X-ray Diffraction
crystalline interference pattern of X-rays to determine atomic and molecular structure of a crystal.
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Product
Medical And Dental X-Ray
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Teledyne DALSA offers powerful, innovative CMOS X-Ray detectors combining industry-leading performance with cutting-edge features for applications such as orthopedic and surgical radiology, mammography, intra- and extra-oral dental radiology, CT, and bone densitometry
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Software For SALD-2300 Laser Diffraction Particle Size Analyzer
LabSolutions SALD
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Providing Secure, Confident Data Management on a Network System! The SALD-2300 laser diffraction particle size analyzer is now compatible with data integrity requirements. Connecting LabSolutions SALD to the LabSolutions system, with its proven compatibility with ER/ES regulations, enables confident, reliable data management. In addition to SALD data, consolidated management is available for LC, GC, and UV data.
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X-Ray Detector
Cmosaix CMX4343
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The technology used for the Cmosaix CMX4343 x-ray detector is based on a large array of CMOS cameras and sophisticated mathematical algorithms that produce superior X-ray imaging and enable new applications that were not possible before, at a fraction of the cost of existing technologies.
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X-Ray Detector
XRT Detector Onyx
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ONYX 1412-X is a performance-leading X-ray detector comprising a proprietary 2768 × 2376 active pixel sensor array of 50 × 50 µm pixels. This detector consists of a high-speed, low-noise, radiation-tolerant, 14 × 12 cm, 6.6M pixel CMOS image sensor, with a directly deposited high-resolution CsI scintillator on Fibre Optic Plate. The highly configurable sensor is accessed through a software interface, connected via a 10 GbE SFP+ hardware interface.
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(X-ray and XUV) Streak Cameras
AXIS-PX
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We build streak camera systems that can achieve time resolution on the femtosecond time scale while conserving and ultra-fine spatial resolution on a very long slit length.
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X-Ray Components
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Photonis designed the Micro Pore Optics detector to be used in X-Ray imaging applications. Its perfectly square, flat channels are optimized to allow X-Ray and UV photons to be focused or collimated due to the total external reflection at a grazing angle (<2°). Micro Pore Optics are installed on a number of international space missions.
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Digital Cabinet X-ray System
XPERT 80
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Kubtec's XPERT 80 brings high quality imaging and ease of use to science and research. The XPERT 80's compact self-contained cabinet, with a high resolution x-ray source, provides the sharpest images for every application. Optional sources are also available for micro-focus and soft x-ray applications.
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Product
Energy Dispersive X-ray Fluorescence (ED-XRF) Spectrometer
XEPOS
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SPECTRO Analytical Instruments GmbH
The new SPECTRO XEPOS spectrometer represents a quantum leap in energy dispersive X-ray fluorescence technology. It provides breakthrough advances in multi-elemental analysis of major, minor, and trace element concentrations. New developments in excitation and detection deliver outstanding sensitivity and detection limits yielding remarkable gains in precision and accuracy. The amazing SPECTRO XEPOS excels at critical tasks from rapid screening analysis to precise product quality control. Apply it for at-line processing in a variety of industries, for geology and mining, for environmental and waste monitoring, and for research and academia.
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Product
X-ray Microscopy
ZEISS Xradia Ultra
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Synchrotron X-ray nanotomography enables non-destructive 3D imaging at the nanoscale but you have to apply for very limited beamtime. What if you didn’t have to wait for synchrotron time anymore? Imagine if you had synchrotron capabilities in your own lab. With the ZEISS Xradia Ultra family, you have 3D non-destructive X-ray microscopes (XRM) at hand that deliver nano-scaled resolution with synchrotron-like quality. Choose between two models: both ZEISS Xradia 810 Ultra and ZEISS Xradia 800 Ultra are tailored to gain optimum image quality for your most frequently-used applications.
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X-ray Fluorescence Measuring System
FISCHERSCOPE X-RAY/XDV-SDD
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Premium model for universal use for the inspection of very thin or complex layers up to RoHS screening at very low detection limits.
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Energy Dispersive X-ray Spectroscopy
EDS
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Materials Evaluation and Engineering
EDS is an elemental chemical microanalysis technique performed in conjunction with each of the SEMs at MEE. Features or phases as small as about 1 micron can be analyzed.
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Product
Proton Induced X-ray Emission (PIXE)
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Elemental Analysis Incorporated, utilizing Proton Induced X-ray Emission (PIXE), provides a non-destructive, simultaneous analysis for the 72 inorganic elements from Sodium through Uranium on the Periodic Table for solid, liquid, and thin film (i.e. aerosol filter) samples. The PIXE technique offers the advantage of analysis, without the necessity for time consuming digestion, thereby minimizing the potential for error resulting from sample preparation.
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Product
X-Ray and CT Inspection
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Systems offer a microfocus X-ray source, a large inspection volume, high image resolution and is ready for ultrafast CT reconstruction. They cover a wide range of applications, including the inspection of plastic parts, small castings and complex mechanisms as well as researching materials and natural specimens.
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X-Ray And Gamma Detector Systems
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The XR-100CR is a new high performance x-ray detector, preamplifier, and cooler system using a thermoelectrically cooled Si-PIN photodiode as an xray detector. Also mounted on the 2-stage cooler are the input FET and a novel feedback circuit. These components are kept at approximately -55 °C, and are monitored by an internal temperature sensor. The hermetic TO-8 package of the detector has a light tight, vacuum tight thin Beryllium window to enable soft xray detection. The XR-100T-CdTe represents a breakthrough in xray detector technology by providing “off-the-shelf” performance previously available only from expensive cryogenically cooled systems. The XR-100-CdTe is also suited for measuring gamma rays.
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X-Ray Inspection
MXI Jade Plus
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Restrictions in manufacturing materials and ever increasing expectations for reliability mean ensuring quality product manufacture is more important than ever. Jade Plus enables you to Prove Your Quality and reduce product returns from the field, and the associated cost and damage to reputation.
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X-ray Microscopy
Xradia Family
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✔ Characterize the properties and behaviors of your materials non-destructively.✔ Reveal details of microstructures in three dimensions (3D).✔ Develop and confirm models or visualize structural details.✔ Achieve high contrast and submicron resolution imaging even for relatively large samples.
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Product
X-ray Photoelectron Spectroscopy Analysis (XPS Analysis)
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Rocky Mountain Laboratories, Inc.
X-ray photoelectron spectroscopy (XPS Analysis) also called Electron Spectroscopy for Chemical Analysis (ESCA) is a chemical surface analysis method. XPS measures the chemical composition of the outermost 100 Å of a sample. Measurements can be made at greater depths by ion sputter etching to remove surface layers.
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Product
Large-Area CMOS X-Ray Detector
Rad-icon
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Teledyne DALSA’s Rad-icon product family of large-area digital x-ray cameras offers users a high-speed, high-performance x-ray imaging detector with a fast, reliable PC interface (either GigE or CameraLink) for easy integration.
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Product
Imaging X-Ray Photoelectron Spectrometer
AXIS Supra+
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X-ray photoelectron spectroscopy (XPS) is unique in providing quantitative elemental and chemical state information from the uppermost 10 nm of a materials surface. The AXIS Supra+ (also known as Kratos Ultra 2+ in Japan) is a market leading X-ray photoelectron spectrometer combining state-of-the-art spectroscopic and imaging capabilities with the highest level of automation currently available. Unrivalled large area spectroscopic performance allows photoelectron spectra to be acquired from all types of materials including metals, semi-conductors and insulators. Fast, high spatial resolution XPS imaging reveals the lateral distribution of surface chemistry and aids further characterisation with selected small area analysis.
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X5 Pack X-Ray Inspection
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Designed to be integrated into line with built-in automatic reject and available in 300, 500 and 600 mm belt width models, the X5 Pack is perfect for a variety of unpackaged and packaged products.
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X-ray Fluorescence Measuring Instrument
FISCHERSCOPE® X-RAY XDL®
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Your entry into automated measuring. Robust XRF measuring device for quality control of electroplated bulk parts and for bath analysis.
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A Compact X-ray Inspection System, The MedaScope™ Desktop
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A compact X-ray machine weighing only 55 pounds, the MedaScope Desktop is easy to carry and can be set up rapidly. Glenbrook’s MedaScope Desktop is a portable, compact manual system for real-time, magnified x-ray screening of packaged devices including medical devices, electronics, and cables.
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X-Ray Cameras
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A range of scientific camera solutions optimized for high energy / X-Ray detection.
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NEX CG II Energy Dispersive X-ray Fluorescence Spectrometer
NEX CG II
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Applied Rigaku Technologies, Inc
NEX CG II, a powerful second-generation energy dispersive X-ray fluorescence (EDXRF) spectrometer, delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types — from oils and liquids to solids, metals, polymers, powders, pastes, coatings, and thin films.
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Compact Photon Counting X-Ray Detector
HyPix-3000
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Rigaku’s HyPix-3000 is a next-generation two-dimensional semiconductor detector designed specifically to meet the needs of the home lab diffractionist. One of the HyPix-3000’s unique features is its large active area of approximately 3000 mm² with a small pixel size of 100 μm², resulting in a detector with high spatial resolution. In addition, the HyPix-3000 is a single photon counting X-ray detector with a high count rate of greater than 10⁶ cps/pixel, a fast readout speed and essentially no noise.
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Inspection System for high-power precise 3D X-ray CT
X-eye PCT225
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Inspection System for 3D X-ray CT able to analyze defected area precisely by precise movement of axis with high polished Anti-vibration table. High-power X-ray Tube of max. 450kV and large area Flat Panel Detector of max.16 inches can be installed depending on the sample. Customized 3D CT equipment is available with selecting main parts by customers depends on their needs for size and material.
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Product
Windows-Based Software Suite for Rigaku's X-Ray Diffractometers
SmartLab Studio II
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SmartLab Studio II is a new Windows®-based software suite developed for the flagship Rigaku SmartLab X-ray diffractometer that integrates user privileges, measurements, analyses, data visualization and reporting. Newly available for the MiniFlex, the modular (plugin) architecture of this software delivers state-of-the-art interoperability between the functional components. Just one click switches from measurement to analysis. Watch real-time scans from one experiment while simultaneously analyzing other data on the same desktop by selecting an appropriate layout. The software provides various analysis tools such as automatic phase identification, quantitative analysis, crystallite-size analysis, lattice constants refinement, Rietveld analysis, ab initio structure determination, etc.
