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Exhaust Test
See Also: Exhaust
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Engine Based/Burner Hot Vibration
Does your company need to test exhaust joints in real world applications?Trialon’s hot vibration test cell can validate any exhaust joint and interface connection past the manifold.
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Acceleration Simulation Mode Roller Set for Vehicles with a Single Driven Axle
ASM-BF/1 | VP 230043
Maschinenbau Haldenwang GmbH & Co. KG.
The ASM-BF/1 roller set is used in test centres and is suitable for vehicles with a single driven axle. It was designed for the exact measurement of the exhaust gas behaviour of vehicles during their transient emission test and permits a driving resistance simulation for the exhaust gas tests ASM-5015 and ASM-2525 (Acceleration Simulation Mode) in accordance with the specifications BAR '97.
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Acceleration Simulation Mode (ASM) Roller Set
ASM-P | VP 230046
Maschinenbau Haldenwang GmbH & Co. KG.
The ASM-P roller set is used in test centres and is suitable for vehicles with a single driven axle. It was designed for the exact measurement of the exhaust gas behaviour of vehicles during their transient emission test and permits a driving resistance simulation for the exhaust gas tests ASM-5015 and ASM-2525 (Acceleration Simulation Mode) in accordance with the specifications BAR '97. The increased tractive force of its eddy current brake means that the ASM-P is also suitable for power measurements at constant speed and constant tractive force.
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Power Module Tester
The Power Module Checkout ATE is developed for testing DC-DC Power modules typically utilized in India's space program. The DC-DC converters are exhaustively tested for all design parameters including supply voltage range, line and load regulation, efficiency, ripple, noise, transient response and so on. Special power sources and loading mechanisms are deployed to enable testing of various types of power modules.
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Acceleration Simulation Mode (ASM) Roller Set
ASM-P-PLUS | VP 230047
Maschinenbau Haldenwang GmbH & Co. KG.
The ASM-P-PLUS roller set is used in test centres and is suitable for vehicles with a single driven axle. It was designed for the exact measurement of the exhaust gas behaviour of vehicles during their transient emission test and permits a driving resistance simulation for the exhaust gas tests ASM-5015 and ASM-2525 (Acceleration Simulation Mode) in accordance with the specifications BAR '97. The increased tractive force of its eddy current brake means that the ASM-P-PLUS is also suitable for power measurements at constant speed and constant tractive force.
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Dynanometer Roller Set
FPS 2700 | VP 230048
Maschinenbau Haldenwang GmbH & Co. KG.
The FPS 2700 roller set is used in test centres and is suitable for vehicles with a single driven axle. It was designed for the exact measurement of the exhaust gas behaviour of vehicles during their transient emission test and permits a driving resistance simulation for the exhaust gas tests ASM-5015 and ASM-2525 (Acceleration Simulation Mode) in accordance with the specifications BAR '97. As a result of the increased tractive force of its eddy current brake, the FPS 2700 is additionally suitable for power measurements at constant speed and constant tractive force.
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4WD Roller Set
ASM-BF/2 | VP 230044
Maschinenbau Haldenwang GmbH & Co. KG.
The ASM-BF/2 4WD roller set is used in test centres and is suitable for vehicles with a single driven axle. It was designed for the exact measurement of the exhaust gas behaviour of vehicles during their transient emission test and permits a driving resistance simulation for the exhaust gas tests ASM-5015 and ASM-2525 (Acceleration Simulation Mode) in accordance with the specifications BAR '97. The ASM-BF/2 4WD is built into the base.
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Acceleration Simulation Mode (ASM) for Single Driven Axle Vehicles
ASM_AF | VP 230045
Maschinenbau Haldenwang GmbH & Co. KG.
The ASM-AF roller set is used in test centres and is suitable for vehicles with a single driven axle. It was designed for the exact measurement of the exhaust gas behaviour of vehicles during their transient emission test and permits a driving resistance simulation for the exhaust gas tests ASM-5015 and ASM-2525 (Acceleration Simulation Mode) in accordance with the specifications BAR '97. The ASM-AF is built into the base.
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Back Pressure Tester
TU29P
Enables Technician to test exhaust back pressure thru oxygen sensor. Oxygen Sensor adapter includes M12 & M18 thread.Special Gauge has two multi-colored bands - idle and 2500RPM, with pressures shown in PSA and bar.
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NI Automated Test Software Suite
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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Test Workflow Pro
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Test Instruments
Test instrumentation from COTS to custom, including VXI, PXI and LXI-based platforms.
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NI Vehicle Radar Test System
VRTS provides automated radar measurement and obstacle simulation capabilities for 76 to 81 GHz automotive radar systems. With VRTS, you can perform precision RF measurements and simulate a wide range of test scenarios for radar hardware and software subsystems, including sensors, advanced driver assistance systems (ADAS), and embedded software. Use VRTS for all phases, from design to manufacturing, of ADAS and radar system test.
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EV Power Components End of Line Test Platform
Test and Validate all EV Power Electronics with One Flexible and Scalable Solution
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Semiconductor Testers
Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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Audio and Acoustic Functional Test Solution
With the growing popularity of Internet of Things devices worldwide, many electrical products are adopting voice commands as their user interface. This means that acoustic and audio test challenges are likely to impact more products than ever before. Test teams must meet extended test coverage requirements to ensure product quality while maintaining throughput and operational efficiency. For a solution to meet these sorts of demands, it must:
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VLSI Test System
3380
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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SoC Test Systems
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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NI's Electrical Functional Test Solution
PXI instrumentation ensures complete and accurate test coverage with a modular architecture mounted in ultra-reliable PXI chassis.TestStand and LabVIEW software provide rapid development of complex test steps and sequences. PXI systems conserve floorspace because of their small, light form factor. Order them preassembled and installed using NI ATE Core Configurations.SystemLink™ software deploys updates and democratizes data insights to optimize operational efficiency.
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PXI Semiconductor/IC Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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80 DIOs, 8AIs, 8AOs JTAG Boundary Scan Resources Unit Expansion
YAV9JTAH
80 DIOs8 Ais8 AOsCompatible with all JTAG vendors
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LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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Flight Control System Test Platform
The Flight Control System Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of Flight Control Systems (FCS) of both commercial and military aircraft. The system simulates control surface activities from multiple combinations of rudder, flaps, elevator, aileron, and engine controls to the FCS. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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In-Line Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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NI Semiconductor Test Systems
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
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NTS Platform
Manufacturers all over the world are leveraging our NTS platform for products with rotating or otherwise moving parts, or produce sounds. Typical applications include mass production of air conditioning units, pumps or small electric motors, where errors in assembly can cause malfunctions or significantly shorten service life. This test platform is customized to your specification and application. Feasibility studies are available to ensure your solution is exactly what you are looking for.
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Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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In-Circuit Test (ICT) Fixtures
At Forwessun we support and manufacture In-Circuit Test Fixtures for a range of Test Systems. We regularly build fixtures that are supported on a range of systems including - - HP3070- Agilent- Keysight- GenRad- TeradyneWith over 50 years in the industry, we provide a weatlth of knowledge and support to our customers. We are a global company and can support businesses all over the world with the help of over 30 experienced test engineers.
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EV-DO Analysis Using NI PXI RF Test Instruments
NI-RFmx EV-DO
Highly optimized RF measurement experiencePerform physical layer analysis on EV-DO cellular signals including MODACC, ACPR, CHP, OBW, and SEMSimple access to advanced measurement parallelism
