Test Engineering
-
Product
Scienlab Battery Test System – Module Level
SL1001A Series
-
The SL1001A and SL1006A Battery Test Systems – Module Level Series help you emulate sink and source for battery modules for automotive and industrial applications.
-
Product
Test System
2000/DATS
-
WesTest Engineering Corporation
The WesTest-2000/DATS features Teradyne's high performance Digital Test Instrument and state-of-the-art intrsuments from Agilent, Elgar and North Atlantic.
-
Product
Engineering Services
-
In addition to the highest quality test programming, maximizing board coverage, and efficient board testing, TTCI offers a full array of other engineering services, including CCA (Circuit Card Assembly) Testing, Design for Test, ASTER TestWay electrical design for test analyzer, Feasa LED analyzer, SMH Technologies FlashRunner in-system programmer, finite element analysus, installation, reverse engineering of Gerber to CAD, Training, Test System PC, Hardware, and Software Upgrades, and more.
-
Product
Insulation Testing
-
Insulation resistance testing is used as a quality control measurement.
-
-
Product
Pre-Certification Testing
-
Gain confidence that your product passes certificationVerify your product qualityTest specific areas
-
Product
Test Leads
-
designed for electrical and electronics testing in today’s industrial environment.
-
-
Product
EBIRST 200-pin LFH To 104-pin D-type Adapter
93-002-422
-
eBIRST adapters allow extension to other switching system connectors, including SMB
-
Product
On-Site Testing
-
Radiometrics Midwest Corporation
At Radiometrics we understand that some products are just to big to bring to us. Radiometrics will travel to you and perform in-situ testing at your facility or your clients location.
-
-
Product
Custom Testing
-
You create a custom test plan (a file that lists a series of tests to be run), to meet requirements specific to your environment and apply that test plan to any number of clusters. You specify the order in which tests run and the specific components to be tested. After you set up your custom test environment, you run the test procedure from SMIT and view test results in SMIT and in the Cluster Test Tool log file. For information about customized testing, see Setting up custom cluster testing.*Fixture Design*Fixture Fabrication*Custom Test Stands*Prototype Testing Services*Product Safety Testing Services
-
Product
Test Leads
AL-34WB 10A
-
Standard Electric Works Co., Ltd
● Wire length: 1m approx. Silicone insulated wire (700mm) with wire connected to straight input plugs (150mm PVC wire), and wire for clamp (150mm PVC wire).● Outside diameter of silicone insulated wire: 6.4mm Outside diameter of PVC wire: 4mm● Input plug color: Red•Green•Black•Blue ● Current rating: 10A● Voltage rating: 300V● Designed for Milliohm meter, Micro-ohm meter, Low resistance measurement with high current injection. ● Conductor size: 40mm maximum● Safety standard: IEC/EN 61010-031 CAT IV 300V
-
Product
Testing and Measurement
-
AkroMetrix provides a variety of products to help you identify and evaluate warpage: For warpage measurements along a production line or at room temperature, AkroMetrix has developed the LineMoiré Production Level Automated Flatness Inspection System. If you need to measure warpage and flatness during pre-defined temperature profiles, AkroMetrix's TherMoiré In-Process Warpage Measurement Systems may fit your requirements.
-
Product
Test Probes
-
A physical device used to connect electronic test equipment to a device under test (DUT).
-
Product
Ultrasonic Testing
Pundit PL-200
-
The Pundit PL-200 is a best-in-class Ultrasonic pulse velocity (UPV) test instrument to examine the quality of concrete and other materials such as rock, wood and ceramics.
-
Product
Twist Testing
STT
-
The STT Shaft Twist Tester is a system designed for quickly testing of twist structures and/or twist-freed condition on shafts in seconds.
-
Product
Microwave Testing
40A
-
The GGB Industries, Inc., MODEL 40A microwave probe sets new standards in microwave probing performance. Using low loss coaxial techniques, the Model 40A achieves an insertion loss of less than 0.8 db and a return loss of greater than 18 db through 40 GHz.
-
-
Product
EMC Testing
-
Underwriters Laboratories Inc.
Leverage our EMC expertise to avoid costly errors and accelerate time to market. Our customized testing solutions can enhance process efficiency and reduce testing cycles to help you make the most of your time and budget.
-
Product
Test Fixtures-Assemblies
-
Qmax Test Technologies Pvt. Ltd.
Test Clips are available for various types of DIP ICs like 8, 14, 16, 20, 24, 28, 40, 48 & 64. These can be supplied with or without connectors and cables for interfacing to Qmax Testers. Test Pins in the clips are gold plated and engineered for good contact with the Device Under Test. It is designed for long life and trouble free operation. For easy handling the clips are provided with metal covers.
-
Product
Test Sockets
Non Standard
-
Chances are good Ardent can help you with that. We can adapt our technology to just about any package, device or module. Small volumes of custom sockets for higher bandwidth applications are a niche all in their own, and our engineering team has many years of experience designing custom sockets for all kinds of applications.
-
Product
Parametric Test Fixture
U2941A
-
The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
-
Product
Device Testing
-
The BTL Working Group (BTL-WG) has developed a test package which contains a set of testing procedures. These can be acquired and used by manufacturers to pre-test their products for BACnet compliance before they send their products to an RBTO (Recognized BACnet Testing Organization) for BTL Testing. The BTL Test Package is available on the test documentation page.
-
Product
Testing Consumables
-
Solar Light offers a plethora of consumables for SPF and other testing requirements, including high quality Molded and Sandblasted PMMA Plates, Pre-Analyzed and Certified SPF and UVA Sunscreen Standards, Disposable Medical-Grade Pads, and long-life spare Xe Lamps for use with our state of the art Solar Simulators.
-
Product
Functional Test
-
A type of software testing that verifies a program's functions against its requirements, checking that the software works as expected by comparing the actual output to the expected output.
-
Product
MEP Engineering And Design Services
-
MEP BIM Services is crucial in building design, ensuring safe and functional environments. The aim is to produce mechanical, electrical, and plumbing components for precise, comprehensive models. MEPF design should be accurate and detail-oriented, adhering to industry standards for constructability, performance, and maintenance.
-
Product
Test Solution
Eye-BERT MicroX
-
The Eye-BERT MicroX is a compact, easy to use test solution offering high performance bit error rate testing at a fraction of the cost of competing solutions. The unit is offered in two speed grades including the X10 which operates up to 14.5Gbps, and the X30 which extends the data rate to 29Gbps. Its broad data rate capabilities and long test patterns make this unit suitable for testing nearly all optical SFP, SFP+, and SFP28 transceivers in production with just one unit. The real-time eye opening monitor and eye scanning capability can aid in troubleshooting by providing the operator with additional link quality information. Other features include Autonomous pattern detection, SFP diagnostic tools, and wavelength tuning (per transceiver capability). With a click of a button the Eye-BERT MicroX will automatically test an SFP module based on its advertised capabilities and generate a detailed test report complete with manufacturer, part number, serial number, date code, fiber type, link length, speed, and test results. The Unit is supplied with anti-skid bumpers and is small enough to be integrated into larger systems for dedicated link verification.
-
Product
Detector Testing
-
CI Systems' Optical Test benches are especially built to test many types of detector arrays used as the sensors of a camera, from visible to far infrared ranges. With CI Systems' expert know-how, these test benches can be tailored to a customer's design requirements. MTF, spectral response, crosstalk, NETD and sensitivity are some of the basic parameters that can be tested with CI's Optical Test benches during the design, manufacturing and integration of detector arrays.
-
Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196C
-
The 16196C surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
