Source Debugers
See Also: Debuggers, In-Circuit Debuggers, Code Debuggers, JTAG Debuggers, Debugging
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6.5-Digit Low Noise Power Source, 32 W, 210 V, 3 A, 2-Channel
B2962B
The Keysight B2961B Series 6.5-digit low noise source power supplies provide a power supply and source solution that meets the difficult measurement challenges researchers, designers, and developers face working on advanced components, circuits, and materials.
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PXIe-4138, 60 V, 3 A System PXI Source Measure Unit
782856-01
±60 V, 3 A System PXI Source Measure Unit—The PXIe‑4138 system source measure unit (SMU) delivers high power, precision, and speed. It is ideal for a broad range of applications including manufacturing test; board-level test; lab characterization with devices such as integrated circuits (ICs), power management integrated circuits (PMICs), and radio frequency integrated circuits (RFICs); and discrete devices including LEDs and optical transceivers. The PXIe‑4138 features 4-quadrant operation. The PXIe‑4138 is a hardware-timed instrument with a high-speed sequencing engine for synchronizing acquisitions between multiple SMUs. The module supports direct DMA streaming between the host PC and SMU, so you can stream large waveforms and measurement data at the full update rate and sample rate of the instrument.
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Tunable Laser Source - PXI
Laser 1000 Series
The Laser 1000 Series PXIe module is a Continuous Wave (CW), tunable laser source offering high-power output, narrow 100kHz linewidth and 0.01pm resolution tunability.With seamless PXI integration, it can be easily integrated into new or existing PXI test setups. Save space, lower your costs and improve testing efficiency while delivering reliable and repeatable results in production or research environments.
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PXIe Source/Measure Unit, 15 MSa/s, 1 PA, 60 V, 3.5 A DC/10.5 A Pulse
M9602A
The Keysight M9602A is a PXIe SMU featuring best-in-their-class narrow pulse width as narrow as 10 μs. It enables dynamic/pulsed measurements with up to 15 MSa/s for broad emerging applications such as VCSEL optical devices.
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Source Measure Units
NGU
Thanks to their extremely high accuracy and fast load recovery time, the R&S®NGU source measure units (SMU) are perfect for challenging applications. A special ammeter design is used to precisely measure current drains from nA to A in one pass – no need to make multiple measurement sweeps. The instruments’ short recovery times enable them to handle fast load changes that occur, for example, when mobile communications devices switch from sleep mode to transmit mode. With high speed data acquisition, every detail is detected down to 2 μs resolution.
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High-Speed Precision SMU (100 FA, 60 V, 1 MSa/s)
PZ2120A
The Keysight PZ2120A is a cost-effective, high-speed precision source / measure unit (SMU) featuring best-in-class narrow pulse width, fast Digitizer Mode, and seamless current measurement ranging. It enables narrow-pulsed measurements and fast dynamic measurements with a wide dynamic range for a wide range of emerging applications such as vertical-cavity surface-emitting laser (VCSEL) optical devices and integrated circuit (IC) testing. In addition, its low measurement noise performance enables measurements with shorter aperture times, and its seamless current measurement ranging function enables a wide dynamic range and eliminates range change time, which improves test throughput.
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USB Modular Source Measure Unit
U2722A
The U2722A USB Modular Source Measure Unit is a 3-channel 20V/120mA that can operate in a 4-quadrant operation. The channels could be connected in series or in parallel to achieve up to 60 V/360 mA. It uses the common non-proprietary standard high-speed USB 2.0 interface that provides ease of connectivity allowing users to set up and configure their tests swiftly with its plug and play feature.
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PXI/PXIe Source Measure Unit Family
PXS(e)840x
The PXS840x PXI SMU family is a high-speed, 4-quadrant source measure unit. Carry out measurements directly on the DUT with the integrated CMU and VMU.
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Source Measurement Unit
SMU32
The SMU32 is a low cost solution for V/I source and measurement. The SMU32 offers PMU/DPS in a compact, 3U PXI form factor. The SMU32 supports -1V to +10V +- 32 mA FVMI/FIMV modes. 8~32 PMUs can be ganged to DPS for high current driving.
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Fixed Laser Source Module
Keysight offers a broad choice of fixed laser sources, which are available as single-wavelength and dual-wavelength modules as part of the Keysight Lightwave Solution Platform. The Keysight 8165xA Fabry-Perot laser sources can be used in conjunction with optical power meter modules for insertion loss, optical return loss and PDL measurement of broadband components and fiber. The Keysight 81663A Distributed Feedback Laser Sources are best suited for amplifier test and WDM system test applications. Keysight covers PON and common WDM wavelengths with its 81663A Distributed Feedback (DFB) laser source modules. The precise tunability around ITU-grid center wavelength gives you the flexibility to match test setups to the latest requirements of the DWDM-system. The fine-tuning allows to shift the center wavelength from one DWDM transmission channel to the adjacent channel in dense WDM systems. The built-in isolator ensures highest laser stability, even when reflections are present in the optical path.
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4-Quadrant General-Purpose Source/Measure Unit, ±20 V, ±1 A Or ±6 V, ±3 A, 20 W
N6784A
The Keysight N6784A is a source/measure unit (SMU) designed for general-purpose precision sourcing and measurement. General-purpose applications can span many different industries and many different devices under test (DUTs). The N6784A SMU is a versatile tool designed to tackle many of these general-purpose applications. Its glitch-free operation ensures safe usage with the DUT during output and measurement range changes, even with capacitances of up to 150 µF. Its 4-quadrant operation enables it to act as a bipolar power supply or a bipolar electronic load, for added versatility. When using the N6784A SMU, engineers can be confident that they have an all-around general-purpose tool for their test systems or lab bench.
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PXIe-4141, 4-Channel, ±10 V, 100 mA, Precision PXI Source Measure Unit
781743-01
PXIe, 4-Channel, ±10 V, 100 mA, Precision PXI Source Measure Unit - The PXIe-4141 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4 wire) sensing for accurate measurements. The fast sample rate of the PXIe-4141 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4141 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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PXIe-4135, PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit
783762-02
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit - The PXIe-4135 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology and native triaxial connectors help you perform high-precision measurements with a current resolution of 10 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4135 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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Tunable Laser Source, High Power And Low SSE
N7778C
The N7778C value line tunable laser source offers a peak output power of more than +12 dBm, at least 75 dB/nm above its spontaneous emission level. It features a typical wavelength repeatability of ±1.5 pm at two-way sweeps up to 200 nm/s. The N7778C’s balance of features, performance and price makes it suitable for cost-effective, high-throughput manufacturing-floor component testing as well as for coherent transmission experiments.
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Fixed Wavelength CW Laser Source (DFB)
Laser 1200 Series
The Laser 1200 Series is a highly customizable fixed-wavelength Continuous Wave (CW) laser source available in a wide range of wavelengths and powers.With seamless PXI integration, it can be easily integrated into new or existing PXI test setups. Save space, lower your costs and improve testing efficiency while delivering reliable and repeatable results in production or research environments.
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PXIe-4139, ±60 V, ±3 A DC, ±10 A Pulsed, 20 W DC, 100 fA Precision System PXI Source Measure Unit
782856-02
PXIe, ±60 V, ±3 A DC, ±10 A Pulsed, 20 W DC, 100 fA Precision System PXI Source Measure Unit - The PXIe-4139 is a high-precision, system source measure unit (SMU) that features 4-quadrant operation and sources up to 20 W of DC power. This module features analog-to-digital … converters that help you perform high-precision measurements with a current resolution of 100 fA or high-speed acquisitions up to 1.8 MS/s. The module can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. You can use the PXIe-4139 for applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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PXIe Precision Source/Measure Unit, 1.25 MSa/s, 10 fA, 210 V, 315 mA
M9601A
M9601A PXIe precision SMU is the industry-first precision PXIe SMU enabling faster precise measurement from DC to 20 μs pulse up to 210 V/315 mA with the best-in-class 10 fA resolution and low noise.
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Source/Measure Unit for Functional Test, Multiple Ranges, 80 W, Double-wide
N6786A
Only Keysight`s N6780 Series SMUs let you visualize current drain from nA to A in one pass and one picture unlocking insights to deliver exceptional battery life.
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PXI Source Measurement Unit
PX773x
The PX773x is a high precision, high speed source and measurement unit, which is designed for automated high throughput testing.
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Source Measurement Unit
PEMU4
The PEMU4 represents a new level of performance and capabilities for USB-based SMU (Source MeasurementUnit) instrumentation. The PEMU4 supports -1V to +6.5V 0.5A with FVMI, FVMV, FIMV, FIMI modes. 4 channel can be ganged to support high current driving. I2C/SPI/RFFE function for serial port device testing. 4 Counter for frequency measurement.
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Step-Tunable Laser Source, High Power and Low SSE, Basic Line
N7779C
The new N7779C basic line step-tunable laser source is ideal for cost-effective testing of broadband optical devices. It can also serve as a highly stable, tunable local oscillator for receiver testing or transmission experiments.
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Debug Probes
J-Link and J-Trace
SEGGER Microcontroller GmbH & Co. KG
SEGGER J-Links are the most widely used line of debug probes available today. They've been proven for more than 10 years with over 250,000 units sold, including OEM versions and on-board solutions. This popularity stems from the unparalleled performance, extensive feature set, large number of supported CPUs, and compatibility with all popular development environments.
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Debug Hardware
To record your digital and analog signals, just press start. You can fill your entire computer’s memory with data so it is easy to capture lengthy or rare events.
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Multipurpose Debug Board
DB40 Debug Module
The DB40 Debug Card is designed for debugging of COM Express and PC/104 boards. It includes the following features: - Port 80/81 decoding for Power On Self Test (POST) via LPC - Interface to SPI Flash for BIOS update - Interface to Board Management Controller (BMC) for update - Power and Reset buttons and status LEDs The DB40 Debug card can only be used on products that have the appropriate FFC debug connector designed for this purpose. (Includes DB40 Debug Module, two 40-pin FFC cables, and 14-pin cable for SP100 DediProg USB to SPI programmer.)
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Kernel Aware Debug
Kernel Awareness for RTXC Quadros gives the developer deep visibility into virtually every aspect of kernel activity during debugging. The popup windows allow you to view RTXC Quadros-specific objects in an easy-to-read fashion.
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PXI Source Measure Unit
PXI Source Measure Units (SMUs) combine high-precision source and measure capability with features designed to reduce test time and increase flexibility. These features include high channel density for building parallel SMU test systems, deterministic hardware sequencing for minimizing software overhead, and high-speed update and sample rates for quickly changing setpoints and acquiring data. Additionally, the flexible sampling rate and streaming capability of PXI SMUs allows you to use the instrument as a digitizer to capture transient behavior, and the digital control loop gives you the ability to adjust the transient response of the instrument. The ability to change the transient behavior of the SMU, called SourceAdapt, reduces SMU settling time and minimizes overshoot and oscillations, even with highly capacitive loads.
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In-Line Debug Press
Use for DEBUG without having an In-Line TesterUse Standard 3070 Test System for DebugSupport In-Line Tester on current 3070Verify Form and FitSlides in and Out like on an actual In-Line System
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High Precision Source Measure Unit (SMU) - Hybrid Compatible PXI, 100ks/S Programming/Measurement Speed
52400 series
Hybrid Compatible PXIFour quadrant operationHigh source/measurement resolution (multiple ranges)Low output noiseHigh programming/measurement speed (100k s/S) & slew rateOptional measurement logDIO bitsOutput profiling by hardware sequencerProgrammable output resistanceFloating & Guarding output16 Control Bandwidth SelectionMaster / Slave operationDriver with LabView/LabWindows & C/C# APISoftpanel GUI
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Debug probe for ARM Cortex processors
USB Multilink ACP
P&E’s USB Multilink ACP is a debug probe which allows a PC/laptop access to JTAG/SWD on ARM Cortex devices from several manufacturers (see complete list below). It connects between a USB port on a Windows machine and the standard debug connector on the target. The product photos to the left of this page show how the headers can be accessed by simply flipping open the plastic case. Ribbon cables suitable for a variety of architectures are included. By using the USB Multilink ACP, the user can take advantage of the debug mode to halt normal processor execution and use a PC to control the processor. The user can then directly control the target’s execution, read/write registers and memory values, debug code on the processor, and program internal or external FLASH memory devices.
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Light Sources
Bentham's range of light sources has evolved to suit the requirements of our systems and their users and now offers single or multiple sources from 200nm to 40m:
