High Definition TV
Digital broadcast television with higher resoultion than NTSC, SECAM and PAL.
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Alternate 2.14 (61.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-72I40-6
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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Alternate 2.58 (73.00) - 6.00 (170.00) High Performance Lead Free Probe
LFRE-25V-6
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Ultra High 1.77 (50.00) - 10.00 (283.00) High Performance Lead Free Probe
LFRE-25V-10
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Standard 1.02 (29.00) - 4.00 (114.00) High Performance Bias Ball Probe
POGO-62H-4-S
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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High Speed Imaging
The High-speed Intensified Camera Attachment (HiCATT) is designed for use with a high-speed camera. The HiCATT increases the sensitivity of a high-speed camera and allows low-light-level imaging applications at frame rates up to 300 000 fps.
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High Voltage Inclined Plane And Erosion Tester
SCR ELEKTRONIKS have developed HIGH VOLTAGE INCLINED PLANE AND EROSION TESTER to carryout test specified in many standard to cover test method for the evaluation of the relative tracking and erosion resistance of insulating solid using liquid contaminant (ASTM D2303). Perform the Initial Tracking Voltage Test, Time to track Test, And Erosion Test as per selection.
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High Voltage Test Station
High-voltage test stations place high demands on the safety aspect. We design these test stations in cooperation with our manufacturers as self-sufficient test systems.
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PXI/PXIe High Voltage Multiplexer, Triple 7-Channel, 2-Pole
42-321-122-HI
The 40-321-122-HI (PXI) and 42-321-122-HI (PXIe) are triple 7-channel 2-pole high voltage multiplexers capable of hot or cold switching up to 1000 V peak. They are also available in a range of bank sizes with 1 or 2 poles and channel counts between 4 and 48. High quality reed relays are used throughout.
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PXI/PXIe High Density Precision Resistor Module, 4-Channel
40-297A-136
The 40-297A-136 (PXI) and the 42-297A-136 (PXIe) are 4-channel programmable resistors with a range of 2 Ω to 395 kΩ. They are part of the 40/42-297A series of high density precision resistor modules and provide a simple solution for applications requiring accurate simulation of resistive sensors.
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Standard 1.53 (43.00) - 4.00 (113.00) High Performance Lead Free Probe
LFRE-72I8-4
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18
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PXI High Density Multiplexer, 4-Bank, 40-Channel, 1-Pole
40-615A-007
The 40-615A-007 is a 2-bank, 80-channel, 1-pole MUX and is part of our range of PXI high density reed-relay based multiplexer modules. These feature a wide range of switching configurations and are especially useful where a large number of small multiplexers are required. Typical applications include signal routing in ATE and data acquisition systems. Connections are made via a front panel 200-pin connector.
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4 (High Current) D/A Outputs (±40 VDC or +100 mA)
DA3
The DA3 module features 4 high-current D/A output channels with a full-scale range of ±40 VDC or ±100 mA (max). The DA3 provides either voltage or current control loop modes that are programmable for the particular application.
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Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Lead Free Probe
LFRE-1L24-7
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02
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PXI/PXIe High Density Precision Resistor Module
42-297A-031
The 40-297A-031 (PXI) and the 42-297A-031 (PXIe) are 9-channel programmable resistors with a range of 2 Ω to 13.6 kΩ. They are part of the 40/42-297A series of high density precision resistor modules and provide a simple solution for applications requiring accurate simulation of resistive sensors.
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Elevated 2.65 (75.00) - 6.50 (184.00) High Performance Lead Free Probe
LFRE-25T79-6.5
Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Testing for Si Solar Cells Using High Performance CCD
EL Imaging Tester
EL Testing for Si Solar Cells using High Performance CCD. The determination of luminescence (photo emissions) in solar cells is an important characterization tool. Typical solar cells often have defects which limit the efficiency or lifetime of a cell. Many of these defects are visualized with Luminescence Imaging. By using this technique, the manufacturing process can be optimized to produce better cells. Luminescence Imaging takes advantage of the radiative inter-band recombination of excited charge carriers in solar cells. The emitted photons can be captured with a sensitive CCD camera to obtain an image of the distribution of the radiative recombination in the cell. This distribution is determined by the local excitation level, allowing the detection of electrical losses, thus mapping the diffusion length of minority carriers as the emitted light is low intensity and in the near infra-red range, the CCD camera has a high sensitivity wavelength from 900 to 1100 nm with little thermal noise. This CCD camera provides excellent resolution of 1024 x 1024 pixels with a large 1μm pixel size, multi-megahertz readout speed, and robust USB 2.0 connectivity. The EL CCD Camera is the ultimate high-performance CCD camera for electroluminescence and photoluminescence imaging for Photovoltaic (PV) Cells and Modules. This camera combines low noise electronics and optimal sensitivity in NIR.
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Ultra High 3.38 (96.00) - 10.00 (283.00) Bead Probe
BTP-72HC-10
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,700Overall Length (mm): 43.18
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High Voltage SMU 2500 V
AXV7607
Generate extremely short, fully regulated voltage pulses of up to 2500 V. Measure leakage currents up to the pA range.
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High Speed Digital Analog
The Automatic Test Equipment is designed to provide R&D and the Production floor with a high quality, reliable and easy to use Test Station comprised of COTS equipment from industry leading instrument manufactures. The measurement switching has low thermal offset allowing for micro volt measurements. The switching also accommodates both stimulus and measurement up to 5 Amps. Also to provide High Speed and Static Digital Stimulus and Response that covers LVDS, 3.3V, TTL, CMOS and Industrial logic families. For Serial communications there are SPI, I2C, RS232/485, USB and Ethernet. The system has nine programmable DC power supplies that are capable of powering both the UUT and the UUT interface separately. The system can interface with a variety of UUT’s via an ITA. Each system comes with the Imperial Test Executive, National Instruments TestStand, CVI, LabView and .NET Runtime.
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Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1T24-2
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe
POGO-1H-INS-2
Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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High Temperature Test Clip
- High temperature HT Parrot Test Clips PCS-HT , can be efficiently used at high temperature up to 160° Celsius. Plastic body is HT poly-amide.- High temperature HT Parrot Test Clips PCS-HT , can be used in ovens being connected with the silicone cables.
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PXI/PXIe High Density Precision Resistor Module, 4-Channel
40-297A-123
The 40-297A-123 (PXI) and the 42-297A-123 (PXIe) are 4-channel programmable resistors with a range of 1.5 Ω to 3.55 kΩ. They are part of the 40/42-297A series of high density precision resistor modules and provide a simple solution for applications requiring accurate simulation of resistive sensors.
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High Speed Test Bench
AT444
AC motor with mechanical multiplying gearbox test benches allow precise programming of all drive parameters required for accurate rotating devices test.The use of special high-speed bearings, mechanical components and parts wear resistant leads to a large life. The supply includes the electronic drive and control as well as the entire oil cooling unit.
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High Flow Mass Flow Controllers
High flow thermal mass flow controllers and meters offer both elastomer and metal seals for flow rates up to 300 slm. Versions are available for standard and harsh environments where protection from water and dust is required.
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AC High Voltage Break Down Tester
High Voltage Breakdown Testers also known as Hipot Testers or Insulation Testers are a necessity for any Transformer testing, Substation equipment testing, Cable testing, Panel testing and testing of various insulating materials. Insulation testing is very important to ensure and maintain the safety of electrical equipments and also for the safety of operator.
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High Speed Slip Rings
High Speed Slip Rings transfer power and data in rotating environments at speeds of up to 20,000 rpm. They provide low noise, high reliability and long life.
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MOSFETs For High Frequency Amplifier
The MOSFETs shown below are best suited for amplification of high-frequency signals.
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XMC-PCIeStor, High Speed PCIe Single SSD Adapter
9301
The 9301 is a VITA 42.3 XMC adapter card / mezzanine storage module with a single M.2 SSD site. The M.2 site supports up to 4 lanes of PCIe Gen 2 connectivity at 5 Gb/s per lane when a Gen 2 or 3 capable M.2 PCIe card is used.
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PXI High Voltage Power Multiplexer, Dual 12:1
40-331A-002
The 40-331A-002 dual 12:1 MUX is part of our range of 40-331A/332 High Voltage Power Multiplexer and Matrix Modules and is suitable for applications requiring high voltage power relay switching with high density. They feature current handling up to 5A, 1000VDC/1000VAC peak cold switching and 110VDC/250VAC hot switching.
