MIxed Signal Test Systems
See Also: Mixed Signal, Mixed Signal ATE, Mixed Signal Oscilloscopes, Mixed-Signal Test, Mixed Signal Testers
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Nanomechanical Test Systems
Bruker’s nanomechanical test systems deliver the highest degree of performance, accuracy, reliability, and versatility for quantitative mechanical and tribological characterization at the nanoscale and microscale. Utilizing multiple patented and proprietary technologies, the Hysitron product line of standalone nanomechanical test systems enable quantitative characterization at length scales unreachable by others.
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Test Systems
As new products emerge and change, the requirements for the industry also increase becoming more and more challenging. Complex products require demanding and versatile test systems, capable of performing complex test cycles. The ultimate goal is to ensure the validation of the final product during the different stages of the production process.
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Brake Test Systems
GIANT Evo
The GIANT Evo is an extension of the well-proven GIANT product portfolio and has been developed to suit the growing demands and needs of the current and future brake markets. Covering the market segments from mini and compact cars to medium sized SUVs as well as large vehicles, this brake testing machine forms the base of HORIBA’s inertia brake dynamometers portfolio. All components are specifically tailored to the needs of the passenger car market segment.
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Coil Test System
CTS
International Electro-Magnetics, Inc.
The system is controlled by a PC using software written in Visual Basic. It offers visually oriented menus that allow easy coil configuration and test set up procedures.
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Laser Diode Characterization System
58620
The Chroma 58620 Laser Diode Characterization Station is a state-of-the-art full turnkey system specially designed for laser diode testing. Features range from macro inspection of the facet or aperture active area to a full suite of electro-optical parametic tests.
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Memory Test System
T5221
The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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Armature Test Systems
Automation Technology's ATS-3800 is at the top of the class when it comes to Armature Test Systems. The ATS-3800 is packed with standard features and like all of ATI's 3800 Series Test Systems; it is backed by ATI's industry leading two-year limited warranty. The ATS-3800 offers the most comprehensive testing of armatures available.
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Optics Test Systems
Contract Measurements And Services
Optik Elektronik Gerätetechnik GmbH
Thanks to our very good laboratory equipment, we offer contract measurements for numerous measuring tasks. In the field of optics, measurement and testing technology, these are, for example, the parameters MTF, focal length, radius, contact dimension, focal length, geometric and optical parameters of cylindrical lenses. Others on request.
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CRPA Test System
The Spirent CRPA Test System is a development of Spirent’s GSS9000 Series platform for testing Controlled Reception Pattern Antenna (CRPA) systems with a separate RF output per antenna element. The CRPA Test System generates both GNSS and interference signals. Users can control multiple antenna elements. Null-steering and space/time adaptive CRPA testing are both supported by this comprehensive wavefront approach.
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Signal, Patchcord, Receiver, 72", TriPaddle, USB 2.0 Wire, to USB Type A Plug (1.5 Amps)
7-104872596-072
Signal, Patchcord, Receiver, 72", TriPaddle, USB 2.0 Wire, to USB Type A Plug (1.5 Amps).
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Modular Test System
A modular test system, RTS (real time scanner) provides instant test results with minimal interface cables to check wiring during installation.It tests wire harnesses in real time using our micro switching technology, reducing the need for high cost interface cables by around 90%. an innovative best-in-class solution for FAL testing, RTS also offers many benefits for wire harness and sub-assembly manufacturers.
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IPC Systems
Industrial Server-Grade System delivers a scalable high performance platform for a wide array of industrial applications.
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Universal Test System
LS6601A
LS6601A Universal Test System is based on LXI bus, primarily used for functional electronic product or system verification, test parameters. Because the system design is based on LXI bus structure, so its addition to general characteristics of versatility, scalability, but the architecture of the system more flexible, the test system is not limited to one or more cabinets, but may be needed test network and multiple LS6601A and can be easily grouped into one or more of the ground test system, depending on the test mechanism, form a powerful set of test, control, simulation, simulation, data management as one; distributed in different places .
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Lens Module Test Platform
The Lens Module Test Platform is a flexible solution to deliver the quality that is expected from your brand for all types of lenses and cameras. The system can be configured to measure objective, eyepiece or camera lenses. As the platform can efficiently measure lenses as small as 2 mm3, it is perfect for the critically precise applications of life sciences, consumer electronics, automotive and other industries. With 25+ years of quality experience, the Lens Module Test Platform ensures that all products shipped to market work as intended.
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Stress Testing System
Load Dynamix
LoadDynamix (former Swifttest) is famous for its IP based converged storage system stress testing, including iSCSI, SMB/CIFS, NFS, FC and HTTP/HTTPS based storage systems. Its GUI interface is very easy to use and allow customer engineer to fully configure all the parameters at the protcol layer. Nearlly all the major IP storage system manufacturers have LoadDynamix products in their test lab.
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802.11be Test System
IQxel-MX
Next generation wireless devices Access Points, CPEs and client devices like smartphones or tablets based on the IEEE 802.11be EHT (Extremely High Throughput) standard require stringent RF performance to meet the latest standard requirements.
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Test System
ETS788XL
The 50/100 MHz ETS788XL system is the compact protable version of our ETS788. Made with the new high-performance precision components of our Griffin series, this portable powerhouse offers an optional tough road case and ready to go to any test site needed. Just pop off the covers and get started. Whether it's research, Failure Analysis, or single-event effects testing, his powerful member of the HiLevel family takes advantage of all of the tried and true features that have served users so successfully to date.
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E-mobility Test Systems
Correct contactingcharging cable detectionsecurity questionExtensive range of accessories for on-site measurements in a separate caseCharging cable with additional measuring lines (Sense)Convenient control through guided test procedure via WinSAM and tabletElectromechanical locking
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In-Circuit Test Systems
TestStation In-Circuit Test Systems provide full structural and functional coverage for a wide range of manufacturing, component, process, and performance for high-performance analog, digital, and mixed-signal devices used on modern PCBs.
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Lightwave Test Systems
Keysight offers a wide range of innovative test-and-measurement solutions to accelerate the progress of next-generation high-bandwidth optical networks. Keysight's mission in the optical market is to shorten time to market and reduce cost of test for customers in R&D and manufacturing. In addition, Keysight enables new technologies that include 40 Gb/s optical components, network elements and systems, and all-optical fiber networks.
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Asynchronous System Level Test Platform
Titan
The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
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Mixed Signal Oscilloscope, 500 MHz 2 Analog Plus 16 Digital Channels
MSOX3052A
500 MHz2 analog plus 16 digital channels Easily view your signals on the 8.5-inch WVGA display Capture more data with up to 4 Mpts memory See more signal detail with 1,000,000 wfms/s update rate Expand your measurement capabilities with full upgradability: Add bandwidth, memory, 20 MHz arbitrary waveform generator, 3-digit voltmeter, serial trigger and analysis, segmented memory & mask testing at any time
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Mixed Signal Oscilloscope: 20 GHz, 4 Analog Plus 16 Digital Channels
MSOV204A
20 GHz analog bandwidth (upgradable)4 analog plus 16 digital channels Capture a longer signal trace with up to 80 GSa/s sample rate and 2 Gpts of acquisition memory Get the best signal integrity with the low noise floor (1.54 mVrms at 50 mV/div) and lowest jitter measurement floor (100 fs)See better measurement accuracy with ENOB values in excess of 5.5 and a SFDR exceeding 50 dBC Access the broadest range of jitter, trigger, analysis and protocol tools (featuring Precision Probe)
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High Performance Analog & Mixed Signal Test Solutions
Applicos
Effective mixed-signal test solutions demand know-how and experience. Low level analog signals need to be stimulated and analyzed near fast switching digital logic. Cross talk, magnetic fields, clock jitter, ground noise and non-linearity of components, are just a few of the problems that must be addressed. Applicos knows what it takes to design and produce high quality mixed-signal test solutions. They have been servicing the mixed-signal test industry since 1993 and have established a distinguished reputation for providing our customers with high performance, cost effective solutions. In 2018 we acquired Applicos B.V. to extend our portfolio for the ATE business.
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AT-1212, 14-Bit, 1.2 GS/s, 2-Channel Signal Generator Adapter Module for FlexRIO
782248-02
The AT-1212 provides an analog output channel for signal generation. It also features single-ended, DC-coupled inputs. The AT-1212 is ideal for generating complex signals like digital modulations and RF stimuli for functional and performance tests. Each channel has a user-configurable sample rate, and data is written directly from the FPGA. To use the AT-1212, you must pair it with a compatible PXI FPGA Module for FlexRIO.
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Test Block & Plug Systems
Test Block system is an evolution of the 14 test circuit versions widely employed in the power utility sector. The primary difference is the incorporation of ‘finger safe’ test sockets which allow the use of shrouded 4mm banana plugs.
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FieldFox Handheld Microwave Signal Analyzer, 50 GHz
N9962B
A lightweight, durable, software-enabled, microwave signal analyzer, interference analyzer, distance-tracking generator, preamplifier, power meter, and more.
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Signal Conditioning System
SCS-801
The SCS-800 is a high-performance signal conditioning system for PC-based data acquisition. An SCS-800 system consists of an AC operable chassis and up to 8 multi-channel modules.The SCS-800 takes advantage of the increasing capabilities of notebook and desktop PCs by leveraging off the PC's strengths. It provides a high-performance, flexible solution whether used as a conditioning front-end for desktop systems in the factory or as a mobile solution for portable systems in the field.
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PXI Signal Generators (Signal Sources)
Accelerate test throughput with fast, high-quality measurements optimized for RF or microwave design validation & manufacturing testIncrease test configuration flexibility with a PXI platform and license key upgradesReduce development time with easy integration of drivers and programming examples into test environments
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Battery Test Systems
The Intepro’s battery test systems are configurable systems designed to test the latest Lithium Ion batteries and other high power density batteries and chargers. Combining high resolution, high powered charge and discharge systems, Intepro IBT line of battery test systems link to the battery management through the bus communication and fail-safe external monitoring of key battery parameters.
