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Automated Testers
Automated test equipment creates a repeatable and efficient environment for testing your products. Innovar offers modular test equipment that easily scales with your production demands and provides redundancy to ensure continued production.
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MultiBeam System
FIB
An easy-to-use, out-lens type scanning electron microscope (SEM) equipped with a Schottky electron gun, as well as a new FIB column capable of large current processing (maximum ion current 90nA) installed into one chamber. JIB-4610F enables high-resolution SEM observation after high-speed cross-section milling with FIB, and high-speed analysis with a variety of analytical instruments, such as energy dispersive X-ray spectroscopy (EDS) that takes advantage of the Schottky electron gun delivering a large probe current (200nA), electron back scatter diffraction (EBSD) to perform crystallographic characterization, and cathodoluminescence (CLD). In addition, the 3D analysis function Cut & See is included in the standard configuration, allowing cross-section milling to be executed automatically at fixed intervals, while acquiring SEM images for each cross section.
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System
SpecMetrix
SpecMetrix systems by Sensory Analytics were designed from the ground up to precisely measure the absolute thickness of just about any coating on any substrate. All our systems are flexible for use in virtually any manufacturing environment. They provide coating thickness data of unprecedented accuracy—helping manufacturers reduce costs by optimizing coating process control and product quality. Our systems are easily configured to measure webs, coils, flat sheets, small samples or finished parts.
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Electrodynamic Vibration Test Systems
CV-series
CV-series is suitable for transportation tests. The lateral support stiffness and maximum displacement of the CV-series are large enough to be accommodate vibration tests of the specimens with high center of gravity.
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Sensortech Systems
IMPS-4400
The Instant Moisture Profiling System (IMPS) is a non-contact RF moisture profiling system, typically used in board manufacturing plants, built in a customizable multi-sensor arrayed framework.
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Medical System
Sentinel II
Chroma Systems Solutions, Inc.
The Sentinel II system provides fully automatic Electrical safety testing to IEC/EN/UL/CSA 60601-1. Sentinel II saves time by scanning patient connections for leakage current without powering down the medical device.
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HEV / EV / Grid Emulators and Test Systems
With Scienlab test systems and test software, Keysight offers customized test environments for the development and testing of electronic components according to hybrid and electric vehicle testing standards. Our solutions help you to accelerate your e-mobility applications from the battery, Battery Management System (BMS), inverter, the charging interfaces of Electric Vehicle (EV), and Electric Vehicle Supply Equipment (EVSE).
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AOI & SPI Test Systems
To keep the quality of your production at its best you need a good inspection of your boards. For efficient and detailed in-depth board inspection ensure you have SMT inspection equipment that meets your needs. Our AOI & SPI units will provide the quality you need for reliable inspection of soldering inspection.
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Test Systems Integration
Highly flexible test solutions that are cost effective offering basic tests that easily adapts to high product volumes and complicated tests. Mobile computer based test stations provide a wide variety of test solutions at efficient costs.
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On-Board Systems
OBS-ONE series
HORIBA developed the OBS-ONE series on-board emission measurement system in response to new requirements for exhaust emissions measurement from vehicles being driven on public roads (Portable Emissions Measurement Systems - PEMS). This development has been made possible by reducing the dimensions and power consumption of laboratory grade analyzers and ensuring that the system components have excellent vibration resistance. The OBS-ONE series continuously measures not only the concentration of CO, CO2, THC and NOx, but also measures exhaust fl ow rate and A/F ratio to calculate mass emission and fuel economy.
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System Solutions
The modular and flexibly expandable system solutions from aixACCT Systems ensure that you always measure the characteristics of your samples independently of the operator and according to the specifications of the entire system.
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Laboratory Automation & Robotics
Anton Paar offers more than 170 analytical solutions and is the market leader in digital density measurement and rheology. Our automation solutions optimize automated workflows which address today’s key topics, namely productivity, reproducibility, and precision.
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Assay System (Rest System for Longevity)
New polymers are constantly being developed and component manufacturing techniques appear, allowing the gradual replacement of metallic materials by plastics or composites, in various fields of application, in different industries. In particular, in the air conditioning, heating and water supply sector, plastic components are subject to the aging process due to the temperature to which they are subjected or due to the amount of oxygen in the fluids. The Test System for Longevity and Accelerated Aging Tests developed by Controlar allows to foresee, in accelerated test, the wear throughout the life of the plastic components of the hydraulic systems, in order to prevent eventual failures during the useful life cycle of the DUT.
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Optical Systems
Thorlabs' optics can be incorporated together to create packages with new functionalities. Some of the packages highlighted here range from beam expanders and collimators to interferometers and spectroscopy kits. Optical isolators, Pockels cells, and modulators are other examples.
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Scan Systems
Allows its user to achieve previously unreachable levels of dynamic performance and precision.
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Automation Equipment
Through its SMART and COMPACT automated equipments, RECIF Technologies proposes a complete offer for wafers/substrates atmospheric handling, and provide IC manufacturers with innovative and configurable solutions responding to wafers and frames handling requirements.
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Semiconductor & Electronic Systems Test and Diagnostics Services
Reliability Test and Diagnostic services are offered to a wide range of customers that are active as Fabless Semiconductor or Integrated Device Manufacturers, automotive electronics supplier, Telecom and ICT application specialists, Industrial and Medical electronic system manufacturers or in Aerospace and Space applications. Independent high tech test and diagnostic service laboratory. IC and electronic module qualification. ESD and Latch Up testing. Design assessment by HALT/HASS. Failure and construction analysis.
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Mobil Cable Test and Fault Location System
SWG-12 (SWG-32)
• testing cable insulation with DC (rectified) voltage up to 32 kV;• conditioning faults by burning faulty cable insulation with current up to 100 mA;• pre-locating cable faults with the reflectometer RIF-9 based on the pulse reflection method (TDR), voltage wave oscillation method (DECAY), impulse current envelope (ICE) method and arc reflection method (ARC / ARC multi-shot);• pinpointing cable faults with the acoustic method with up to 2000 J surge wave generator and a suitable signal receiver.
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Diving Technology Test Systems
Ingenieurbüro Dr. Hillger Ultrasonic-Techniques
The imaging ultrasonic testing systems of the USPC 30XX series are optimized for testing a wide variety of materials and provide high-resolution findings in the form of A, B, C, D and F images. The hardware consists of an industrial PC, in which a motor controller and an ADC card are installed, as well as a HILL-SCAN pulser/receiver unit. An overview of the available systems is given in Table 1.
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Pneumatic Horizontal Shock Test System
KRD12 series
The KRD12 series shock test system is used to measure and determine the horizontal impact resistance of a product or package, and to evaluate the reliability and structural integrity of the test unit in a horizontal impact environment. The system can perform conventional half-sine wave, post-peak sawtooth wave, or trapezoid wave shock test to realize the shock energy that the product is subjected to in the actual environment, thereby improving the product or packaging structure.
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Dynamic Component Test Systems
RedViking brings advanced engineering and proven implementation expertise to your next dynamic component test stand. We’ve designed entire fleets of multi-model and single-model test systems for new component development and production as well as military and commercial MROs. We have decades of experience building and implementing turnkey dynamic component test systems, and we’ll work with your teams virtually anywhere in the world.
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Raman Systems
Raman spectroscopy is a element specific non-contact analysis technique. It is widely used for the classification and quantification of a variety of substances and materials. Meanwhile, this versatile and selective method has established itself as an essential standard method in the industrial environment, making various process analytical applications easily accessible.
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Custom Motor Test Systems
Magtrol's Customized Motor Test Systems (CMTS) are PC-based, turnkey systems custom designed and built to meet your specific motor testing requirements. By integrating Magtrol's motor test equipment with power supplies, adaptable fixtures, custom tables/cabinets, printers, etc., Magtrol's engineering team can customize PC-based, turnkey systems and modular test benches for almost any motor test application.
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Bipolar/FET/Diode Dual Head Production Test System
36XX
Two test stations on the 3600E and 3601E systems. Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes and darlingtons. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3602E or 3603E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
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SoC Test System
T2000
SoC devices require small-lot high-mix manufacturing methods in the present era of rapid generation change. Semiconductor makers struggle with requirements to replace their testers on a 2-3 year cycle. The T2000 addresses their needs by enabling rapid response to market needs with minimum capital investment.
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Rapid Automated Modular Microscope
RAMM
Applied Scientific Instrumentation
*Featuring automated high-speed XY stages, precision piezo & motorized Z focusing, and a wide range of scanning options.*Configurable with infinity-corrected optics, dichroic filter cubes, multi-wavelength excitation and emission filterwheels, shutters, and detectors including cameras and photomultipliers.*Auto-focus, focus stabilization, tracker, and robotic specimen loader available.*Arrangement provides a solid platform for high throughput screening, genetic sequencing, experimental research, and much more.*Designed for flexible cost-effective OEM development using high quality high MTBF components to reduce cost and increase customer satisfaction.
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Conducted Immunity Test System
Conducted RF immunity tests acc. to IEC/EN61000-4-6 and BCI tests acc. to ISO 11452-4 and MIL-STD 461 CS 114 Signal generator,RF-power amplifier, RF-power meter and directional coupler (optional) in one 19”-caseStand-alone operation possible with optional available netbookControl-software includedMost important parameters are shown on an integrated displayAutomatic EUT-monitoringOperation via USB port of a PC or NotebookComplete range of CDNs available
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Diagnostic Test System™
The original Teseda system for bench-top stimulus, test pattern debug, validation, device failure mode stimulation in-situ with other Failure Analysis lab equipment such as an EMMI, etc.
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COMPUTERIZED AUTOMATIC RELAY TEST SYSTEM
CVRT-S16
CVRT-S8 & S16 are ideal for automatic testing of ELECTRO MECHANICAL AND READ RELAYS (only DC relays) both for static and dynamic characteristics. This system scans at one stroke, all the parameters of the relay as per definition of test procedure. The test sequence can be pre-programmed and stored in the disk. You can select the tests as per your requirement. Can include or exclude the test and you can have several options to match your test definitions. Semi skilled person can be engaged for actual testing, as he need not make any settings and need not interpret the readings. The system conducts the tests and gives PASS / FAIL indication on overall test results. If a printer is connected, each test result will be printed.Test Parameters : -> Coil Resistance.-> PickUp/Pull In /Operating Voltage or Current Linear Ramp Method or Step Method.-> Measure Pickup Contact Gap FBB-LBB V or mA-> DropAway/Drop Out/Release Voltage or Current Linear Ramp Method or Step Method.-> DropAway Contact Gap FFB-LFB V or mA-> % Release Dropaway/Pickup-> Contact Resistance of all contacts both Front and Back contacts.-> Operating Time @ Set Voltage or Current.-> Contact Bounce or Chattering Time while Operating @ above-> Release Time @ Set Voltage or Current.-> Contact Bounce or Chattering Time while release @ above-> Difference of Operate Time - Release Time.-> Bridging Test or Non Overlap Test.-> Transfer or Traverse Times while Operate and release.-> Operate Time @2nd Set Voltage or Current.-> Release Time @2nd Set Voltage or Current.-> Power Consumption @ Rated Voltage.-> Coil Current @ Rated Voltage at Room Temperature.-> Coil Resistance Corrected to 20deg C.-> Timing Waveform Graph for all active Contacts.
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GPC Systems
GPC System
The Nexera GPC System provides highly reliable and highly extensible performance in a wide variety of applications. Hardware that provides rapid instrument stabilization and excellent reproducibility of analytical results, and software that includes analytical workow automation and overlap injection functions and features a user-friendly analysis screen view contribute to improving productivity. In addition, Analytical Intelligence functionality based on state-of-the-art digital technology provides highly reliable analytical results by preventing potential problems and ensuring the instrument is always in a stable state, regardless of the skill, knowledge, or experience level of the analyst.
