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Product
High Temperature Test System
129620A
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Solartron Analytical, specialists in the design of precision impedance test equipment, has joined forces with high temperature Furnace specialists Carbolite, and sample holder specialists NorECS to produce a range of advanced high temperature materials characterization test systems.
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Product
Uncooled Microbolometer
384 x 288 FPA
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Drawing on its extensive experience in microbolometric detector design, fabrication, and characterization, as well as in detector-to-ROIC (Read-Out Integrated Circuit) monolithic integration, INO is proud to offer its 384 x 288 pixel microbolometer FPA (Focal Plane Array) in short series.
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Product
ENA Vector Network Analyzer
E5072A
Vector Network Analyzer
30 kHz to 4.5 GHz & 8.5 GHz2-portImprove accuracy, yield and margins with wide dynamic range 130 dB / 151 dB (direct receiver access), measurement speed 7 m sec and excellent temperature stability 0.005 dB/C Increase test flexibility with wide source power range -109 to +20 dBm for linear and nonlinear device characterization Protect your investment with upgradability across all of the options Every spec verified, adjustments included Lock in support & peak performance from the start
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Product
50 µs Pulse Medium Current Source/Measure Unit (MCSMU)
B1514A
Source Measure Unit
The 50 s Pulse Medium Current SMU is an SMU designed for faster pulsed IV measurement. It enables a pulsed measurement down to 50 s pulse width, a 10 times or more narrow pulsed measurement than provided by a comparable conventional SMU. In addition, the instrument offers a wider range and versatility, up to 30 V / 1A, with voltage/current programmability. It is useful to characterize high to medium power devices on the new materials such as SiC and GaN, and organic devices, and the MCSMU expands your choices of pulsed IV measurement.
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Product
Penetrometerand Texture Analyzer
MDT Series
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Mohr Digi-Test (MDT) Series instruments are portable materials testers designed to accurately characterize the texture and firmness of fruit, vegetables, and other agricultural produce in the field, packing house, and the laboratory.
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Product
PXIe-6547, 100 MHz, 32-Channel PXI Express PXI Digital Waveform Instrument
781011-02
Digital Waveform
PXIe, 100 MHz, 32-Channel PXI Express PXI Digital Waveform Instrument—The PXIe‑6547 is a digital waveform generator and analyzer for interfacing and basic characterization test with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 100 MHz and interfacing with user-programmable voltage levels that have a 100 mV resolution. The PXI‑6547 also features advanced synchronization capabilities for building integrated mixed-signal test systems, hardware comparison for bit-error test, and per-bank digital timing features.
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Product
Test, Map, Profile and Qualify "Dark" Coax Cable Networks
Coax Clarifier
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Dark unpowered coax systems give no clue as to their design, condition or configuration. The new Coax Clarifier by T3 Innovation makes it simple and easy to discern the layout of a coax network, locate faults on individual cable runs, identify remotes through splitters, and determine cable run length. In addition, separate wiremapping sets allow a technician to map out the entire coax system and measure the quality and characterization of the overall network for carrying services, such as high grade video, surveillance data and HD programming.
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Product
Broadband VNA Operation To 220 GHz
S93301B
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Configure a 220 GHz broadband vector network analyzer (VNA) for on-wafer device characterization of emerging 5G and 6G MMICs
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Product
Streak Camera
OptoScope SC-20 systems
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The SC-20 streak camera system is characterized by its large detection area of 35 mm x 4 mm and a large usable screen diagonal of 40 mm. Signals are mapped onto the fiber optic input window and measured without the need for optical reduction. In the simplest case, the entrance optics consists of a slit mask that lies directly on the entrance window. In addition, a flexible extension with a shutter, a lens mount or an adjustable slot with coupling optics is possible. The time resolution in the sub-nanosecond range qualifies the camera for many applications in detonics and plasma physics.
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Product
Specialty Instruments
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Advanced Thermal Solutions, Inc.
ATS offers a variety of unique specialty instruments, designed for specific applications across the electronics industry. These instruments range from providing heat flux measurements and cold plate characterization, to precise isothermal surface temperature control and fan flow characterization.
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Product
LXI Microwave Matrix, 20GHz, Single 3x3, Terminated With Loop-Thru
60-751-133-C
Matrix Switch Module
The 60-751-133-C is a single 3x3 20GHz microwave matrix with internal termination and loop-thru. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 20GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Product
Compact Imaging Modules
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The Opto compact M imaging modules are characterized by the only 40mm wide 90° angled all-aluminum housing.
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Product
PXI Network Analyzers
M983xA Series
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Keysight’s M983xA PXIe vector network analyzer (VNA) combines all your measurements into a single instrument, enabling multisite, multi-DUT, multiport system characterization with faster speeds and greater flexibility.
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Product
Booster and In-line Amplifier
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Amonics' EDFA range adopts unique design to produce maximum signal gain and saturated output power while maintaining low noise figure, enabling test capabilities in system or component level manufacturing and characterizing processes, as well as facilitating highly demanding R&D applications. The compact turnkey benchtop or 19" rackmount unit incorporates a user-friendly front panel housing with a LCD monitor display, key switch, power control knob and optical connectors. An integrated RS232 computer interface enables easy control, diagnostic functions and data acquisition.
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Product
802.11ad & ay (WiGig) Test System
IQgig-IF
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When used in conjunction with IQgig-RF, it supports over-the-air (OTA) testing of WiGig RF modules and end-products. The IQgig family products provide total test solution for R&D characterization and high volume manufacturing.
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Product
Infiniium UXR-Series Oscilloscope: 33 GHz, 4 Channels
UXR0334A
Oscilloscope
The UXR0334A is the 33 GHz, 4 channel, Infiniium UXR-Series real-time oscilloscope, that offers 10-bit high-definition ADC, 20 femtoseconds (typical) of intrinsic jitter for exceptional jitter characterization.
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Product
Four Slot PXI/PXIe Full Hybrid ABex Chassis with up to PXIe x4 Connectivity on Each Slot
ABex PXIe Rack 04
Chassis
Ultra-Compact 2U ABex chassis with 4 slots. This variant is characterized by outstanding compactness and due to the directly integrated PXIe full hybrid backplane one achieves maximum performance at an attractive price. The first slot is reserved for a single slot PXIe controller. Either Konrad PXIe embedded controllers or MXI interfaces are supported.
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Product
SSD
M.2 SSD (iSLC)
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Innodisk M.2 (S42) 3IE4 is characterized by L3 architecture with the latest SATA III (6.0GHz) Marvell NAND controller. Innodisk’s exclusive L3 architecture is L2 architecture multiplied LDPC (Low-Density Parity Check). L2 (Long Life) architecture is a 4K mapping algorithm that reduces WAF and features a real-time wear-leveling algorithm to provide high performance and prolong lifespan with exceptional reliability.
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Product
Oil-In-Water Analyzer
RTG100
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The Mirmorax Oil-in-Water analyzer is based on an ultrasonic measurement technique which is a direct measurement on individual acoustic echoes that are characterized using advanced signal processing.
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Product
Metrology Solutions for Semiconductors
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Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition. In applications ranging from C-S thin films materials characterization to wafer substrate analysis and defect detection, Bruker’s systems provide simulation analysis and fit. HRXRD, XRR, WA-XRD, and XRDI measurement types are fully supported, enabling researchers, production engineers, and process developers unparalleled capabilities. Whether you are a semi and C-S fabricator, R&D center or academy, or an industry materials research facility, Bruker has a specifically designed solution for your metrology needs.
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Product
Test House Services
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Microtest provides complete test house services in a clear room equipped with the state of the art handler and wafer probing system using its own innovative ATE.The test house operates in hot, cold and room temperature for both production and characterization test.Innovative reliability system for Burn In and HTOL ServicesStatistical analysis is performed for digital and mixed-signal devices.Microtest Pacific Test house is located in Malacca (Malaysia).
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Product
LIV – High-power Laser Diode Testing
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An important aspect of the development and manufacture of laser diodes is the so-called laser diode characterization, or laser IV curve. By applying increasing current to the laser diode so it that emits light, the optical output is measured together with the voltage drop across the diode element. The resulting LIV curve reveals important clues about the quality of manufacture and the performance of the laser diode, enabling a pass/fail decision to be met.
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Product
Oil-in-Water Analyzers
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The Mirmorax Oil-in-Water analyzer is based on an ultrasonic measurement technique in which individual acoustic echoes are characterized using advanced signal processing.
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Product
Thermal Test Chip
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Thermal Engineering Associates, Inc.
Thermal Test Chips (TTC) are used in many different Applications: Package Thermal Characterization, Heat Source Simulator, Temperature Reference Platform, Transient Analysis, System Thermal Management Design, Thermal Interface Material (TIM) Measurement & Characterization, Heat Sink Measurement & Characterization.
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Product
Magnet Testing
Helmholtz Coils
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A coil arrangement consisting of two coils with the same radius or edge length is called a Helmholtz coil. At the correct distance, these coils are arranged in parallel on the same axis and current flows through them in the same direction. Their magnetic field is then characterized by a large homogeneous area in the center of the coil, which is freely accessible for experiments and measurement tasks. Helmholtz coils can have a circular or square geometric shape.
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Product
CXA Signal Analyzer, Multi-touch, 9 kHz to 26.5 GHz
N9000B
Signal Analyzer
Master the essentials in signal characterization with the leading low-cost tool in signal analysis Perform cost-effective stimulus response measurements with the optional built-in tracking generator Add crucial functionality with X-Series measurement applications Enhance theory with practical skills when used with a training kit in your RF & microwave education lab
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Product
LXI Microwave Matrix, 10GHz, Dual 4x4, Terminated With Loop-Thru
60-750-244-C
Matrix Switch Module
The 60-750-244-C is a dual 4x4 10GHz microwave matrix with internal termination and loop-thru. It is part of the 60-750/751 range of LXI Microwave Switches controlled through an LXI compliant Ethernet connection. It is available in a variety of configurations and frequencies up to 18GHz (60-751). The matrix is characterized for 50 ohm applications, for 75 ohm versions please consult your local sales representative.
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Product
NTA Particle Size Analyzers
NanoSight Range
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The Malvern Panalytical NanoSight range of instruments utilizes Nanoparticle Tracking Analysis (NTA) to characterize nanoparticles from 10nm -2000nm* in solution. Each particle is individually but simultaneously analyzed by direct observation and measurement of diffusion events. This particle-by-particle methodology produces high resolution results for nanoparticle size distribution and concentration, while visual validation provides users with additional confidence in their data. Both particle size and concentration are measured, while a fluorescence mode provides differentiation of intrinsic or fluorescently labelled nanoparticles.
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Product
PXIe-4136, 200 V, 1 A System PXIe Source Measure Unit
783760-01
Source Measure Unit
±200 V, 1 A System PXI Source Measure Unit—The PXIe‑4136 system source measure unit (SMU) delivers high power, precision, and speed. It is ideal for a broad range of applications including manufacturing test; board-level test; lab characterization with devices such as integrated circuits (ICs), power management integrated circuits (PMICs), and radio frequency integrated circuits (RFICs); and discrete devices including LEDs and optical transceivers. The PXIe‑4136 features 4-quadrant operation. The PXIe‑4136 is a hardware-timed instrument with a high-speed sequencing engine for synchronizing acquisitions between multiple SMUs. The module supports direct DMA streaming between the host PC and SMU, so you can stream large waveforms and measurement data at the full update rate and sample rate of the instrument.
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Product
Gross Alpha/Beta Measurement Systems
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Gross alpha/beta measurement is one of the simplest radioanalytical procedures which are applied widely as a screening technique in the field of radioecology, environmental monitoring and industrial applications. This procedure has been developed to determine whether radionuclide specific analysis is required to further characterize the water. Regular measurements of gross alpha and gross beta activity in water may be invaluable for early detection of radioactive contamination and indicate the need for supplemental data on concentrations of more hazardous radionuclides.
