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- Cytec Corp.
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Physical Layer Switching Systems for Copper LAN, WAN< DSL, Telco Apps with RJ Style Connectors
RJ Series Switching Systems
The RJ Series of computer controlled switching systems are designed for physical layer switching of multiwire signals on RJ style connectors. Since the system uses mechanical relays it acts exactly like a piece of cable which makes it perfect for testing networks without altering the signals or regeneration. These systems are typically used for Ethernet LAN 10BaseT through 1000BaseT, DSL including ASML through GFAST, CAT5 through CAT6A cable testing, USB up to 2.0, RS232, RS422, RS485 up to 8 wire at 20 Mbps and many other applications switched over RJ45 connectors up to 8 wires. They may also be used as lab automation switches, network testing switches, patch panels, network redundancy switches or any number of physical layer applications.
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Partial Discharge Detection System
JFD-2000
Wuhan Sangao Electrical Test Installations Limit Co.
Ease of use was the mandate to our engineering and design teams. The JFD-2000 uses the worldwide standard Windows operating system and an intuitive control and display panel to allow even inexperienced operators to learn quickly with minimal training. In addition, advanced features such as higher accuracy, auto-mated calibration, data analysis, and customized test recording, are standard. Use as much or as little as you like.
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AC / DC Electronic Loads – Benchtop Testing to Automated Test Systems
Chroma Systems Solutions, Inc.
Chroma is the global leader in Electronic Load manufacturing. Chroma’s AC Electronic Loads are designed for testing uninterruptible power supplies(UPS), Off-Grid Inverters, AC sources, and other power devices such as switches, circuit breakers, fuses and connectors. Chroma’s DC Electronic Loads are used for power testing in all markets including automatic test systems, LED, power supply testing, battery testing, and fuel cell testing. Chroma loads can do it all including full current down to 0.4VDC, CZ mode, user defined waveforms, timing measurements, and 3 current ranges per load. Chroma’s electronic loads come standard with either USB or RS232 ports for control and can be configured for GPIB (IEEE-488) control as well.
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PXI-2531, 512-Crosspoint, 1-Wire PXI Matrix Switch Module
778572-31
512-Crosspoint, 1-Wire PXI Matrix Switch Module—The PXI‑2531 is a high-density PXI matrix switch module built to serve high‑channel‑count automated test systems. Featuring compact reed relays with switching speeds up to 2,000 cycles/s, the PXI‑2531 is designed for low‐current, high‐speed switching. It also features onboard relay counting for relay monitoring and deterministic operation with hardware triggers to improve test throughput.
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Production – High Speed Functional Test Systems
Chroma Systems Solutions, Inc.
Built for production, our high speed functional automated test system is based on our C8000 platform which uses a unique test command optimization technology to prevent sending repetitive control commands to the system hardware devices. This improves system test speed dramatically and, when used with our PowerPro III software, makes it highly efficient as a closed or optimized auto test system.
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Temperature Chamber
MTC-20
Improve your temperature dependent testing with the Compact Bench Top Temperature Chamber, seamlessly integrated with a Maccor Automated Test System. Its compact design allows for easy placement on any benchtop. For increased capacity, you can install up to 4 chambers into a standard 19” industrial rack cabinet.
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Automatic Software Testing
Conformiq
Instead of using test cases, Conformiq users have a model, which describes the System Under Test, or the product they want to test. From the model, Conformiq products use highly intelligent algorithms to automatically determine the necessary tests and test data, and automatically generate scripts for automated execution.
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Microwave Switches
SMX-7XXX (Microwave)
The AMETEK VTI Instruments SMX-7000 Series of microwave switch cards extends functionality typically reserved for dedicated stand-alone systems into the PXIe from-factor. Single and dual slot configurations provide the ability to mix and match multiple switch configurations including SPDT, SP4T, SP6T and Transfer. Embedded virtual schematic control further simplifies setup and debugging allowing all relays to be engaged independent of application software and device drivers. Ideally suited for medium-to-high density automated test equipment (ATE), the SMX-7000 Series deliver uncompromised measurement integrity ideal for the most demanding aerospace, defense and communication applications.
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AUTOMATED SAFETY AND COMPLIANCE
DMC's test and measurement system offerings include designs and development of Automated Safety, Compliance, and Benchmark Testing. These serve interests of commercial product certification, including fire hazards, safety and signaling, lighting, building safety, energy, and hazardous location testing. These also serve interests of product and technology benchmarking, including brand quality protection, consumer quality, and energy efficiency. Test systems have been developed by DMC to support many standards, including UL (Underwriters Laboratories), Consumer Reports, Intertek, Energy Star, and EN / CEN European Standards.
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VFTLP+ Test System
4012
The Model 4012 VFTLP+™ test system was developed in early 2000 to add high speed measurements to the usual I-V plot, to measure and record the real TDDB waveform which causes oxide failure.*Accurate measurements of this waveform have finally been identified by Barth Electronics Inc. and CDM protection can now be based on known dimensional design parameters. We identify the response of your CDM protection circuits with 100ps risetime pulses which simulate the real CDM test. This is the only way with which to provide the total gate oxide threat voltage data.*Convenient, precise, repeatable operation*Computer controlled for automated testing
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Air Data Calibrator
ADC-2550
TestVonics ADC-2550 Air Data Calibrator is a high accuracy pitot static calibrator. The ADC-2550 is capable of controlling and measuring Altitude and Airspeed pressures with the highest degree of accuracy. The control and measurement range of the test system can meets or exceed requirements for both commercial and military applications - the ADC-2550 is Nationally Stock Listed. The ADC-2550 is a derivative of the ADC-2500 Series. It features a touchscreen interface, a mid range 23PSIA sensor. It is ideally suited for Automated Test Equipment (ATE) applications.
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Multiport Coaxial Switch, DC to 26.5 GHz, SP6T
87106C
The Keysight 87106C multiport switch improves insertion loss repeatability and isolation, which is necessary for higher performance test systems. The repeatability and reliability of this switch is vital to ATS measurement accuracy and can cut the cost of ownership by reducing calibration cycles and increasing test system up time. The Keysight 87106C terminated multiport switch provides the long life and reliability required for automated test and measurement, signal monitoring, and routing applications. Highly repeatable switching capability is made possible through Keysight's rigorous design and tight manufacturing specifications. Low insertion loss repeatability reduces sources of random errors in the measurement path, which improves measurement accuracy.
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Vehicle Dynamics
Vehicle Dynamics TestingComplete data acquisition and analysis system for vehicle dynamics testing. The solution offers a set of automated test maneuvers for vehicle dynamics. The entire solution is based on the Dewesoft data acquisition systems and offers standard test maneuvers and quick pass/fail evaluation for the driver.
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True RMS Power Sensors
LadyBug True RMS Average Power Sensors deliver reliable, accurate power measurements for CW, Pulse, and modulated signals. These diode based sensors feature a wide dynamic range and a great VSWR. The optional external triggering input feature can be used without any external components. Recorder and Trigger outputs are also available. Our patented NoZero NoCal technology make these sensors ideal for calibration systems, automated test stations and other embedded applications.
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Development Software Suite
JTAG ProVision
The JTAG ProVision software suite is used to generate boundary-scan tests and in-system programming applications for assembled PCBs and systems. This professional development tool is fully automated and supports the import of design data from over 30 different EDA and CAM systems. Other key data inputs are JTAG device BSDL models and a large, well-maintained model library describing thousands of non-JTAG devices.
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Mixed Signal Battery Test System
The Mixed-Signal Battery-Test System is an automated test platform designed to meet today’s advanced battery test requirements. The platform is ideal for testing a range of battery cells and packs, and can be used in applications such as research and design, quality control, and end-of-line manufacturing. Its distributed architecture provides a scalable solution with configurable system components to accommodate specific applications.
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AC Filament Switching and Line Relays
*Heavy duty Elkonite contact tips*AC and DC versions available*AC versions available with or without internal rectifier PCB*Automated vision system and operator inspection*Comprehensive automated end of line testing*Test Certificates supplied with each relay*Certificate of Conformity supplied with each order*Recertification and repair services available
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Signal Analysis Synthetic Instrument
SASI
Textron Systems’ SASI 240 is a Signal Analysis Synthetic Instrument that combines the capabilities of six distinct measurement systems into a single device. Our dual-channel architecture enables two independent radio frequency (RF) measurements to be run simultaneously. Whether used as a benchtop device or an integrated automated test equipment (ATE) RF subsystem, our SASI’s simple and intuitive graphical user interface (GUI) ensures easy, out-of-the box functionality.
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GO-2000 Goniophotometer
Hangzhou Everfine Photo-E-Info Co., LTD
GO-2000 is a highly automated luminaire light distribution performance test system, mainly used for all kinds of indoor lamps, road lamps and floodlights ( add B-β test accessories) light distribution performance test, total luminous flux test and electrical parameters (voltage, current, power, power factor) measurement.
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RF Automated Accelerated Reliability Test Station (AARTS)
RF-HTOL
The RF Automated Accelerated Reliability Test Station (AARTS) systems are designed to stress devices with RF, DC, and thermal stimulus. The systems were designed from their inception to include RF stimulus - it was not added as an after-thought. Hence, the software and hardware are fully integrated and provide full-featured support.
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cRIO-PN-S, Slave, C Series PROFINET Slave Interface Module
782131-01
Slave, C Series PROFINET Slave Interface Module - The cRIO-PN-S connects NI programmable automation controllers (PACs) to PROFINET industrial networks as powerful slaves. The interface includes the NI‑PROFINET for CompactRIO driver for human machine interface (HMI) and supervisory control and data acquisition (SCADA) applications. You can perform PROFINET device automated test using these interfaces. The cRIO-PN-S is only compatible with CompactRIO systems.
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Launch Analyzer
2440
The 2440 Launch Analyzer is the first fully automated test system for characterizing the optical power distribution of the light produced by VCSEL laser sources, multimode fiber test equipment and launch cords utilized in multimode fiber links. Built on over 20 years of experience testing the transmission and geometric properties of muitimode fibers, the 2440 is the ideal solution for ensuring that source launches comply with applicable international component specifications and measurement standards. The 2440 can be configured for measurements in either or both the 850 and 1300 nm windows.
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T3DSO4000L-HD Series Oscilloscopes
T3DSO4000L-HD Series
The Teledyne Test Tools T3DSO4000L-HD Oscilloscopes feature four and eight channel low profile models all with 12 bits of vertical resolution. With analog bandwidth options of 500 MHz, 1 GHz and 2 GHz. Each model offers a maximum sample rate of 10 GSa/s with ESR per channel, and a maximum memory depth of 500 Mpts in single channel mode. The T3DSO4000L-HD series is ideal for ATE systems as well as other automated applications.
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PXI-2599, 26.5 GHz, 50 Ω, Dual SPDT PXI RF Relay Module
778572-99
26.5 GHz, 50 Ω, Dual SPDT PXI RF Relay Module - The PXI‑2599 is a general-purpose single‑pole double‑throw (SPDT) switch module for routing RF or microwave signals in automated test applications. You can use this module for basic signal routing or inserting and removing components in a signal path. The PXI‑2599 is also well-suited for passing high-order harmonics from PXI RF Signal Upconverter modules or routing multiple sources to PXI RF Signal Downconverter modules. You can use its onboard relay count tracking feature to predict relay lifetime and reduce unexpected system downtime.
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Software Platform Bundle
The Software Platform Bundle provides the entire NI software portfolio for building any application. Develop applications in multiple environments, including LabVIEW Professional, LabWindows/CVI, and Measurement Studio. Extend the functionality of the LabVIEW development environment with all add-ons to perform code deployment, hardware integration, data analysis, and code validation. Build automated test systems with TestStand and real-time test systems with VeriStand.
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RF/Microwave ATE Systems
Over two decades ago, In-Phase Technologies founded our company for the purpose of designing and producing reliable high quality RF and microwave Automated Test Equipment (ATE). We continue that tradition today, providing the best, world-class automated test equipment. Our system designs bring together the right combination of Commercial Off the Shelf (COTS) test equipment, custom designed and built Interface Test Adapters (ITAs), lightning fast and accurate measurement software, and the optimum user interface to make all of this technology easy to use.
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Automated Test Systems
WinSoft designs, develops and integrates automated functional test systems for use in aerospace, military, high tech and commercial applications
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Semiconductor Test Software
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
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Function Test Systems & Equipment
Cincinnati Test Systems (CTS) provides our customers with turnkey systems that include the design, manufacture and support of custom built lean cell and automated functional equipment testing solutions. We are a recognized global leader for providing test solutions integrated with advanced technology, precision instrumentation, information software written by CTS engineers with proven experience, and supported by a team of technical application specialist.
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Power Transformer Automatic Test Device
XD71
Hangzhou Xihu Electronic Institute
The device is used for power transformer power outage routine test items to do automated testing.Which is characterized by dielectric loss, insulation resistance, DC resistance, tap-changer switching characteristics, short circuit impedance and variable ratio of six test items are concentrated in an instrument,so that the instrument function, test power and test lead height fusion.Field test, just start wiring once, at the end of unplugging wiring once,the middle process by the test personnel in the computer terminal to send command control,the test system automatically completes all or part of the above test items.
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Universal Function Test System for Industrial Electronics
General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.The system has a Virginia Panel adapter interface to which various desk adapters can be docked, including automated contacting of the DUTs. A camera for the verification of light emitting diodes on the test object is integrated in the adapter interface.
