Test Pattern Generators
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Product
PXIe-5451, 145 MHz, 16-Bit, 2 GB PXI Waveform Generator
781204-03
Waveform Generator
PXIe, 145 MHz, 16-Bit, 2 GB PXI Waveform Generator—The PXIe‑5451 is a 145 MHz, dual‐channel arbitrary waveform generator capable of generating user-definied waveforms, standard functions, and I/Q communications signals. It is an ideal instrument for including in systems for testing devices with I/Q inputs, or as the baseband component of an RF vector signal generator as wells as time-domain signals like envelope tracking. The PXIe‑5451 also features onboard signal processing (OSP) functions that include pulse shaping and interpolation filters, gain and offset control, and a numerically controlled oscillator (NCO) for frequency shifting. The PXIe‑5451 also features advanced synchronization and data streaming capabilities.
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Product
RF-Antenna Communication Links Functional Test
Functional Test
The application encompasses functional tests of very large quantities of automotive antenna amplifiers, plus parallelization of tests by implementing several test stations in a rotary indexing table. The DUTs are inserted manually and after final assembly, they are loaded into the rotary table; this requires manual triggering by the operator.
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Product
Alternate 2.64 (75.00) - 6.50 (184.00) General Purpose Probe
EPA-2F-1
General Purpose Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Product
PCIe 16 Bit Arbitrary Waveform Generator - up to 1.25 GS/s on 2 Channels
M4I.6631-X8
Arbitrary Waveform Generator
The M4i.66xx-x8 series arbitrary waveform generators (AWG) deliver the highest performance in both speed and resolution. The series includes PCIe cards with either one, two or four synchronous channels. The large onboard memory can be segmented to replay different waveform sequences. The AWG features a PCI Express x8 Gen 2 interface that offers outstanding data streaming performance. The interface and Spectrum’s optimized drivers enable data transfer rates in excess of 2.8 GB/s so that signals can continuously replayed at a high output rate. While the cards have been designed using the latest technology they are still software compatible with the drivers from earlier Spectrum waveform generators. So, existing customers can use the same software they developed for a 10 year old 20 MS/s AWG card and for an M4i series 625 MS/s AWG.
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Product
True Concurrent Test
TestStation Duo
Test System
The TestStation Duo is a true concurrent test system with independent test modules providing fast in-circuit test throughput and lowering high-volume production costs.It effectively doubles the test throughput of conventional in-circuit test systems, without doubling capital equipment costs or increasing manufacturing floor space, by combining two complete and independent test modules inside a single tester frame.
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Product
Ultra High 4.18 (119.00) 11.70 (332.00) General Purpose Probe
EPA-3E-2
General Purpose Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
9GS/s 8 Bit, 4GS Mem 4CH 16 Markers AWG
P9084B
Waveform Generator
The Proteus P9084B, is a 9GS/s, four channel arbitrary waveform generator packaged in a 4U, 19” standalone box with a 9” touch screen and on board PC , offering technologically advanced options and configurations that integrate the ability to transmit, receive and perform digital signal processing all in a single instrument. The P9084B offers industry leading performance Including an innovative task oriented programming, real time data streaming, fast feedback loop for environment dependent waveform generation and user customizable FPGA for application specific solutions.
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Product
LXI High Voltage Switching - 50xSPST Plugin Module
65-233-900
General Purpose Relay Module
The 65-233-900 plug-in module is part of a scalable high voltage switch platform that provides a high voltage switching solution with capability up to 9 kV.
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Product
PXI-5651, 3.3 GHz RF Signal Generator
779670-01
Signal Generator
3.3 GHz PXI RF Analog Signal Generator—The PXI‑5651 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXI‑5651 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
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Product
Liquid Test Fixture
16452A
Test Fixture
The 16452A provides accurate dielectric constant and impedance measurements of liquid materials. The 16452A employs the parallel plate method, which sandwiches the liquid material between two electrodes to form a capacitor. An LCR meter or an impedance analyzer is then used to measure the capacitance created from the fixure.
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Product
RMP Replaceable General Purpose Probe
RMP-22B
General Purpose Probe
Current Rating (Amps): 2Average Probe Resistance (mOhm): 125Test Center (mil): 20Test Center (mm): 0.51Full Travel (mil): 79Full Travel (mm): 2.01Recommended Travel (mil): 52Recommended Travel (mm): 1.33Mechanical Life (no of cyles): 50,000Overall Length (mil): 598Overall Length (mm): 15.19
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Product
Memory Test System
T5833/T5833ES
Test System
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Product
Standard 2.20 (62.00) - 4.80 (136.00) General Purpose Probe
EPA-4F
General Purpose Probe
Current Rating (Amps): 7Average Probe Resistance (mOhm): 35Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,320Overall Length (mm): 33.53
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Product
Dual/Quad 125 MS/s VXI Arbitrary Waveform Generator
3164
Waveform Generator
The Racal Instruments™ 3164 Series is a single-wide VXIbus Module. The 3164-2 has two 14-bit Arbitrary Waveform Generator (AWG) channels that operate independently, and the 3164-4 AWG has four channels. The maximumsample rate for each channel is 125 MS/s. All waveforms can be sampled from data previously loaded into waveform memory or loaded and output on the fly.
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Product
Ultra High 4.09 (116.00) - 10.00 (283.00) General Purpose Probe
EPA-2F-2
General Purpose Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Product
MEP General Purpose Probes
General Purpose Probe
Current Rating (Amps): 2Average Probe Resistance (mOhm): 50Test Center (mil): 25Test Center (mm): 0.635Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 750Overall Length (mm): 19.05Rec. Mounting Hole Size (mil): 20.5Rec. Mounting Hole Size (mm): 0.52Rec. Mounting Hole Remark: 20.5 to 21.5 mil / 0.52 to 0.55 mmRecommended Drill Size: #75 or 0.52 mm
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Product
PXI-5652, 6.6 GHz RF Analog Signal Generator
779670-02
RF Signal Generator
6.6 GHz PXI RF Analog Signal Generator—The PXI‑5652 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXI‑5652 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
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Product
Standard 1.71 (48.00) - 3.00 (85.00) General Purpose Probe
HPA-74T156
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 598Overall Length (mm): 15.19Overall Length Remark: Tip “A-B”: 598 (mil), 15.19 (mil), Tip “C”: 586 (mil), 14.88 (mil), Tip “E, T135, T156, T65, T80”: 610 (mil), 15.49 (mil), Tip “T75”: 620 (mil), 15.75 (mil)
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Product
Alternate 2.54 (72.00) - 6.20 (176.00) General Purpose Probe
HPA-52D-1
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 250,000Overall Length (mil): 629Overall Length (mm): 15.98
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Product
EBIRST 50-pin D-type To 2x8-pin Power D-type Adapter
93-005-236
Test Adapter
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Photonics Module Test System
58625
Test System
Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
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Product
NTS Platform
Test Platform
Manufacturers all over the world are leveraging our NTS platform for products with rotating or otherwise moving parts, or produce sounds. Typical applications include mass production of air conditioning units, pumps or small electric motors, where errors in assembly can cause malfunctions or significantly shorten service life. This test platform is customized to your specification and application. Feasibility studies are available to ensure your solution is exactly what you are looking for.
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Product
PXIe-5442, 43 MHz Bandwidth, 16-Bit Onboard Signal Processing, 512 MB, PXI Waveform Generator
780109-03
Waveform Generator
PXIe, 43 MHz Bandwidth, 16-Bit Onboard Signal Processing, 512 MB, PXI Waveform Generator—The PXIe‑5442 is a 43 MHz arbitrary waveform generator capable of generating user-defined, arbitrary waveforms, standard functions including sine, square, triangle, and ramp, as well as signals that require onboard signal processing. Some of these signal processing operations include FIR and CIC interpolation filters, digtal prefilter gain, numerically-controlled oscillator, and I/Q mixing for quadrature digital upcoversion. The PXIe‑5442 also features advanced synchronization and data streaming capabilities.
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Product
PCI-5402, 20 MHz Bandwidth, 14-Bit Waveform Generator Device
779656-01
Waveform Generator
The PCI‑5402 can generate standard functions, including sine, square, triangle, and ramp as well as other signals like pseudorandom noise and DC signals. This function generator can generate signals from -5 V to +5 V and uses direct digital synthesis (DDS) to precisely generate waveforms.
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Product
6GHz Four Channel Signal Generator 19" 1U Rack Module
LS6084R
Signal Generator
The LS6084R, 6GHz four channel RF Analog Signal Generator, offers industry leading performance, in a 1U, 19” space efficient, rack-mounted box. The LS6084R features four phase coherent channels, exceptionally fast switching speed, superior signal integrity and purity and all the necessary modulated signals for analog communication systems. The LS6084R was designed to offer excellent performance and abilities combined with an affordable price tag, needed from the R&D benches to the production lines.
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Product
9GS/s 8Bit, 4GS Mem 6CH 24 Markers AWG
P9086D
Waveform Generator
The Proteus P9086D, is a 9GS/s, six channel arbitrary waveform generator packaged in a 4U, half 19” dedicated chassis, offering technologically advanced options and configurations that integrate the ability to transmit, receive and perform digital signal processing all in a single instrument. The P9086D offers industry leading performance Including an innovative task oriented programming, real time data streaming, fast feedback loop for environment dependent waveform generation and user customizable FPGA for application specific solutions.
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Product
Semiconductor Testers
Test Instrument
Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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Product
PXIe-6571, 32-Channel 1-Slot, 100 M Vector/s PXI Digital Pattern Instrument
786320-01
Digital Pattern
The PXIe-6571 helps you perform semiconductor validation, characterization, and production test. It includes the Digital Pattern Editor for configuring pin maps, specifications, levels, timing, and patterns. Additionally, the PXIe-6571 includes debugging tools such as Shmoo, digital scope, and viewers for RAM history, pin states, and system status. The 32-channel option for the PXIe-6571 requires a chassis with a cooling capacity of 82 W for each slot, such as the PXIe-1095 PXI Chassis, while the 8-channel option for the PXIe-6571 can be used in chassis with a cooling capacity of 58 W for each slot, such as the PXIe-1084 PXI Chassis.
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Product
Ultra High 4.09 (116.00) - 10.00 (283.00) General Purpose Probe
EPA-2P-2
General Purpose Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Product
Arbitrary Waveform Generators
M9300 Series
Arbitrary Waveform Generator
The M9300 Series arbitrary waveform generators (AWGs) offer you high resolution and wide bandwidth waveforms with excellent signal quality in a PXIe form factor. Generate the most realistic waveforms for your radar, satellite, and frequency-agile communication systems.
