Fine Pitch
Fine Pitch Probes range from 0.25 mm to 0.50 mm pitch. They are suitable for sockets and contactors with high pin count.
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Product
Fine Pitch Probe FP510S01S036L050L203
1003758
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The FP510S01S036L050L203 fine pitch probe is engineered for high-precision applications, particularly suited for continuous use within temperature ranges of -45°C to +100°C. This robust design boasts a fine pitch of 0.70 mm (28 mil), making it ideal for advanced interfacing with miniature electronic components. The probe is part of the FP-S family, well-regarded for its reliability and performance in electronic testing environments.
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Product
Fine Pitch Probes (< 300µm) FP200D2901P010U013L037
1030448
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The Fine Pitch Probes FP200D2901P010U013L037 are high-performance test probes designed for applications requiring precision and reliability. Featuring a compact pitch of just 0.30 mm, these probes are ideal for intricate electronic connections, ensuring optimal performance in confined spaces. With a temperature tolerance ranging from -45°C to +120°C, these probes can operate effectively in various environmental conditions, making them suitable for diverse testing scenarios.
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Product
Fine Pitch Probes (300µm - 500µm) FP300D0301B016G019L032
1023111
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The Fine Pitch Probes FP300D0301B016G019L032 are engineered for precision and reliability in diverse applications, featuring a double plunger design that ensures optimal performance in high-density environments. With a pitch of 0.40 mm (or 16 mil), these probes are capable of operating within a temperature range of -45°C to +120°C, making them suitable for a variety of operational conditions. Their mechanical structure includes a preload of 7.00 cN and a spring force of 19.00 cN, allowing for fine adjustments and reliable connections. The nominal travel is measured at 0.45 mm, with a maximum travel capability of up to 0.58 mm, ensuring flexibility in application setups.
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Fine Pitch Probes (> 500 Μm) FP510D0101B035G050L166
1001356
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The Fine Pitch Probes FP510D0101B035G050L166 are designed with precision and reliability at the forefront, making them an essential choice for companies requiring high-performance testing solutions. Engineered with a double plunger probe design, these probes feature a pitch of 0.70 mm (28 mil), allowing for meticulous connections in tight configurations. The probes operate efficiently across a wide temperature range from -45°C to +100°C, ensuring adaptability in various environmental conditions.
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Product
Fine Pitch Probes FP480S01B034G050L158
1001399
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The Fine Pitch Probes (300µm - 500µm) FP480S01B034G050L158 is a high-performance basic contact probe designed for precision applications. With a pitch of 1.00 mm (39 mil), this probe operates within a temperature range of -45°C to +100°C, making it suitable for a variety of environmental conditions. Its robust design features a total length of 15.80 mm and a projection height of 4.00 mm, ensuring ease of use in tight spaces while maintaining accuracy and reliability.
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Fine Pitch Probes (< 300µm) FP210D2903B010G011L057
1024774
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The Fine Pitch Probes FP210D2903B010G011L057 are specially designed for applications requiring precision and reliability in fine pitch testing. With a pitch of 0.30mm (12 mil), these double plunger probes are capable of withstanding a wide temperature range from -45°C to +120°C, making them suitable for various environments and conditions. Their innovative design features two distinct tip styles, allowing for versatile applications across different electronic components and circuit designs.
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Fine Pitch Probes (300µm - 500µm) FP380D2901P022U025L030
1023006
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The Fine Pitch Probes (300µm - 500µm) FP380D2901P022U025L030 are specifically designed for precision soldering applications, thanks to their innovative double plunger probe design. This model accommodates a pitch of 0.50 mm (20 mils) and operates effectively across a temperature range of -45°C to +120°C, making it suitable for various environmental conditions. Its robust construction and reliable performance ensure excellent connectivity, particularly in intricate electronics manufacturing processes where space is a constraint.
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Fine Pitch Probes (< 300µm) FP200DF7111P020U015L045
1030202
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The Fine Pitch Probes (FP200DF7111P020U015L045) are designed for precision applications requiring a compact design with exceptional performance capabilities. These double plunger probes come with a pitch measurement of just 0.30 mm (12 mil), making them ideal for high-density electrical interconnections. They operate efficiently within a wide temperature range from -45°C to +120°C, ensuring reliability under varied environmental conditions. The continuous current capacity of 0.70 A and typical contact resistance of only 500 mOhm highlight their robust electrical performance, making them an excellent choice for demanding applications in the electronics sector.
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Fine Pitch Probe H380DR
1004049
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The H380DR is a specialized fine pitch probe designed for precise applications, particularly in high-density circuits and fine pitch testing. With a pitch of 300µm - 500µm (0.50 mm / 20 mil), it caters to modern electronic requirements that demand accuracy and reliability. This probe boasts a total length of 9.95 mm and utilizes a flux-proof connection type, ensuring secure and consistent performance in varied testing environments.
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Fine Pitch Probes (300µm - 500µm) FP300D0301B015G030L057
1023125
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The Fine Pitch Probes (300µm - 500µm) FP300D0301B015G030L057 is an advanced double plunger probe designed for precision applications that require high performance and reliability. Engineered within the FP-D family, these probes feature a pitch measurement of 0.40 mm (16 mil), ensuring compatibility with fine pitch circuits. With a robust operational temperature range from -45°C to +120°C, these probes are capable of withstanding extreme conditions, making them ideal for various environments in electronic testing and production.
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Fine Pitch Probes (> 500 Μm) FP580D2929B030G040L059
1001490
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The Fine Pitch Probes FP580D2929B030G040L059 are specifically designed for precision applications requiring high reliability and accuracy. This model, particularly suited for environments with stringent temperature requirements, operates efficiently in a range from -45°C to +100°C. Its double plunger design and a pitch of 0.75 mm (30 mil) make it ideal for testing applications where space is at a premium and precision is critical. With a typical contact resistance of only 50 mOhms and a continuous current rating of 3.50 A, these probes deliver excellent performance under demanding conditions.
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Fine Pitch Double Plunger Probe FP300D2901P015U025L057H
1024430
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The Fine Pitch Double Plunger Probe FP300D2901P015U025L057H (item number 1024430) is designed for precise contacting where installation space is limited. Tip style 29 (4-point crown) targets FP300D2901P015U025L057H at solder bumps and pads; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP300D2901P015U025L057H, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data includes pitch 0.4 mm / 16 mil, spring force 25 cN, continuous current 1.4 A. As an H version, FP300D2901P015U025L057H extends the operating range to high-temperature applications up to 200 °C.
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Fine Pitch Probe FP520DF2911B045P042L058
1142380
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The FP520DF2911B045P042L058 Fine Pitch Probe is engineered specifically for high-performance applications in electronic testing. This model features a double plunger design that not only enhances reliability but also ensures consistent contact at pitches as fine as 0.75 mm. Operating within a temperature range of -45°C to +150°C, it is suitable for a broad spectrum of testing environments, making it an excellent choice for advanced electronic measurement tasks.
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Fine Pitch Probes (> 500 Μm) FP680D0101S036L085L245
1035969
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The FP680D0101S036L085L245 is a fine pitch probe specifically designed for applications requiring high precision in contact testing, with a pitch of 0.80 mm (31 mils). This double plunger probe features an exceptional temperature tolerance ranging from -45°C to +100°C, making it suitable for a variety of environments and applications. With its robust design and specifications, the FP-D family of probes ensures reliability and accuracy, essential for today's advanced technology testing requirements.
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Fine Pitch Probes (300µm - 500µm) FP380D0301B025G023L032
1127923
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The Fine Pitch Probes (300µm - 500µm) FP380D0301B025G023L032, also known by the order code 1127923, are engineered with precision for high performance in various electronic testing applications. Featuring a double plunger probe design from the FP-D family, these probes are designed to meet rigorous standards for accuracy and reliability. With a pitch of 0.50 mm (20 mil), they offer superior electrical connectivity and durability, functioning optimally across a temperature range of -45°C to +120°C. The probes maintain a continuous current of 1.40 A with a typical contact resistance of 100 mOhm, achieving peak frequency performance at 29.30 GHz.
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Fine Pitch Probes (300µm - 500µm) H480LI
1001689
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The Fine Pitch Probes H480LI are designed for precision applications requiring a pitch of 300µm to 500µm. With a robust mechanical configuration, these probes feature a stranded wire connection type, ensuring reliability in flux-proof environments. The total length of each probe is 16.00 mm, complemented by a press ring diameter of 0.71 mm and an outer diameter of just 0.66 mm. The collar height stands at 0.30 mm, making them suitable for tight spaces and intricate assemblies.
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Fine Pitch Probes (< 300µm) FP280D0301B013G025L057
1031135
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The Fine Pitch Probes (< 300µm), specifically model FP280D0301B013G025L057, offer a superior solution for precise electronic testing and applications requiring meticulous attention to detail. With a compact double plunger probe design, these probes achieve a pitch of just 0.35 mm (14 mil), making them ideal for densely populated circuit boards where space is a premium. They can operate effectively across a temperature range of -45°C to +120°C, ensuring reliability in diverse environmental conditions.
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Fine Pitch Probes (300µm - 500µm) FP300D2929B015G035L066
1051670
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The Fine Pitch Probes (300µm - 500µm) FP300D2929B015G035L066 are designed for precision applications requiring high reliability and performance. This double plunger probe is part of the FP-D family, characterized by a pitch of 0.40 mm (16 mil). It is engineered to deliver a typical contact resistance of just 100 mOhm, ensuring low resistance and high signal integrity during electrical testing. Notably, the design features a reliable preload of 6.00 cN and a spring force of 35.00 cN, providing optimal contact pressure for effective operation.
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Fine Pitch Spring Probes
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For MARATHON series, we have ultra-fine spring probes with high quality for small lot order and in short lead time. We have product range from probe outer diameter 0.11mm.
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Product
Fine Pitch Stencil Printer
MC110
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MC110 SMT stencil printer offers quick and easy setup via tooling hole or edge mounting for both single and double-sided boards. Exceptional build quality, with a heavy-duty cast aluminum base, ensures stability and repeatability.
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Fine Pitch Double Plunger Probe FP650D2901B035G030L057
1131051
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The Fine Pitch Double Plunger Probe FP650D2901B035G030L057 (item number 1131051) is designed for precise contacting where installation space is limited. Tip style 29 (4-point crown) targets FP650D2901B035G030L057 at solder bumps and pads; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP650D2901B035G030L057, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data for FP650D2901B035G030L057 includes pitch 0.8 mm / 31 mil, spring force 30 cN, continuous current 4 A.
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Fine Pitch Double Plunger Probe FP300D2901B016G019L032
1023004
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The Fine Pitch Double Plunger Probe FP300D2901B016G019L032 (item number 1023004) is designed for precise contacting where installation space is limited. Tip style 29 (4-point crown) targets FP300D2901B016G019L032 at solder bumps and pads; Fine Pitch Probes are used, among other applications, in semiconductor final test, WLCSP solutions, MEMS and micro-PCB testing. In FP300D2901B016G019L032, the double-plunger design provides spring-loaded contacting on both sides and can compensate for mechanical tolerances in compact interfaces. Key design data for FP300D2901B016G019L032 includes pitch 0.4 mm / 16 mil, spring force 19 cN, continuous current 1.4 A.
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Fine Pitch Probes (< 300µm) FP200DF7111B020G015L045
1024610
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The Fine Pitch Probes FP200DF7111B020G015L045 provide an ideal solution for various applications requiring precision and reliability. Engineered with a double plunger probe design, this model is particularly well-suited for environments where performance under temperature extremes is essential, operating effectively between -45°C and +120°C. It combines advanced engineering with robust materials, making it versatile for high-frequency applications, with a frequency handling capability of up to 18.80 GHz.
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Fine Pitch Probes (< 300µm) FP280D2901B013G025L057
1031133
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The Fine Pitch Probes (FP280D2901B013G025L057) are engineered for precision applications requiring exceptional performance in tight spaces. Designed with a double plunger mechanism and a pitch of 0.35 mm (14 mil), these probes are perfect for maintaining reliability in varying environmental conditions, ranging from -45°C to +120°C. Their robust construction combines advanced materials including beryllium copper for the plunger, and gold plating for optimal conductivity and durability. These features contribute to a typical contact resistance of just 100 mOhm, making them an ideal choice for advanced electronic testing.
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Fine Pitch Connector Test
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C.C.P. Contact Probes Co., LTD.
Our Ceramic/Aluminum sockets have a lifetime of up to 30,000 cycles.
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Product
Fine Pitch Probes (< 300µm) FP280D2901B013G015L057
1031134
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The Fine Pitch Probes (FP280D2901B013G015L057) are designed to meet high-performance standards with exceptional precision, making them an ideal choice for various electronic applications. These Double Plunger Probes, categorized under the FP-D family, feature a compact pitch of 0.35 mm (14 mil), enabling efficient connections in tight spaces. With a resilient operational temperature range from -45°C to +150°C, these probes guarantee reliable performance across diverse environments. The combination of Beryllium copper and bronze materials ensures durability while maintaining optimal conductivity, enhanced by gold plating for superior reliability.
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Fine Pitch Probes (300µm - 500µm) FP380D2901B025G023L032
1127922
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The Fine Pitch Probes FP380D2901B025G023L032 are engineered for precision applications, featuring a double plunger probe design that ensures accurate measurements within their specified pitch range of 0.50 mm (20 mils). Capable of operating in extreme temperatures from -45°C to +120°C, these probes are versatile enough for various environments. They maintain a continuous current capacity of 1.40A while ensuring a typical contact resistance of just 100 mΩ, making them reliable for high-frequency applications up to 29.30 GHz.
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Fine Pitch Probes (300µm - 500µm) FP380D1111B027L050L243
1003137
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The Fine Pitch Probes (300µm - 500µm) FP380D1111B027L050L243 represent a significant advancement in precision probing technology, designed to meet the stringent requirements of modern electronics testing. This innovative double plunger probe falls within the FP-D family, featuring a compact pitch of 0.50 mm (20 mils) which is essential for accessing densely packed circuitry. Capable of operating in temperatures ranging from -45°C to +100°C, these probes provide versatility and reliability under varying conditions.
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Fine Pitch Probe FP210D0303B010G016L057
1031798
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The FP210D0303B010G016L057 Fine Pitch Probe is designed for precision applications requiring contacts narrower than 300µm. This double plunger probe belongs to the FP-D family, ensuring high-performance connections that are essential for microelectronic testing and other high-density applications. With a pitch of 0.30mm (12 mil), the probe maintains excellent functionality across a wide temperature range, from -45°C to +120°C, making it suitable for various testing environments.
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Fine Pitch Probes (300µm - 500µm) FP380D0101B027L050L243
1003136
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The Fine Pitch Probes FP380D0101B027L050L243 are designed with precision and versatility to meet the demanding requirements of various applications. Featuring a double plunger probe design with a pitch of 0.50 mm (20 mil), these probes operate effectively in temperatures ranging from -45°C to +100°C. The mechanical specifications ensure reliability, with a preload of 10 cN and a spring force of 50 cN, providing a nominal travel of 2 mm and a maximum travel of 2.50 mm, while maintaining a pointing accuracy of +/- 0.04 mm.
