voltage of 7200 PIV. The detailed circuit is shown below.
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Diode Lasers
Spot Creator
Advanced Photonic Sciences LLC
Spot Creator is an innovative accessory developed for enhancing the performance of blue laser diode based engraving and cutting machines. Spot Creator solves a major problem with using asymmetric blue laser diodes: the production of engraving features that are different in the X-Y directions, resulting in unequal or blurred lines. Using Spot Creator, line widths are equal in the X-Y directions, with a minimum spot of 50 μm. The intensity on the engraved part is thus maximized.
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Varactor Tuning Diodes
Macom Technology Solutions Holdings Inc.
MACOM’s GaAs and Silicon varactor tuning diodes provide broadband performance ranging from 10 MHz to 70 GHz. They are ideal for high Q filter and VCO electronic tuning circuits and are available in die form, flip chip, plastic and ceramic packaging. These GaAs diodes boast a constant gamma series for higher frequency and high Q applications and silicon abrupt and hyper abrupt series in plastic packaging are suitable for high volume surface mount applications.
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Silicon Carbide Diodes
In addition to ensuring compliance with today's most stringent energy efficiency regulations (Energy Star, 80Plus, and European Efficiency), ST's silicon-carbide diodes show four times better dynamic characteristics with 15% less forward voltage (VF) than standard silicon diodes. Silicon-carbide diodes belong to our STPOWER family.
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Laser Diodes
Our laser diode portfolio is broad, extending from cw laser diodes to pulsed laser diodes to high-power laser diodes. For special areas of application VCSELs and quantum cascade lasers are also included in our range of products.
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Laser Diode Drivers
Arroyo Instruments offers a broad range of laser drivers to meet your exact test needs. From 100 milliamps to 100 Amps, all of Arroyo Instruments' LaserSource benchtop laser drivers include unique features not found on competing products such as optically isolated photodiode and modulation inputs, programmable PD bias, and both RS232 and USB computer interfaces. The LaserSource also has laser diode protection circuits such as interlock, ESD protection, and hardware limits for current and voltage.
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Laser Diode Characterization Systems
Artifex Engineering GmbH & Co. KG
The LIV100 and LIV120 employ digitally programmable analogue end stages for flexible and accurate current control. A wide range of current end stages are available with maximum currents of 250mA for low power and telecom lasers or up to 1200A for high power laser bars. Custom units are available with even more current!
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Vegas Data Diode
01-09838
Non-ruggedized module that addresses concerns regarding use of untrusted, commercial-off-the-shelf (COTS) bus logging on aircraft with a MIL-STD-1553 or ARINC-429 bus interface.
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Modular Laser Diode Test System (PXI/PXIe)
LTS8620
The LTS8620 test system is a modular PXI test system for testing and qualifying laser diodes. The system is able to generate extremely short current pulses. This minimizes the effects of heat on the laser diode.
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Diode Temperature Monitor
SIM922
Stanford Research Systems, Inc.
The SIM922 Diode Temperature Monitor and the SIM923 Platinum RTD Monitor are designed to measure four sensors simultaneously. Based on the modular SIM platform, they provide high-performance and multiple-channel capability in a small footprint.
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Diode Module Scanners
Scan500
Frothingham Electronics Corporation
The Scan500 scanners are add-on scanners for diode modules, to be used with a tester such as the FEC200.
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Laser Diode Source Product Family
LDS-7200
5 nanometers tuning range• 10 picometer setpoint accuracy• 0.1 picometer resolution• 20mW output power• 0.005 dB power stability• Built-in coherence control• Integrated function generator• USB remote interface• Application program with source code
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High-Speed Switching Diodes 33 To 140 GHz
Insight Product Company offers high-speed switching diodes with switching time up to 2 nsec and operating frequency range up to 140 GHz. Silicon p+-p-n-n+ high-speed switching diodes are designed to be used in mm-wave switching devices, phase changers, modulators, attenuators for the millimeter wavelength range. They are fabricated in the metal-ruby packages with hard-lead carrier (diameter 3.0 mm, 1.5 mm).
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High Power Laser Diode Drivers
Lumina Power state-of the art laser diode drivers are designed for the emerging high power laser diode industry.
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SiC Schottky Barrier Diode
We offer high-performance products with low forward voltage (VF) and high-speed reverse recovery time (trr) for increasing device efficiency.We are also employing a new material (silicon carbide: SiC) for products with even higher efficiency.
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Bipolar/FET/Diode Dual Head Production Test System
36XX
Two test stations on the 3600E and 3601E systems. Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes and darlingtons. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3602E or 3603E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
