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- Pickering Interfaces Inc.
product
EBIRST 104-pin D-type Test Tool
93-022-001
The 93-022-001 eBIRST 104-pin D-type test tool is part of a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Software
LXinstruments offers a modular test software platform which provides a holistic solution, covering the following aspects:Implementation of product-specific test applications, based on commercially available sequencersSoftware operation in a production environment under TSCOE4, including extensive process and automation interfacesCentralized, database-controlled management of test data and test resultsData mining, data analysis and traceability
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Test Management Software Tool
TestRail
Modern test case management software for QA and development teams. Comprehensive web-based test case management software to efficiently manage, track and organize your software testing efforts.
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Portable Interface Unit
1553-USB-PIU
The 1553-USB-PIU is a Portable Interface Unit providing full MIL-STD-1553 test, simulation and bus analysis capability in a compact self-contained unit, to connect via a USB interface to suitable host systems. The unit provides support for all 1553A, 1553B, McAir and STANAG 3838 variants in a self contained battery operated unit, and is supplied with a matching power supply and battery charger unit for desk-top use. The 1553-USB-PIU supports concurrent Bus Controller (BC) and up to 31 Remote Terminals (RT) with Bus Monitor (BM). An additional stand-alone Chronological Bus Monitor (CBM) facility is also provided, with comprehensive multi-level triggering capability. Full error injection capability is provided in BC and RT modes, with full error detection in BC, RT, BM and CBM modes. The unit provides a variable amplitude dual redundant 1553 interface. 2 Mbytes of dual ported RAM are provided. The unit is supplied with "C" Driver library, together with a Windows GUI, providing a user friendly software tool for all 1553 set-ups, data management and storage.
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Universal Testing Machine
QM-Series
The QM-Series Universal Testing Machine is loaded with technical features, ergonomic design and is produced with the highest quality as a benchmark. This instrument is suitable to be used in production lines, where the operator has to be fast and efficient, and accurately control the test, Testing lab environments, where using the advanced software, the users can analyze the test data, have full control on processing, filing, and test management.
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Test Automation Software for Laboratory Management
STARS ENTERPRISE
STARS ENTERPRISE is a completely new generation of software from HORIBA, consisting of innovative web and mobile apps in a cloud-based platform. It enables you to seamlessly and completely integrate all your measurement systems, test beds and specimens, as well as on-board systems in the laboratory or in mobile road tests. The numerous apps in the STARS Enterprise system offer you a universal, flexible and scalable software solution for accomplishing your entire test automation activities, today and into the future.
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Antenna Measurement Software
Raymond RF's Antenna Measurement Software performs 2-D (polar/rectangular) and 3-D (spherical) antenna pattern measurements for passive antennas and active wireless mobile stations (cell phones). Insertion loss of passive devices is included as part of the calibration component. Data management and reporting of antenna properties such as half power beam-width, directivity, gain, radiation efficiency, total radiated power, and total isotropic sensitivity. AMS performs and reports all measurements required by the CTIA Over-the-Air Performance Test Plan.
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Software
The MSPS Software offers complete remote control of the partial discharge test set TPP.It is built ontop of a powerful database and offers the following possibilities. It is especially designed for use in a continious manufacturing test environment within a quality management system.
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MIMIC® Cable Modem Simulator
MIMIC Cable Modem Simulator, is the industry's first integrated simulation tool supporting DOCSIS, allows cable modem developers and cable companies to perform real world, integrated cable and internetworking device simulations. MIMIC allows suppliers of cable modems to design, develop and test their products in a virtual and scalable network environment, assuring customers that their cable modems will work properly when deployed across heterogeneous environments. Cable providers can use MIMIC to simulate the 1000s of households that use cable modems to assure the scalability of cable management software. In addition, providers can also use MIMIC for large-scale Operations Support System (OSS) testing deployments in place of large banks of cable modems, which would be cost prohibitive.
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Test Data Management
Tequra Analytics
Tequra Analytics is a test data management and analysis solution for advanced manufacturing organisations. By using the tools provided by Tequra Analytics an extensive insight into manufacturing can be gained, enabling actions to be taken to improve quality and streamline processes. ATML Results - Industry standard format for automated test. CSV Output - Machine readable, open in spreadsheet software. PDF Reports.
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Semiconductor Test Software
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Series 6000 Data Acquisition Software
PI660
PI660 - 2 Software Options, 1 Powerful Package! PI660 is the choice software for test management, data acquisition and recording, data display, and network distribution of transducer and other measurement data. It is a 32-bit, multithreaded application available in stand-alone, server and client versions for Windows.PI660 offers two distinct approaches to data acquisition and display:
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Test Data Management Software
WATS
WATS is an off-the-shelf Quality and Test Management solution, chosen by customers who want real-time test and repair data for monitoring and improving product quality and manufacturing processes. WATS collects and structures Data worldwide, enabling real-time data acquisition, analysis, reporting and management of manufacturing quality.
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EasyEXPERT Group+ Software (for PC)
Keysight Easy EXPERT group+ GUI based characterization software is available for Keysight Precision Current-Voltage Analyzer Series. It is available on your PC or the B150xA's embedded Windows 7 platform with 15-inch touch screen to accelerate the characterization tasks. It supports efficient and repeatable device characterization in the entire characterization process from measurement setup and execution to analysis and data management either interactive manual operation or automation across a wafer in conjunction with a semiautomatic wafer prober. EasyEXPERT group+ makes it easy to perform complex device characterization immediately with the ready-to-use measurements (application tests) furnished, and allows you the option of storing test condition and measurement data automatically after each measurement in a unique built-in database (workspace), ensuring that valuable information is not lost and that measurements can be repeated at a later date. Keysight Precision Current-Voltage Analyzer Series provides the complete solution for device characterization with these versatile capabilities.
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AMIDA 3001XP Tester
AMIDA has introduced two new analog/mixed-signal and logic options in the AMIDA-3000 series in recent years—the AMIDA-3001XP and AMIDA-3KS test systems. Both reinforce the AMIDA-3000 series' ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. The AMIDA-3000 series provides more than twice the number of analog channels of its modules per test system, thus greatly reducing the acquisition cost of each channel and more than doubling the number of analog channels in the entire test system. This results in a higher number of parallel tests and a higher level of capability for this system, as well as a lower and more cost-effective IC unit test cost for this tester. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The built-in instant messaging protocol detection function of AMIDA-3001XP test machine not only simplifies the complexity and difficulty of test development, but also greatly shortens the test time by using its high-speed computing capability.
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Test Solutions For Integrators
Beyond being your test equipment expert, Testek can also provide engineering design advice and guidance on building complete test solution facilities. We will work closely with your building contractor to advise on the most optimal layout configuration and to specify all facility resource requirements. For systems that may share resources, we can facilitate resource demand and management, including power management and fluid management. With a central control system, we can provide software logic to monitor these resources and route them appropriately based on demand and priority.
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Vacuum & Leak Detection Software
Agilent vacuum and leak detection software and app provide the data management performance needed to meet manufacturing yields, quality-control standards, and compliance requirements in industrial vacuum applications.The powerful Vacuum Link app offers wireless remote pump control, making it easy to monitor your system.A-PLUS software enables the user to control and monitor vacuum solutions.Leak Test Data Wizard software enables powerful tracking and automation of leak detection processes.
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Quality Management Software
QMan
The Paperless Repair software QMAN is a powerful quality management system. It helps achieve higher quality assurance, reduce production costs and shorten repair time – regardless of which test system you are using.
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Test Solutions
Our range of test solutions is far reaching, comprised of off-the-shelf test instruments and interfaces, standard automated test systems, and custom solutions for test, simulation, and training. Put our E2E focus and experience to work for you with these solutions: automated test equipment, maintenance trainers, and test management software.
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±6 kV ANSI/ESDA/JEDEC 2-Pin HBM Tester
HBM-S1-B
High Power Pulse Instruments GmbH
*±6 kV Human-Body-Model (HBM) 2-pin tester according ANSI/ESDA/JEDEC JS-001 standard with C = 100 pF, R = 1.5 kΩ discharge network*True HBM: the classical discharge network of the HBM-S1-A according the standard ensures compliant waveforms for all load conditions*Optionally available upgrade for all HPPI TLP-3010C, 4010C, 8010A, and 8010C hardware systems and software (upgrade on request)*Suppression of trailing pulses*Integrated 10 kΩ charge removal resistor*Integrated DUT voltage and DUT current sensor for real time voltage and current monitoring*Integrated DC test DUT switchIntegrated hardware 50 Ω trigger output for high speed digital oscilloscopesIntegrated overvoltage protection of voltage sense and DC test interfaces for oscilloscope and SMU protection during high voltage HBM testing*Fast and efficient HBM measurements including transient waveform data management using the HPPI TLP software*Compact size 145 mm x 82.5 mm x 44 mm
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PXI Multiplexer Switch Module
PXI Multiplexer Switch Modules are ideal for high-channel-count applications that need to connect measurement or signal generation instruments to various test points on devices or units under test(DUTs or UUTs). PXI Multiplexer Switch Modules use a variety of relay types, including electromechanical armature relays, reed relays, field-effect transistor(FET) relays, and solid-state relays, each with their own benefits, allowing you to choose a multiplexer that fits your requirements. To program the switches, you can use the IVI-compliant NI-SWITCH driver software, complete with help documentation, example programs, and a soft front panel application for interactive control of switches. For intelligent management of complex switch systems, NISwitch Executive provides additional software tools to help you design, build, and deploy your switching system.
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TMS Test Management Software
LX TMS
To diagnose and analyze electronic components and devices, various tests are required in development, production and service. Equipped with all the necessary standard functions, the test sequencer developed by LXinstuments meets all criteria for a successful and smooth test process. The test item ( DUT ) is examined under various operating conditions for its properties, function and usability. Typical areas of application can be found where the usual complexity of test sequences has to be processed. The test sequencer is therefore suitable for small and medium-sized systems where special functions of other sequencers are not required. The free, cross-platform, open source developer platform .NET serves as a starting point. The integrated WPF (Windows Presentation Foundation) framework ensures a user-friendly program interface.
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TestStand
TestStand is industry-standard test management software that helps test and validation engineers build and deploy automated test systems faster. TestStand includes a ready-to-run test sequence engine that supports multiple test code languages, flexible result reporting, and parallel/multithreaded test.
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JESD22-A115 Machine-Model (MM) Pulse Emulator
MM-10A
High Power Pulse Instruments GmbH
- Pulse unit to generate JESD22-A115 machine-model (MM) waveforms with TLP- Extremely stable and reproducible machine-model (MM) waveforms- Compatible with HPPI TLP-3010C/4010C/8010A/8010Csystems which have installed pulse width of 25 ns and rise time of 100 ps to 300 ps- Up to ±10 A machine-model peak current with TLP-3010C, which is equivalent to ±667 V (MM)- Up to ±15 A machine-model peak current with TLP-4010C, which is equivalent to ±1000 V (MM)- Up to ±30 A machine-model peak current with TLP-8010A and TLP-8010C, which is equivalent to ±2000 V (MM)- Same measurement procedure as TLP including DC test of the DUT- Compatible with HPPI TLP software and waveform data storage and management- 50 Ω SMA input and output connectors- Compact size: 61 mm x 25 mm x 17 mm
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Compact Semiconductor Tester
QST4416-FC
Qmax Test Technologies Pvt. Ltd.
The Qmax Model QST4416-FC is a compact small foot print, sophisticated automatic semiconductor tester. Its state-of-the-art hardware design which is freely configurable to user's application requirements and software features facilitates it to test linear & mixed signal IC components which covers a wide range of products like linear, Power management, Opto electronics, digital and mixed signal devices etc.
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Compute Express Link (CXL)
Compute Express Link (CXL) is a new high-speed CPU-to-Device and CPU-to-Memory interconnect designed to accelerate next-generation data center performance. CXL technology maintains memory coherency between the CPU memory space and memory on attached devices, which allows resource sharing for higher performance, reduced software stack complexity, and lower overall system cost. This permits users to simply focus on target workloads as opposed to the redundant memory management hardware in their accelerators. CXL is based on a PCI Express 5.0 Physical layer with speeds up to 32GT/s. Teledyne LeCroy provides protocol analysis test equipment to support development and debug of CXL based devices.
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Test Management Software
XStudio
XStudio allows the scheduling/running offully automated, semi-automated or manual test campaigns. It comes with an integrated requirement management module and a bug-tracking database. Some connectors are also provided to connect real-time with JIRA, Mantis, Bugzilla or TRAC.
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Bare Bord Tester
Rapid 220-260
he Rapid 260 is Bare Bord Tester particularly suitable where a short test set up time is needed to achieve the quickest time to market of the customer’s products. In addition, the system can address the most sophisticated prototypes, small and medium volumes (up to a single unit).Compactness and rationality, combined with the simplicity of the management software, are the results of Seica research to develop a system for immediate operation.
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Software Suite for Automated Test
UTP Automated Test
Increasing product complexity, centralized test data management and different hardware platforms from different manufacturers – these are typical challenges of test software developers for which we offer specific solutions.Our test software solution is based on certified development environments such as NI TestStand, NI LabVIEW and .NET. Thanks to our expertise based on more than 30 years of experience, we have managed to create a hardware abstraction layer that serves hardware and software developers alike and improves their collaboration. At the same time, it also covers all the needs of maintenance engineers and operators.The UTP Suite for Automated Testing includes a wide range of tools for configuring, developing, analyzing, debugging, and executing test sequences. It helps you speed up your developments while maintaining a consistently high quality standard.
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AMIDA 5000 Tester
AMIDA 5000 is a high-end performance test system, combining analog, mixed-signal and logic with the latest test solutions. High pin count - as many as 512 smart multi-function pinframes and 128 sites. Ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. This system has a higher number of parallel tests and a higher level of capability. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The 5000 series test system is the best analog, mixed signal, digital IC, PA test system for engineering verification and mass production. It can be easily connected to all well-known wafer probing machines and sorters, and also supports parallel test functions. The 5000 series meets customers' needs for high-precision, high-resolution, high-reliability, user-friendly, and low-cost testing and measurement of test systems.