Product

Zero Bias Schottky Detectors

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Fairview Microwave Inc.

Fairview Microwave Inc.

Fairview Microwave’s line of coaxial packaged zero bias Schottky detectors feature matched inputs for excellent VSWR, voltage sensitivity levels that range from 100 to 500 mV/mW for small signal detection, negative video output polarity, and can withstand maximum input power levels up to +20 dBm CW. Operating temperature range covers 0°C to +90°C and storage temperature of -65°C to +125°C. These zero bias Schottky detectors utilize compact cylindrical package outlines that are made of passivated stainless steel and offer a variety of popular input/output SMA and BNC connector configurations that make them ideal for use with precision test and measurement, instrumentation, and subsystems assemblies. Numerous applications include power measurement, leveling pulsed signal sources, AM noise measurements, radar or missile guidance systems, monitoring system level performance, and pulsed RF measurements.

Product

Bias Tees

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Kuhne electronic GmbH

Kuhne electronic GmbH

A bias tee is a three-port network used for setting the DC bias point of some electronic components without disturbing other components. The bias tee is a diplexer.

Product

DC Current Bias Supply

DC1000A

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Voltech

DC1000A - Voltech

To guarantee the quality and performance of inductive components such as inductors, chokes and transformers they are tested at their real-life operating point. If the inductor is designed to carry a DC current, then its inductance must be measured with that DC current present. Until now, these measurements were made by an LCR meter connected via special interfacing to a DC bias supply available only from the manufacturer of the LCR meter. The unique NEW DC1000A can be used with any precision LCR meter and connects simply into existing test fixturing.

Product

Schottky Zero Bias Detectors

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Pasternack Enterprises, Inc.

Pasternack Enterprises, Inc.

Schottky Zero Bias Detectors from Pasternack

Product

Bias Networks

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Macom Technology Solutions Holdings Inc.

Macom Technology Solutions Holdings Inc.

At MACOM we offer 18 - 40 GHz bias networks suitable for DC biasing of PIN diode control circuits. Our bias networks function as both RF to DC decoupling networks, as well as a DC return. These bias networks can also be used as bi-directional reactive couplers for Schottky detector circuits in multimarket applications.

Product

Bias Tees

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Pasternack Enterprises, Inc.

Pasternack Enterprises, Inc.

Pasternack Bias Tees

Product

High-Power Low-Loss Pulsed Bias Tees

MBT series

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Maury Microwave Corporation

MBT series - Maury Microwave Corporation

The MBT-series of bias tees is based on Maury's patented broadband capacitor (US Patent 9,614,267) which simultaneously enables the industry's widest bandwidth, lowest insertion loss and lowest return loss in a coaxial bias tee up to 18 GHz. In addition, its unique design makes it ideal for pulsed applications, including pulsed IV and pulsed load pull characterization, without distorting the voltage and current waveforms.

Product

DC BIAS CURRENT UNIT

3265B SERIES

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Wayne Kerr Electronics, Ltd.

3265B SERIES - Wayne Kerr Electronics, Ltd.

To evaluate components at currents up to 125 A the 3265B DC Bias Units are used with either the Wayne Kerr 3255B series of Inductance Analyzers or the 3260B Precision Magnetics Analyzer. When one 3265B/25A or 3265BQ/25A DC Bias Unit is connected to an instrument up to 25 A of DC bias current can be set in steps of 25 mA with one unit. Additional DC Bias Units can be added such that with five units connected in parallel it is possible to set DC bias currents up to a maximum of 125 A DC.

Product

Zero Bias Schottky Detectors

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KRYTAR, Inc.

KRYTAR, Inc.

KRYTAR Zero Bias Schottky Detectors are specifically designed for use in today's high-performance microwave instrumentation and systems. KRYTAR detectors are designed for such applications as power measurements, analyzing radar performance, leveling pulsed signal sources, AM noise measurements, system monitoring and pulsed RF measurements in ultra-broadband and mm-Wave applications.