Defect
other than specified, imperfection .
-
Product
Counterfeit Defect Coverage Tool
-
The SAE Counterfeit Defect Coverage Tool is a dynamic, web-based application that supplements SAE Standard AS6171 authored by the SAE G-19A Test Laboratory Standards Development Committee. It provides potential test sequences for the identification of counterfeit electrical, electronic, and electromechanical (EEE) parts along a range of risk levels and EEE part types. Allowing users to compare alternative test sequences as a function of resources needed to implement those tests, the SAE CDC Tool is appropriate for those ordering counterfeit detection tests as well as those performing the tests.
-
Product
Defect Inspection System
NovusEdge
-
The NovusEdge System provides high sensitivity inspection for the edge and backside of bare unpatterned wafers for current and advanced nodes. Multiple modules can be configured on the same automation platform for increased throughput while maintaining a small footprint for an improved cost of ownership.
-
Product
Pipeline Defect Mapper
-
The non-intrusive measuring device takes measurements along the pipeline and plots the results directly onto the screen of the receiver. There is no need to carry extra logging and display devices. All the data is displayed and logged into the receiver for downloading to a spreadsheet or dedicated analysis program.
-
Product
Semiconductor Wafer Defect Inspection Management Software
ProcessGuard
-
Microtronic ProcessGUARD Software is the desktop client for the EagleView auto macro wafer defect inspection system. ProcessGUARD is a high volume, high speed semiconductor wafer defect inspection management solution that provides an easy-to-use, customizable and extensible platform and interface to automate your fabs defect inspection process. ProcessGUARD is feature rich (see below) and its newest releases include complete wafer randomization software, a user-defined defect library, and an integrated trainer and knowledge base.
-
Product
Surface Defect Inspection System
-
Wafer for inspection of surface condition of specular flat substrate, glass substrate, others φ 100 ~ φ 300 compatible
-
Product
Defect Inspection System
F30
-
The F30 System boasts a five-objective turret that enables the resolution-throughput flexibility required by today’s multi-process inspection applications. Equipped with an advanced productivity suite (waferless recipe creation, simultaneous FOUP, recipe server and tool matching), the F30 System redefines inspection cost of ownership expectations.
-
Product
Transistor-Level Defect Simulator
Tessent DefectSim
-
Tessent DefectSim is a transistor-level defect simulator for analog, mixed-signal (AMS), and non-scan digital circuits. It measures defect coverage and defect tolerance. Tessent DefectSim is perfect for both high-volume and high-reliability ICs. Tessent DefectSim replaces manual test coverage assessment in AMS circuits needed to meet quality standards such as ISO 26262 and provides objective data to guide improvements in DFT. Tessent DefectSim dramatically reduces SPICE simulation time compared to simulating every potential defect.
-
Product
NUV-PL SiC Defect Inspection System
VS6845E
-
Industrial Vision Technology Pte Ltd.
Comply with IEC63068-3 Standard: Test method for defects using photoluminescence, Model VS-6845 SiC Wafer defect inspection system has capability on Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices.
-
Product
Auto Macro Wafer Defect Inspection
EagleView
-
EagleView automated macro defect semiconductor wafer inspection system provides industry leading throughput, defect detection accuracy, and wafer classification for semiconductor manufacturing. EagleView systems have inspected over 100 million semiconductor wafers worldwide. The EagleView macro defect inspection tool resolves many of the problems and pitfalls of manual and micro wafer inspection by automating and standardizing semiconductor wafer inspection processes while creating complete images of every wafer in the cassette. Unlike manual micro defect wafer inspection, EagleView’s automated wafer inspection is always consistent, tireless, reliable, and fast. EagleView helps find macro defects while there’s still time to take corrective action.
-
Product
Translating process images into significant tool-defect reduction
Trans-Imager
-
Real-time, tool-specific defectivity data. Now there is a way to monitor defectivity on individual processing tools – automatically – in real-time. Microtronic’s new Trans-Imager software module is able to take high-resolution images directly from your processing equipment and immediately detect and displaymacro wafer defects – transferring all of that information into our powerful and long-proven ProcessGuard software which provides a wealth of defect management and analysis. This new capability is called ProcessGuard Xtensis (PGX) because it extends the power of ProcessGuard software to fab tools that previously had no way to detect defects. This provides an important new stream of defect data.
-
Product
Defect Isolation
-
*Traverse through the physical design to trace nets and vias down to the defect location*Utilizes industry standard LEF/DEF design files, scan-based test information, tester fail logs and diagnostic reports to determine and isolate the physical defect location*Enables the user to leverage their diagnostic experience to determine the root cause of the defect*Interactive layout viewer displays scan chains, mapped mismatches of scan cells, layers, nets and subnets with search capabilities(component, net, cell)*Physical XY coordinates are always displayed for components and nets to guide the user through the design to quickly identify suspect sites for FA using techniques like Emission, OBIRCH, LIVA, TIVA, or FIB
-
Product
TO-CAN Package Inspection System
7925
System
Chroma 7925 is an automatic inspection system for TO-CAN package. The appearance defects over 30 um like lens scratch, partial are clearly conspicuous by using advanced illumination technology. Because the height variation of tray and package exists, Chroma 7925 can calculate the focus distance and compensate to overcome the variation with auto focus function.
-
Product
PocketDetect LRM
PD-01LM
-
Hachmann Innovative Elektronik
With a PocketDetect LRM you have a highly specialized, miniaturized and easy-going voltage detector at your fingertips. A thorough self-test ensures reliable function. A permanently enabled interface-tester warns against defect interfaces or residual voltages, while the low-power long-term display mode secures live working. The PocketDetect can be carried along due to its diminutive dimensions and lightweight (e.g. in the optional available belt case).
-
Product
Moisture Meters
-
Moisture can be found in any material. Even materials considered to be dry have a minor amount of moisture. An imbalance of moisture, whether it be excessive moisture or too little moisture, can cause problems ranging from undesired mold and bacteria growth to cracks and defects. To avoid a moisture imbalance, it is essential to monitor moisture content with a moisture meter that returns accurate and reliable measuring results. A moisture meter can measure the moisture content of everything from the air (relative humidity) to construction and building materials (concrete, wood) to biomass and agricultural products (hay, straw, grain, corn, beans, pellets) to solid waste (pulp, slurry) and beyond. Many moisture meter devices can also measure temperature. The moisture measurement range of each moisture meter varies depending on the model. Some moisture meter products take moisture measurements, store the moisture measurement data to an internal memory or SD cad, and allow the stored moisture measurement data to be transferred to a computer for detailed analysis by means of an evaluation software. PCE Instruments' moisture meter products come factory calibrated. ISO calibration certificates are available optionally for purchase as accessories to most moisture meter models. An ISO calibration certificate may be important to your company in meeting specific quality standards.
-
Product
E-beam Metrology And Inspection
-
Our HMI e-beam solutions help to locate and analyze individual chip defects amid millions of printed patterns.
-
Product
Food Quality Analyzer
Hydra F100 BQ
-
The Hydra is a kiosk like machine with a touchscreen that is installed at a food processing facility. Instead of inspectors manually selecting and inspecting samples, whole trays of samples can now be inserted into the machine to be assessed at once. The Hydra has cameras above and below the fruit to capture images of this bulk sample, which is sent to AgShift’s cloud platform to analyze it for weight, size, color and to check for defects like mold or bruising.
-
Product
DI Lab System™
-
Comprehensive Product Engineering and Failure Analysis Lab system for complete device analysis and physical defect isolation.
-
Product
Ultrasonic Flaw Detector
MFD350B
-
Based on ultrasonic principle, digital ultrasonic flaw detector MFD350B with 320*240 TFT LCD, it can test, orient, evaluate and diagnose various flaws such as crack, lard, air hole in workpiece’s interior swiftly and accurately without any destruction. It can be used in Laboratory as well as in engineering filed. With range of 0-6000mm, it can meet the requirement for general defect inspection in manufacturing industry, metallurgical industry, metal processing industry, chemical industry and so on. Low power design with large capacity and high performance lithium battery module, it can be long standby for months. High quality with low price, it is the first choice for the practical economic model for ultrasonic testing equipment.
-
Product
Power Capacitor
POLB HD 7%
-
Lifasa - International Capacitors, SA
They are self-regenerating condensers with low loss polypropylene dielectric, filled with N2 inert gas mainly, or with resin, and with overpressure disconnection system, which offers a high level of safety against defects, when cutting the 3 phases in case of action.
-
Product
DM 150-Watt Transmitter
Loc-150Tx
-
The Loc-150Tx, 150-Watt DM Transmitter is used primarily with the Defect Mapper (DM) Receiver, however it is also useful for those needing a low frequency, high output transmitter. Typically, the Loc-150Tx, transmitter (DM transmitter) is used to apply a signal current to the anode bed. The pipeline returns the signal via coating faults back to the transmitter. The Loc-150Tx transmitter is designed to be powered from CP (Cathodic Protection) stations, AC or external batteries, eliminating the need for internal batteries. This transmitter has a direct connection mode to apply the locate frequency onto the conductor. There is no clamp or induction mode.
-
Product
Line Scan Vision System
In-Sight 9902L
-
The In-Sight 9902L 2K line scan smart camera is a high resolution self-contained vision system ideal for detailed inspections of large, cylindrical, or continuously moving objects. The 9902L acquires up to 16,000 lines of 2,000 pixels per line to produce a 32MP image that can used to detect even the smallest features and defects. Each pixel line is acquired at 67,000 lines per second to keep up with the fastest production lines. This standalone vision system only requires a small view of the target part, making it an ideal choice for installations with restrictive field of view or mounting space requirements.
-
Product
Code Verification Systems for Quality Inspection
-
Matrix codes enable the comprehensive and seamless traceability of goods, which turns out as significant advantage considering everyday product recalls across all industries. Whether salmonella in food, contaminated cosmetics or poor components: defective products can harm consumers, cause losses of image as well as massive economic losses. Using the 2D code, each individual article can be localized globally. Based on the specific serial number, producers and consumers can clearly identify articles if required. That represents a perfect tool for determining whether the article is subject to be withdrawn from circulation. The proper application and specification of 2D code contents allows for serious and sustainable companies to limit recalls, save costs, and to take responsibility for consumer protection.
-
Product
Scanning Electron Microscope
E5620
-
The E5620 is a MASK DR-SEM(∗) product for reviewing and classifying ultra-small defects in photomasks and mask blanks. It implements Advantest’s highly stable image capture technology to easily import defect location data from mask inspection systems and automatically image the locations. Compared to the E5610, our predecessor DR-SEM system, the E5620 features a number of improvements designed specifically to target mask requirements for extreme ultraviolet (EUV) lithography.
-
Product
Halt Hass Chambers
-
HALT and HASS chambers from WEIBER provide extreme temperature & vibration capabilities used during the product design and manufacturing cycles to compress the time normally required to identify design and process weaknesses. HALT techniques are important in uncovering many of the weak links inherent to the design and fabrication process of a new product. HASS techniques are incorporated during the production phase to find manufacturing process defects that could cause product failures in the field.
-
Product
Wafer & Die Inspection
-
SemiProbe wafer inspection system (WIS) examines, locates and identifies defects created during wafer manufacturing, probing, bumping, dicing or general handling. This provides microelectronic device manufacturers with accurate, timely quality assurance and process information. The WIS has single sided and double sided wafer mapping capabilities and can improve efficiency, reduce manufacturing costs, increase yields and shorten time to market.
-
Product
Pre-reflow AOI
Zenith LiTE
-
Minimizes Shadow Problems with 4way projectionEasy Programming with parametric approachReal time defect diagnosis and root cause removalrortified 2D features using 9 channel RGB lights100% 3D measurement inspection.
-
Product
Solar Cell PL/EL/IV 3-in-1 Testing System
VS6841
-
Industrial Vision Technology Pte Ltd.
This luminescence Analyzer integrates a Photoluminescence (PL), Electroluminescence (EL) , and I-V Measurement Technology, has a Device’s PL image, EL image, as well Device’s I-V characteristics in One system. It is being using to quantitatively map Minority-Carrier Lifetime, and to characterize the defect of silicon wafer & solar wafer, and measure the key parameters from solar cell I-V Curve. It is also a useful tool for scientist to develop other methodology & parameters that can be used as a promising technique for online material monitoring and process control.
-
Product
Agile Application Performance & Security Resilience Test Tool
Developer
-
Keysight Network Applications and Security
Ixia Developer is an agile application performance and security resilience test tool that helps developers find bugs early in the development cycle. Ixia Developer features an integrated debugger that helps locate the primary source of defects. An easy-to-use, fast, and responsive web-based user interface significantly reduces the time it takes to move from test configuration to actual packets on the network. And by leveraging a robust ATI engine, Ixia Developer always includes the most up-to-date apps and security strikes.
-
Product
Quick Change Probes For Weld Seam Testing (ASTM)
SONOSCAN Q
-
In addition to angle beam probes according to european standards (EN), we offer probes with quick-change wedges for ultrasonic weld seam inspection as well as various wedges for the american market. Quick-change probes are used wherever access to the inspection object is difficult to reach with the larger AWS transducers. The relatively small, round elements also offer better defect resolution.
-
Product
Holiday Detectors
-
Holiday Detectors are devices used to minimize the effects of corrosion by detecting the presence of “holidays” or “defects” in non-conductive coatings.
