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- Scientific Test, Inc.
product
Automated Discrete Semiconductor Tester (ATE)
5000E
Same Proven Technology as all 5000 Series Testers. High Speed Single Test Measure. Capable of Testing Multiple and Mixed Devices. 1KV Standard, 2KV Optional. 1NA to 50A Standard, 100A Optional. 0.1NA Resolution. Complete Self Test. Auto-Calibration. RDSON to 0.1MOHM Resolution. Windows Application Software. Optional Scanner. Optional Wafer Mapping. Optional Curve Trace. MOSFET, IGBT, J-FETTriac, SCR, Sidac, Diac, Quadrac, STS, SBS Transistor, Diode, Opto, Zener Regulator, MOV, Relay. UNDER $23,000.00
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ICT/FCT-Fixtures, Max UUT 250 × 180 mm (wxd)
CK-1 Small (Hold-Down Gate) / 230154
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Flying Probe Tester
Condor MTS 505
Primarily the Flying Probe Tester was developed to enable In-Circuit testing (ICT) of prototype PCBs. For testing a new design an existing fixture has to be changed or a new fixture has to be procured. The fixtureless design of the MTS 505 Condor is one of its most attractive properties, where the unnecessary and costly time delays incurred for fixture build or changes can be avoided. It is the ideal platform for testing prototypes.
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Manufacturing Defects Analyzer
eloZ1-1600
The eloZ1 Manufacturing Defects Analyzer is an in-circuit tester of the very latest generation, reliably detecting connection and assembly faults on printed circuit board assemblies. The eloZ1 can be integrated into table systems as well as into inline-systems.
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ICT/FCT-Fixtures, Max UUT 370 × 300 mm (wxd)
CK-2-228X (Small IF) / 230540
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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In-Circuit Testers
SPEA’s Bed of Nails Board Testers are scalable In-Circuit Test platforms that deliver the shortest test time, superior diagnostic accuracy, and extended test coverage for the most comprehensive range of electronic products.SPEA’s In-Circuit Board Testers are designed to increase yield, shorten the testing time, and cut the cost-of-test. Thanks to their unique Multi-Tester and Multi-Core Architecture, the SPEA’s Board Testers provide up to ten times greater throughput than conventional ICT test systems.
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Acculogic Scorpion
ICT 7000
Accologic's Scorpion family of In-Circuit testers are feature rich and flexible, created with a consideration for cost effective testing.Systems are designed to allow for evolving test requirements by including the facility for future modular expansion with a broad array of innovative, patented expansion options.
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PXI Test Instrumentation
The Yelo Pixi general purpose tester is a PXI based functional test system with in-circuit and continuity capability. Built into a free standing 19” rack is a PXI chassis, mass interconnect fixture interface, PC, flat screen and space for additional user selectable instrumentation.
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In-Circuit Tester
Eagle MTS180
The Eagle offers low testing cost for high volume with even the most complex fixture applications. Equipped with a Press-Down-Unit and a combination of analog and hybrid In-Circuit test pins, the MTS180 is in a class for its own. Furthermore, the tester can be equipped with functional test modules to provide even higher fault coverage and thus satisfy the test requirements of a larger number of customers.
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Manufacturing Defects Analyzer
eloZ1-400
The eloZ1 Manufacturing Defects Analyzer is an in-circuit tester of the very latest generation, reliably detecting connection and assembly faults on printed circuit board assemblies. The eloZ1-400 is the compact version of the eloZ1. It is particularly suitable if there is only limited space to fit test appliances. The eloZ1-400 can also be used as a mobile test system.
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Test Systems
In-Circuit Test (ICT) tests populated circuit boards by means of electronic measurements through thin needles on test fixtures. We offer in-circuit testers for various testing strategies – from the flexible 19“ rack to the ergonomic high-performance tester. And all of our in-circuit testers are also available in the Lambda edition for true parallel testing. The flying probe test checks your printed circuit boards using four movable test heads. This requires no fixtures and allows for flexible test program generation. That makes our flying probe test systems ideal for a high mix of printed circuit boards and small to medium test volumes, such as for prototype testing.
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In-circuit and functional Tester
Compact TK
This is the smallest configuration , and is generally recommended for ICT and on-board programming applications. It is characterized by a high level of ergonomy, small footprint, easy maintenance , low power consumption and enhanced operator safety.
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ICT/FCT-Fixtures (Large IF)
GenRad CK-2-228X
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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TAP Signal Isolation Module
JT 2139
The JT 2139 is a TAP signal isolation module designed for use in combinational test systems that utilise multiple instrument interfaces. To avoid parasitic capacitance effects and/or unwanted ground loops the JT 2139 can be used to completely galvanically isolate any JTAG Technologies boundary-scan controller from the remainder of the instrumentation system. JT 2139 isolators are a standard component of the JTAG Technologies ‘Symphony’ systems that integrate boundary-scan with In-Circuits Testers etc..
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ICT/FCT-Fixtures, Max UUT 370 × 300 mm (wxd)
CK-2 Medium (Hold Down Gate) / 230156
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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In-Circuit Test
In-circuit test works by checking all components are fitted correctly to the PCB and are within the correct electrical tolerance. In-circuit testers do this by interfacing to the board via a "bed of nails test fixture" and programs can be generated via CAD data. They offer a quick and easy method of checking the manufacture of the board and also offer a reliable and simple fault report.
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ICT/FCT-Fixtures Max UUT 370 × 300 mm (wxd)
CK-2-228X (Large IF) / 230532
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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In-Circuit Tester Integration
The benefits of boundary-scan are noticed in all phases of a product life cycle. By coupling the power of Corelis boundary-scan tools with an In-Circuit Tester (ICT), a complete, integrated solution is available that offers the best advantages of both technologies.Boundary-scan operates as the perfect companion to ICT. Boundary-scan is capable of testing areas of printed circuit board assemblies that are difficult to access due to physical space constraints and loss of physical access, which is often due to fine pitch components such as Ball Grid Array (BGA) devices. Conversely, the ICT is able to check the non-boundary-scan compatible portion of the unit under test (UUT) such as analog.
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ICT/FCT-Fixtures Max UUT 370 × 300 mm (wxd)
CK-2 Large (Hold-Down Gate) / 230158
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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Analog In-Circuit Tester
406C
The 406C is an open architecture power up test platform designed to facilitate the implementation of functional testing after the MDA test is completed. Internally dubbed as "Armadillo" the new architecture provides the user almost unlimited flexibility by combining the best of the VME buss and a dedicated ICT buss.
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Bare Board Tester
1232
High-Precision Batch Fixture-Type Testing System that Support Boards with Embedded Passive and Active Devices. The 1232 is a bare board tester that utilizes the full range of Hioki’s in-circuit testing technologies to deliver LSI reliability testing, complex component separation testing, high continuity and insulation testing, and more. (Double-sided alignment) Testable board dimensions: 50 × 50 to 330 × 330 mm (including clamp area) • Support for build-up boards that require resistance guarantees.
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In-Circuit Test
TR5001T
The TR5001T Tiny 2 ICT is a new full feature In-Circuit board tester with a laptop sized footprint that provides a very cost effective alternative to large In-Circuit testers.
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In-Circuit Tester
Sigma MTS300
The system is designed for high throughput; with up to 1,000 analog measurements per second it is one of the fastest test systems available on the market. Sigma test systems provide analog and digital In-Circuit Test capabilities, Vectorless Testing, Functional Test, Boundary Scan and On-Board Programming.
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In-Line Full Automatic Testing System
ALMAX
Automated press unit with board loading belt.ALMAX can become automated in-line type in-circuit tester in case our ICT is integrated. And it also can become automated in-line function tester as well.PLC is not used in order to reduce cost as a PC control mechanical part.Press unit is 4 shaft structures which reduce unbalanced load and contact fail of probe pins.
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In-Circuit Tester
IP-5000, IP-5300
The IP-5000 series is a space-saving high-speed board inspection device with a compact design.
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Test System Elowerk
eloZ1
The eloZ1 Manufacturing Defects Analyzer is an in-circuit tester of the latest generation. It reliably finds connection errors and assembly errors in electronic assemblies. The test electronics can be integrated both in table systems and in inline systems.
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2-Module ICT System, I317x Series 6
E9902G
Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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In-circuit and Functional Tester
Compact SL
This configuration offers a completely automated solution via an integrated, SMEMA-compatible conveyor system, allowing completely automatic board handling and easy integration into high volume production lines. Configurable as ICT, pre-functional, functional and combinational. The compact footprint and the compliance with WCM criteria, enable easy and successful integration both in-line and/or within an automated test island. Cost reduction and high throughput guaranteed.
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In-Circuit Test Fixtures
Every type of in-circuit test fixtures (wired, wireless, pneumatic, vacuum) for all major tester brands.
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Deep And Sloped Pan Fixtures
Line of deep and sloped pan fixtures for general purpose/system non-specific pcb test applications. H+W Test Products manufactures test fixture products for in-circuit, functional and combinational testers for users of automated test systems (ATE) such as Aeroflex, Agilent (HP), Checksum, Factron, Teradyne (GenRad), Test Research (TRI) and Testronics.
