Inspection Systems
See Also: Inspection, Inspection Services, X-ray Inspection Systems, Automated Fiber Optical inspection Systems
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Product
VLSI Test System
3380D
Test System
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Product
Vision Systems
System
Embedded vision systems, also referred to as compact vision systems, offer an alternative to Smart cameras and computer-based systems. The ADLINK EOS series is a complete embedded system that offers image acquisition, processing, archiving, and display capabilities. It is equipped with a multi-core CPU, ideal for applications requiring high computing power and multi-camera imaging, such as 3D vision and robotics guidance. Featuring rich I/O connectivity with factory-floor networks, including RS-232/422/485, USB, and isolated digital I/O, as well as onboard storage, ADLINK’s embedded vision system is ready to deploy. A system monitoring feature, feeding back temperature and voltage data, combines with a watchdog timer to maximize robustness and reliability of the ADLINK EOS series in mission critical applications.
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Product
Modular Breakout System 50-Pin D-type Plugin Module for 40-196
95-196-001
Modular Breakout System
The 95-196-001 Plugin Breakout Module is designed to be fitted to a PXI 40-196 Fault Insertion Switch as part of the Pickering MBoS. The Modular Breakout System is designed to Simplify HILS (Hardware In the Loop Simulation) Applications.
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Product
High-Speed Signal Recording Systems
System
GaGe has a long history of providing high-speed, real-time signal acquisition, processing, and recording systems on PC-based platforms. This expertise saves customers time and eliminates uncertainties and risks with self-integrated systems.
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Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
Test System
Compact solution for testing Battery Packs with output power up to 110 kW and voltage range up to 1500 V
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Product
2-Module ICT System, I317x Series 6
E9902G
In-Circuit Test System
Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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Product
Resolver Systems and Resolver Sub Systems
TDSM
System
Computer Conversions Corporation
The TDSM Series are low cost absolute encoders consisting of a size 11 electromagnetic transducer and a 2.6 x 3.1 x .6 conversion module. The outputs available are 12 to 16 bit binary format representing 0 to 359.99 degrees of absolute shaft angle input. The transducer reference supply is also included in the module which is designed for printed circuit mounting. A data transfer and data hold line are provided for simple computer or microprocessor interfacing. These features in addition to the latest digital circuitry techniques, make these encoders the best selection in today's applications where resolutions greater than 10 bits are required with ultra high reliability assured.
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Product
Battery Management Systems Testing
System
A Battery Management System (BMS) is an embedded unit performing critical battery functions, including cell monitoring and balancing, pack charge and discharge control, safety, and communications. The BMS must be tested early in development to optimize control algorithms, as well as during manufacturing to ensure reliable functionality. Bloomy’s family of BMS test systems provides a consistent platform for engineers to bring a BMS to market faster, and more reliably.
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Product
Functional Test System Optimized For Real-Time Digital Bus Test
Spectrum HS
Test System
Spectrum HS is Teradyne’s fully integrated functional test system. Optimized for real-time test of low latency buses, it’s a high-performance system delivering excellent test coverage of current and future products.
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Product
Mezzanine System
5147
System
ECM P/N 5147 provides two channels of 12 bit A/D conversion using the Analog Devices AD9235, and is suitable for medium resolution high speed applications. The two differential inputs are terminated in 120 ohms and buffered with a gain of 1 differential amplifier. Differential Input range is +/-3.0V. Sample rates are 20MHz per channel with a 5MHz 4 pole elliptical analog input filter.
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Product
Automated Gage Measurement System
AGMS
System
Our Automated Gage Measurement System for Sand Screen (AGMS) provides accurate and repeatable optical measurements for all wire-wrapped gaps along the full screenlength. This inspection machine enables oil field sand screen manufacturers to meet the measurement requirements of API Spec 19S1 and ISO 17824:2009.
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Product
SoC Test System
V93000 SoC / Smart Scale
Test System
Advantest’s V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. The user benefits are reduced test time, best repeatability and simplified program creation. The system design makes it easy to extend your configuration with new modules and instrumentation, as your test needs change.
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Product
6U VPX Direct RF Processing System
VP460
System
The VP460 is designed to enable customers to begin development of their next generation systems using revolutionary new processor technology. It is in alignment with the SOSA™ Technical Standard to provide the interoperability required by the US Air Force, Army and Navy.
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Product
HV Test System for Patient Monitors
Test System
HV test enclosure for testing medical products (patient monitors). Insulated test booth with large space for DUT.3 different test nests for adapting different devices.Displays from patient monitors are checked. For this, insulation tests and leakage current measurements must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
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Product
Positioning Test System
TS-LBS
Test System
The R&S®TS-LBS is a comprehensive test solution for network and satellite based location technology testing of wireless devices and chipsets.It is highly configurable for testing various location technologies and uses Rohde & Schwarz location based test systems.The R&S®TS-LBS test system family fulfills the requirements of LBS conformance testing and operator acceptance testing on GSM, WCDMA, LTE and 5G devices and chipsets as well as regulatory testing consisting of adjacent channels and spurious emissions for EN 303 413 receiver testing. It also fulfills the requirements of E112 (EU) 2019/320 testing consisting of GNSS testing such as Galileo and AML mobile testing.
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Product
PCB Test System
Circuit Wizard - CW409
Test System
Qmax Test Technologies Pvt. Ltd.
CW 409 –Circuit Wizard PCB Test System has all the features of QT9627 such as Desktop PCB Test System. It can be configured to maximum 64 Channels of In-circuit Functional Test Channels and 64 Channels of QSM V-I Signature Test.Maximum Digital Test Speed 10MHz in the QT9627 .It can be connected to any PC/AT or Laptop with Windows 10 operating system through USB Plug and play interface. It operates on user friendly Qmax Test Director software platform with different modes like Test Station for operator level use Test Sequencer mode for Programmer level use and Interactive Workstation mode for quick working.
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Product
LabVIEW Professional Development System
System
ntegrate hardware from a variety of measurement instruments and devicesIntuitive graphical programming syntax to simplify automationBuild custom user interfaces for engineering applicationsBuilt-in algorithms for signal processing, analysis, math, and PID controlSoftware engineering tools to debug, validate, and deploy codeOne-year SSP membership for technical support, online training, and software upgrades
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Product
Photodiode Burn-in Reliability Test System
58606
Test System
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Product
Flash Memory Test System
T5830
Test System
T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
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Product
PXI Semiconductor/IC Test System
Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Product
Antenna Test System
ATS1000
Test System
Offering measurements on active and passive devices - supporting also extreme temperature testing. 5G is all about data, speed and reliability using high frequency millimeter wave bands. The lack of conventional external RF connectors makes 5G antenna characterization challenging. 5G antenna, chipset and UE manufacturers as well as wireless market operators need a viable solution for research, diagnostics and debugging up to type approval.
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Product
In-Line RF Test Station
AP770
RF Test System
ICT, Functional, Hipot, Vision, ISP and RF test with low cost fixtures in a very compact test station footprint Works with PCBs up to 450×550 mm or with palletized devices Space for up to 25 VPC mass interconnect modules or YAV switching units
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Product
Lower-Cost Small Footprint In-Circuit Test System
TestStation LHS
In-Circuit Test System
The TestStation LHS in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne’s popular, award winning TestStation product family. Compatible with existing TestStation LH fixtures.TestStation LH features the voltage accuracy and backdrive current measurement embedded in Teradyne’s SafeTest protection technology for accurate, reliable and safe powered-up testing of new low-voltage software.
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Product
Image Sensor Testing
IP750Ex-HD Family
Test System
The IP750EX-HD has been the test platform that has enabled the industry to manufacture high quality CCD and CMOS image sensors, and it is the most economical platform to meet the needs of newer technologies such as Time of Flight (ToF) sensors. When you use a smartphone, high performance digital still camera, or in-home security and surveillance system, these applications have image sensors most likely tested by Teradyne’s IP750ExHD.
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Product
HTOL Test Systems
Test System
Our IOL & Power-Cycling systems increase measurement quality & throughput while simultaneously reducing the Total Cost of Test (TCoT) of an open platform. We focus on complete monitoring and precise temperature control for each device under test.
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Product
LabVIEW Full Development System
System
LabVIEW is engineering software designed specifically for test, measurement, and control applications that require rapid access to hardware and data insights. The LabVIEW Full Development System is recommended to customize your engineering application with advanced inline analysis and control algorithms. For applications that require software engineering tools to develop, debug, and deploy professional applications, consider LabVIEW Professional Development System.
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Product
Medalist i1000D
U9401B
In-Circuit Test System
The Keysight Medalist i1000D is now even better. Improving from its previous state of an analog-only ICT, the new digital release of the system now features per pin programmable digital cards and a whole new set of intuitive software graphical user interfaces (GUIs) that makes programming and development effortless.
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Product
EMS Test System
TS9982
Test System
The R&S®TS9982 is the base system for conducted and radiated EMS measurements. Due to its modular design, it covers a wide range of applications and can be very easily adapted to the measurement task at hand. Any configuration is possible – from conducted measurements and the small precompliance system with a compact test cell to the accredited test system for complete motor vehicles with 200 V/m.
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Product
Build-to-Print for Test Systems
Test System
Built-to-print / test system replication addresses your internal capacity and capability constraints. Ball Systems has perfected quoting, procurement, planning, assembly, testing, quality, delivery and installation to ensure your testers are on-time and on-budget, and meet design and production standards while keeping open and transparent communication.
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Product
Radar Test System
UTP 5065
Test System
Radar sensors are core elements to realize autonomous driving. The UTP 5065 radar test system from NOFFZ Technologies has a compact vertical design and contains everything needed to allow State-of-the-Art measurement and sensor calibration. The test bench setup and component selection are tuned to get best possible results for highly accurate and cost-efficient testing in production of automotive radar sensors.
