Measuring Microscopes
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Product
Laser Scanning Microscopes
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The Olympus FLUOVIEW confocal microscopes are designed for high-resolution, confocal observation of both fixed and living cells, enabling visualization deep within samples. From the New FV3000, optimized for the most robust interactive live cell and tissue experiments, to easy-to-use high content imaging, explore the wide range of options with Olympus exclusive optical technologies.
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Measurement Services
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API offers on-site dimensional inspection, 3D scanning, machine tool and robot error mapping and calibration, laser tracker calibration/verification.
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Infrared Microscope
DDR200/300 NIR
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The McBain DDR200 NIR (for 200mm) and DDR300 NIR (for 300mm) provide high-speed defect detection and precision measurement on wafers and other parts. These cost-efficient systems offer unique advantages for both production and process development use, providing an optimum near-infrared (900-1700nm) solution when both subsurface defect detection and dimensional metrology are required.
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Video Stereo Microscope
BVM-20105
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High-resolution CCD sensor, built-in analog/digital converter, analog and digital signal directly display on the screen, can also simultaneously display on TV and computer through corresponding interfaces; taking photo and video through software; simple operation, reducing user's fatigue and injury.
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Light Sheet Microscopes
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Discover advanced light sheet microscopy solutions from Leica Microsystems. Our portfolio combines cutting-edge technology with exceptional imaging capabilities to enhance your research.
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3D Microscope
BVM-5006
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BVM-5006 Electric 3D Microscope features the quality optical system, high resolution, large field of view, high zoom ratio, novel design and one-up technology, easy and automatic operations. Includes: Motorized zooming, motorized observation angle for changing and optional motorized focusing. The speed can be adjusted while changing observation angle. With the angle attachment, the microscope can realize 3D image effects for observing the components and deep holes. The LED lights can generate high brightness. Theoretically the service life of LED lights can reach 20,000 hours. The LED lights with area control function can illuminate from different angles for convenient multi-angle inspections. The M-N3D Microscope can be widely used in micro-electronics, automated monitoring and testing industries. By selecting the appropriate objectives and video couplers, different magnification, field of view and depth of field can be acquired. Digital and Analog video systems can meet the different users' demands.
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Product
Stability Measurement
Rancimat
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Instrument for determining the oxidation stability of natural oils and fats.
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Product
Pressure Measurement
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Advanced Thermal Solutions, Inc.
Instruments for Measuring Differential Pressure and Pressure Drop in Electronic Enclosures.
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Product
Precision Source / Measure Unit, 1-Channel, 10 FA Resolution, 210 V, 3 A DC / 10.5 A Pulse
B2911B
Source Measure Unit
The Keysight B2911B precision source / measure unit (SMU) is a 1-channel, compact, and cost-effective benchtop SMU with the capability to source and measure both voltage and current. It easily measures current versus voltage (I/V) with high accuracy. The 4-quadrant source and measurement capabilities enable taking I/V measurements without configuring multiple instruments.
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Product
Length Measurement
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Trumeter products are the global standard in length measurement equipment.
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Product
Vision Measurement
CMM Camera System
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Aberlink’s camera system offers a non-contact facility on any Aberlink CMM. A innovative design of magnetic, kinematic joint allows the probe and camera to be swapped in just seconds. This means that components can be inspected using both touch trigger and vision inspection technology on the same machine.
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Product
Measuring Benches
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• Modern design and Bluetooth® transmission integrated• The bench tables are designed to check dimensions up to 50 mm (depends on model)• These bench tables can be equipped with different kind of tables to fit your needs as well as with several types of anvils of any shapes• A ball bearing, an adjustable and reversible measuring force, as well as many other features and accessories make these tables a must for your workshop or your inspection room• Adjustable measuring force
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Product
Resistance Measurement
PROMET
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High-precision micro-ohm measuring systems with adjustable DC test current for determining resistances on circuit breakers or inductive loads such as transformers, for example. The high-precision ohm meters of the PROMET series are used to determine very low electrical resistances in the µΩ range. The adjustable test current of up to 600 A in combination with a four-wire measuring method delivers measurement results which meet stringent accuracy requirements. State-of-the-art power electronics coupled with a robust design guarantee excellent reliability for use as a portable device in switching stations and industrial environments. Typical applications include determining the contact resistance of switchgear devices and determining the resistance on inductive loads such as transformers.
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Product
PXIe-4136, 200 V, 1 A System PXIe Source Measure Unit
783760-01
Source Measure Unit
±200 V, 1 A System PXI Source Measure Unit—The PXIe‑4136 system source measure unit (SMU) delivers high power, precision, and speed. It is ideal for a broad range of applications including manufacturing test; board-level test; lab characterization with devices such as integrated circuits (ICs), power management integrated circuits (PMICs), and radio frequency integrated circuits (RFICs); and discrete devices including LEDs and optical transceivers. The PXIe‑4136 features 4-quadrant operation. The PXIe‑4136 is a hardware-timed instrument with a high-speed sequencing engine for synchronizing acquisitions between multiple SMUs. The module supports direct DMA streaming between the host PC and SMU, so you can stream large waveforms and measurement data at the full update rate and sample rate of the instrument.
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Measuring Stations
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In cooperation with important customers in the automotive industry, medical engineering, mechanical engineering, and the semiconductor industry, OptoSurf has developed measuring devices that enable scattered light to be used for production purposes as well as in R&D and universities.
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Product
Atomic Force Microscope
LensAFM
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The Nanosurf LensAFM is an atomic force microscope that continues where optical microscopes and profilometers reach their resolution limits. It is mounted like a normal objective lens, thus extending the resolution and measuring capabilities of these instruments.
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Ambient Measurement
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A measurement of the concentration of a substance or pollutant within the immediate environs of an organism; taken to relate it to the amount of possible exposure.
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Product
Scanning Acoustic Microscope
Pulse2
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This industry-leading scanning acoustic microscope provides a universal inspection tool for packaged semiconductor development, production and failure analysis. With the ability to detect air defects as thin 0.05 micron and spatially resolve defects down to 10 microns, the ECHO is perfect for bump detection, stacked die (3D packaging) inspection, complex flip chip inspection and more traditional plastic packages.
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Product
PXIe Measurement Accelerator
M9451A
Measurement Accelerator
The M9451A PXIe Measurement Accelerator combined with Option DPD Digital Pre-Distortion & Envelope Tracking Gateware shows what is possible when you combine state of the art FPGA's with Keysight's trusted measurement expertise and PXIe's high speed data handling. As part of Keysight's RF PA/FEM Characterization & Test, Reference Solution, this combination provides unprecedented performance for demanding envelope tracking and digital pre-distortion measurements required for testing modern power amplifiers (PAs) and front-end modules (FEMs). Hardware acceleration provides better than 20x speed improvement over Keysight's previous host-based Reference Solution, with closed/open loop digital pre-distortion (DPD) and envelope tracking (ET) measurements taking just tens of milliseconds and overall measurement times less than 70 ms.
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Filaments for Measures
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Japan Electronic Materials Corp.
The field of filaments for measuring instruments is where our boasting processing technology of tungsten and other thin wires powerfully plays a major role.
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Horizontal Measurement
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Our innovative horizontal/vertical instruments fulfill quality requirements for many applications.
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Product
Flow Measurement
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HighReach Measuring & Controlling System Co.,Ltd
Involves using flow meters that measure the flow rate of steam, liquid, or gas flowing through a pipe.
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Product
*Terahertz Measurement
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Terahertz laser power and beam profiling measurement is not a trivial task. But as anyone using or developing THz lasers knows, it is crucial to obtain accurate measurements of your laser. Ophir offers a few choices, depending on what aspect of your laser you need to measure. Read these posts for more about Terahertz measurement.
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Product
Accurate Measurements
SA500
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The SA500 is a derivative of PFOs WS500 WorkStation. Its application focuses on spectral attenuation and is designed to produce accurate measurements quickly and with confidence
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Product
Scanning Electron Microscope (SEM)
Prisma E
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Prisma E scanning electron microscope (SEM) combines a wide array of imaging and analytical modalities with new advanced automation to offer the most complete solution of any instrument in its class. It is ideal for industrial R&D, quality control, and failure analysis applications that require high resolution, sample flexibility and an easy-to-use operator interface. Prisma E succeeds the highly successful Quanta SEM.
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Product
High Resolution Microscope For Multi-fiber Connector
D SCOPE MT LWD
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Designed for inspection of MPO connectors, patch-cords or bulkheads, the D Scope MT LWD checks the cleanliness of the connector face and precisely measures the defects on the optical fiber end-faces. Using Deep Learning technology associated with a high-resolution optical bench, the scratch and defect detection thresholds are significantly improved compared to traditional software.
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Measuring Complexes
K-5000
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As a measuring unit of the complex, the NI cDAQ data collection platform was chosen. The measuring system consists of the following components:a personal computer or laptop;measuring block - chassis cDAQ with installed on it measuring modules.The complex measures and records the following parameters:working water pressure;water flow;turnovers;moment.
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Product
Metallurgical Microscope
BXJ900 Series
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Nanjing Kozo Optical and Electronical Instrument Co., Ltd.
LCD Metallurgical microscope is one new microscope, it is suitable to observe the sample while with the sharp image.
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Product
High Precision Source Measure Unit (SMU) - Hybrid Compatible PXI, 100ks/S Programming/Measurement Speed
52400 series
Source Measure Unit
Hybrid Compatible PXIFour quadrant operationHigh source/measurement resolution (multiple ranges)Low output noiseHigh programming/measurement speed (100k s/S) & slew rateOptional measurement logDIO bitsOutput profiling by hardware sequencerProgrammable output resistanceFloating & Guarding output16 Control Bandwidth SelectionMaster / Slave operationDriver with LabView/LabWindows & C/C# APISoftpanel GUI
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Upright Microscope Systems
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Below you can see examples of an upright microscope system created using our components. Typically these examples are for life science applications, however they can be used for industrial or material applications.
