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Product
Soft Front Panel for NI RF Analyzers
NI RFSA Soft Front Panel
Analyzer
The NI RFSA Soft Front Panel helps you quickly view and analyze RF signals using PXI hardware from National Instruments. The soft front panel features built-in measurements such as third-order intercept (TOI), complementary cumulative distribution function (CCDF), adjacent channel power ratio (ACPR), occupied bandwidth (OBW), channel power, and transmit power. With these one-button measurements, you can quickly measure, display, and store results, which makes NI PXI instruments ideal for characterization and validation environments. You can also use the NI RFSG Soft Front Panel for generating continuous waveform (CW) or modulated RF signals.
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Product
USB Type-C Interconnects Compliance Test Software
S94USBCB
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Use the S94USBCB software to test, debug and characterize your USB Type-C cable and connector designs. The PathWave TAP based test sequencer automates the network analyzer (VNA) for each test and generates a comprehensive HTML report. When run with L8990M switch matrix, it enables 20-ports fully automated test without port re-connection.
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Product
PXI-5154, 1 GHz, 2 GS/s, 8-Bit, 256 MB/ch, PXI Oscilloscope
780319-03
Oscilloscope
1 GHz, 2 GS/s, 8-Bit, 256 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.
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Product
Test House Services
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Microtest provides complete test house services in a clear room equipped with the state of the art handler and wafer probing system using its own innovative ATE.The test house operates in hot, cold and room temperature for both production and characterization test.Innovative reliability system for Burn In and HTOL ServicesStatistical analysis is performed for digital and mixed-signal devices.Microtest Pacific Test house is located in Malacca (Malaysia).
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Product
Modulation Distortion Up To 50 GHz
S930705B
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S930705B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 50 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930704B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Product
Telurometer
AMRU-10
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AMRU-10 is a simple meter that allows to perform measurements by the technical method, as well as the measurement of the resistance of the grounding by the bipolar method. The device is characterized by its ease of operation, high resistance to disturbances and high accuracy.
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Product
Reflection/Transmission Spectrophotometry
FilmTek 3000 PAR-SE
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Scientific Computing International
Engineered to meet the needs of any advanced thin film measurement application, excelling at material characterization on both transparent and non-transparent substrates. Combines spectroscopic ellipsometry, DUV multi-angle polarized reflectometry, and transmission measurement with a wide spectral range to meet the most challenging of measurement demands in both R&D and production. Patented parabolic mirror technology allows for a small spot size down to 50µm, ideal for direct measurement of product wafers and patterned films.
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Product
Nanoindenter
Hysitron TI 980
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Bruker’s Hysitron TI 980 TriboIndenter operates at the intersection of maximum performance, flexibility, reliability, usability, and speed. This industry-leading system builds upon decades of Hysitron technological innovation to deliver new levels of extraordinary performance, enhanced capabilities, and ultimate versatility in nanomechanical characterization.
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Product
Dynamic Vapor Sorption Analyzer
IGAsorp
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The IGAsorp is a fully automated compact benchtop DVS analyzer, for fast and accurate vapor sorption measurements using the dynamic flow technique for water and organic solvents. Measured vapor uptake isotherms and kinetics are used to characterize, test and evaluate materials in precisely defined environmental conditions.
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Product
Switch Probes (Normally Open (NO)) F88506B180G350LM
1007113
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The Switch Probes (Normally Open) model F88506B180G350LM, with an order code of 1007113, is expertly engineered for precision and efficiency in various applications. This probe is part of the F885-NO family, designed to operate effectively in temperatures ranging from -45°C to +100°C, making it ideal for challenging environments. Its compact design, characterized by a pitch of 3.50 mm, accommodates fine applications while maintaining robust performance.
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Product
Open Top BGA Sockets
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Ironwood has the most comprehensive collection of open top BGA and QFN sockets that can be used for qualification application, silicon FIB testing, system development, thermal characterization, burn-in application, etc. IC socket can be defined as an electromechanical device, which provides removable interface between IC package and system circuit board with minimal effect on signal integrity. Typical packages include BGA, LGA, QFN, QFP, WLCSP, etc. Open top allows access to the top side of IC. Below is an example BGA socket that uses low cost elastomer contact technology.
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Product
microLED Testing System
OmniPix-ML1000
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The OmniPix-ML1000 is the first all-encompassing microLED testing system, offering both full wafer and localized individual pixel inspection. Measure localized and total EQE. Use automated PL and EL to test and characterize your microLEDs. Analyze defective pixels with nano-PL and nano-EL.
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Product
Surface Measurement Instrument
SMI
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Redefining speed and accuracy in non-contact metrology, the Optikos SMI is a high-speed surface topography instrument that characterizes spherical, toric, and aspheric surfaces. The SMI measures surface shape deviations of precision surfaces using wavefront analysis technology. Configured to measure such items as: micro-optics, ball lenses, and contact lens molds, the instrument allows users to easily measure aspheric and toric parts without the need for reference surfaces.
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Product
Pogo Connectors (≤ 2,54mm / 100mil) P16501S120L075TL126CR
1001482
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The Pogo Connectors (≤ 2.54mm / 100mil) P16501S120L075TL126CR are designed to meet high-performance standards in electrical connectivity, especially in demanding conditions. With a temperature range of -45°C to +200°C, these connectors ensure reliable performance across various applications. The connectors feature a basic contact probe design, characterized by their P-T / P165T-L126 family, making them suitable for a broad spectrum of electronic devices and systems.
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Product
Ferroelectric Tester
Premier II
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The Precision Premier II, is one of Radiant's most advanced test systems. The Premier II has the large envelope in terms of frequency response, voltage range, and accuracy of any ferroelectric tester in the world. Vision Software is provided with the Premier II Test System. Vision uniquely allows the user to construct complex or simple programs with any number of tests to characterize all aspects of the sample in one execution while keeping track of the measurement results and the history of the sample being tested. Tasks such as Hysteresis, I/V, C/V, PUND, Waveform, Magnetoelectrics, Piezoelectrics are just a few features to choice from.
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Product
Signal Integrity Measurement Systems
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GigaTest Labs is a Keysight Technologies Solutions Partner, offering fully configured signal integrity measurement systems for high bandwidth signal integrity characterization. Our wealth of experience with Keysight's Vector Network Analyzer and Time Domain Resonance Oscilloscope tools will help you navigate and understand different instrument capabilities & configuration options that will benefit your engineering team.
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Product
Characterization Of VCSEL Arrays Including Polarization Analysis
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Konica Minolta Sensing Americas, Inc
Laser diodes are becoming indispensable in a multitude of everyday and industrial applications, thereby expediting new applications and technologies. These include: facial and gesture recognition in consumer electronics, LiDAR (light detection and ranging) in the car and material processing with high-performance diode lasers.
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Product
Frequency Converter Characterization With Wideband Modulated Signal
N5245BQ
Network Analyzer
The N5245BQ provides the N5245B 50 GHz PNA-X network analyzer, application software and accessories for frequency converter measurements with modulated signal such as EVM, NPR and ACPR in addition to gain, gain compression, IMD and other measurements
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Product
PXIe-4136, 200 V, 1 A System PXIe Source Measure Unit
783760-01
Source Measure Unit
±200 V, 1 A System PXI Source Measure Unit—The PXIe‑4136 system source measure unit (SMU) delivers high power, precision, and speed. It is ideal for a broad range of applications including manufacturing test; board-level test; lab characterization with devices such as integrated circuits (ICs), power management integrated circuits (PMICs), and radio frequency integrated circuits (RFICs); and discrete devices including LEDs and optical transceivers. The PXIe‑4136 features 4-quadrant operation. The PXIe‑4136 is a hardware-timed instrument with a high-speed sequencing engine for synchronizing acquisitions between multiple SMUs. The module supports direct DMA streaming between the host PC and SMU, so you can stream large waveforms and measurement data at the full update rate and sample rate of the instrument.
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Product
ProxiLAB Quest Contactless Tester
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Fully programmable card (PICC), reader (PCD) and NFC signal emulator for device characterization and protocol conformance verification. ProxiLAB Quest offers the performance and features required for full characterization and conformance validation of all 13.56 MHz contactless technologies, including the latest very high bit-rate evolutions. ProxiLAB Quest integrates with a variety of conformance certification solutions and test automation platforms.
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Product
Kelvin Probes F81912B0001G2020
1033293
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The Kelvin Probes F81912B0001G2020 is designed with precision to deliver excellent performance in various applications. Characterized by its coaxial design, this probe features a pitch of 12 mm (472 mil) and operates within a temperature range of -45°C to +100°C. Its robust construction ensures reliability under diverse conditions, making it an ideal choice for high-tech environments where accuracy is paramount.
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Product
PXI/PXIe MIL-STD-1553 Multiplexer, Single 16-Channel, 2-Pole
42-739-001
Multiplexer Module
The modules are ideal for the testing of multiple devices that use a serial communication interface, allowing the test system to select one target device from many. The design is bi-directional to permit use as a multiplexer or de-multiplexer with no impact on performance. The module uses long lifetime electromechanical relays characterized for use in communications systems.
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Product
RF Coaxial Probes & Probe Positioner
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Fairview Microwave’s line of coaxial RF probes and RF PCB probe positioner are ideal for use with chip evaluations, signal integrity measurements, coplanar waveguide, substrate characterization, gigabit SERDES and test fixture applications. The RF coaxial probes provide return loss better than 10 dB and a maximum operating frequency of 20 GHz. The probes have a 3.5mm female interface, a pitch of 800 or 1500 micron and they can be cable-mounted. They feature gold-plated contacts and can be used by hand, with or without a probe positioner. Compliant coaxial GSG (or GS) pogo pins allow for a broad range of probing angles. The RF PCB probe positioner can hold coaxial probes, has articulated joints and delivers multi-axis positioner control. This positioner also boasts a magnetic mounting plate with on-off positioner switch.
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Product
High Voltage Dividers
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Ohm-Labs manufactures precision resistive high voltage dividers. By individually characterizing each resistor in the divider, voltage and power effects are minimized.
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Product
Solid-State Three-Electrode Test Module
LMF1
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A precision-engineered three-electrode battery test cell designed for advanced solid-state battery research. It enables independent monitoring of the working, counter, and reference electrodes for accurate electrochemical analysis, interface characterization, and battery performance evaluation.
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Product
4-Channel Simultaneous Sampling Module for DAQ970A and DAQ973A
DAQM909A
Simultaneous Sampling Module
The Keysight DAQM909A module enables the DAQ970A and DAQ973A Data Acquisition System to perform dynamic data acquisition for applications such as harmonic and noise distortion, power analysis, and acoustic characterization of electromechanical devices.
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Product
Basic Threaded Probes (F731) F73111B050G100
1025489
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The Basic Threaded Probes (F731) F73111B050G100 is a highly versatile and essential component designed for precision contact applications in demanding environments. Engineered to operate efficiently across a temperature range of -45°C to +100°C, this probe features a robust design characterized by a basic contact probe style. The F731 model is particularly noted for its reliability, with a continuous current rating of 5.00 A and a typical contact resistance of just 30.00 mOhm, ensuring optimal performance in various electrical testing scenarios.
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Product
Test Charts
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Image Engineering GmbH & Co. KG
Professional image‑quality testing starts with reliable, standards‑compliant test charts. Our portfolio covers more than 200 chart types designed for camera evaluation, low‑light testing, spectral analysis, resolution measurement, grayscale performance, color reproduction, and lens characterization.
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Product
Bus Analyzer, Exerciser, Emulator, and Programmer
CAS-1000-I2C/E
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While the I²C interface seems simple on the surface, this straightforward architecture is not immune to intermittent glitches, device misbehaviors, and protocol violations. Likewise, tracking down these errors can be tedious business if the right tool is not utilized.The CAS-1000-I2C/E bus analyzer is an exceptional tool for pinpointing I2c irregularities. The ability to spot complex problems and identify invisible obstacles make it the preferred I²C development solution. Advanced logging, debugging, emulation, and verification capabilities offer power and versatility, yet the Windows-based user interface makes the most complex features simple to use.The CAS-1000-I2C/E succeeds where simple monitoring and interactive I/O tools fall short—a complete solution to monitoring, emulating, stressing, and characterizing I²C and SMBus interfaces.
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Product
Probe Card
T40™ Series
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Ultra low noise and fast settling modeling and characterization tests are made possible by Celadon’s patented ceramic probe cards.
