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Plastic Optical Fiber Preform Analyzer
2600
The unique vertical design of the 2600 Preform Analyzer gives manufacturers of GIPOF the ability to perform completely automated analysis. Its' automated axial (longitudinal) and radial preform positioning facilitates rapid and precise analysis of the entire preform structure. From the acquired index profile, the 2600 is able to calculate geometry metrics such as preform core diameter, outside diameter and core/clad concentricity.
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3D Roughness Measurement System
IF-Profiler
The If-Profiler is a handheld 3D roughness measurement system for high resolution measurement of surface finish. You measure roughness of flat and curved components with only one system. Measurements are performed both profile based (ISO 4287) and areal based (ISO 25178). The measurement system achieves flexible measurements and applications at high measurement speed. Various positions and measurement fields are traceably and intuitively measured. The IF-Profiler is also used to measure geometries with steep flanks and various coatings.
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High Power LED Test System
Lumere-GM
Evolusys Technologies Sdn. Bhd.
Lumere GM is a LED test and measurement system for various parameters of LED light. It is a high-accuracy system with a temperature-controlled CCD, its geometry conforms with CIE-Publication 127, and the test program is easy to configure and adjust. The Lumere GM is used in laboratory applications and in the production of high-power LEDs.
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Wall Thickness Measurement Gauges
ElektroPhysik Dr. Steingroever GmbH & Co. KG
Portable wall thickness measuring device for non-destructive measurement of up to 24 mm. Thickness measurement of all non-magnetic materials such as glass, synthetic materials, stainless steel and composites; can also be used for objects with complex geometries.
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CMM (Coordinate Measuring Machine) Solutions
A device that measures the geometry of physical objects by sensing discrete points on the surface of the object with a probe.
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Non-Destructive Testing
The essential feature of active thermography is the targeted supply of energy to the test object. A temporal and spatial characteristic heat flow results depending on the geometry and thermal properties of the test subjects. Its progression on the surface of the test object is captured by a thermographic camera.
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Integrating Sphere Solutions
An integrating sphere is a light collector which takes advantage of physical geometry to homogenize any radiation being emitted inside by relying on a high-reflectance coating material. Depending on the wavelength range the end user using a sphere with, different coatings have different advantages based on the application.
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3D Scanner
Artec Eva Lite
Eva Lite is the budget version of the bestselling white light Artec Eva 3D scanner. It features the same accuracy specs, but with reduced functionality: Eva Lite has geometry only tracking and capture. As a result, this affordable 3D scanner can be used for making high quality textureless 3D scans when scanning geometrically rich objects, such as the human body.
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Non-Destructive Subsurface Layer Profiling
NMR-Mouse one-sided NMR
The unique, powerful Profile NMR-MOUSE® probe works hand-in-hand with the Kea2 spectrometer. The Profile NMR-MOUSE is a portable, open NMR sensor equipped with a novel permanent magnet geometry that generates a flat sensitive volume parallel to the scanner surface. The system can measure *Proton density as a function of depth *T2 NMR relaxation times *T1 NMR relaxation times *Self-Diffusion coefficient of liquids
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Passive Probe, 500 MHz, 2.5mm Tip
PP007-WR-1
The PP007 embodies leading technology in passive probe design. The small probe is optimized for maximum waveform fidelity, including high frequency signal components, in a rugged probe suitable for every day.The sharp probe tip* is spring loaded, allowing it to retract into the narrow probe head. The tip does not slip off the object being probed—important when probing small geometry surface-mounted components. Probing dense circuits is easier with the small 2.5 mm ground sleeve, which provides much better visibility than 5 mm and 3.5 mm probes.
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Premium Spectral Light Meter
GL SPECTIS 1.0 TOUCH
The Spectis 1.0 Touch handheld light meter offers unmatched performance and flexibility. With an interchangeable detector, the system can be used for wide range of applications and measurement geometries. Use in the field, the lab or both!
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ReMesh
ReMesh is the CAD program, which provides powerful tools for geometry creating, checking and editing. Program has tools to remesh discretely or semi-analytically specified geometry in 3D and has convenient interface for editing geometry manually. Problems with remeshing of such geometries arise in EMC simulations.
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Turret Kelvin Test Contactor
cHybrid
cHybrid™ Kelvin contactor contains a new and unique contact spring architecture which allows the test socket to adapt to challenging IC pad geometry requirements of todays and future small package types. Great lifetime up to 3 million touchdowns, with best-in-class contact resistance repeatability reduces cost of test significantly. A multi-beam contact structure optimizes signal integrity and current capability according to challenging electrical test requirements.cHybrid Kelvin contactor with multi-beam contact spring architecture delivers improved yield and long life minimizing cleaning cycles. This innovative solution will help customers reduce cost and maximize productivity.
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Linear Strain Gauges
Linear Pattern Strain Gages are the most straightforward geometry of strain gauge, designed to indicate strain in only a single direction.
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÷10 HiZ 500 MHz Passive Probe for WaveSufer 400 Series Oscilloscopes.
PP007-WS-1
The PP007 embodies leading technology in passive probe design. The small probe is optimized for maximum waveform fidelity, including high frequency signal components, in a rugged probe suitable for every day.The sharp probe tip* is spring loaded, allowing it to retract into the narrow probe head. The tip does not slip off the object being probed—important when probing small geometry surface-mounted components. Probing dense circuits is easier with the small 2.5 mm ground sleeve, which provides much better visibility than 5 mm and 3.5 mm probes.
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PAL Standard Pattern Generator
PG315P
The MicroImage PG315 pattern generator is designed for simple size and geometry reference applications. The PG315 will overlay one of five standard patterns including a centered cross line, a centered cross hair, a centered target style symbol, a dot grid (cross dot) array, a hatch grid (crosshatch) array.
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Substrate Manufacturing
KLA’s substrate manufacturing portfolio includes defect inspection and review, metrology and data management systems that help substrate manufacturers manage quality throughout the wafer fabrication process. Specialized wafer inspection and review tools assess wafer surface quality and detect, count and bin defects during production and as a critical part of outgoing wafer qualification. Wafer geometry systems ensure the wafer shape is extremely flat and uniform in thickness, with precisely controlled wafer shape topography. Data analysis and management systems proactively identify substrate fabrication process excursions that can lead to yield loss. KLA’s substrate manufacturing systems support process development, production monitoring and final quality check of a broad range of substrate types and sizes including silicon, prime silicon, SOI, sapphire, glass, GaAs, SiC, GaN, InP, GaSb, Ge, LiTaO3, LiNBO3, and epitaxial wafers.
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Helmholtz Coils
Helmholtz-Coils are especially designed to generate precisely defined magnetic fields from DC to the upper end of the audio frequency range and beyond. The generated fields are in a strongly linear relation to the coil current. The field- strength can be calculated exactly by analytical (or numerical) methods, based on the coils' geometry, the number of turns and the coil current.
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Day Camera Testing
CI Systems' CCD test stations are used to carry out all the necessary tests to verify and compare the quality of a CCD based camera. These stations are based on CI Systems' reflective collimators, Visible Radiation Sources, special targets and integrated software, to project standard patterns with known geometry and intensity to the Unit Under Test. As a result, these stations are turnkey solutions for the CCD camera testing needs.
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Torque Sensors
In universities and industry, for basic research or quality assurance: Kistler torque sensors guarantee precise definition of the power and friction values of drives, transmissions and pumps. Strain gage technology (DMS) is a powerful solution for measurements on rotating shafts, and also for long-term dynamic and static measurements. Maximum precision, the most rigid structure possible and high temperature stability: thanks to these assets, DMS sensors can accomplish the most demanding tasks. Piezoelectric reaction torque sensors offer convincing features such as exceptional overload protection, high signal resolution and a wide frequency range. They are ideal for measurement tasks when conditions are difficult due to geometry, temperature range or dynamics.
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Thin Film Analyser
TFA
The TFA instrument has be designed to monitor dissolution rates with a minimal volume of developer, typically ≤ 1 ml. The design uses surface tension to hold the developer in a small gap between the sample and the detector head. The instrument allows multiple measurements on the same sample. Thickness measurement can be made in the same geometry as dissolution measurements.
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TDR Structural Health Monitoring
Material Sensing & Instrumentation
MSI Time-Domain-Reflectometry (TDR) Structural-Health Monitoring probes the structural health of a composite part by propagating a fast electrical pulse along a distributed linear sensor which has been fabricated directly in the laminate. The sensor is formed from the native graphite fibers already used in composite manufacture, and constitutes zero defect. Fibers are patterned into a microwave waveguide geometry, or transmission line, and interrogated by a rapid pulse as shown below. Structural faults along the line cause distortions in waveguide geometry, producing reflected pulses similar to radar. Cracking, delamination, disbonds, moisture penetration, marcelling, and strain are all detected by propagation delay, for sensor lengths up to several meters.
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Fiber Test & Measurement
Thorlabs manufactures a range of devices for testing and measuring the performance of optical fiber. Power, spectral signature, polarization, or end face surface geometry can by characterized with out-of-the-box solutions from our catalog. EO modulators, optical switches, and light sources are available to treat light being used on a test bed.
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Probe Card Analyzers
PB6500
The Probilt PB6500 has many features that make it the ideal analyzer for all probe card technologies, including the latest probe tip geometries being used to test leading edge semiconductor devices. Its excellent electrical measurement capability and the ability to drive relays on any channel make it the best tool for probe cards with complex circuits and relays on the PCB.
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Human Radiation Spectrometers
Human radiation spectrometer is designed for express control and measurement of the activity of 137 Cs and 134 Cs gamma-emitting radionuclides in the human body, as well as for assessing the internal radiation dose (“sitting in a chair” geometry).
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Low Temperature Operating Life (LTOL) Test
LTOL
LTOL is being more used more and more frequently by manufacturers of low geometry devices as part of the qualification process, and in order to gain more failure data, a greater understanding of different failure modes of the device at low temperature, and to enable more complete reliability estimations. As device geometries decrease and frequencies become higher, Hot Carrier Injection (HCI) increases and the resulting degradation causes the deterioration of device characteristics and ultimately leads to failure.
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Rotman Lens Designer
Rotman Lens Designer (RLD) is a software tool for the design, synthesis, and analysis of Rotman Lenses and their variants. It is based on Geometrical Optics combined with the classical Rotman Lens design equations. It is intended for rapid development and analysis of Rotman Lenses given several physical and electrical input parameters. RLD generates the proper lens contours, transmission line geometry, absorptive port (dummy port) geometry, provides an approximate analysis of performance, and generates geometry files for import into Remcom's XFdtd® for further analysis and fabrication.
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High Precision Angular Position, Calibration and Geometry Inspection
GeoOrdinate
Rotary Precision Instruments UK Ltd
Ultra precise rotary tables intended for fine inspection, metrology and test applications.The GeoOrdinate has been designed specifically for the inspection of large and heavy components and is fully compatible with any shop floor environment whilst maintaining world class accuracies more commonly seen in the standards laboratory.
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PV-IV Solutions
We offer a broad range of PV IV Measurement systems for measuring solar cells from 3 mm to 300 x 300 mm. The wide range of solar simulators, vacuum chuck test stations, and electronic loads make it impossible to list “standard solutions” Most systems are put together for individual customer needs based on cell type and contact geometry of the devices being tested. Over the last several years we have designed and manufactured a wide range test solutions for many different types of cells and contact geometries. In most cases a customized solution is no more than a slight customization of a standard platform that has been previously designed.
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WATOM
Wafer edge and notch profile measurementThe use of smaller and smaller patterns in the semiconductor industry calls for increasingly advanced materials of extremely high quality. In response to the steady improvements in the quality of wafers, KoCoS Automation has developed WATOM, a wafer edge and notch profile measurement tool which heralds a new era of extremely precise wafer geometry measurement.WATOM supports quality assurance throughout the wafer manufacturing process, starting at the very beginning and continuing on through to wafer reclaim.The WATOM Edge and Notch Wafer Geometry Analyser sets the worldwide benchmark for the quality assurance of geometrical measurements in semiconductor wafer manufacturing, combining the highest quality standards with top-class service. These high-precision, laser-based edge profile measurement tools are specially designed for optimum integration in manufacturing lines within the semiconductor industry.
