Gate
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Electric Testing
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Our Capabilities*Dielectric Withstand*Hi-Potential Testing*Voltage Drop*Contact Resistance*Gate Leakage*Insulation Integrity*Dielectric Integrity
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Product
HDTV Frame Grabber / HDMI Video Capture Card (formerly HDV62)
PCIe-HDV62
Frame Grabber
The PCIe-HDV62 is a PCI Express frame grabber offering uncompressed image acquisition and video streaming in full 1080p HD.The ADLINK PCIe-HDV62 provides 1920x1080p resolution, progressive scan, and noise reduction for greater image quality. Equipped with a field programmable gate array (FPGA) and 512 MB memory buffer, the PCIe-HDV62 offers the ability to stream uncompressed image to the host PC, in addition to color space conversion in real-time via on-board hardware in order to offload repetitive tasks from the host CPU. Based on the PCI Express x4 form factor, the PCIe-HDV62 is specifically designed for medical imaging, scientific imaging, and military application system integrators by providing uncompressed video streaming up to 1920x1080p at 60 fps and lossless pixel information for both spatial and frequency domain analysis.
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Product
Thickness Gauges
CMX DL+
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The CMX DL+ has all the features of the CMX DL, plus a full featured A-Scan presentation with RF and Rectified viewing options. The CMX DL+ is equipped with 3 fully adjustable gates (start, stop, width, & Threshold). Equipped with a 20dB boost/cut attenuator, which offers added flexibility for transducer types and applications. Selectable 50 volt pulser boost or cut (100 200 volts). Truly the Cadillac of the CMX series.
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Product
Quick Start Kit
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Curtiss-Wright Defense Solutions
The OpenVPX CHAMP-WB/CHAMP-WB-DRFM/A25G/D25G 6U Quick Start Kit (QSK) from Curtiss-Wright Defense Solutions enables the system developer to rapidly prototype a core system for software and fieldprogrammable gate array (FPGA) development using the CHAMP-WB. Other components can be added to this basic configuration or alternative options can be explored.
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Product
Mechanical Bench-top Test Jigs
CGF Series
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Advanced test jig, using a cam-operated, fully adjustable gate - self customisation.
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Product
Test System
ITC57300
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The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
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Product
Multi Functional VME Logic Module
MDGG-16
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The MDGG-16 is a single wide 6U VME multi functional FPGA based delay logic and timing module which provides often needed functions as gate generator & pulse generator, logic fan in - fan out, coincidence register and scaler / pre-scaler. The module has 16 LVDS/ECL inputs and 16 ECL outputs on pin headers and 2 NIM inputs as well as 4 NIM outputs (Lemo), which are free configurable in regards to their functionality.
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Product
P-Series Dual Channel Power Meter
N1912A
Power Meter
30 MHz video bandwidth Single shot real time capture at 100 M sample/s per second Key Measurements: - peak, average, peak-to-average ratio, rise time, fall time and pulse width22 Predefined formats: WiMAX, DME, HSDPA, etc. One screen view for pulse measurement analysis: Auto Scale, Auto Gate, Rise/Fall Time, Duty Cycle, etc. Internal Zeroing and Calibration while connecting to the DUT Bench Vue software enabled
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Product
FieldFox Handheld Microwave Spectrum Analyzer, 50 GHz
N9962A
Spectrum Analyzer
9 kHz to 50 GHz frequency range Expand capabilities with optional tracking generator, interference analyzer, built-in power meter, and more Make accurate spectrum analyzer measurements ( 0.5 dB) without needing warm-up Locate interfering signals using the intuitive spectrogram display and recording capability Easily measure average and pulse power with a USB power sensor, pulse measurements with time gating Lightest microwave handheld spectrum analyzer at only 7.1 lb. (3.2 kg)
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Product
Interface and Isolation
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Analog Devices offers a wide range of digital interface and digital isolators with iCoupler® technology covering the industry’s field bus and peripheral communications standards. Digital isolators, isolated transceivers, isolated A/D converters and isolated gate drivers utilize the award winning iCoupler® and isoPower® technologies for isolation solutions without many of the constraints found in optocouplers. Find design solutions for interface devices including keypad controllers, level translators, and high voltage protection products (channel protection, fault protection, overvoltage protection), and latch-up proof switches and multiplexers.
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Product
Frequency-Resolved Optical Gating Pulse Analyzer
IQFROG
Analyzer
The IQFROG measures pulse intensity and phase in both spectral and temporal domains, yielding a complete pulse characterization. With its long delay arm and high resolution spectrometer, it measures chirped pulses up to 50 ps wide, or up to 10 ps wide if the pulse is transform limited. The IQFROG is available in 1.0 and 1.5 micron wavelengths.
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Product
MOSFET Drivers
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The bridge driver products handle voltages up to 100V, with industry-leading gate rise and fall times and exceptional input-to-output propagation delay performance. Select parts are available in 4mm x 4mm and 3mm x 3mm DFN packages which meet IPC-2221 creepage and clearance specifications for high-voltage systems.
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Product
Desktop stand-alone
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All Three Sensors Of Optical Comb Can Be Installed On The Gate Type Stage And It Can Be Used As A General-Purpose Stand-Alone Machine. Tasu Since It Is A Rectilinear Laser, Complex Shapes Can Also Be Measured Tasu Measuring Time With A Working Distance exceeding 100 mm can be easily measured + parts with high irregularities can be measured with deep depth of focus
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Product
Gate-Level Design Optimization
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After logic synthesis, STAR helps reaching power, performance and area (PPA) requirements for complex SoCs is becoming a real challenge. Large design netlists are restructured and optimized to reach aggressive PPA requirements, cost-effectively.
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Test Solutions For OEMs
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A partnership with Testek Solutions fits into your business because we do business like youdo business. Our partnerships are built on open communication, process transparency, and trust – trust that is built on our proven engineering design process. We assign a dedicated team consisting of a program manager who will be your single-point-of-contact, an experienced project engineer to design and oversee all engineering on the project, and any supporting engineers and manufacturing team members necessary for every project. Each test stand goes through a series of stage gates including an initial review of requirements, preliminary design review, critical design review, final design and manufacturing review, and a quality review regardless of whether you request these reviews.
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Product
ORing FET Control
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Renesas' ORing MOSFET Controllers with a suitably sized N-Channel power MOSFET(s) increase power distribution efficiency and availability when replacing a power ORing diode in high-current applications. They provide gate drive voltage for the MOSFET(s) with a fully integrated charge pump.
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Product
Power MOSFETs
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ST's power MOSFET portfolio offers a broad range of breakdown voltages from –100 to 1700 V, with low gate charge and low on-resistance, combined with state-of-the art packaging. ST's process technology for both high-voltage power MOSFETs (MDmesh™) and low-voltage power MOSFETs (STripFET) ensures an enhanced power handling capability, resulting in high-efficiency solutions. Power MOSFETs belong to the STPOWER family.
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Product
Duty Cycle Meter
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Displays ON or OFF period as a percentage of total period over a programmed gate time from 10 ms to 199.99 s. A resolution of 1%, 0.1% or 0.01% is user-selectable. Applications include monitoring modulated proportional control systems and pulse-modulated systems, such as radar, lasers or packet radio.
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Product
Photometer II
Spectra Film Gate
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The Spectra Film Gate Photometer II offered by Spectra Cine is a significant advance in the field of photometry. It is extremely sensitive and solid state throughout. Reads directly in printer steps of 0.025 log exposure units. The large, uncrowded scale has an 80 printer point range and affords ease and accuracy in reading. A variety of probes are available for use in Acme optical printers, Bell & Howell Model "C", "J", and "A" contact printers, ARRI printers and Oxberry printers.
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Product
12-Bit, 2.5 GSPS Digitizer Optimized for Pulse Detection
ADQ32-PDRX
Digitizer
ADQ32-PDRX acquires the input signal via a single connector and uses an onboard splitter to separate the signal into two paths with different gain settings. The high gain path is used to accurately capture low-amplitude portions of the input signal whereas the low gain path ensures the acquisition of high-amplitude peaks without causing saturation. The two signal paths are then combined in real-time inside the onboard field-programmable gate array (FPGA) to create a digitized output with improved performance.PDRX increases the dynamic range by 3 bits and is fully integrated into the digitizer for fast and easy system-level integration. ADQ32-PDRX is therefore comparable with a 16-bit digitizer in terms of dynamic range, but with the benefit of offering a higher sampling rate.
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Product
Eddy Current Flaw Detector
US-525M
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United Western Technologies Corp
The US-525M multi-channel eddy current testing instrument is a rugged industrial rack-mounted instrument offering multi-channel testing, integral digital strip chart, as well as Ethernet control and data transfer to meet your in process testing requirements. This instrument offers up to eight channels, with a frequency range of 20 Hz to 10 Mz, a high signal-to-noise ratio, a bright 12-inch diagonal color LCD flat-panel screen, and data storage of 32 Gig. It offers input/output (I/O) capability, USB and Ethernet connectivity, as well as three discrete alarm gates with independent outputs per channel. for your on-line bar, tube, wire and specialty component testing needs.
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Product
RF Amplifiers Bias Controllers
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RF amplifier bias controllers generate a regulated drain voltage and actively adjusts the gate voltage of an external amplifier to achieve constant bias current. It can be used to bias any enhancement and depletion type amplifier operating in Class-A regime with drain voltages (VDRAIN) as specified. These devices achieve excellent bias stability over supply, temperature and process variations, and eliminates the required calibration procedures used to prevent RF performance degradation due to such variations.
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Half, Full Bridge & Three Phase Drivers
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Renesas' half-bridge (h-bridge), full-bridge and three-phase drivers handle voltages up to 100V, with industry-leading gate rise and fall times and exceptional input-to-output propagation delay performance.
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Series Gated Integrators and Boxcar Averagers
SR200
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Stanford Research Systems, Inc.
The SR200 Series Boxcar Averager System is a modular instrumentation platform designed to acquire and analyze fast analog signals. The system consists of a NIM compatible mainframe and modules which can be selected to tailor a system to individual requirements. The
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Brushless DC Drivers (BLDC)
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Covering a wide range of power systems, our integrated MOSFET and gate driver ICs thrive in automotive, industrial, and consumer applications, ranging from 3.5 to 100 V operating voltage.
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Product
SWIR InGaAs Camera Module For Short Exposures
XSW Gated Series
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The XSW 320 Gated series is based on in-house developed, temperature stabilised InGaAs detector with a 320 x 256 pixel resolution. The XSW 320 Gated modules are able to provide maximum frame rates up to 400 Hz. The exposure time of the sensor is configurable from 100 ns up to 1 ms in steps of 100 ns, or from 1 ms to 40 ms.
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Product
10Hz-150KHz Frequency Counter
HCF-F1000L
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FEATURE:*Period,totalize measurement self test*High sensitioity:85dBV (25mVrms)*Stability:±3x10-9/s*8 digit LED display*Gate Time:0.01s,0.1s,1s*Power supply:AC 220V(110V optional)
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Flaw Detector & Thickness Gauge
DFX-7+
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Measurement Gates: Two independent gates (Flaw), and three gates (thickness). Start & width adjustable over full range. Amplitude 5-95%, 1% steps. Positive or negative triggering for each gate with audible and visual alarms.
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Product
CoreCommander
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While many ICs are equipped with a JTAG (IEEE Std. 1149.1) boundary-scan register (BSR), a significant number of microprocessors and DSPs can be found with deficient or even non-existent BSRs. CoreCommander Micro uses the on-chip debug mode of processors to access ports and embedded peripheral controllers to promote ''kernel-centric'' testing. Similarly, in the case of today's Field Programmable Gate Arrays (FPGAs) test engineers can ''bridge'' from the JTAG interface to the resources of the gate array itself. Our CoreCommander FPGA product implements a translatorinterface that allows our JTAG hardware to control embedded IP cores via a variety of bus interfaces (e.g. Wishbone Avalon etc.).
