Memory Test Systems
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Product
Test Port Cable, 1 Mm
11500I
Test Port Cable
Connect test ports to devices, fixtures, or probe tips with this 8.8-cm cable featuring a return loss of 17 dB minimum.
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Product
High-Speed Memory Test Solution
UltraFLEX-M
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The UltraFLEX-M builds on the advanced test technology and architecture of the proven UltraFLEX test system to ensure high test quality at the lowest cost of test for high-speed memory devices.
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Product
DDR5 Memory
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SQRAM DDR5 offers extreme high speed with 6400 MT/s data transfer rate and high efficiency power management.
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Product
Batterie Inspektor
Battery Test Platform
By combining the most diverse hardware and software modules, Batterie Inspektor™ delivers innovative, automated, and digitalized battery testing at every stage of manufacturing. With this flexible test platform, all modules can be adapted to their respective quality requirements. Manufacturing is simplified through a scalable and standardized framework for both new projects and upgrades.
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Product
Functional Test Fixtures
Functional Test
Forwessun’s Functional Test Fixtures are tailored to validate the performance of your electronic assemblies, ensuring each product meets critical quality and functional standards. With customisable designs and precision engineering, these fixtures support a range of testing needs—from checking connectivity and function to confirming performance under real-world conditions. Built to handle rigorous demands, Forwessun's solutions are ideal for industries requiring reliable and repeatable results. Whether for high-volume production or specialised testing, our fixtures provide robust, adaptable support to maintain efficiency and accuracy throughout the testing process. We also create, and work with Ingun to create fixtures using the Ingun kit.
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Product
Test System
LPDDR4 and LPDDR3
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Testing LPDDR4, LPDDR3 devices is made fast and simple with the "Lower Power" LPDDR4/3 TCE-3200LP IC test system. It can be configured up to 32 sites in parallel and integrated with the customer's selected handler.The TCIII-3200LP system can be used as a production tool as well as an engineering tool. To assist manufacturers and integrators, TurboCATS has developed a heat chamber that can be integrated with the TCE-3200LP, LPDDR4 and LPDDR3 test system. This allows the devices to be tested while being exposed to heat conditions.
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Product
Headlamp Test Platform
Test Platform
Leverage 25+ years of automotive test experience, with the specialized design and manufacturing of automotive lighting testers. Using specialized know-how in this field, including photometric, electro-mechanical equipment and software solutions, accelerate your time to market with a higher quality product.
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Product
LabVIEW Development Systems
System
Base--The instant productivity of graphical development for DAQ and instrument controlFull--A rich set of routines for mathematics, signal processing, and signal generationProfessional--The solution for professional developers who need code deployment or validationLabVIEW suites--LabVIEW Professional plus industry-specific add-on software
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Product
Universal Test System
LS6601A
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LS6601A Universal Test System is based on LXI bus, primarily used for functional electronic product or system verification, test parameters. Because the system design is based on LXI bus structure, so its addition to general characteristics of versatility, scalability, but the architecture of the system more flexible, the test system is not limited to one or more cabinets, but may be needed test network and multiple LS6601A and can be easily grouped into one or more of the ground test system, depending on the test mechanism, form a powerful set of test, control, simulation, simulation, data management as one; distributed in different places .
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Product
Reflective Memory
VME-5565
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The VME-5565 Reflective Memory node card provides a high-speed, low latency, deterministic interface that allows data to be shared between up to 256 independent systems (nodes) at rates up to 170 Mbyte/s. Each Reflective Memory board can be configured with either 64 Mbyte or 128 Mbyte of onboard SDRAM. The local SDRAM provides fast Read access times to stored data.
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Product
DWV/IR Test Systems
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When used in conjunction with ART's own parametric relay test systems such as the RT290, the RT900 offers high speed AC and DC Hipot (dielectric withstand voltage) and Leakage testing of relays or other multi-pin passive devices.
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Product
Armature Test Systems
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Automation Technology's ATS-3800 is at the top of the class when it comes to Armature Test Systems. The ATS-3800 is packed with standard features and like all of ATI's 3800 Series Test Systems; it is backed by ATI's industry leading two-year limited warranty. The ATS-3800 offers the most comprehensive testing of armatures available.
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Product
Test System
Series 303
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The 303-Relay Test System tests the integrity of electromechanical relays and switches. The system can perform an array of tests and control output binning in a fraction of the time of any other tester on the market. Ease of use and overall system flexibility make the 303 ideal for applications in development, incoming inspection, and production line testing.
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Product
IT Battery Test System
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Shenzhen Sinexcel RE Equipment CO., Ltd
IT battery test system support for multiple charging mode (such as CC, CV, CP, pulse, etc.) and discharge mode, to ensure that the battery performance and safety in the practical application. IT battery test system is designed to be modular, easy to maintain, and with anti-reverse connection, data loss and other protection functions
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Product
Test System
ETS788
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The 55/110 MHz ETS788 system boasts the same small footprint and cool quiet CMOS architecture as our ETS780 but with the new high-performance precision components of our Griffin series. This powerful member of the HiLevel family takes advantage of all of the tried and true features that have served users so successfully to date. Learn why the ETS788 is the perfect cost-effective solution for higher performance in Design Verification, Production and Failure Analysis.
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Product
SODIMM DDR4 3200MT/s
SQR-SD4S
Dual In-Line Memory Module (DIMM)
Original Hynix IC chips adopted, Data transfer rate: 3200MT/s. Capacity: 4/8/16/32GB, Operating temperature: 0 °C ~ 85 °C Lifetime warranty.
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Product
Parallel Memory Test Solution
Magnum2
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Teradyne’s Magnum 2 test system delivers high throughput and high parallel test efficiency for high performance non-volatile memories, static RAM memories and logic devices.
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Product
Coil Test System
CTS
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International Electro-Magnetics, Inc.
The system is controlled by a PC using software written in Visual Basic. It offers visually oriented menus that allow easy coil configuration and test set up procedures.
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Product
Cobot Testing System
CT6
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The CT6 cobot testing system introduces the benefits of automation to the testing of biomedical devices and components. This system pairs a collaborative robot with a 5900 or 6800 Series universal testing system to increase the efficiency of small to mid-sized testing labs that require a high degree of flexibility in their testing systems. The CT6 is designed to handle a wide range of medical components, including drug delivery, sample collection, and wound closure products.
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Product
HV Test System up to 20000 Volt
Test System
Insulated test booth with large space for test items. 2 banana sockets for AC connection and 4 banana sockets for the DC connection of the DUTs. IC’s are tested in a long-term test. These are checked in an oil bath so that there are no air gaps to reduce the insulation. Maximum voltage 20 kV. Therefore, insulation tests must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
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Product
Component Test Fixture For N1413 With B2980 Series
N1428A
Test Fixture
The N1428A is designed to operate specifically with the B2985B / 87B electrometer / high resistance meter. It is provided with two component modules, which are used to hold SMD, lead, and various types of devices. Electrical noise effects are reduced by the employment of a shielded case. A built-in interlock circuit enables safe high-voltage measurements. The N1413A high resistance meter fixture adapter is also required to connect the N1428A to the B2985B / 87B.
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Product
PCI Express 5.0 Test Platform
Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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Product
Flexible Cable, 2.4 Mm To 3.5 Mm
85134H
Test Port Cable
The Keysight 85134H is a 62.9 cm (24.75 in) long1 flexible cable with a 2.4 mm female2 to 3.5 mm male connector. Cable frequency range is dc to 26.5 GHz with a return loss greater than or equal to 16 dB. Insertion loss is 0.31 * sqrt (f) + 0.2 (where f is frequency is GHz) for the test port connector and 1.8 dB at maximum frequency for the device connector. Phase stability of semi-rigid/flexible cables is characterized with a 90 degree bend using a 2.5 inch radius. Stability1 of the Keysight 85134H is less than 0.12 dB and phase is less than 0.13o * f + 0.5o, (where f is frequency in GHz).
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Product
Advanced SoC Test System
3680
Test System
The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.
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Product
CRPA Test System
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The Spirent CRPA Test System is a development of Spirent’s GSS9000 Series platform for testing Controlled Reception Pattern Antenna (CRPA) systems with a separate RF output per antenna element. The CRPA Test System generates both GNSS and interference signals. Users can control multiple antenna elements. Null-steering and space/time adaptive CRPA testing are both supported by this comprehensive wavefront approach.
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Product
Memory Interposers
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Memory interposers for logic analyzers and oscilloscopes are ordered by memory type. Please select the memory type/technology of interest.
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Product
Test Port Cable, 1 Mm
11500J
Test Port Cable
The Keysight 11500J test port connector has a length of 16 cm and a frequency range of DC to 110 GHz. The 11500J integrates with the Keysight N5250A network analyzer and Keysight 8510XF network analyzer systems.
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Product
Memory Test Software
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Teradyne’s customers count on us for our Near Device Under Test (DUT) technology that gives memory device manufacturers a guaranteed performance advantage. A brief description of dynamic memory and storage memory devices will highlight why device manufacturers depend on Teradyne’s memory test solutions.
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Product
ATE Self Test Fixtures
AL663
Test Fixture
AL663 fixtures include all the electronic parts required to perform an effective test platform diagnostic. The AQ818 device allows to perform a series of tests, obtaining a report of the faulty instruments or switch modules and also a report about the relay contacts estimated life.
