Test Platform
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Product
ULTRA® Contactors
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ULTRA CONTACT Series offers high yield, durability and consistent performance under the most demanding testing environment. Our design offers easy integration to most test handler platforms and on automotive devices.
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Product
Semiconductor Test Software Solutions
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The test engineering staff at Test Spectrum has developed hundreds of test software projects on all major ATE platforms for numerous product technologies.Whether you need to optimize a current test platform, convert to a lower cost test platform, or design a brand new program for a cutting edge product within incredible time constraints, the Test Spectrum team will exceed your program expectations with quality products and excellent results.
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Product
Accelerometer & Platform Test Bench
mS 1115
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Platform Test Bench used to test the Digital Inputs, Accelerometer Count Reading, High and Low Gyro Torque control of Platform. It also performs Real Time Test for single negative pulse, checks Roll Axis, Pitch Axis, Azimuth Axis. Software package is available to test the Accelerometer.
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Product
Dispersion Compensating Fiber
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Dispersion compensating fiber from M2 Optics is used for correcting dispersion effects created over distances within G.652 single mode optical fibers. Offered in a 19" chassis for rack or benchtop use, these high quality testing platforms are easy to work with and provide consistent, repeatable results.
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Product
Desktop DMA
Desktop Series
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DMA25 and DMA50 are “desktop” Dynamic Mechanical Analyzers offering a high force range and outstanding flexibility. From glass transition determination to immersed tests, they make powerful and very cost-effective thermomechanical testing platforms.
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Product
Rack Systems
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Real-time testing and validation often require versatile testing platforms, providing a high number of different signals ranging from low-power communication and sensor signals to high-power actuator signals. Integrating all the necessary components in one standard system and designing signal-conditioning for all interfaces is time-consuming and requires specific expertise.
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Product
ATE Self Test Fixtures
AL663
Test Fixture
AL663 fixtures include all the electronic parts required to perform an effective test platform diagnostic. The AQ818 device allows to perform a series of tests, obtaining a report of the faulty instruments or switch modules and also a report about the relay contacts estimated life.
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Product
SAS Protocol Test System
Sierra M124A
Test System
The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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Product
RF Testing Platform for ATx05
AT118
Test Platform
The functional test of modern devices with wireless connectivity always requires RF isolated cameras, as the only way to have the parameters controlled and to guarantee operation under the specified conditions.
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Product
NTS Platform
Test Platform
Manufacturers all over the world are leveraging our NTS platform for products with rotating or otherwise moving parts, or produce sounds. Typical applications include mass production of air conditioning units, pumps or small electric motors, where errors in assembly can cause malfunctions or significantly shorten service life. This test platform is customized to your specification and application. Feasibility studies are available to ensure your solution is exactly what you are looking for.
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Product
UTP Software Suite
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Increasing customer requirements, shorter product cycles and higher time to market demands dramatically influence the long-term goals in software development. With the Universal Test Platform Software Suite (UTP Suite), we introduce a robust standard that features a great set of tools for configuring, developing, analyzing, debugging and executing test sequences.
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Product
PCI Express 3.0 Test Platform with SMBus Support
Test Platform
The Summit Z3-16 Test Platform with SMBus Support allows the Summit Z3-16 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen3, Gen2 or Gen1 hosts and devices. In addition, it supports the Summit Z3-16 with SMBus Support by providing SMBus tapping connectivity.
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Product
Test Platforms
Test Platform
Leverage 20+ Years of Test Industry Experience with Built-In IP for Maximum Reuse
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Product
Midirack - 120 x 60 x 80 cm
OTP2-Modul-Nr002
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The rack serves as the basic framework for your individually designed test system. Various OTP² modules can be installed in the 120 x 60 x 80 cm rack in order to meet the most varied of test requirements.The modular architecture of the OTP (Open Test Platform) is based on a flexible instrumentation matrix, LXI-based sources and measuring devices, combined with a high-quality transfer interface for connecting the test adapters. The systems can easily be expanded with customer- and application-specific functions. We use standardization to build cost-effective systems that still fit your requirements exactly.
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Product
Analog In-Circuit Tester
406C
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The 406C is an open architecture power up test platform designed to facilitate the implementation of functional testing after the MDA test is completed. Internally dubbed as "Armadillo" the new architecture provides the user almost unlimited flexibility by combining the best of the VME buss and a dedicated ICT buss.
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Product
Polarization Controller and Scrambler - PXIe
Pol 1000 Series
Controller
The Pol 1000 Series PXIe module enables high-speed automated polarization control for polarization dependent testing procedures.Rotate or scramble the polarization of your signal with no need for manual adjustment of paddles or tension screws using intuitive software, LabVIEW or comprehensive SCPI commands. Pol 1000 Series can be used with our wide range of optical and electrical PXIe test modules, and can be used to build complete mixed-signal test platforms.
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Product
ATE Test & Engineering Services
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We can provide a limited scope project or a full turn key solution where we analyze a data sheet and provide a full test plan. Our wide range of ATE test equipment and experienced team can support first silicon debug to release to high volume production for a wide range of products, from Digital to RF, including wafer sort and packaged part testing. Test platforms include Verigy, Teradyne, Advantest.
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Product
Programmable Step Attenuator, DC to 50 GHz, 0 to 65 dB, 5 dB steps
84908M
Attenuator
Keysight now offers a family of higher frequency attenuators for your communications and aerospace applications. Combining low insertion loss with long life and excellent repeatability, these attenuators safeguard your test platform from failures, recalibration, downtime, and lost production.
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Product
3U PXI-E System Controller
PX32101
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LinkedHope Intelligent Technologies Co.,Ltd.
PX32101 is a 3U PXI-E system controller based on the newest Intel® Haswell platform. It is designed to provide comprehensive and reliable system controller to support hybrid PXIe-based systems for multiple environments test and measurement applications.Hybrid PXIe-based systems are often required to complete independent diversified complex testing tasks on the PXI test platform. PX32101 provides rich interfaces: 4 USB2.0 / 3.0 for peripheral connectivities; UART for communication or control equipment; dual 1000Base-T Ethernet, one port for LAN connection and the other one for the control of the next generation of LXI instruments.PX32101 can support 4 x4 or two PCIe x8-link, and up to 16GB / s system bandwidth. The ExpressCard 34 expansion slots on the front panel allow users to expand the system modules flexibly. If you install a hybrid multi-slot backplane in the system, then various standard PXI-E and PXI / CPCI peripheral cards could be fitted.In a multitasking environment, PX32101 processor is able to complete multiple tasks independently. The CPU and memory chips soldered with PCB increase reliability performance in shock and vibration environments. Combined with a variety of instrument control interfaces and reliable mechanical & electronic design, PX32101 can meet your hybrid PXIe-based testing for system application requirements perfectly.
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Product
Comprehensive Suite of Software Tools for Semiconductor Test Applications
ICEasy Test Suite
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Marvin Test Solutions' ICEasy Test Suite is supplied with both the TS-900 and TS-960 semiconductor test platforms and provides a comprehensive set of software tools - facilitating the development and debugging of test programs for semiconductor devices. In addition the suite includes I-V curve and Shmoo plot tools for analyzing a device's DC and AC characteristics. The complete suite of tools interfaces seemlessly with Marvin Test Solutions' ATEasy®, a test executive and test development evironment which is supplied with each TS-900 / TS-960 system.
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Product
test measurement unit
ITC59100 Rg/Qg
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The ITC59100 Test Measurement Unit (TMU), which plugs into the ITC59000 Test Platform, performs gate charge (Qg) measurements that conform to MIL-STD-750C, Notice 2, Method 3471 and JEDEC Standard JESD24-2. In addition the ITC59100 TMU performs an internal gate resistance (Rg) test method that conforms to JEDEC Standard JESD24-11.
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Product
Qsome Software Testing Platform
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The Qsome software testing tool has been built to make the automation of functional testing of web-based and mobile applications faster, easier and more cost-effective. Our software testing tools have been built from the ground-up with these key principles in mind: Users with no testing experience should be able to use our tools without exhaustive trainingExecuting a batch of tests should be as simple as a few mouse clicksEasy cross-browser and cross-device automated testing is a must-have, not a nice-to-have
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Product
Java Test Platform
JUnit 5
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JUnit 5 is the next generation of JUnit. The goal is to create an up-to-date foundation for developer-side testing on the JVM. This includes focusing on Java 8 and above, as well as enabling many different styles of testing.
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Product
VR/AR/MR Calibration Platform
Test Platform
AR, VR and MR device calibration is critical for product performance. Leverage Averna’s standardized alignment platform to efficiently calibrate cameras and Inertial Measurement Unit (IMU) modules with supreme accuracy. Easily customize or upgrade the base platform into the automated quality solution to best fit your manufacturing requirements.
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Product
Tunable Notch Filters
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The Ranatec Tunable Notch Filters are critical tools for adaptation to stringent new ETSI/3GPP conformance test specifications for mobile device radio properties, that covers all sub-6 mobile bands and channel bandwidths for 2G/3G/4G/5G. Designed for formal conformance testing performed by accredited test houses, as well internal verification by mobile device vendors. A flexible and easy to use test automation platform to support almost any ambition level, tailored to your demands.
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Product
JTAG 3rd Party Controller Support
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Corelis offers support for a variety of devices and instruments from third-parties in an effort to provide existing test platforms comprehensive JTAG test execution with Corelis ScanExpress software products. Supported instruments include National Instruments PXI-655x HSDIO and Teradyne Di-Series modules. Corelis also provides support for JTAG testing with FTDI FT2232 ICs embedded on a unit under test (UUT).
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Product
EV Power Components End of Line Test Platform
Test Platform
Test and Validate all EV Power Electronics with One Flexible and Scalable Solution
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Product
Bluetooth LE Protocol Qualification Tester
conformanceHarmony
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The conformanceHarmony LE Tester is a robust testing solution recognized by the Bluetooth SIG as a validated test platform, focused on the qualification testing of products to the Bluetooth low energy specification. It is an integrated software/hardware test platform for Bluetooth protocol qualification testing that provides:
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Product
Image Sensor Testing
IP750Ex-HD Family
Test System
The IP750EX-HD has been the test platform that has enabled the industry to manufacture high quality CCD and CMOS image sensors, and it is the most economical platform to meet the needs of newer technologies such as Time of Flight (ToF) sensors. When you use a smartphone, high performance digital still camera, or in-home security and surveillance system, these applications have image sensors most likely tested by Teradyne’s IP750ExHD.
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Product
Software
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LXinstruments offers a modular test software platform which provides a holistic solution, covering the following aspects:Implementation of product-specific test applications, based on commercially available sequencersSoftware operation in a production environment under TSCOE4, including extensive process and automation interfacesCentralized, database-controlled management of test data and test resultsData mining, data analysis and traceability
