Test Applications
See Also: Test Apps, Test Management Applications, Crowdsourced
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Product
Faraday Chamber for RF w/Exchangeable Cassettes 340x350mm RCV 9025 for 6TL36
AN133
Test Fixture
The Faraday Chamber is an add-on for the 6TL36 test handler. This kit is installed into the 6TL36 in the same way a normal test fixture would be installed, being the only difference the fact that different products to be tested will, from that moment on, only need an additional exchangeable cassettes to be tested.
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Product
SoC Test System
V93000 SoC / Smart Scale
Test System
Advantest’s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. The user benefits are reduced test time, best repeatability and simplified program creation. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change.
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Product
BSD (Test Diagnostics)
test
BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
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Product
Component Test Systems
Test System
These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
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Product
Scienlab Charging Discovery System (CDS) – High-Power Series
SL1047A
Battery Test Platform
The Scienlab Charging Discovery System – High-Power Series from Keysight enables you to test charging interfaces of electric vehicles (EVs) and EV supply equipment (EVSE) during high-power charging up to 1,500 V DC and ±600 A DC. With the CDS can perform all necessary conformance and interoperability tests according to worldwide charging standards. Our new solution, which features the separate Scienlab Cooling Unit with interchangeable liquid-cooled charging adapters, also enables a high-power upgrade of the SL1040A Scienlab Charging Discovery System - Portable Series.
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Product
Laser Diode Burn-in Reliability Test System
58604
Test System
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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Product
Special Application
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Columbia Research Laboratories
This group of Piezoelectric Accelerometers have been specifically designed to meet Columbia Research Labs customers "special" needs. Whether it be our model 876 designed for use in extremely cold temperatures (-400°F) or our model 378-HT-1XP, designed with an extremely rugged housing for prolonged use in adverse industrial environments of shock, vibration, temperature, humidity and excessive oil, that can withstand temperatures of 700°F. We would be happy to see this list of sensors grow to meet your needs. Please call us so we can make something "special" for you.
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Product
JTAG Functional Test
JFT
Functional Test
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
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Product
Application Gauging
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Bowers Group offers a range of both standard and bespoke measurement solutions for a variety of gauging applications. As the world’s leading bore gauge manufacturer, our application heads can be fitted directly onto our XT range of internal micrometers to create a flexible, modular measuring system. Whether you’re measuring threads, grooves, splines, sphericals, or deep holes, we have a standard solution to suit. If you’re looking for something completely bespoke, our team has the skills and expertise to solve your measurement problem.
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Product
In-Circuit Test
TestStation LH
Test System
The TestStation LH in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne's popular, award winning TestStation product family.
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Product
HV Test System for Patient Monitors
Test System
HV test enclosure for testing medical products (patient monitors). Insulated test booth with large space for DUT.3 different test nests for adapting different devices.Displays from patient monitors are checked. For this, insulation tests and leakage current measurements must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196A
Test Fixture
The 16196A surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
Web Application Penetration Testing
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Web Application Penetration Testing – to identify, analyze, and report vulnerabilities in a given web application. LGMS adopts a robust technology and process-based approach supported by a well-documented methodology to identify potential security flaws in the web application and the underlying environment.
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Product
Application Software
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Application software offers power and flexibility to expedite your applications. This high performing software tool manages numeric, waveform, and harmonic data measure. It allows data to be tranferred to and configured on your personal computer for maximum flexibility and support.
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Product
In-Line RF Test Station
AP770
RF Test System
ICT, Functional, Hipot, Vision, ISP and RF test with low cost fixtures in a very compact test station footprint Works with PCBs up to 450×550 mm or with palletized devices Space for up to 25 VPC mass interconnect modules or YAV switching units
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Product
PCI High Voltage MUX
50-350-001
Multiplexer Module
The 50-350-001 is a Short PCI Card designed as a high voltage multiplexer for use in a Submarine Cable Testing Application. It is designed to allow the dynamic connection of various test instruments to 1 of 16 test points. The multiplexer may be operated as a conventional multiplexer with break-before-make action when a new channel is selected.
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Product
Mobile Application Penetration Testing
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A Mobile application is an application that runs on mobile devices. It has become a dominant and popular business tool today. Corporates are empowering mobile devices by offering more and more services on mobile and handheld devices. Unfortunately, mobile devices like notebook computers, PDAs, Pocket PCs, smartphones, and BlackBerrys are all attractive targets for malicious attackers. By accessing your corporate network via email, VPNs, and other means of remote access, a successful compromise can result in the exposure of Personally Identifiable Information, corporate secrets, customer data, and additional sensitive information.
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Product
Functional Test
xUTS
Functional Test
Extend test to encompass copious test points and DUT varieties along with real-time, hardware-in-the-loop and other state-of-the-art instrumentation. extendedUTS (xUTS) is a custom product for high complexity functional test. Configured for the unique needs of a class of devices under test (DUTs), the xUTS employs our universal test system approach that combines the best open platform instrumentation and software along with mass interconnect technology.
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Product
Advanced SoC/Analog Test System
3650-EX
Test System
Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
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Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196B
Test Fixture
The 16196B surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results, reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement. Now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Product
Application Tooling
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Using the proper interconnect manufacturer’s tooling is essential to meet many of the industry standards and to maintain the connector manufacturer’s product warranty.
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Product
NI Vehicle Radar Test System
Test System
VRTS provides automated radar measurement and obstacle simulation capabilities for 76 to 81 GHz automotive radar systems. With VRTS, you can perform precision RF measurements and simulate a wide range of test scenarios for radar hardware and software subsystems, including sensors, advanced driver assistance systems (ADAS), and embedded software. Use VRTS for all phases, from design to manufacturing, of ADAS and radar system test.
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Product
NFC and Mobile Payment Application Testing
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An increasing number of banks and mobile operators are now offering mobile contactless payments to their customers. As with EMV contactless cards, the mobile payment application contained on the SIM needs to be certified by the contactless payment schemes, and in some cases by GlobalPlatform.
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Blockchain Application Testing
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Blockchain has revolutionized the approach businesses are conducted and provides enterprises the great opportunity to track assets, collaborate and share information. Diverse verticals like retail, finance, and healthcare are reaping the benefits of blockchain distributed ledger technology. The blockchain apps have now gone way beyond crypto-currencies like bitcoin and other decentralized payment modes or systems.
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Product
Applications
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No matter what the requirement for ultra high-precision measurement, VIEW has the ideal solution. VIEW non-contact measurement systems utilize sub-pixel image feature detection with either field-of-view (FOV) or point-to-point (PTP) configurations for exceptional accuracy and repeatability. From etch-dimensions on hard disk drive (HDD) heads to semiconductor overlay measurements, we provide the accuracy you need for quality manufacturing.
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Product
Test Port Cable, 1 Mm
11500I
Test Port Cable
Connect test ports to devices, fixtures, or probe tips with this 8.8-cm cable featuring a return loss of 17 dB minimum.
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Product
PMIC (Application Specific)
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Renesas offers several power management integrated circuits (PMICs) for ultrabook, notebook and tablet computers powered by 2-cell Li-ion batteries.
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Product
Special Applications
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Series of TRMS digital multimeters for specific tasks in telecommunications, avionics, medicine and extreme environments
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Product
Conformance Test System
TS8980
Test System
The R&S®TS8980 is the most compact full range conformance testing solution on the market for testing in line with requirements from GCF, PTCRB and regulatory bodies. It supports the entire device certification process for RF and RRM, covering the widest range of technologies including 5G NR based on 3GPP and carrier acceptance specifications. The test system is available in various configurations to cover the required scope of testing.
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Product
Open Test Platform for High Performance Automotive Applications
TSVP
Test Platform
The R&S®TSVP family of products is an open test platform from Rohde & Schwarz ideal for high performance automated test equipment (ATE) applications. The chassis contains a mechanical frame, digital backplane, analog backplane, mains switching and filtering, power supply and diagnostic extensions. A highlight is the analog bus for routing measurement signals between different slots without additional external wiring.
