Test Pattern Generators
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Product
Communications Test System for Frontline Diagnostics
ATS3000P
Test System
The ATS3000P is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The ATS3000P also includes the sophisticated IF and baseband I/Q DigitalSignal Processing required for modern radios. The fieldupgradeable, software-defined architecture features easyto-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets are available for a full range of tactical radios, or you can create new TPSs easily using the included TestEZ® software suite.
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Product
PXIe Microwave Signal Generator, 1 MHz to 44 GHz
M9383A
Microwave Signal Generator
Modular test solution for design validation that can be efficiently leveraged into manufacturing Flexibility to solve your immediate test needs, but upgradable for what comes next – whether that’s upgrading for frequency coverage, or a rapid shift to high volume production.Pre-5G signal confidence you need with 1% EVM @ 28 GHz, 800 MHz bandwidth
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Product
MXG Vector Signal Generator
N5186A
Vector Signal Generator
Compact, four-channel vector signal generator capable of signal generation up to 8.5 GHz with 960 MHz of modulation bandwidth per channel
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Product
HD Pattern Signal Generator
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Evaluate, Calibrate, and Test Digital Video Equipment. Advanced testing device for your audio and video equipment.
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Product
Dielectric Material Test Fixture
16453A
Test Fixture
The 16453A is designed for accurate dielectric constant and loss tangent measurements on the E4991A/4291A/B. It employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. The E4991A/4291A/B measures the capacitance created from the fixure, and option 002 firmware calculates the relative complex permittivity as described in the 16451B. Adjustment to insure parallel electrodes is required when using the 16451B. This adjustment is not required with the 16453A because the fixure has a flexible electrode that adjusts automatically to the material surface.
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Product
PCIe 16 Bit Arbitrary Waveform Generator - up to 125 MS/s on 4 Channels
M2P.6566-X4
Arbitrary Waveform Generator
The M2p.65xx series offers different versions of arbitrary waveform generators for PCI Express with a maximum output rate of 125 MS/s. These boards allow to generate freely definable waveforms on several channels synchronously. With one of the synchronization options the setup of synchronous multi channel systems is possible as well as the combination of arbitrary waveform generator with digitizers of the M2p product family. The 512 MSample on-board memory can be used as arbitrary waveform storage or as a FIFO buffer continuously stream data via the PCIe interface. Importantly, the high-resolution 16-bit DACs deliver four times the resolution than AWGs using older 14-bit technology.
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Product
EBIRST 200-pin LFH To 160-pin DIN Adapter
93-002-410
Test Adapter
eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Ultra High 4.09 (116.00) - 10.00 (283.00) General Purpose Probe
EPA-2C40-2
General Purpose Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Product
80 MHz, 1.2 GS/s, 8 Mpts, 2 Ch, 20 Vpp Function/Arbitrary Waveform Generator
T3AFG80
Arbitrary Waveform Generator
Teledyne Test Tools T3AFG5 and T3AFG10 series Function/Arbitrary Waveform Generators are a new family of low cost, high performance, single channel Function / Arbitrary waveform generators offering a high level of functionality and an excellent specification at a very competitive price point.
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Product
HPA General Purpose Probes
General Purpose Probe
General Purpose Spring Probe contact solutions are designed for high volume testing and feature the industry-proven Pylon line. General-purpose probes are offered in both replaceable and non-replaceable options.
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Product
Alternate 1.30 (37.00) - 4.50 (128.00) General Purpose Probe
HPA-1J-1
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 655Overall Length (mm): 16.64
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Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
Test System
Compact solution for testing Battery Packs with output power up to 110 kW and voltage range up to 1500 V
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Product
Ultra High 4.18 (119.00) 11.70 (332.00) General Purpose Probe
EPA-3J-2
General Purpose Probe
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Memory Test System
T5851/T5851ES
Test System
The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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Product
Ultra High 4.09 (116.00) - 10.00 (283.00) General Purpose Probe
EPA-2H-2
General Purpose Probe
Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Product
Four Image Pattern Generator
BL-PG314-01
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The MicroImage PG314 series of pattern generators are for applications to display custom designed patterns on screen. The PG314 units will overlay the pattern or patterns on top of the video signal provided to the input of the device. While the PG311 can be factory programmed with only one unique pattern, the PG314 can hold up to four patterns and switch between them.
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Product
Keysight 20-Channel 5A Form A Switch for 34980A
34938A
General Purpose Switch
The Keysight 34938A is a high power general-purpose switch module for the 34980A Multifunction Switch/Measure Unit. It has 20 independent single-pole, single-throw (SPST) 5A relays. This module is used to cycle power to products under test, control indicator and status lights, and to actuate external power relays and solenoids. Its 30VDC/250VAC, 5A contacts can handle up to 150W on a single channel, enough for many power line switching applications. Standard 50-pin Dsub connectors allow for use with standard cables, terminal blocks, or mass interconnect solutions.
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Product
Test Fixture, Axial And Radial
16047A
Test Fixture
The 16047A is designed for impedance evaluation of axial/radial lead type devices of up to 13MHz. The 16047A employs Kelvin contacts which realize a wide impedance measurement range. The contact tip can be changed according to the device shape.
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Product
BSD (Test Diagnostics)
test
BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
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Product
Component Test Systems
Test System
These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
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Product
Function / Arbitrary Waveform Generators
Arbitrary Waveform Generator
Teledyne Test Tools generate fixed or arbitrarily defined waveforms and signals for use in the development, testing and repair of electronic systems.
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Product
T3AWG6K Series – 2, 4 and 8 Channel Arbitrary Waveform Generator
T3AWG6K Series
Arbitrary Waveform Generator
The T3AWG6K series consists of three high-performance arbitrary waveform generators with 2, 4 and 8 analog channels, 16-bit vertical resolution, sampling rate up to 12.32 GS/s with RF mode, waveform memory depth of 4 Gpts, with outstanding signal fidelity and easy generation of complex signals. In addition, up to 32 digital channels in sync with analog signals for advanced electronic testing.
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Product
Open Test Platform for High Performance Automotive Applications
TSVP
Test Platform
The R&S®TSVP family of products is an open test platform from Rohde & Schwarz ideal for high performance automated test equipment (ATE) applications. The chassis contains a mechanical frame, digital backplane, analog backplane, mains switching and filtering, power supply and diagnostic extensions. A highlight is the analog bus for routing measurement signals between different slots without additional external wiring.
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Product
Standard 1.71 (48.00) - 3.00 (85.00) General Purpose Probe
HPA-74T75
General Purpose Probe
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 598Overall Length (mm): 15.19Overall Length Remark: Tip “A-B”: 598 (mil), 15.19 (mil), Tip “C”: 586 (mil), 14.88 (mil), Tip “E, T135, T156, T65, T80”: 610 (mil), 15.49 (mil), Tip “T75”: 620 (mil), 15.75 (mil)
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Product
2.0 ~ 68.0 Gb/s Pulse Pattern Generator
CA9809
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The UC INSTRUEMNTS CA9809 2.0 ~ 68.0 Gb/s Pulse Pattern Generator pulse pattern generator and error detector is a high performance, flexible and costeffective broad band data rate covered Pulse Pattern Generator that can operate from 2.0 Gb/s to 68 Gb/s. The CA9809 can be used with existing equipment to generate higher rate bit streams for use in telecom applications up to 68 Gb/s. Broadband test systems will benefit from the low power dissipation, precision connectors, and excellent output waveform characteristics. The compact size of the equipment allows the CA9809 to be placed at the measurement plane, reducing or eliminating artifacts related to long cables.
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Product
8K Super Hi-Vision Video Pattern Generator
Model 2238
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Featured in modular design, the 2238 Video Pattern Generator is capable of providing 8K Super Hi-Vision (7680 x 4320 / 8192 x 4320) resolution for testing. Full 8K at 30/60 Hz resolution is supported by one single module (via a HDMI Display Port), and up to 4 modules can be installed and configured as required for all testing application to 8K. DisplayPort 1.3 signal module (Optional)
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Product
Laser Diode Burn-in Reliability Test System
58604
Test System
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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Product
Compact EMS/EMI Test Platform
CEMS100
Test Platform
Setting up an EMS/EMI test system is a very complex process requiring significant investment. The steps involved include custom planning, design, installation and configuration of various components and standalone instruments as well as the RF shielded anechoic chamber. Rohde & Schwarz offers the standardized R&S®CEMS100 test platform that is the company's first flexible, reliable and cost-effective off-the-shelf solution for radiated EMS measurements in line with IEC/EN 61000-4-3.
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Product
Conformance Test System
TS8980
Test System
The R&S®TS8980 is the most compact full range conformance testing solution on the market for testing in line with requirements from GCF, PTCRB and regulatory bodies. It supports the entire device certification process for RF and RRM, covering the widest range of technologies including 5G NR based on 3GPP and carrier acceptance specifications. The test system is available in various configurations to cover the required scope of testing.
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Product
Standard 0.39 (11.00) - 1.39 (39.00) Replaceable General Purpose Probe
MEP-30J
General Purpose Probe
Current Rating (Amps): 2Average Probe Resistance (mOhm): 50Test Center (mil): 30Test Center (mm): 0.76Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 690Overall Length (mm): 17.53
