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Product
HCF76289B310100250G300
1018509
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The HCF76289B310100250G300 is a specialized high current probe designed to meet stringent performance standards in demanding electrical applications. Characterized by its basic contact probe design and a robust construction, it can operate within a temperature range from -45°C to +200°C, enabling it to perform reliably under extreme conditions. This probe features a precise pitch of 4.00 mm (157 mil) which ensures compatibility with various high-current applications, establishing it as an essential tool for professionals requiring assurance of both safety and performance in electrical measurements.
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Product
Deep-Level Transient Spectroscopy System
FT 1030
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The Deep-Level Transient Spectroscopy has grown up to a most powerful tool for semiconductor characterization with unbeaten sensitivity in trap concentration detection and high efficiancy in impurity parameter determination.
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Product
PNA-X Microwave Network Analyzer
N5245B
Network Analyzer
Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Accurately test linear and nonlinear device characterization using advanced error correction Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Product
Autocorrelators
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From material processing to scientific and medical base research, ultrafast laser systems are used in many areas of their high peak intensity and extremely short pulse width. One relevant area of application is time resolved spectroscopy. The pulse width is a critical factor for the adjustment of these laser systems and the characterization of experiments.
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Product
PXI Vector Component Analyzer, 100 kHz to 53 GHz
M9818AS
Vector Component Analyzer
The PXI vector component analyzer enables complex multiport device characterization with continuous wave and modulated signal measurements.
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Product
Basic Contact Probe F07538S064P280HP
1171946
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The F07538S064P280HP Basic Contact Probe is engineered for precision and reliability, making it an essential component in a variety of applications. This model is characterized by its robust mechanical specifications, including a preload of 147 cN and a spring force of 280 cN, which contribute to its effectiveness in ensuring stable contact and reliable performance. With a nominal travel of 4.30 mm and maximum travel reaching 6.40 mm, this probe is designed to operate under a range of conditions without compromising its integrity or accuracy.
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Product
PCI Express 4 M.2 Receiver Test Automation
N5991PM4A
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The N5991PM4A is the receiver test automation software for bit error ratio testers, allowing you to test, debug and characterize PCI Express M.2 devices and hosts at 8 GT/s.
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Product
Profile Imaging Modules
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The Opto profile imaging modules are characterized by the U-shaped all-aluminum housing, which is only 40mm wide.
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Product
Mass Flow Controllers for Gases
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Sensirion''s mass flow controllers are characterized by fast and accurate control of gas flow over a wide dynamic range. Based on the innovative CMOSens Technology, the heart of these mass flow controllers is a calorimetric microsensor (MEMS), which is integrated with the complete signal conditioning electronics on one single chip. While the flow is measured using the thermal measurement principle, efficient control is provided by an analog controlling circuit. This unique integrated technological approach results in excellent performance and reliability - at a very attractive cost.
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Product
PathWave BenchVue Electronic Load App
BV0012B
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Easily control your dynamic electronic loads, build automated tests and visualize measurements over time for better device characterization.
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Product
Earth resistivity meter
16GL-N
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Last release of a very popular family of earth resistivity meters, this 16 bits geoelectrical instrument represents a really performing and affordable solution for Vertical Electrical Soundings at medium and great depth. Reliable and lightweight, 16GL-N is characterized by really first-rate performances, even if it remains extremely easy to use. The possibility to download data through USB enables a quick interpretation with the data inversion software. It is recommended, as to exploit its capabilities, to use it in conjunction with one or more P-100-N rechargeable accumulators.
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Product
Switches
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Whether you are performing high-accuracy, low-speed measurements on a dozen test points or high-channel, high-frequency characterizations of integrated circuits, National Instruments delivers a flexible, modular switching solution based on PXI or SCXI to help you maximize equipment reuse, test throughput, and system scalability.
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Product
PXIe-5654, 250 kHz to 20 GHz, PXI RF Analog Signal Generator
784776-01
Signal Module
PXIe, 250 kHz to 20 GHz, PXI RF Analog Signal Generator - The PXIe-5654 features a combination of exceptional phase noise and frequency tuning time. These features address applications such as blocker test/receiver desensitization, high-performance intermodulation distortion measurements, and various electronic warfare applications. The PXIe-5654 is designed to meet the challenging requirements of RFIC characterization, satellite test, and radar applications. Some PXIe-5654 options include a PXIe-5696 Amplitude Extender Module. The PXIe-5696 supports a frequency range of 250 kHz to 20 GHz and an extended amplitude range up to 27 dBm.
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Product
Programmable Digital Attenuator
LDA-602EH
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The LDA-602EH has a large attenuation range of 120 dB with an exceptional 0.1 dB step size, allowing for both precision and accuracy during fading tests or device characterizations. This attenuator also features a fast 15 us switching speed, an operating temperature from -30oC to 50oC, a maximum RF input of +28 dBm, and is priced at $875. The LDA602-EH operates with a low insertion loss of 9 dB to 6 GHz, an input IP3 of +55 dBm and a typical VSWR of 1.3:1. Easily programmed for ATE applications, the LDA digital attenuators are a cost effective solution whether you are in engineering, the production test lab, or in the field. Units are ROHS compliant and can be used with any PC or laptop computer with USB 2.0 port (or powered USB hub) and Windows operating system. Lab Brick Signal Generators are provided with easy to use Lab Brick GUI software, 32 and 64 bit API DLL files, LabVIEW and Linux compatible drivers.
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Product
Scratch Tester
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Scratch testers from Anton Paar are used to characterize film-substrate systems and to quantify parameters such as adhesive strength and friction force by using a variety of complementary methods. This makes scratch testers invaluable tools for the determination of coating adhesion, scratch resistance, and mar resistance in research, development, and quality control.
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Product
DUV-NIR Spectroscopic Reflectometry
FilmTek 2000
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Scientific Computing International
Automated metrology system designed for rapid, reliable, and accurate characterization of nearly any unpatterned thin film. Fully user-customizable wafer mapping capabilities rapidly generate 2D and 3D data maps of any measured parameter. Capable of simultaneous determination of multiple film characteristics within a fraction of a second per site.
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Product
Solutions for Nondestructive Characterization of Elastic
Sonelastic
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Sonelastic® is a line of solutions for nondestructive characterization of elastic modulus and damping of materials by the natural frequencies obtained by impulse excitation technique.
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Product
PXI Semiconductor/IC Test System
Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Product
Penetrometerand Texture Analyzer
MDT Series
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Mohr Digi-Test (MDT) Series instruments are portable materials testers designed to accurately characterize the texture and firmness of fruit, vegetables, and other agricultural produce in the field, packing house, and the laboratory.
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Product
EasyEXPERT group+ Device Characterization Software
EasyEXPERT group+
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Keysight EasyEXPERT group+ GUI based characterization software is available for Keysight Precision Current-Voltage Analyzer Series. It is available on your PC or the B150xA's embedded Windows 7 platform with 15-inch touch screen to accelerate the characterization tasks. It supports efficient and repeatable device characterization in the entire characterization process from measurement setup and execution to analysis and data management either interactive manual operation or automation across a wafer in conjunction with a semiautomatic wafer prober. EasyEXPERT group+ makes it easy to perform complex device characterization immediately with the ready-to-use measurements (application tests) furnished, and allows you the option of storing test condition and measurement data automatically after each measurement in a unique built-in database (workspace), ensuring that valuable information is not lost and that measurements can be repeated at a later date. Keysight Precision Current-Voltage Analyzer Series provides the complete solution for device characterization with these versatile capabilities EasyEXPERT group+ is upgradable from the previous generation of EasyEXPERT/Desktop EasyEXPERT software.
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Product
WaveMaster 8000HD High Bandwidth Oscilloscopes
WaveMaster 8000HD Series
Oscilloscope
WaveMaster 8000HD is the only high speed oscilloscope designed for all stages of product development, whether first-silicon characterization, link validation over channels, or debugging across the entire the protocol stack. No other high speed oscilloscope supports more engineering tasks with more unique tools.
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Product
Enterprise Yield Management Solution
dataConductor
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dataConductor is an interactive enterprise yield management solution for the semiconductor industry. With dataConductor, semiconductor manufacturers can collect data from diverse, global manufacturing systems and combine them into a single warehouse to manage yields during data characterization, yield ramp and volume production.The dataConductor platform is a comprehensive enterprise yield management system built upon our high-performance dC Warehouse. dataConductor features an optimized Oracle database, standard and custom data parsers, and a full suite of analysis capabilities that can be tailored to your particular environment.
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Product
Impedance Analyzers
HTF-1100.
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A laboratory furnace used specifically for the electrical characterization of materials and also for heat treatment between ambient temperature and 1100 °C.
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Product
Bit Error Rate Tester - PXI
BERT 1001/1005 Series
Tester
The BERT is 2 or 4-channel PPG and Error Detector for the design, characterization and production of optical transceivers and opto-electrical components at data rates up to 30 Gb/s.With scalability and exceptional signal fidelity, it is a cost effective test solution for 400 Gb/s communication eco-systems.
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Product
Basic Contact Probe F79311B064G120
1169634
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The F79311B064G120 Basic Contact Probe is engineered for precision and reliability in a variety of applications. This contact probe is characterized by a pitch of 1.90 mm and is designed to operate effectively within a temperature range of -45°C to +100°C. The probe boasts impressive electrical specifications, accommodating a continuous current of up to 4.00 A with a typical contact resistance of just 20.00 mΩ, ensuring minimal energy loss and optimal performance.
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Product
InfiniiVision Oscilloscopes
3000A X-Series
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100 MHz to 1 GHz, DSO and MSO modelsView time-correlated digital content with16 digital channels (MSO)Modulate signals within the scope with WaveGen, built-in 20 MHz function generator (optional)Quickly characterize signals with the built-in 3-digit voltmeter and 5-digit counter option Decode serial busses faster with hardware-based serial analysis options for CAN, LIN, IC, SPI, RS232 and more Protect your investment with full upgradability
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Product
Image Sensor Characterization Systems
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Image Sensor QE and Spectral Responsivity Characterization
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Product
PXIe-5651, 3.3 GHz RF Signal Generator
PXIe-5651 / 781216-01
RF Signal Generator
PXIe, 3.3 GHz, PXI RF Analog Signal Generator—The PXIe‑5651 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXIe‑5651 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
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Product
PXIe-4145, 4-Channel, ±6 V, 500 mA Precision PXI Source Measure Unit
782435-01
Source Measure Unit
PXIe, 4-Channel, ±6 V, 500 mA Precision PXI Source Measure Unit - The PXIe-4145 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4 wire) sensing for accurate measurements. The fast sample rate of the PXIe-4145 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules. Additionally, you can tune the PXIe-4145 response to any load to achieve optimum responses with maximum stability and minimum transients using SourceAdapt technology.
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Product
Thermal Warpage Metrology Tool
AXP 2.0
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The TherMoiré® AXP 2.0 is a modular metrology solution that utilizes the shadow moiré measurement technique, combined with automated phase-stepping, to characterize out-of-plane displacement for samples up to 400 mm x 400 mm. With time-temperature profiling capability, the TherMoiré® AXP 2.0 captures a complete history of a sample’s behavior during a user-defined thermal profile.
