Qualification
fulfills an absolute condition.
See Also: Performance Testing, Validation, Characterization
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Product
Mechanical Tester
TriboLab CMP
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Leveraging over 20 years of CMP characterization expertise with its predecessor product (Bruker CP-4), TriboLab CMP brings a complete set of capabilities to the industry-leading TriboLab platform. The resulting accuracy and measurement repeatability enables the highly effective qualification, inspection, and ongoing functionality testing required throughout the CMP process.
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Product
Open Top BGA Sockets
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Ironwood has the most comprehensive collection of open top BGA and QFN sockets that can be used for qualification application, silicon FIB testing, system development, thermal characterization, burn-in application, etc. IC socket can be defined as an electromechanical device, which provides removable interface between IC package and system circuit board with minimal effect on signal integrity. Typical packages include BGA, LGA, QFN, QFP, WLCSP, etc. Open top allows access to the top side of IC. Below is an example BGA socket that uses low cost elastomer contact technology.
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Product
3U PCIe Gen2 ATR Style Chassis
Crosswind 600
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PCI-Systems innovative 1-2-3 system. 1: Lab unit 2: Configure unit 3: Deploy unit! All our chassis and prototype systems can be deployed without needing to change out the chassis. Add Front and rear custom covers and full sealing and you are ready to go to qualification!
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Product
Microelectronics Test & Engineering Services
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EAG's Microelectronics Test and Engineering lab network provides semiconductor and electronics design firms worldwide with test, debug, and early engineering support to help you with new product introduction. We actively service a broad range of semiconductor and electronics companies worldwide. Services include ATE testing, Reliability testing and qualification, ESD testing, Failure Analysis, FIB Circuit Edit and Debug. for both ICs and systems
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Product
Microelectronics - Integrated Solutions
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Teledyne e2v HiRel provides microelectronics packaging and products with a full range of packaging solutions from COTS to MIL-PRF-38534 compliant (Class H & K) qualifications. HiRel provides a one stop solution for your microelectronic assembly, evaluation, test and screening requirements. Our MCM packaging technology enable our customers to meet size, weight, power and cost (SWaPC) requirements without a sacrifice in performance. Our numerous certifications including AS9100, ISO 9001, and MIL-PRF-38534 Class H accreditation, all of which are integral factors in our company-wide initiative to deliver high-reliability microelectronic devices that meet our customers' stringent requirements. We are a DOD Trusted Source for Microelectronics Packaging, Assembly, and Test.
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Product
Advanced Test Systems
ATS
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The commercial version of the RTS-503, this one is not built with the rugged qualifications of the RTS-503. The case is plastic and fuses are used. Otherwise, the internal components and software capabilities are very similar.
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Product
Biased and Unbiased HAST Testing
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Considered within the semiconductor industry as the fast and effective alternative to Temperature Humidity Bias testing (THB), Highly-Accelerated Temperature and Humidity Stress Test (HAST) is a critical part of the device package Qualification process and is used to evaluate the reliability of non-hermetic packaged devices in humid environments.
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Product
Rugged Deployable, Rackmountable Chassis For 3U Cards Aligned To SOSA Or CPCI Serial
20037765
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This unit is a rack-mountable, rugged deployable chassis for use in harsh environments. The chassis has been designed to provide modularity and flexibility to support the full design life cycle of a system from initial concept and lab development through to qualification and full platform deployment.
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Product
HBM Verification Tester
HBM-VT
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High Power Pulse Instruments GmbH
- HBM pulse generator verification tester according ANSI/ESDA/JEDEC JS-001 up to ±10kV- To be used in HBM test and qualification labs for regular pulse generator specification compliance test in order to fulfill lab audit and certification requirements- Fully automatic compliance test and verification of HBM pulse generators regarding ANSI/ESDA/JEDEC JS-001 normative standard at 3 different load conditions: Short Circuit, 500 Ω, and a reference diode at VBR=15 V reverse breakdown voltage, including DC test- Parameter evaluation and verification of the transient HBM current waveforms: Peak Current, Rise Time, Decay Time, Maximum Ringing Current- Optionally available upgrade for all HPPI TLP-3010C, 4010C, 8010A, 8010C, HBM-TS10-A hardware systems in combination with HBM-S1-B (6kV) pulse generators (upgrade on request)- Fully automatic test report generation (PDF)- Electrically floating (no fixed system ground): The HBM loads, current sensor output, USB control interface and the enclosure are electrically floating. There is no limiting system ground which may introduce common-mode interference induced HBM current measurement errors.- Isolated industrial full-speed USB control interface- Isolated power supply derived from USB port- Compact size 126mm x 82.5mm x 44.5mm
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Product
END-to-END VALIDATION TESTING
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SANBlaze VirtuaLUN NVMe Initiator is the key piece of test equipment for anyone needing to test NVMe target devices. The VirtuaLUN feature set provides a unique set of functions applicable in all aspects of a product lifecycle; from development to design validation to test and QA. The ability to drive NVMe targets with a wide range of configurable attributes provides engineers with a flexible, scalable tool to simulate real disk and memory access environments and issues. Development, qualification and certification test cycles can be highly automated, reducing time and surfacing issues and errors.
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Product
Substrate Manufacturing
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KLA’s substrate manufacturing portfolio includes defect inspection and review, metrology and data management systems that help substrate manufacturers manage quality throughout the wafer fabrication process. Specialized wafer inspection and review tools assess wafer surface quality and detect, count and bin defects during production and as a critical part of outgoing wafer qualification. Wafer geometry systems ensure the wafer shape is extremely flat and uniform in thickness, with precisely controlled wafer shape topography. Data analysis and management systems proactively identify substrate fabrication process excursions that can lead to yield loss. KLA’s substrate manufacturing systems support process development, production monitoring and final quality check of a broad range of substrate types and sizes including silicon, prime silicon, SOI, sapphire, glass, GaAs, SiC, GaN, InP, GaSb, Ge, LiTaO3, LiNBO3, and epitaxial wafers.
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Product
Space Applications & High Performance Cable Assemblies
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Teledyne Stom Microwave’s space flight heritage began in the 1990s when one of our military/aerospace customers independently performed space qualification testing on our cables. Since 2010, TSM has dedicated design, engineering, test, qualification and documentation resources to specifically service a growing list of military and commercial space customers. These customers include most of the major US defense contractors and a growing number of Low Earth Orbit and small satellite companies.
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Product
Three Phase Meter Qualification Board
MQB3
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Apply true three phase voltage and current to electric meters, enabling them to be tested under all possible conditions that may be encountered in the field with TESCO’s Three Phase Meter Qualification Board (MQB3).
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Product
Emulator
GCI E84
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The GCI E84 Emulator is the world's leading tester for development, implementation and qualification of products that must comply with the SEMI E84 Standard. It provides the industry-standard automated test plans that are utilized by virtually every 300mm FAB and equipment manufacturer worldwide. GCI testers are the only solutions that guarantee 300mm factory automation interoperability.
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Product
Software
Tool Qualification Solutions
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Many regulatory agencies require that any software tool used to tailor the safety life-cycle must be qualified to ensure that the tool is functioning correctly for the intended purpose. Genuen’s Tool Qualification Kits (TQK) provide a solid foundation for achieving formal qualifications used as part of your development process in highly regulated industries such as automotive, aerospace and medical.
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Product
Ordnance Release Testing Services
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Dayton T. Brown, Inc. can help ensure that your payload is delivered accurately and reliably every time. Our team is responsible for first article, production lot, qualification, and associated testing and engineering support for mechanical and electrical armament and missile launching systems. DTB can help you develop a customized test plan that combines testing across many specifications – environmental, dynamics, EMI/EMC, structural, and non-destructive. Some of the standards that we follow include:
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Product
Weld Testing
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Supports industries such as Aerospace, Nuclear, Automotive, Commercial Fabrication etc.Welding procedure consultancy and approvalWelder qualification test and codingWelding procedure certificationWelder performance qualificationOn site welding invigilationOffers a complete range of destructive and non-destructive testing facilities.Responsible Welding Co-ordinators available for customer supportCAA Weld Specimen SignatoriesCSWIP Approved Inspectors
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Product
Low Voltage Differential Signaling (LVDS)
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Available in QML-Q and QML-V processing flows, CAES LVDS solutions meet all of the stringent mechanical qualification requirements defined in MIL-PRF-38535.
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Product
EDX-FTIR Contaminant Finder/Material Inspector
EDXIR-Analysis Contaminant Finder/Material Inspector
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EDXIR-Analysis software is specially designed to perform qualitative analysis using data acquired by an energy dispersive X-ray (EDX) fluorescence spectrometer and a Fourier transform infrared spectrophotometer (FTIR). This software is used to perform an integrated analysis of data from FTIR, which is excellent at the identification and qualification of organic compounds, and from EDX, which is excellent at the elementary analysis of metals, inorganic compounds and other content. It then pursues identification results and the degree of matching. it can also be used to perform EDX or FTIR data analysis on its own. The library used for data analysis (containing 485 data as standard) is original to Shimadzu, and was created through cooperation with water supply agencies and food manufacturers. Additional data can be registered to the library, as can image files and document files in PDF format. It is also effective for the linked storage of various types of data as electronic files.
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Product
HIL/V&V Solutions
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SPHEREA designs test systems derived from our modular platform for V&V applications, for the whole development chain, from design to qualification
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Product
Shock & Drop Testing
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Shock testing is often performed as part of a hardware qualification or design process. Information obtained during shock testing can improve the survivability of products as well as verify that they will perform properly in service. These types of tests require special transducers and measurement systems to record and process the high level, high frequency response.
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Product
Defect Inspection and Review
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KLA’s defect inspection and review systems cover the full range of yield applications within the chip and wafer manufacturing environments, including incoming process tool qualification, wafer qualification, research and development, and tool, process and line monitoring. Patterned and unpatterned wafer defect inspection and review systems find, identify and classify particles and pattern defects on the front surface, back surface and edge of the wafer. This information allows engineers to detect, resolve and monitor critical yield excursions, resulting in faster yield ramp and higher production yield.
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Product
Cable Manufacturing
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For years, we’ve been at the forefront of optimizing and automating how cable manufacturers test their fibers. Whether it’s cable design qualification, in-process testing, or final quality control—PK instruments around the globe are running 24/7 measuring thousands of fibers.
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Product
General Purpose Piezoelectric Accelerometers
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Piezoelectric accelerometers offer tremendous versatility for shock and vibration measurements. These rugged sensors can withstand adverse environmental conditions. A wide variety of configurations are available to support multiple application requirements. Specialty units are also available through mechanical or electrical design modifications or additional qualification testing.
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Product
Parts Screening And Testing
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DPA Components International performs 100% screening as well as qualification testing on electronic parts supplied to the high reliability Commercial, Industrial, Space, and U.S. Military sectors. We generate software and hardware to test microcircuits, discrete semiconductors, hybrids, PEMS, and other EEE electronic components to exact customer and military specifications.
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Product
Bathless Dissolution Tester
Model 2500 Select
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Offering maximum flexibility and configurability, the Distek Model 2500 Select - Bathless Dissolution System succeeds three generations of patented bathless technology. A brilliant touch screen and unparalleled command of the instrument with electronic tracking of serialized stirring elements, qualification status and due dates and extensive reporting and method storage capabilities make this a robust and reliable system.
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Product
Round Wire Coil Inductors
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Round wire coil (RWC) inductors come in six platform sizes and enable the highest efficiency of any SMT inductor through the use of a low loss ferrite core material which minimizes AC losses and also eliminates thermal ageing. The use of round magnetic wire instead of rectangular flat coils enables a lower cost while still maintaining a low DCR and small footprint. The platforms have passed the AEC-Q200 stress test qualification proving the designs robustness and suitability to difficult environments but the parts are not IATF certified. The platform range from 7.6×7.4×6.4mm to 26x26x15mm and are suitable for a wide range of applications and markets including communications, computing and industrial.
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Product
Low Temperature Operating Life (LTOL) Test
LTOL
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LTOL is being more used more and more frequently by manufacturers of low geometry devices as part of the qualification process, and in order to gain more failure data, a greater understanding of different failure modes of the device at low temperature, and to enable more complete reliability estimations. As device geometries decrease and frequencies become higher, Hot Carrier Injection (HCI) increases and the resulting degradation causes the deterioration of device characteristics and ultimately leads to failure.
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Product
PCIe® Gen5 NVMe SBExpress Test System
SBExpress-RM5
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The SANBlaze SBExpress-RM5 is a complete turnkey PCIe® Gen5 NVMe SSD Drive validation test system. The SBExpress-RM5 feature set provides unique functions applicable to all aspects of a product lifecycle, from development and QA, to design validation and manufacturing test cycles. The ability to drive Gen5 NVMe SSDs with a wide range of configurable attributes provides engineers with a flexible, multi-controller supported validation test platform. Development, qualification, and certification test cycles can be highly automated, thus reducing overall test time, and rapidly surfacing errors and non-conformance.The SANBlaze SBExpress-RM5 hardware provides a rackmount chassis with sixteen dual or single port front-accessible drives.
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Product
GETTER Scorption Analyzer
DELTA-P MODEL 410
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ORS manufactures the Delta-P Model 410 for companies that want to perform on-site getter qualification and lot conformance testing.
