Product

Headlamp Test Platform

Test Platform

Averna

Averna

Leverage 25+ years of automotive test experience, with the specialized design and manufacturing of automotive lighting testers. Using specialized know-how in this field, including photometric, electro-mechanical equipment and software solutions, accelerate your time to market with a higher quality product.

Product

Test Instruments

Test Instrument

Astronics Corporation

Astronics Corporation

Test instrumentation from COTS to custom, including VXI, PXI and LXI-based platforms.

Product

RF-Antenna Communication Links Functional Test

Functional Test

LXinstruments GmbH

LXinstruments GmbH

The application encompasses functional tests of very large quantities of automotive antenna amplifiers, plus parallelization of tests by implementing several test stations in a rotary indexing table. The DUTs are inserted manually and after final assembly, they are loaded into the rotary table; this requires manual triggering by the operator.

Product

Design for Testability (DFT Test)

test

Corelis, Inc.

Corelis, Inc.

Corelis can provide you with design consultation and an analysis of your design for boundary-scan testability. We will review your design and make specific recommendations that if implemented will improve the testability. We can also suggest improvements that will increase test coverage and allow boundary-scan to be implemented in a more cost-effective manner.This service also includes a DFT test coverage analysis that we recommend to do after schematic capture and before PCB layout. At this stage of product development, Corelis provides you with a comprehensive test coverage reports that identifies all of the boundary-scan nets and pins and classifies them as completely tested, partially tested, or not tested. The report also recommends where to add test points (pads) for physical “nails” access if additional test coverage is required.

Product

Environmental Control System Test Platform

Test Platform

Bloomy Controls, Inc.

Bloomy Controls, Inc.

The Airframe Environmental Control System Test Platform provides a hardware-in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of cockpit and cabin environmental control systems for airframes. The system simulates a military or commercial airframe cabin, including sensors and actuators from the control system and the passengers. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation systems.

Product

Generator/Analyzer for NFC/EMVCo Manufacturing Test

Micropross MP500 PT1-NFC

test

NI

Micropross MP500 PT1-NFC - NI

Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition

Product

HTOL Test Systems

Test System

SET GmbH

SET GmbH

Our IOL & Power-Cycling systems increase measurement quality & throughput while simultaneously reducing the Total Cost of Test (TCoT) of an open platform. We focus on complete monitoring and precise temperature control for each device under test.

Product

RSE Wireless EMC Spurious Emission

TS8996

Test System

Rohde & Schwarz GmbH & Co. KG

TS8996 - Rohde & Schwarz GmbH & Co. KG

The R&S®TS8996 RSE test system is designed for EMI and radiated spurious emission testing on wireless devices in semi-anechoic or fully anechoic chambers. The modular design makes it easy to extend the system to include new communications technologies. Typical devices under test include mobile phones or radio sets along with radiated measurements of other short-range devices. Standards require a wide range of test setups and a wide and high frequency range (up to 40 GHz). ESW or FSW frequency ranges are extended up to 325 GHz with option B21 using receive units TC-RSE for 5G FR2. Dedicated RSE test routines are also covered for this frequency range.

Product

Parallel Electrode SMD Test Fixture

16192A

Test Fixture

Keysight Technologies

16192A - Keysight Technologies

The 16192A test fixture is designed for impedance evaluations of side electrode SMD components. The minimum SMD size that this fixture is adapted to evaluate is 1(L)[mm].

Product

Application Software for Electronic Test & Instrumentation

test

NI

NI

Application software provides configuration-based workflows for electronic test and instrumentation applications. Application software is part of the NI software portfolio.

Product

Interactive Benchtop Test

test

NI

NI

Strict time-to-market deadlines make it vital to efficiently debug and validate product designs. Virtual instrumentation provides a unified interface that gives engineers an advantage over traditional box instruments.

Product

6TL24 Combinational Base Test Platform

H71002400

Test Platform

6TL Engineering

H71002400 - 6TL Engineering

The 6TL24 is the Base platform ideal for Combinational test (ICT+FCT) in low to mid volume, high-mix electronics productions. A dual-stage pushing mechanism will allow performing both, the FCT and the ICT test, without the need of changing the test platform and with a low cost fixturing technology. To do so, the exchangeable cassette fixture must be designed with two-level probes. IN the 6TL24, the second level is reached thanks to a pneumatic actuator.

Product

Isolated Digital I/O 60VDC, 150mA

OTP2 module no.186

Test Platform

LXinstruments GmbH

OTP2 module no.186 - LXinstruments GmbH

The National Instruments PXI-6528, PCI-6528, and PXI-6529 Digital I/O Modules are isolated digital I/O interfaces for PCI and PXI. These modules can use inputs from NI 6528 and PXI 6529 devices to capture the status of sensors, actuators, and logic devices. NI 6528 devices have 24 SSR outputs for switching external devices with input currents up to 150 mA. The NI 6528 and PXI-6529 devices are suitable for a variety of applications, from automotive development and industrial factory automation to aerospace, laboratory research, and biomedical applications due to their high current handling capacity and isolation.

Product

NFC Conformance Test System

T3111S

Test System

Keysight Technologies

T3111S - Keysight Technologies

The T3111S RIDER NFC Conformance Test System is the Keysight solution for RF Analog and Digital Protocol testing of NFC, EMV and ISO devices. The Test System is based on the Keysight T1141A NFC Test Set and it is complemented by the Keysight's or FIME's robots for accurate and repeatability RF testing. Selected 3rd party positioning robots can also be supported.

Product

Functional Test System Optimized For Real-Time Digital Bus Test

Spectrum HS

Test System

Teradyne, Inc.

Spectrum HS - Teradyne, Inc.

Spectrum HS is Teradyne’s fully integrated functional test system. Optimized for real-time test of low latency buses, it’s a high-performance system delivering excellent test coverage of current and future products.

Product

Batterie Inspektor

Battery Test Platform

Averna

Averna

By combining the most diverse hardware and software modules, Batterie Inspektor™ delivers innovative, automated, and digitalized battery testing at every stage of manufacturing. With this flexible test platform, all modules can be adapted to their respective quality requirements. Manufacturing is simplified through a scalable and standardized framework for both new projects and upgrades.

Product

Build-to-Print for Test Systems

Test System

Ball Systems, Inc.

Ball Systems, Inc.

Built-to-print / test system replication addresses your internal capacity and capability constraints. Ball Systems has perfected quoting, procurement, planning, assembly, testing, quality, delivery and installation to ensure your testers are on-time and on-budget, and meet design and production standards while keeping open and transparent communication.

Product

Open Test Platform for High Performance Automotive Applications

TSVP

Test Platform

Rohde & Schwarz GmbH & Co. KG

TSVP - Rohde & Schwarz GmbH & Co. KG

The R&S®TSVP family of products is an open test platform from Rohde & Schwarz ideal for high performance automated test equipment (ATE) applications. The chassis contains a mechanical frame, digital backplane, analog backplane, mains switching and filtering, power supply and diagnostic extensions. A highlight is the analog bus for routing measurement signals between different slots without additional external wiring.

Product

VLSI Test System

3380

Test System

Chroma ATE Inc.

3380 - Chroma ATE Inc.

The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.

Product

Modular Functional Test Platform

LX-OTP2

Test Platform

LXinstruments GmbH

LX-OTP2 - LXinstruments GmbH

The OTP² system platform has recently been available in both the PXI and LXI versions. The OTP2 system platform enables the cost-effective and fast implementation of function test systems based on defined modules and function blocks. Thanks to the open system interfaces, customer-specific adjustments can be made at any time without any problems. When considering options for your next generation functional test system, it is important to assess the entire life cycle of the system and the associated costs and efforts. Use OTP² to accelerate development cycles and reduce the development effort for new functional test systems.

Product

Test Fixture, Axial And Radial

16047A

Test Fixture

Keysight Technologies

16047A - Keysight Technologies

The 16047A is designed for impedance evaluation of axial/radial lead type devices of up to 13MHz. The 16047A employs Kelvin contacts which realize a wide impedance measurement range. The contact tip can be changed according to the device shape.

Product

PCI Express 5.0 Test Platform

Test Platform

Teledyne LeCroy

Teledyne LeCroy

Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.