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Standard CW Amplifiers
The BT-AlphaA-CW series is a range of classAB RF power amplifiers covering the 10kHz to1MHz frequency range.• Rugged, solid-state design - high reliability• Extremely high phase and amplitude stability• High linearity• In-Built Protection• Very fast blanking• Capable of pulsed operation• Competitively pricedSuitable for CW radar, communications, HF/VHF jamming, particle accelerator applications/plasma systems, plasma, RF heating and otherscientific applications.
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PXI FPGA & Measurement Accelerator
Keysight PXI FPGA & measurement accelerator provide digital-pre-distortion (DPD) and envelope tracking (ET) measurements that are embedded in high performance FPGA processing cards.
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Alpha Particle Counting System
UltraLo-1800
The UltraLo-1800 is a best-in-class alpha particle counting system. Our patented design reduces background rates by 50x compared to conventional systems.
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PXIe Measurement Accelerator
M9451A
The M9451A PXIe Measurement Accelerator combined with Option DPD Digital Pre-Distortion & Envelope Tracking Gateware shows what is possible when you combine state of the art FPGA's with Keysight's trusted measurement expertise and PXIe's high speed data handling. As part of Keysight's RF PA/FEM Characterization & Test, Reference Solution, this combination provides unprecedented performance for demanding envelope tracking and digital pre-distortion measurements required for testing modern power amplifiers (PAs) and front-end modules (FEMs). Hardware acceleration provides better than 20x speed improvement over Keysight's previous host-based Reference Solution, with closed/open loop digital pre-distortion (DPD) and envelope tracking (ET) measurements taking just tens of milliseconds and overall measurement times less than 70 ms.
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EMC Actuator for Accelerator Pedal
PSE-G
Pneumatically operated actuator for operation of accelerator handle. External set-point of the pedal actuator position via analog voltage to closed-loop pressure regulator in external valve box.
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Reticle/Mask Particle Remover
RP-1
The RP-1 automatically removes particles from the reticle/mask by air (or N2) and vacuum suction. Routinely removing the particles before the lithography process extends the replacement cycle of the pellicle and cleaning cycle of the mask, thereby contributing to a reduction in running costs.
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Particle Deposition Systems
Sets the standards for wafer inspection and metrology equipment. This advanced tool is vital for increasing the yield of future leading-edge devices, while meeting the measurement needs of today.
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Particle Size Analyzers
NanoBrook Series
Brookhaven Instruments Corporation
Rapid and accurate protein & nanoparticle size distributionsMultimodal & unimodal size distribution softwareISO 13321 and ISO 22412 compliant resultsRange: < 0.3 nm to 10 mThree measurement angles: 15, 90, and 173Ideal for fast, routine sizing applications in research or quality controlHigh power 35 mW diode laserDynamic light scattering at 173 and 90Temperature control, -5 C to 110 CCompact bench top unit, USB connectionMolecular weight determination (relative and absolute through Debye plot)
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Magnetic Particle Liquid Checker
S-2A / S-2B
Magnetic particle liquid checker S-2 series is a test bar which can directly check the quality of magnetic particle liquid immediately. Magnetic particle liquid checker S-2A type has a sensor at the head of straight test bar.
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Handheld Emission Particle Counter
HEPaC
Naneos Particle Solutions gmbh
*Simple measurement of particle number concentrations*Portable and battery-operated*Emission measurements without dilution (sensor heated)*Concentration range up to 5'000'000 particles/cm3*No operating fluids or dryers necessary*Automatic creation of an official measurement report on a tablet*METAS-certified according to ordinance SR 941.242
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Process Particle Size Analyzers
Insitec Range
Insitec systems deliver the online continuous particle size analysis needed for efficient, cost-effective monitoring and control of industrial processes. Suitable for the widest variety of process streams from dry powders to hot sticky slurries, sprays and emulsions, whether milligrams of material or hundreds of tonnes per hour. Insitec systems measure particles in the size range 0.1 micron to 2.5 mm.
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Particle Deposition Systems
MSP’s 2300G3 Particle Deposition System sets the standards for wafer inspection and metrology equipment. This advanced tool is vital for increasing the yield of future leading-edge devices, while meeting the measurement needs of today.
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Reticle / Mask Particle Detection System
PR-PD2HR
In semiconductor plants, where high performance and demanding functionality are required, the HORIBA PD Series'' high operating rate and long-term dependability have earned it a solid reputation. Inheriting a transfer system that has proven to provide stable, high performance and superior throughput over long operating periods, the PR-PD2HR now offers the most sensitive detection in the series with exclusive signal processing that can detect particles as small as 0.35 m.
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Particle Analysis for Liquids
With our partner Pamas we have developed the microscopic image analysis system PAMAS FastPatch 2 GO for automatic membrane filter analysis.
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Particle Solutions
Brookhaven Instruments Corporation
ultimodal Size Distribution which has been refined to give a more accurate graphical image of the particles being measuredHealth Mode post-measurement analysis for DLS, ELS, and PALSStatistical Process Control seamlessly integratedParticle Solutions 3.2, a robust suite of software that integrates five measuring technologies in one package: DLS, ELS, PALS, ASEC and Rhe.
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Non-Destructive Particle Monitoring
PARTi
PARTi provides a complete solution for non-destructive surface particle monitoring of consumables, parts and cleanroom apparel.
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Portable Particle Counters
Engineered for you, they provide real-time cleanroom particle counting in an easy-to-use, reliable instrument that's ready for measurement.
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Particle Counters
PaMas Partikelmess- und analysesysteme gmbH
an instrument that detects and counts physical particles; either ionising or non-ionising.
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Laser Diffraction Particle Size Analyzer
SALD-2300
The new standard in the SALD series. While maintaining continuity and compatibility with respect to the data of the SALD2000/2100/2200, which were popular, widely distributed models, this instrument is equipped with many new functions useful for evaluating changes (dispersion, aggregation, dissolution) in particle size distribution relative to the concentration or time. It supports a particle concentration range from 0.1 ppm to 20% and can perform a series of measurements of 200 data points at 1 second minimum intervals.
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Handheld Particle Counters
Models 3888 And 3889
Kanomax’s innovative Handheld Particle Counters (Models 3888 & 3889) set the standard of instrumentation in cleanroom / operating room monitoring and verification, filter testing, IAQ investigation, data center cleaning and many more highly specialized and highly sensitive applications. These beautifully engineered devices boast some of the most highly advanced technology in the industry. A combination of accuracy and practicality, these devices count airborne particles with high quality performance.
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Particle Analyzers
Teilch Particle Analyzers have proven significant advantages when compared to competitors’ solutions. Innovations in light source, flow control, analog and digital signal processing, components integration and software allow Teilch to provide a state of the art system for precision particle analysis.
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Magnetic Particle Flaw Inspection System
This model can perform every kinds of magnetic particle flaw inspection in our unit. circular magnetization longitudial magnetization continuous magnetization, residual magnetization threading bar magnetization current induction magnetization, AC magnetization AC demagnetization DC magnetization, DC demagnetization.
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Dynamic Particle Image Analysis System
iSpect DIA-10
Shimadzu's iSpect DIA-10 Dynamic Image Analyzer combines particle size and image analysis technology to offer complete particle characterization. It can perform particle imaging, size analysis, and foreign object detection, and obtain size distributions and number concentration, in as little as two minutes.
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Particle Sizing
REPRODUCIBLE ANALYSIS OF PARTICLE SIZE AND SHAPEStatic Light Scattering – perfect for particle sizing from 0.01 to 2100 µm!The Laser Particle Sizer ANALYSETTE 22 NanoTec is used worldwide in production and quality control, in research and development for the precise measurement of particle sizes.Dynamic Image Analysis – particle shape and size analysis in a wide measuring range 20 µm - 20 mm!The Particle Sizer ANALYSETTE 28 ImageSizer is ideal for particle shape and size analysis of powders and bulk solids as well as emulsions and suspensions.
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Laser Particle Size Analyzer
Easysizer20
Zhengzhou Nanbei Instrument Equipment Co. Ltd
sysizer20 is the latest product of OMEC in Year 2006 and is highly automated, all the process can be done automatically after setting up initial parameters. Multiple sample feeding systems are available to meet your requirements. Applications：Measure the particle size distribution of powder or latex Principle：Use the principle of laser light scattering to determine particle size distribution.
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Fast Particle Sizer Spectrometers
To measure rapidly-evolving aerosols (such as engine or 3D printer emissions), you need a particle sizer that can keep up. TSI has several fast particle sizer spectrometers that are designed for such situations. Whether your application requires 1 Hz (or faster) size distributions, a soot-specific data inversion, or sample dilution, TSI has a fast sizing solution.
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Silicon Charged Particle Radiation Detectors
ORTEC introduced the first silicon surface barrier detectors for charged particle spectroscopy in the early 1960’s. Since then, ORTEC has expanded the product line with more than ten different options to choose from.
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Particle & Molecular Size/Charge Analyzers
Zetasizer Range
Instruments in the Zetasizer range are used to measure particle and molecular size from less than a nanometer to several microns using dynamic light scattering; zeta potential and electrophoretic mobility using electrophoretic light scattering; and molecular weight using static light scattering. The Zetasizer system is available in a range of variants, including the new Zetasizer Pro and Ultra. These two new systems offer unprecedented ease-of-use and flexibility, along with empowering user guidance and novel measurement techniques such as MADLS® and Particle Concentration.
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SmartNIC Storage Accelerator Card Zynq Ultrascale+
iW-RainboW-G35P®
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