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- Blackline Safety Corp.
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G7 Connected Safety Devices
Our G7 product line incorporates leading incident detection and advanced location technology with 3G and satellite communications to ensure seamless monitoring. From gas detection to lone worker monitoring and evacuation management, G7 has your teams covered.
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Thermal Characterization Testing Services
Thermal Engineering Associates, Inc.
Thermal Characterization - TEA offers this service to customers having need for precise thermal parameter values for product data sheets, purchase specifications, specific application configurations, and/or device comparisons. This service is offered for a wide range of Discrete Devices (i.e., Bipolar Junction Transistors, MOSFETs, IGBTs, Diodes, SCRs, Triacs) and Integrated Circuits (i.e., digital, linear and mixed-signal devices).
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NED-LMD Near-Eye Display Measurement Systems
NED-LMD WG Series
Gamma Scientific is introducing the NED-LMD Waveguide Tester as the world’s first specialized near-eye display measurement system that mimics human visual perception for fast, accurate and repeatable characterization of next generation optical waveguide-based Augmented/Mixed Reality displays and display components (light engine, waveguide, etc.). This comprehensive offering features a ‘robotic eye’ to help device manufacturers predict how the human eye would perceive their AR/MR displays, quantifying end user experience mapping the entire display field of view.
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PXIe-4142, 4-Channel, ±24 V, 150 mA PXI Source Measure Unit
782430-01
PXIe, 4-Channel, ±24 V, 150 mA PXI Source Measure Unit - The PXIe-4142 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4142 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules.
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Photonics Test Solutions
Chroma offers precision instruments such as laser drivers, photodetector monitoring, and temperature controllers. These lab class instruments are often intefrated into production solutions for wafer probe test, burn-in and device or module characterization with inspection, metrology, robotics, Industry 4.0 and more.
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Device Characterization
Probe systems for device characterization must be particularly flexible because many different measurements often must be performed; DC, IV/CV, Capacitance, HF, 1/f, temperature and more. The modular architecture of the PS4L product line is ideal for these broad requirements.
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PXI-5651, 3.3 GHz RF Signal Generator
779670-01
3.3 GHz PXI RF Analog Signal Generator—The PXI‑5651 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXI‑5651 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
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Compact Tunable Laser Source with Continuous Sweep Mode, 1520nm to 1630nm
81940A
Keysight's 81940A high power compact tunable lasers enables optical device characterization at high power levels and measurement of nonlinear effects. It's improves the testing of all types of optical amplifiers and other active components as well as broadband passive optical components. As single slot plug-in modules for Keysight's 8163A/B, 8164A/B and 8166A/B mainframes, they are a flexible and cost effective stimulus for single channel and DWDM test applications. Each module covers a total wavelength range of 110 nm in the C+L-band.
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PXIe-6547, 100 MHz, 32-Channel PXI Express PXI Digital Waveform Instrument
781011-02
PXIe, 100 MHz, 32-Channel PXI Express PXI Digital Waveform Instrument—The PXIe‑6547 is a digital waveform generator and analyzer for interfacing and basic characterization test with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 100 MHz and interfacing with user-programmable voltage levels that have a 100 mV resolution. The PXI‑6547 also features advanced synchronization capabilities for building integrated mixed-signal test systems, hardware comparison for bit-error test, and per-bank digital timing features.
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Automated Compliance and Device Characterization Tests
N5990A
The Keysight N5990A test automation software platform is the most powerful tool for serial and multi-lane gigabit testing. It is the unique universal platform for testing a wide range of digital buses such as PCI Express, USB, HDMI or MIPI. The same graphical user interface and operating principles are used for all applications. This boosts productivity, especially when testing devices which support multiple digital buses. The N5990A can be tailored to your individual test needs with the flexible test sequenzer and controls all instruments needed for your tests. The configurable database interface of the N5990A test automation platform enables the convenient storage of all test results. A web interface allows an effective and easy operation. Custom calibration and test procedures can be implemented easily with User Programming.
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ULTRA Test Cells
The ULTRA Series of high performance MEMS handling, stimulus and test cells provides unparalled flexibility and capability for engineering development, characterization or high volume production test of inertial MEMS (accelerometer, gyroscope) semiconductor devices.
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PXIe-4144, 4-Channel, ±6 V, 500 mA PXI Source Measure Unit
782432-01
PXIe, 4-Channel, ±6 V, 500 mA PXI Source Measure Unit - The PXIe-4144 is a 4-channel source measure unit (SMU) ideal for high-pin-count applications. It features 4-quadrant operation, and each channel has integrated remote (4-wire) sensing for accurate measurements. The fast sample rate of the PXIe-4144 can reduce measurement times, capture transient device characteristics, and allow quick I V characterization of devices under test (DUTs). With a high-speed sequencing engine, you can synchronize all these SMUs with each other or with other instruments such as switches or high-speed digital test modules.
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PNA-L Microwave Network Analyzer
N5235B
Perform basic analysis of passive components and simple active devices Measure S-parameters with good accuracy up to50 GHz in cost-sensitive applications Get the world's best price-to-performance ratio for microwave manufacturing Configure an economical solution for signal-integrity measurements and materials characterization Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Transmission Line Pulse Testing
Transmission Line Pulse testing, or TLP testing, is a method for semiconductor characterization of Electrostatic Discharge (ESD) protection structures. In the Transmission Line Pulse test, high current pulses are applied to the pin under test (PUT) at successively higher levels through a coaxial cable of specified length. The applied pulses are of a current amplitude and duration representative of the Human Body Model (HBM) event (or a Charged Device Model – CDM – event in the case of Very Fast TLP, or VF-TLP).
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PXIe-5651, 3.3 GHz RF Signal Generator
PXIe-5651 / 781216-01
PXIe, 3.3 GHz, PXI RF Analog Signal Generator—The PXIe‑5651 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXIe‑5651 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.
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EasyEXPERT Group+ Software (for B150x Mainframe)
Keysight EasyEXPERT group+ GUI based characterization software is available for Keysight Precision Current-Voltage Analyzer Series. It is available on your PC or the B150xA's embedded Windows 7 platform with 15-inch touch screen to accelerate the characterization tasks. It supports efficient and repeatable device characterization in the entire characterization process from measurement setup and execution to analysis and data management either interactive manual operation or automation across a wafer in conjunction with a semiautomatic wafer prober. EasyEXPERT group+ makes it easy to perform complex device characterization immediately with the ready-to-use measurements (application tests) furnished, and allows you the option of storing test condition and measurement data automatically after each measurement in a unique built-in database (workspace), ensuring that valuable information is not lost and that measurements can be repeated at a later date. Keysight Precision Current-Voltage Analyzer Series provides the complete solution for device characterization with these versatile capabilities.
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Automated Tuners / Impedance Tuners / Load Pull Tuners
MT97x, MT98x and XT98x series automated tuners (also known as automated impedance tuners and automated load pull tuners) are precision instruments that are optimized for a broad class of in-fixture and on-wafer applications, and may be used in any automated or manual application requiring the ability to match the impedance of a microwave circuit element or to establish specific impedances at a terminal interface. The tuner design is based on the slide screw concept using the inherently broadband slab-line transmission structure. Each unit has two non-contacting probes deliver high VSWR with superb accuracy and reliability over a wide frequency range. These probes can be fully retracted leaving a low-loss, well-matched transmission line, which is a significant benefit in power related applications where two-port tuners capable of handling large amounts of power are required. As integral components of Maury Device Characterization Solutions, these PC-based tuners are controlled using Maury's family of Device Characterization Software tools, including MT930 IVCAD, MT993 ATS and the DLL-based measurement automation environment. Maury Microwave automed impedance tuners are ideal for load pull, harmonic load pull, active load pull, hybrid active load pull, noise figure, noise parameters and all automated tuner applications.
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PXIe-4135, PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit
783762-02
PXIe, ±200 V, ±1 A DC, ±3 A Pulsed, Up to 40 W DC, 10 fA Precision System PXI Source Measure Unit - The PXIe-4135 is a high-precision, system source measure unit (SMU). It features 4-quadrant operation and sources up to 40 W of DC power and can pulse up to 500 W. Analog-to-digital converter technology and native triaxial connectors help you perform high-precision measurements with a current resolution of 10 fA or high-speed acquisitions up to 1.8 MS/s. The module also can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4135 is ideal for a broad range of applications including manufacturing test, board-level test, and lab characterization with devices such as ICs, power management ICs (PMICs), and RFICs and discrete devices including LEDs and optical transceivers.
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Broadband VNA Operation To 170 GHz
S93300B
Configure a 170 GHz broadband vector network analyzer (VNA) for on-wafer device characterization of emerging 5G and 6G MMICs.
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Semiconductor Device Parameter Analyzer/Semiconductor Characterization System Mainframe
B1500A
Current-voltage (IV) measurement capabilities of spot, sweep, sampling and pulse measurement in the range of 0.1 fA - 1 A / 0.5 V - 200 VAC capacitance measurement in multi frequency from 1 kHz to 5 MHz and Quasi-Static Capacitance-Voltage (QS-CV) measurement capabilitiesAdvanced pulsed IV and ultra-fast IV measurement capability from minimum 5 ns sampling interval (200 MSa/s)Up to 40 V high voltage pulse forcing for non-volatile memory evaluation
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Pulse Pattern Generator, 3.35 GHz, dual-channel
81134A
When timing and performance requirements are critical, for example in high-speed serial bus applications like PCI Express or Serial ATA, its fast rise times and low intrinsic jitter allow the precise and in-depth characterization of devices, e.g. receivers or backplanes. On top of that, it allows to generate application-specific signal levels like pre- and de-emphasis (PCI Express) or squelch (Serial ATA). The Keysight 81134A lets you test your DUT instead of the pulse or data source!
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PNA-X Microwave Network Analyzer
N5241A
Reach for unrivaled excellence in your measurements and designs Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the worlds widest range of single-connection measurement applications Test linear and nonlinear device characterization more accurately with the world's best PNA-X Every spec verified, adjustments included Lock in support & peak performance from the start
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PNA-X Microwave Network Analyzer, 43.5 GHz
N5244B
Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Accurately test linear and nonlinear device characterization using advanced error correction Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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PathWave BenchVue Electronic Load App
BV0012B
Easily control your dynamic electronic loads, build automated tests and visualize measurements over time for better device characterization.
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Parametric Curve Tracer Configurations
Keithley PCT
Developing and using MOSFETS, IGBTs, diodes and other high power devices requires comprehensive device-level characterization such as breakdown voltage, on-state current and capacitance measurements. Keithley's line of high power Parametric Curve Tracer configurations supports the full spectrum of device types and test parameters. Keithley's Parametric Curve Tracer configurations include everything necessary for the characterization engineer to develop a complete test system quickly.
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ThermalAir Series Temperature Forcing System
ThermalAir TA-1000B Rack Mount Test System
The ThermalAir TA-1000B high capacity thermal air stream system is used for temperature testing, fast thermal cycling, and device temperature characterization of components, hybrids, modules, PCBs, and other electronic and non-electronic assemblies at precise temperature from -25°C to +200°C.
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Bit Error Ratio Testers
M8000 Series
Simplified time-efficient testing is essential when you are developing next-generation computer, consumer, or communication devices. The Keysight M8000 Series is the highly integrated BER test solution for physical layer characterization, validation, and compliance testing. With support for a wide range of data rates and standards, the M8000 Series provides accurate, reliable results that accelerate your insight into the performance margins of high-speed digital devices.
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PNA-L Microwave Network Analyzer
N5232B
Perform basic analysis of passive components and simple active devices Measure S-parameters with good accuracy up to20 GHz in cost-sensitive applications Get the world's best price-to-performance ratio for microwave manufacturing Configure an economical solution for signal-integrity measurements and materials characterization Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Low-leakage Switch Matrix Family
Conducting all the parametric measurements necessary for the numerous test structures on a semiconductor wafer can be a time-consuming and expensive process. With the cost of end-user devices continuing to drop, even laboratory characterization environments must reduce the cost of test. Until now engineers and scientists working on current and future semiconductor process technologies were faced with a difficult choice: either use a semiconductor parameter analyzer with positioners on a wafer prober, which limits the ability to perform automated test, or use a switching matrix and probe card, which reduced the analyzer's measurement resolution. Utilizing a switching matrix with a semi-automatic or fully-automatic wafer prober enables characterization tests to be automated, eliminating the need to have an operator manually reposition the probes each time a new module needs to be tested. This reduces both test time and cost. Due to the many price/performance points available, Keysight's switching matrix solutions provide the flexibility to choose exactly what your testing needs require, without overspending.
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Broadband VNA Operation To 220 GHz
S93301B
Configure a 220 GHz broadband vector network analyzer (VNA) for on-wafer device characterization of emerging 5G and 6G MMICs
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Digital Pattern Generators
DPG
Active Technologies Digital Pattern Generators also known as DPG, allow digital stimuli generation to stimulate digital designs, providing the capability to emulate standard serial or parallel bus transactions or custom digital interfaces, for system or device debugging and characterization.
