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Wide-Aperture Fiber-Optic Probes
Wide-aperture Fiber-optic Probes and Very Wide-aperture Fiber-optic Probes are used to test dim or misaligned LEDs.
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Test Probe
UE
Qosmotec Software Solutions GmbH
Qosmotec UE Test Probe offers more flexibility to testers of mobile networks. It is a compact plug & play multi-UE test probe that allows for tests in UMTS, HSPA+ and LTE standards from any location. It can hold a custom set of up to 8 UEs.
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Exchangeable Test Fixture
MA 2111/D/H/S-5/HG
Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 850Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 10,70 kg
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Standard 1.10 (31.00) - 3.85 (109.00) General Purpose Probe
HPA-64-1
Current Rating (Amps): 3Average Probe Resistance (mOhm): 50Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 50Full Travel (mm): 1.27Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 375Overall Length (mm): 9.53Overall Length Remark: Exact length depends on selected tip: Tip 1,4, 7: 0,375″; Tip 2,3,9,10: 0,365″; Tip 8: 0,385″
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Semiconductor
You can find Spring probes used for test process for production of semiconductor here. Spring probe is probe with spring inside and is also called Double-ended probe and Contact probe. It is assembled in IC socket and becomes electronic path, which vertically connects Semiconductor and PCB. By our excellent machining technique, we can provide spring probe with low contact resistance and long life. “MARATHON” series is our standard lineup of spring probe for testing semiconductor.
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700 V, 25 MHz High-Voltage Differential Probe (÷10, ÷100)
AP031
The HVD3000A series of high voltage differential probes cover the fullest range of applications, from 120/240 V switch-mode power supplies through 600 V class and 5 kV electrical apparatus. The table below provides a list of recommended probe models based on specific device under test applications.
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Flying Probe Testers
Flying probe test systems require no test fixturing, have few restrictions on board access, and can test boards with virtually unlimited number of nets. These systems also allow developers to complete test programs in a short time.
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Environmental Test Probe, Temperature
72-8366
Simple thermocouple junction at the end of a 1m wire provides effective low cost ambient temperature measurement. It is suitable for measuring air temperature and may be placed in direct contact with hard surfaces. Type K thermocouple temperature probes are commonly used with all types of industrial temperature controls and measurement equipment, and are compatible with Tenma handheld thermometers and digital multimeters that include temperature function. All are terminated with standard Type K plugs.
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Adapter/Stainless Steel
WADP-NFNF-01
Warison provides wide range of wireless passive coaxial components, includes Adapters, Attenuators, Coaxial Cables Assemblies, DC Blocks, Filters, Isolators & Circulators, Probes & Terminations. With outstanding capability of development and design, Warison is able to custom the spec based on customer��s demand. All Warison��s products pass inspection and electronic performance test before shipping out. It is our principal to deliver the best solution to all our clients.
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Semiconductor Test & High-Speed Digital
Rosenberger Hochfrequenztechnik GmbH & Co. KG
The wide product range means that a variety of semiconductor test applications and high-speed digital applications are possible. To meet the ever-challenging technological requirements and increasing demands of the semiconductor test equipment industry, Rosenberger has developed and produces multiport mini-coax connectors and cable assemblies – for applications up to 40 GHz – , and spring-loaded coax products. Probes and customer-specific cable assemblies are also available.
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Test Contactor/Probe Head
Mercury
Mercury™ test probes and contactors are excellent spring probes for the laboratory though they were designed with the robust qualities needed for high-volume production test. Their unique design ensures excellent plating quality for low, consistent resistance, long life, and high-test yields.Mercury probes are available with minimum pitches of 0.3 mm, 0.4 mm, 0.5 mm, and 0.8 mm, to provide the best performance at any device pitch. Mercury probes have bandwidths of up to 22 GHz, and can carry over 3 Amps of current. The Mercury is an excellent choice for any test application.
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Surface Resistance System Kit
PRS-801RM
- Perform Point-to-Point and Resistance to Ground Measurements from 0.01 Ω to 200 Teraohms- Accuracy of ±2% from 1.00 Ω to 9.99x1010Ω- Measures in accordance with ESD TR53, ANSI/ESD S4.1, ANSI/ESD S7.1, ANSI/ESD STM97.1 and others- Constant Test voltages 10V and 100V meeting ANSI/ESD S20.20- Operates using a Rechargeable Li-ion Battery Pack- Takes Approximately 8,000 Measurements on a Single Charge (480 hours typical)- Stores up to 999 Test Values Into Memory- Compatible with Prostat Connect 2.0 for Downloading into Excel®- Charging and Download via Standard Micro USB Cable- Includes 5lb Conductive Probes and Carrying Case- Certificate of Calibration Traceable to NIST included- 2-year Limited Warranty on Main Instrument
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Photonics Test Solutions
Chroma offers precision instruments such as laser drivers, photodetector monitoring, and temperature controllers. These lab class instruments are often intefrated into production solutions for wafer probe test, burn-in and device or module characterization with inspection, metrology, robotics, Industry 4.0 and more.
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HandyScope HS6-DIFF With SureConnect: 500 MS/s, 250MHz BW, 4 Channel (256MS/ch), USB Differential Digital Storage Oscilloscope, Spectrum Analyzer, Voltmeter, Transient Recorder
HS6-DIFF-500XMS-W5
The only oscilloscope in the world that has:- SafeGround, differential input channels that can be switched to single ended.SureConnect, auto-detects a true connection between the probe tip and the device under test.- CMI interface.- USB 3.0 interface, 5Gb/s data transfer- Lowest noise
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Line Automation Equipment
5000 Series In-line Handler
The Circuit Check 5000 Series In-line Handler is an integrated inline solution that combines automation, fixturing and measurement hardware in addition to other in-line PCBA probe based test stations, while adding a standardized quick change fixture interface. The 5000 series in-line is a unified solution that is software and hardware agnostic, enabling adaptability to a variety of off-the-shelf lower cost ICT, flash and functional test software and hardware.
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Adapter/Stainless Steel
WADP-SFSF-01
Warison provides wide range of wireless passive coaxial components, includes Adapters, Attenuators, Coaxial Cables Assemblies, DC Blocks, Filters, Isolators & Circulators, Probes & Terminations. With outstanding capability of development and design, Warison is able to custom the spec based on customer��s demand. All Warison��s products pass inspection and electronic performance test before shipping out. It is our principal to deliver the best solution to all our clients.
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IEC60335 Test Probe 11
CX-11
Shenzhen Chuangxin Instruments Co., Ltd.
Test Probe 11 This Unjointed Finger Probe is made for forceful insertion where the flexibility of the Jointed Finger Probe would be difficult.
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Environmental Test Probe, Temperature
72-8364
Type K Surface Temperature Probe Surface probe is ideal for flat stationary surfaces such as molds, heating elements, integrated circuits, transistors and transformers. Very low sensor element mass enables fast response measurement time. Type K thermocouple temperature probes are commonly used with all types of industrial temperature controls and measurement equipment, and are compatible with Tenma handheld thermometers and digital multimeters that include temperature function. All are terminated with standard Type K plugs. See the complete line of Tenma Thermocouple Probes and Accessories
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Handheld Digital Multimeter, 2000 Count, Auto/ Manual, 10 A, 250 V, 3.5 Digit
72-13430
Clear LCD Display. Equipped with comfortable protective cover, test probe holder. 2m drop test, precision protection. Auto Power Off. Auto Backlight Off. Loud Buzzer Sound. Knobs shift smoothly, in-line with ergonomics. Relative mode. Powered by AAA 1.5V x 2 batteries. 12-month limited warranty. view Terms & Conditions for details
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Insulation Resistance Meter
1503
The Fluke 1503 is a great choice for basic residential and commercial electrical insulation testing. This rugged, compact tool fits in the palm of your hand. The 1503 is the same form factor as the Fluke 1507 but with a few less features. You can count on it to handle the most common tests at a most affordable price. Additional features, like the remote probe, reduce the time needed to perform repetitive testing.
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LCR-Reader-MPA: Ultimate All-in-One Digital Multimeter
LCR-Reader-MPA combines tweezer probes with a powerful LCR/ESR-meter that is able to determine the type of component and best test parameters before measuring with a 0.1% basic accuracy. The device will display the main impedance value, any secondary values such as ESR, Q or D, component type and test parameters used instantly on a bright backlit LCD display. The 1 oz. device is very portable and ideal for fieldwork.
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Test Fingers & Probes
Test Fingers and Probes are used in most standards to check accessibility to moving parts or hazardous live parts. They comes in many forms, such as test fingers, test rods, test balls etc.
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High Current / High Temperature Spring Probes
We have spring probes, which can be used for high temperature and high current test under 200 degree and shows high performance in them.
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Test Contactor/WLCSP Probe Head
ACE
ACE™ test sockets offer optimal RF performance for fine pitch FBGA, QFN and wafer-level packages for Power Amplifiers, RF switches and mobile communications. Supporting pitches down to 0.4 mm, ACE features an innovative design that provides superior performance, improved yields and power efficiency.ACE probe heads deliver exceptional electrical performance, both DC and RF. Manufactured from HyperCore™ base material, a proprietary material of Cohu’s Everett Charles Technologies, ACE probes have the electrical properties of BeCu with the non-oxidizing properties of a precious metal. The short signal path, sharp tips, and large contact area between plungers provide high current conductance and reliable contact with less force.
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Light Probes (LED-Test)
As the original inventors of light probes for in-circuit color and intensity test of LEDs, our business partner Optomistic Products has been a leader in LED test for over 20 years, providing LED solutions to customers worldwide. Our unique patented LED test solution offers unparalleled reliability and is widely accepted by the LED test industry.
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CAMGATE Test Kits
Series 453
LThe GR Series 453 CAMGATE mechanical kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The Series 453 provides interface compatibility using the GR2270 Style, 12 block interface. This interface accepts the industry standard I/O, power, and coax blocks. The CAM/GATE utilizes a cam roller system for precision guiding and smooth operation and 1.00” push plate movement. The gate assembly is movable to three different positions which allows for the versatility of top side probing, or relocating the frame assembly for PCA’s the have tall components.
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Pulsed SMU Systems
AMCAD Engineering has created professional, industry-proven pulsing technology for both pulsed-bias load pull (Pulsed Load Pull, PLP) and 50ohm transistor test applications. Systems come equipped with a mainframe controller which includes integrated power supplies and integrated input pulser with ±25V/200mA capability. The external output pulser module (probes, pulsers) is configured for 120V/30A pulsing.
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Kelvin Test Contactor/Probe HEad
cPython
cPython™ Kelvin contactors and probe heads provide superior electrical and thermal performance with significant cost savings. This makes cPython Kelvin ideal for lab and high-volume production test of analog and mixed signal integrated circuits – for applications such as power control, A-D and D-A converters, audio, video, power amplifiers, photonics, optical MEMS and sensors.cPython Kelvin probes are electrically isolated and mechanically independent force and sense paths for true Kelvin contact for taking accurate measurements, even under high current conditions. These robust probes provide hundreds of thousands of insertions or touchdowns, and a bandwidth up to 26 GHz.
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PCI Express Bus Analyzer / Exerciser / Endpoint
The PCIE850 provides a complete test and debug solution for PCI Express Bus. Interposers and probes connect to the PCIE850 providing access to PCI Card, AMX, XMC and VPX systems.
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Universal Manipulator
LS
Manage the rapidly changing production environment and achieve the lowest cost of test, converting between probe, final, engineering and service positions with ease. Rapid advancements in semiconductor test technology have resulted in highly efficient test cells, capable of device test throughputs far greater than ever before.
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Probes, Clamp-On
EM-6980 | 20 Hz – 50 KHz
Current probes enable you to measure conducted current without direct connection to the circuit under test by clamping around the conductor, current carrying wire or structural member being tested.
