Electron
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Electron Spin Resonance Spectrometer
ESR
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Electron Spin Resonance (ESR) is a powerful analytical method to detect, analyze and determine thecharacteristics of unpaired electrons in a substance. It is clear that the state of electrons in a substance have a strong influence on its characteristics and functionality, so evaluation by ESR is becoming more and more important. Many types of substances, from electronic materials to catalysts, biological samples, can be studied regardless of whether they are solid, liquid, or gas. A wide range of ESR techniques are possible using suitable attachments together with the basic instrument.
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Scanning Electron Microscopes
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Our Scanning Electron Microscopes (SEMs) resolve features from the optical regime down to the sub-nanometer length scale.
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Electron Microscope Analyzers
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Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials available today. The full integration of all these techniques into the ESPRIT software allows you to easily combine data obtained by these complementary methods for best results.
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Electron Microscope Sample Preparation
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Excellent sample preparation is the prerequisite for first-class electron microscopy. Be prepared – for great results in EM Sample Preparation! Perfect preparation makes the difference between trying and achieving, between failure and success, between results and excellent results. So be prepared for great results with Leica Microsystems!
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Electron Probe Microanalyzer
EPMA-8050G
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This instrument is equipped with a cutting-edge FE electron optical system, which provides unprecedented spatial resolution under all beam current conditions, from SEM observation conditions up to 1 μA order. Integration with high performance X-ray spectrometers that Shimadzu has fostered through the company's traditions achieves the ultimate advance in analysis performance.
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Electron Diffraction System
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Modern physics is the post-Newtonian conception of physics. It implies that classical descriptions of phenomena are lacking, and that an accurate, " Modern", description of nature requires theories to incorporate elements of quantum mechanics or relativity, or both. This section includes many of the most important experiments in physics, including e/m tubes, the Franck-Hertz experiment, and nuclear magnetic resonance (NMR)
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Electron Probe Microanalyzer
JXA-8530FPlus
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JEOL commercialized the world's first FE-EPMA, the JXA-8500F in 2003. This highly regarded FE-EPMA has long been used in various fields, such as: metals, materials and geology in both industry and academia. The JXA-8530FPlus is a third-generation FE-EPMA that comes with enhanced analytical and imaging capabilities. The In-Lens Schottky field emission electron gun combined with new software provides higher throughput while maintaining high stability, thus allowing a wider range of EPMA applications to be achieved with higher resolution.
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Real-Time X-Ray Imaging and Variable Pressure Scanning Electron Microscope
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Trialon has the equipment and experienced staff to operate this highly technical piece of laboratory equipment. Our state-of-the-art materials analysis lab located in Auburn Hills, MI is managed by a Ph.D with over 20 years of hands-on experience in root cause failure analysis of design, material and process for current and future products.
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Electron Beam Lithography System
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Spot type Electron Beam Lithography System JBX-8100FS achieved high throughput, small footprint and electric power saving.
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Cathodoluminescence Solutions for Electron Microscopy
CLUE Series
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HORIBA Scientific's Cathodoluminescence Universal Extension enhances any SEM’s analytical capabilities while maintaining its original functionality. Since the sample is able to remain in the same spot, CLUE can easily be combined with other microscopy applications, such as EDS and EBIC.
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Electron Microscope Analyzers
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Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials available today. The full integration of all these techniques into the ESPRIT software allows you to easily combine data obtained by these complementary methods for best results.
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Electron Multiplication (EM) Standard Image Sensors
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EM (Electron Multiplication) is a technology that uses on-chip gain in the charge domain to effectively eliminate read noise from an image sensor. This enables advanced ultra-low light applications that require extreme sensitivity at fast frame rates. Examples include life science applications such as single molecule detection, super resolution microscopy and spinning disk confocal microscopy along with physical science applications such as nanotechnology imaging, Bose Einstein condensates and soft X-ray spectroscopy, and astronomy applications such as adaptive optics and lucky imaging. The inclusion of an additional conventional output allows further flexibility for applications such as true 24 hour surveillance.
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Scanning Electron Microscopy
SEM
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Materials Evaluation and Engineering
JEOL JSM-6610 LV LaboratoryScanning electron microscopy (SEM) uses electrons for imaging to obtain higher magnifications and greater depth of field than light microscopes. The instruments at MEE are capable of variable-pressure, or low vacuum, SEM (VPSEM), as well as traditional high-vacuum conditions for sample observation. VPSEM is a specialized method using a variable-pressure sample chamber that allows direct evaluation of samples that are not readily examined with a traditional high-vacuum SEM. Nonconductive or vacuum sensitive samples that would typically require additional sample preparation can be directly analyzed in VPSEM without the need for additional sample preparation, such as carbon or metallic conductive coatings. This reduces both sample preparation time and distractions in microanalysis. Our laboratory also has a field emission SEM (FESEM) for critical high-magnification work and low-voltage (LVSEM) applications. Each instrument has a spacious sample chamber that can accommodate large and irregularly-shaped specimens and accessories for feature dimensional analysis and chemical microanalysis.
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Sensitive Terahertz Detectors: Cooled Terahertz Detectors Based On Hot Electron Bolometer (HEB) And Room Temperature Terahertz Detectors Based On Golay Cell.
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Insight Product Company offers Cooled and Room Temperature Terahertz (THz) Detectors
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Scanning Electron Microscope
E5620
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The E5620 is a MASK DR-SEM(∗) product for reviewing and classifying ultra-small defects in photomasks and mask blanks. It implements Advantest’s highly stable image capture technology to easily import defect location data from mask inspection systems and automatically image the locations. Compared to the E5610, our predecessor DR-SEM system, the E5620 features a number of improvements designed specifically to target mask requirements for extreme ultraviolet (EUV) lithography.
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Electron Microscope Analyzer
QUANTAX Micro-XRF
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Micro-X-ray Fluorescence (Micro- XRF) spectroscopy analysis is a complementary non-destructive analytical technique to traditional Energy Dispersive Spectroscopy (EDS) analysis using a Scanning Electron Microscope (SEM).
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Electron Backscatter Diffraction (EBSD) Camera
Velocity™
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high-speed EBSD mapping with the highest indexing performance on real-world materials. Velocity™ EBSD camera combines indexing speeds greater than 3,000 indexed points per second with indexing success rates of 99% or better. At these speeds, the Velocity™ uses 120 x 120 pixel EBSD patterns for improved band detection. This image resolution, combined with proven EDAX triplet indexing routines, provides orientation precision values of less than 0.1°.
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Electron Probe Microanalyzer
EPMA-1720
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Both hardware and software incorporate the latest technologies to create the next generation of EPMA. New functions that offer simple and easy-to-understand operation have been added to the superb basic EPMA performance that Shimadzu has fostered over many years – high sensitivity, high accuracy, and high resolution – to allow the EPMA's capabilities to be exploited to the fullest. While easy enough for even novices to use, it also supports sophisticated analysis by experienced users.
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Transmission Electron Microscope
TEM
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Atomic Resolution Electron Microscope offering a maximum accelerating voltage of 300 kV, and equipped with JEOL’s own Cs Correctors. This instrument guarantees an unprecedented STEM-HAADF image resolution of 63 pm.
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Electronic Data Logging
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Although our Karlan Monolog PC software is first choice for data logging, viewing and printing, sometimes it’s not practical or impossible to use a PC. Situations like this call for our KCU-6L. This is a combined control unit and 10 year data logger. It is supplied with PC software for downloading and storing logged data in a format that goes straight into our Karlan Monolog PC software suite. For more information, please contact us
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Electron Probe Microanalyzer
EPMA
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JEOL commercialized the world's first FE-EPMA, the JXA-8500F in 2003. This highly regarded FE-EPMA has long been used in various fields, such as: metals, materials and geology in both industry and academia. The JXA-8530FPlus is a third-generation FE-EPMA that comes with enhanced analytical and imaging capabilities. The In-Lens Schottky field emission electron gun combined with new software provides higher throughput while maintaining high stability, thus allowing a wider range of EPMA applications to be achieved with higher resolution.
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Film Capacitors
Electronic Equipment Use
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Panasonic Industrial Devices Sales Company of America
Panasonic Film Capacitors offer stable capacitance and temperature characteristics, tight tolerances, low-ESR and low dissipation factors. Available in Surface-Mount (SMT) and radial leaded types, including Metallized Polypropylene Class X2 Capacitors. Functionality offered in the Film Capacitor product line for Electronic Equipment Use include high temperature and high reliability without shock noise, piezoelectric effect and audible noise.
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Electronic Control Units
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Self-contained engine management system and data logger for race engines up to eight cylinders. The unit is complete with integrated ignition and injection drivers and so needs no external units to run an engine.
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HACCP Solutions
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Using Comark HACCP products, gathering the data electronically has never been easier. Hand-held instruments can be fully programmed to record information on all critical events in your HACCP plan, including temperature and cleaning checks.
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Electro-optic Test Bench for IR Detectors
BIRD 210
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Testing detectors requires the implementation of ultra-low noise driving electronics and presenting high quality optical stimuli to the detector under test. This meets all these requirements and allows to test any type of detector by easily implementing the detector’s driving signals and providing exhaustive and accurate measurement results.
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Semiconductor Authenticity Verification & Anti-Counterfeiting
JTAG Interrogator
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Top manufacturers have used JTAG tests for years to ensure electronic systems are free from defects and assembled correctly. With growing uncertainty in supply chains and the proliferation of counterfeit components, that same technology can be used to verify the authenticity of system components.The Corelis JTAG Interrogator is an affordable solution for semiconductor verification. The software and hardware system provides the means to quickly identify components on an assembled electronic product by reading available information from the JTAG chain. Components can also be scanned to discover undocumented opcodes that may indicate hidden JTAG capabilities such as backdoors and harmful or malicious functions.Fast and nonintrusive JTAG component identification has never been so easy.
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Pulse Generators
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An electronic circuit or a piece of electronic test equipment used to generate rectangular pulses.
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Energy Dispersive X-Ray Spectroscopy (EDS)
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Rocky Mountain Laboratories, Inc.
Energy Dispersive Spectroscopy (EDS Analysis) is used in conjunction with the Scanning Electron Microscope (SEM) providing chemical analysis in areas as small as 1 µm in diameter. EDS detects all elements except for H, He, Li, and Be. EDS can be performed exactly on any features or particles seen in the SEM images and can “MAP” elements on a surface. Unknown materials can be identified and quantitative analysis can be performed.
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Oscillators
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An oscillator is an electronic circuit designed to produce either audio or radio frequency signals. These will generally have sineusoidal wave form, but other wave shapes such as square and sawtooth are possible. In radio equipment oscillators will always have a low output power, and if a radio frequency is produced, the oscillator is acually a basic radio transmitter.
