Failure
See Also: Destructive
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Failure Analysis Services
BMP Testing and Calibration Services Inc.
Failure analysis plays a crucial role in product development that enables industries to prevent future product failures and improve them for the end-user. It’s a multi-faceted approach to finding how and why a product failed and involves an in-depth investigation of the circumstances surrounding the failure and discovery of relevant background information, including but not limited to the type of application, environmental factors, service life, and pertinent design information.
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Root Cause Failure Analysis
Maintenance Reliability Group, LLC
Root Cause Analysis of Grease Lubricated Components: Root cause analysis includes a complete root-cause failure report and recommendations for further monitoring and corrective actions. MRG will test for grease consistency, oxidation, product contamination and wear metals utilizing Grease Thief® Analyzer die extrusion test, FTIR, RULER and RDE Spectroscopy. Testing includes Analytical Ferrography and Rheometer testing. Testing can include the submission of a failed component for extraction of grease from failed component and visual inspection for Root Cause Analysis.Root Cause Analysis of Grease Lubricated Components: Root cause analysis includes a complete root-cause failure report and recommendations for further monitoring and corrective actions. MRG will test for grease consistency, oxidation, product contamination and wear metals utilizing Grease Thief® Analyzer die extrusion test, FTIR, RULER and RDE Spectroscopy. Testing includes Analytical Ferrography and Rheometer testing. Testing can include the submission of a failed component for extraction of grease from failed component and visual inspection for Root Cause Analysis.
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Failure Analysis – Materials
Failure analysis – materials is the investigation into the background or history of a sample, or an event, to determine why a particular failure occurred. A product failure may include premature breakage, discoloration or even an unexpected odor. It is useful to know if this failure is a new, unique occurrence or if it has been an ongoing issue. The investigation can involve analyzing the sample as it currently exists and extrapolating from that data what may have caused the failure. A sample of the “good” vs. “bad” product may also be useful for comparison purposes.
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Electronics Failure Analysis System
Sentris
Due to the continued decrease in integrated circuit feature size and supply voltages, detecting and locating the miniscule amount of heat generated by failure sites has become increasingly difficult. Sentris pinpoints low-level infrared thermal emissions from IC faults such as short circuits and leakage current.
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Failure Analysis
Failure Analysis (FA) plays a crucial role in the production of semiconductors. It provides process and design feedback to determine the root cause of any failures. Time-to-data for the FA Engineer is a critical measurement and SemiProbe’s Probe System for Life ® (PS4L) is ideally suited to excel in this application. All key components are interchangeable, making it easy to switch between individual die, wafers, and packaged parts.
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Benchmark, Competitive and Failure Analysis
Helping you determine the root cause of product failures and evaluate products against industry competition and standards.We provide third-party verification and support for claims related to performance versus competition, root product failure cause, and benchmark industry performance. As an independent laboratory with over 60 years of product testing experience, our expertise helps you evaluate products for a variety of performance related characteristics. Additionally, we can provide expert witness legal testimony for insurance claims, CPSC filings, and civil/criminal court cases through our testing results and data.
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Test Data Management
When testing your products, the measurement and test data produced is invaluable in helping your improve your product quality. Most companies do nothing with their test data apart from storing on a hard drive somewhere. Accessing it and using this data is the most valuable way of gaining insights into your manufacturing performance and enabling you to make immediate improvements to help increase product quality whilst reducing the likelihood of unwelcome field failures and expensive product recall events.
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Material Analysis Laboratory
Trialon’s world class Material Analysis Laboratory consists of state-of-the-art equipment and experienced staff. Our specialty is to determine failure analysis of design, material, process and root cause in both current and future products across multiple industries.
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Semiconductor & Electronic Systems Test and Diagnostics Services
Reliability Test and Diagnostic services are offered to a wide range of customers that are active as Fabless Semiconductor or Integrated Device Manufacturers, automotive electronics supplier, Telecom and ICT application specialists, Industrial and Medical electronic system manufacturers or in Aerospace and Space applications. Independent high tech test and diagnostic service laboratory. IC and electronic module qualification. ESD and Latch Up testing. Design assessment by HALT/HASS. Failure and construction analysis.
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Surface Insulation Resistance Testing
AutoSIR2™
One AutoSIR chassis can hold between 1 to 16 measurement cards and can monitor up to 256 x 2-point test patterns or 78 x 5-point test patterns, or 32 x 9-point test patterns at selectable intervals from minutes to days. Each channel is current limited (1 M Ω), ensuring that dendrites are preserved for failure analysis. The frequent monitoring capability provides a full picture of the electrochemical reactions taking place on a circuit assembly, and provides early trend analysis enabling tests to be curtailed, thus saving considerable test time and money.
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UltraTEV Detector
The UltraTEV Detector is the ideal instrument for initial PD surveys. EA Technology's UltraTEV Detector identifies faults BEFORE they lead to failures by testing for critical PD activity using both internal and surface sensors. This device is essential to personal safety and due to its self-explanatory LED display system requires minimal training.
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Reliability Testing
ELES Semiconductor Equipment SpA
ELES designs and manufacturers reliability test solutions to verify the performance of integrated circuits from concept validation to high volume production during all the test phases. No other company can provide universal equipment for all the reliability tests, or can guarantee a seamless data flow between phases or can apply on chip embedded reliability engineering for data tracking and failure investigation. Clients use our functional test data to proactively analyse variations between lots, between temperature extremes and during lifetime (often these defects escape ATE). The improvements to products and processes needed to arrive at zero defects cannot be driven by the quantity of Big Data alone, the quality of reliability data is a strategic advantage that only ELES can provide.
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Low Noise Amplifiers
WA Series
WA series low noise amplifiers are the balance type LNA with alarm capability in some of the products. Besides offering very low noise figure and wide bandwidth, the LNA have high linearity with unconditional stable design. The noise figures are from 0.40 dB to 1.0 dB and IP3 from 30 dBm to 40 dBm.The amplifiers cover the frequency bands of VHF, UHF, Cellular, GSM, DCS, PCS, 3G, C, and wireless LAN. The built-in alarm capabilities include Branch 1 and Branch 2 alarms, Soft Failure alarm, Hard Failure alarm, Soft alarm Open-Collector, and Hard alarm Open-Collector.
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Environmental Stress Screening (ESS) Chamber
ESS
Developed to help electronics manufacturers detect product defects and production flaws, Environmental Stress Screening (ESS) forces infancy product failures that would otherwise occur after final assembly and product delivery. ESS’s goal is to improve profitability by eliminating defective products. ESS Systems can meet individual performance needs, product loading, and throughput requirements. Thermotron has the experience to provide the best solution for ESS testing at your company.
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LIMITER P-I-N DIODES FROM 0.7 TO 9.55 GHz
They prevent failure of of input amplifying stage of low-noise receivers with radio pulse power up to 5000 Watt. They can also be applied as seperate units without power supply and acting as controlled switches. This component is very valuable for radar applications because the high power transmitter and extremely sensitive receiver work with a single antenna.
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Shaft Voltage Tester™ Digital Oscilloscope
AEGIS®
Digital Oscilloscope and Multimeter with Conductive Microfiber Probe Tips. Is your motor safe from destructive shaft voltages? For the first time you can get all of the tools to find out in one place. The AEGIS® Shaft Voltage Tester™ Digital Oscilloscope bundle includes the AEGIS-OSC-9100 100 MHz digital osciloscope, shaft voltage probe tips, and a shaft grounding simulator. Armed with these tools, you can quickly and easily find whether your motors are at risk of premature bearing failure due to VFD-produced bearing currents.
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Power System Recorder with CDR , PMU and IEC 61850 station bus protocol
TESLA 4000
ERLPhase Power Technologies Ltd
The new TESLA 4000 is an intelligent, state of the art, user-friendly multi-timeframe dynamic power system recorder with advanced Phasor Measurement Unit (PMU) and Continuous Disturbance Recording (CDR) capabilities. Wide area swing recording accomodates system performance analysis in minutes Meets NERC continuous disturbance recording standards with non-volatile on board flash memory No mechanical moving parts – flash drive eliminates most common mode of failure in recorders. Each flash drive holds 1000 records. IEEE C37.118-2005 SynchroPhasor Standard
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Ultrasonic Tightness Tester
Cygnus Hatch Sure
This portable ultrasonic leak detector is designed to locate leaks and identify seal failures in any closing appliances or compartments, such as weathertight doors on marine vessels or watertight doors (WTDs) or windows on any structures from offshore oil & gas platforms to transportation vehicles.
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Miniature High Density (MHD) Metal Shell Connectors
A high density (up to 96 contacts) miniature waterproof electrical connector keeps weight to a minimum and fits into compact spaces. Well suited for underwater vehicles such as ROVs, AUVs, and UUVs, where space and weight are typical design constraints. Durable materials allow reliable connectivity with low risk of operational failure.
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Video Inspection Probe
With today's high data rates and high definition services, connector quality and inspection has never been so important. Research reveals that up to 75% of all optical network failures are attributed to poor connector quality - reduce your installation time and ensure your network is reaching its full potential.The Video Inspection Probe (VIP) application for Anritsu field testing platforms gives operators a safe, easy way to analyze and document connector conditions.
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Real-Time X-Ray Imaging and Variable Pressure Scanning Electron Microscope
Trialon has the equipment and experienced staff to operate this highly technical piece of laboratory equipment. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.
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Failure and Technology Analysis
Failure analyses in order to clarify the failure cause soonest possible.From single device to the whole system - and from highly complex IC up to printed circuit board (PCB), mounting & interconnection technology and printed board assembly (PBA).
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Component Test and Analysis Laboratories
The Component Test and Analysis team specializes in electronic and mechanical components such as hybrids, connectors, cables, harnesses, passive or discrete components, and digital or linear devices. The test lab has extensive experience in developing test software to electrically and environmentally characterize virtually any integrated circuit, including analog, digital, mixed signal, converters, FPGA and ASICs, as well as experience in developing actual radiation environments for parts testing. The component analysis team offers the analytical expertise and advanced instrumentation to identify root cause explanation for a wide range of component-level failures, as well as the resources to evaluate for possible quality and reliability issues through non-destructive and destructive techniques. With access to a detailed database, the Component Test and Analysis team offers a 25-year history of test and analysis data — a valuable resource for addressing new customer requirements.
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Eclipse Test Development Environment
The Eclipse Test Development Environment automatically creates tests that are used to bring up new products in the lab. Failures can be quickly debugged using software tools such as the Eclipse Timing Diagram Analyzer and the Schematic Logic Probe.
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Test Bench for AC Compressors
MS111
The test bench is intended to test AC compressors of wide range of vehicles on R134a refrigerant. The equipment detects failures of a vehicle unit before its mounting in a car, whether it is a remanufactured, repaired unit or a used one. In the process of testing, data is shown on LCD display. It gives an opportunity to follow testing results realtime, save and/or print them due to software special features. Unit fixation mechanism is very flexible: a compressor can be easily fixed, no matter what kind of fittings it has. Units with electromagnetic clutch or electromagnetic valve can be tested both separately and simultaneously. Peculiar features of electric commutation are considered, connection polarity is identified automatically, indicator on the control panel indicates on presence of a diode in a circuit.
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Vibration Condition Monitoring
Vibration Condition Monitoring is a predictive maintenance method that allows for early detection of problems with vibration. The techniques of Vibration Condition Monitoring share a common objective of indicating early signs of deterioration or malfunction in machinery. It also helps to reduce failures in your workplace as well as increasing your safety and machine performance.
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S-Beam Static Load Cells
2519 Series
The 2519-xxxN Series load cells are specifically designed for use with 3300 single column testing systems. Automatic transducer recognition and electrical calibration makes them easy to use. The load cells incorporate overload protection and can withstand loads up to 150% of their force capacity without damage and 300% without mechanical failure. The load cells allow the user to zero out the tare weight of a grip or fixture that weighs up to 40% of the force capacity, while still maintaining the full specified accuracy.
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Fence Vibration Sensor
ENVIROMUX-FENCE1
Detects when individuals climb over or cut through chain link or wire mesh fences. Advanced built-in signal processor prevents false alarms. Four sensitivity settings to tune each sensor to a particular fence section and intrusion type. Two open-collector outputs – alarm and power failure. UV resistant case and epoxy sealed electronics provides maximum resistance to harsh environments. Rated NEMA 4X and UL94 5V. Use individually or chain units with each ranging from 40 to 60 feet away. Includes mounting brackets for installing the sensor to fence fabric. Screw terminals. Operating temperature: -4 to 131°F (-20 to 55°C). Operating voltage: 9-15V DC.
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Embedded Software Test Environment
Mx-Suite
Using intuitive graphics, Mx-Suite streamlines your engineering development efforts by automating tests, clarifying testable requirements, improving traceability and diagnosing possible root failure causes. Mx-Suite provides the connectivity to your MIL, SIL, or HIL test environments, allowing you to complete testing earlier in your development cycle to achieve superior product quality levels.
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High Impedance Probes
Everbeing offers GGB’s high impedance active probe for failure analysis of your devices. The high impedance with low capacitive design allows measurements of internal nodes without loading the device. For more information, please visit http://www.ggb.com.Everbeing offers GGB’s high impedance active probe for failure analysis of your devices. The high impedance with low capacitive design allows measurements of internal nodes without loading the device. For more information, please visit http://www.ggb.com.
