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*Terahertz Measurement
Terahertz laser power and beam profiling measurement is not a trivial task. But as anyone using or developing THz lasers knows, it is crucial to obtain accurate measurements of your laser. Ophir offers a few choices, depending on what aspect of your laser you need to measure. Read these posts for more about Terahertz measurement.
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Fixed Wavelength CW Laser Source (DFB)
Laser 1200 Series
The Laser 1200 Series is a highly customizable fixed-wavelength Continuous Wave (CW) laser source available in a wide range of wavelengths and powers.With seamless PXI integration, it can be easily integrated into new or existing PXI test setups. Save space, lower your costs and improve testing efficiency while delivering reliable and repeatable results in production or research environments.
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Tunable Laser Source - PXI
Laser 1000 Series
The Laser 1000 Series PXIe module is a Continuous Wave (CW), tunable laser source offering high-power output, narrow 100kHz linewidth and 0.01pm resolution tunability.With seamless PXI integration, it can be easily integrated into new or existing PXI test setups. Save space, lower your costs and improve testing efficiency while delivering reliable and repeatable results in production or research environments.
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Single-Port Tunable Laser System Source
N7711A
The Keysight N7711A and N7714A tunable lasers are single-port and four-port sources, available with C-band or L-band wavelength coverage. The narrow linewidth and offset grid fine-tuning capability make them ideal sources for realistic loading of the latest transmission systems. All models can reach any wavelength point within their specified wavelength range just like all other Keysight tunable lasers. In this mode, code compatibility with existing test setups based on Keysight's range of full-size and compact tunable lasers is a great asset. In system loading applications, it may be preferable to grid-tune the lasers like system transmitters, simply by changing the channel index. The channel grid is adjustable to standard ITU-T grid spacing like 50 GHz, and to arbitrary grids. Likewise, the zero frequency (base channel) of the chosen grid is adjustable. A 12 GHz fine-tuning range allows de-tuning the frequency.
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PCI Three-Axis Laser Board
N1231A
The Keysight N1231A PCI Three-Axis Laser Board is a register based PCI bus board that implements three axes of laser measurement for position monitoring and closed-loop servo control. The hardware outputs, optimized for connection to a DeltaTau PMAC servo control system, provide parallel digital position data at rates up to 4MHz. The same position data along with velocity data is available over the PCI bus at rates up to 100kHz (3 axes of position and velocity) or 200kHz (position or velocity only).
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Fixed Wavelength CW Laser Source (FP) - PXI
Laser 1100 Series
The Laser-1102 is a Continuous Wave (CW) laser source offering high power 850 nm output into multimode fiber with stable output power operation.
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Step-Tunable Laser Source, High Power and Low SSE, Basic Line
N7779C
The new N7779C basic line step-tunable laser source is ideal for cost-effective testing of broadband optical devices. It can also serve as a highly stable, tunable local oscillator for receiver testing or transmission experiments.
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Fixed Wavelength CW Laser Source (FP) - MATRIQ
The Laser-1102 is a Continuous Wave (CW) laser source offering high power 850 nm output into multimode fiber with stable output power operation.
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Tunable Laser Source - MATRIQ
The Laser 1000 Series is a fully-compliant micro-ITLA laser with up to four channels in a compact benchtop form factor.Offering 0.01 pm resolution tunability across C or L bands, exceptional power accuracy up to 16.5dBm, and optional dither suppression, this is a versatile and cost-effective general purpose instrument.
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High-Resolution VMEbus Laser Axis Board
10897D
The 10897D High-resolution VMEbus laser axis board provides excellent resolution of up to 0.3 nm with a high resolution interferometer. The data age uncertainty is dramatically reduced allowing extremely accurate measurement and control of moving systems. The very high data rates accommodate high-bandwidth and high-performance closed-loop applications. Configured with appropriate lasers and optics components, the 10897D supplies unsurpassed positioning accuracy for dynamic measurement.
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Beam Profiler
BladeCam Series
0.65" Thin! Portable, Port-Powered, USB 2.0, Beam Profiling for Windows XP & Vista, Intel-Mac.
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Fixed Laser Source Module
Keysight offers a broad choice of fixed laser sources, which are available as single-wavelength and dual-wavelength modules as part of the Keysight Lightwave Solution Platform. The Keysight 8165xA Fabry-Perot laser sources can be used in conjunction with optical power meter modules for insertion loss, optical return loss and PDL measurement of broadband components and fiber. The Keysight 81663A Distributed Feedback Laser Sources are best suited for amplifier test and WDM system test applications. Keysight covers PON and common WDM wavelengths with its 81663A Distributed Feedback (DFB) laser source modules. The precise tunability around ITU-grid center wavelength gives you the flexibility to match test setups to the latest requirements of the DWDM-system. The fine-tuning allows to shift the center wavelength from one DWDM transmission channel to the adjacent channel in dense WDM systems. The built-in isolator ensures highest laser stability, even when reflections are present in the optical path.
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Scanning Slit Beam Profilers
DataRay manufactures two types of scanning slit beam profilers: the patented BeamMap series, which offers real-time M², divergence, focus and alignment management, and the Beam’R series which provides affordable, compact, and precise beam profiling. All of our scanning slit beam profilers are available with Si, Ge, and InGaAs detectors, covering wavelengths from 190 nm to 2500 nm.
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*Beam Profiling For 266nm To 3000µm
Unlike a power meter that measures average or instantaneous Watts or Joules of the overall laser beam, knowing how the power is distributed within the beam is equally as important. As an example, if you want to cut something the power should generally be focused in the center of the beam to concentrate the power density in a very small area but if you were trying to weld something with all the power in the center you would poke a hole in the weld; requiring the power to be equally distributed as in a top hat profile.
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Specialized Beam Profiler Systems
DataRay offers specialized beam profiler systems. These systems offer solutions for complex applications. The large beam profiling system is suitable for beams up to 200 mm image area, and the line laser profiling system provides for direct measurement of line lasers up to 200 mm in length.
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PCI Three-Axis High Performance Laser Board with External Sampling
N1231B
The Keysight N1231B PCI Three-Axis Laser Board with External Sampling is a register based PCI bus board that implements three axes of laser interferometer measurement for position monitoring and closed-loop servo control. There are four external sample inputs along with four data hold inputs that allow easy synchronization with user systems. Several threshold compare registers, with both hardware outputs and interrupt capability, can be used for travel limit and in window or out of window detection functions. The dual mode hardware position outputs, controlled by the hold inputs, provide either a 32-bits/axis parallel interface or a 36-bit multiplexed interface to the 36-bit axis position data at rates up to 20MHz. The user can programmatically access the externally sampled position and velocity data, as well as software sampled position and velocity data, over the PCI bus at rates up to 100kHz (3 axes of position and velocity) or 200kHz (position or velocity only).
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Laser Beam Positioning
Under the trade name of SpotOn we offer a wide variety of computerized position measurement systems.This is a family of cost-effective and versatile solutions to numerous industrial and laboratory applications.Among the measurement applications, are:Measure laser power and centration or displacementAlign beams and QC of optical systemsMeasure target rotation and displacementMonitor vibration, deflection and motion
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UV-NIR Beam Profiler
CinCam
CINOGY Technologies CinCam is optimized to provide excellent sensitivity from the UV to NIR spectral range involving CCD/CMOS/InGaAs technologies. Thanks to its high resolution and its small pixel size, the CinCam ensures the highest accuracy in laser beam analysis of cw and pulsed laser systems. The plug and play design facilitates easy and flexible adaption to standard optical components.
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Tunable Laser Source, High Power And Lowest SSE, Top Line
N7776C
The new Keysight N7776C top line tunable laser source is designed to reach best-in-class accuracy in static and swept operation for outstanding test efficiency. Two-way sweeps up to 200 nm/s speed with sub-picometer repeatability and without impacting the specified dynamic accuracy accelerate wavelength-dependent alignment processes and the automated calibration of wavelength-selective devices. Shorter time to testing and faster swept-wavelength tests help reduce test cost per device, improve test margins and lower the cost of ownership.
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*High-Power Beam Profiling
Beam analysis of high-powered industrial lasers have always proved to be difficult because of the power levels (affecting the power densities) that these lasers operate at. Yet, the measurement of these lasers are critical for their success because of thermal effects which are more of a factor at these higher powers. These high-power performance measurement products have proven to be solutions for laser users who operate and maintain these high-powered lasers
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Ultra-compact Laser Collimated Beam Sensor
HL-T1
Panasonic Industrial Devices Sales Company of America
The HL-T1 Sensor is an ultra-small laser Thru-Beam Sensor with very high resolution.
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Beam Diagnostics
We offer camera-based devices with wavelength ranges from UV to IR. All are cameras are USB3.0, for the fastest data transfer rates.
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Beam Probes
The CO2 Laser Beam Probes are hand-held plates designed to simplify the alignment of IR optical systems. They display the laser beam as a dark image on a fluorescent background using the same UV-excited, thermal-sensitive surfaces developed for Macken Instruments'' Thermal Image Plates.
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Scanning Slit Beam Profiling
NanoScan
Measure your beam as never before with the NanoScan™ beam profiler. The advantage of scanning slit beam profiling is sub-micron precision for measuring beam position and size. Scan head configurations include Silicon, Germanium, and Pyroelectric versions for a wide range of wavelengths and laser power levels. The NanoScan software is available in two versions: Standard and Professional, and includes an extensive set of ISO quantitative measurements, an M2 Wizard, and the ability to measure laser power.
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Profile Projector
Wide range of Microscopes and accessories for industry, research, Quality Assurance etc. Microscopes: Biological Binocular Stereo Comperators Gemologycal etc Accessories : Light Sources Cameras Stands for Microscopes.
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Blue-violet Laser Diode Modules: 450nm, Elliptical Beam
The Optoelectronics Company Ltd
Custom lasing wavelengths, from 405 nm to 852 nm, output power options and laser engraving are available to your specifications. Both standard and custom configurations provide OEMs, end-users and systems integrators with complete cost-effective laser solutions.
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Laser Diode Modules: 635nm-660nm Visible Wavlength, Elliptical Beam
The Optoelectronics Company Ltd
Custom lasing wavelengths, from 405 nm to 852 nm, output power options and laser engraving are available to your specifications. Both standard and custom configurations provide OEMs, end-users and systems integrators with complete cost-effective laser solutions.
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Beam Position Detectors
We offer a wide range of laser beam position detectors for optical alignment including Quadrant Cell Photoreceivers, PSDs, and Thermopile Position Sensors. Please see our Beam Position Sensor Guide for more information.
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Multi-Surface Profiler
Tropel® FlatMaster® MSP
The Tropel® FlatMaster® MSP (Multi-Surface Profiler) is a frequency stepping interferometer that provides fast and accurate metrology for semiconductor wafers up to 300mm in diameter. In seconds up to 3 million data points are collected with sub-micron accuracy enabling total thickness and flatness characterization over the entire surface.
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Profile Probes
Consist of several temperature sensing points inside one probe. Used to profile the temperature at various points along a single axis. Great for measuring the temperature distribution in tanks.
