I-V-Curve
See Also: Photoluminescence
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Solar Cell PL/EL/IV 3-in-1 Testing System
VS6841
Industrial Vision Technology Pte Ltd.
This luminescence Analyzer integrates a Photoluminescence (PL), Electroluminescence (EL) , and I-V Measurement Technology, has a Device’s PL image, EL image, as well Device’s I-V characteristics in One system. It is being using to quantitatively map Minority-Carrier Lifetime, and to characterize the defect of silicon wafer & solar wafer, and measure the key parameters from solar cell I-V Curve. It is also a useful tool for scientist to develop other methodology & parameters that can be used as a promising technique for online material monitoring and process control.
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Curve Tracer
Series 5000C
Our curve tracers are used worldwide for high volume production, quality control and final testing of descrete semiconductor devices. Provided with an Intel based single board computer(SBC) and Windows based software, the Scientific Test curve tracer is highly reliable, extemely fast, very easy to operate, and provides quick creation of digital curves for data storage and intuitive manipulation.
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I-V Measurement Systems
The I-V Curve Data Acquisition includes a fixture for holding cells for testing (see Figure 1 below). This fixture can accommodate cells from small to up to 100 mm x 100 mm. Adjustable cell stops, in the X & Y-axis, are provided to consistently locate the cells for testing. Two micro-manipulators are provided as shown in Figure 1. Each micro-manipulator has two spring loaded contacts to allow 4-wire measurement even for cells that have top contacts only. Two back-side voltage contacts are embedded in the Plate (galvanically isolated from the Plate) and make good electrical contact when the cell is held down by vacuum to the plate. All voltage and current probes are gold-plated. The cell is held down with vacuum during testing (built-in vacuum pump).
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High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
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Precision Curve Tracer
CurveMasterTM
The CurveMasterTM delivers new price/performance efficiency to curve tracing and Failure Analysis. Curve trace has been a standard feature in our full-power chip tester for years, so the CurveMasterTM is built with today’s components and technology. With all new high-accuracy DC Parametrics, you’ll enjoy the most powerful curve tracer you have ever used.
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Automated DC Parametric Curve Tracer
MultiTrace
MultiTrace curve tracer is a mid-sized benchtop model supporting pin counts from 216-625 pins and includes the PGA-625 fixture as a standard interface. MultiTrace supports a wide range of test applications: Failure analysis, Reliability testing, Counterfeit device analysis, Nondestructive electrical counterfeit test, Opens, shorts leakage testing (OSL), Post decap electrical inspection, Optical fault localization, ESD testing, Latch-up testing, Supply current measurements, and more!
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Quick I/V Measurement Software For PXIe SMU
PX0109A
The PX0109A is an essential and powerful software tool to control the PXIe Precision SMU which makes it easy to quickly setup and perform current-voltage (IV) measurements and to display the measurement data in tables and graphs without the need to program.
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Power Device Analyzer / Curve Tracer
The B1505A Power Device Analyzer / Curve Tracer is focused on the needs of power device manufacturers, while the B1506A Power Device Analyzer for Circuit Design is focused on the needs of power electronics circuit / product manufacturers. The B1507A Power Device Capacitance Analyzer helps both power device development engineers and power circuit designers maximize product value by revealing device capacitance characteristics.
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IND CAT IV TRMS Clamp Meter with Temperature
ACD-3300
This CAT IV rated ACD-3300 IND Clamp On Tester is ideal for industrial applications and utilities that require an extra level of safety. Including True-rms sensing for accuracy, this clamp on meter’s extra large jaws can clamp on to those wide diameter wires making taking measurements in industrial environments simple.
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Precision I/V Source
MeasureReady™ 155
The MeasureReady™ 155 Precision I/V source combines premium performance with unprecedented simplicity for materials scientists and engineers requiring a precise source of current and voltage. Low RMS noise: from 200 nV (10 mV)/7 pA (1 µA). Bipolar, 4-quadrant power source. DC and AC modes supported up to 100 kHz*. Full scale ranges from 10 mV to 100 V (1 μA to 100 mA). 0.001% programming resolution (from 100 nV/10 pA.
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Automated I-V/AOI/EL and Sorting System
OAI’s High Performance In-line Automated-I-V Testing, AOI/EL Inspection and Sorting/Binning System for Various Si Solar Cells. The 10000A-I-V System is a unique and reliable I-V testing, AOI/EL Inspection and Sorting / Binning system for testing of Mono, Multi-Si, C-HJT and other full Size (156mm x 156mm) and/or Cut-cell (156mm x 39mm or 156mm x 31.2mm or other custom sizes) Si Solar Cells.
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DC Parametric Test System with Curve Trace
DC3
The wafer has been fully tested, cut and packaged. Today's IC manufacturers are finding tremendous cost savings in performing just fast DC tests on these packaged parts rather than running the full wafer tests all over again. Until now this required either an expensive full-power IC tester, or a "rack-n-stack" collection of instruments. Enter the HILEVEL DC3 Co-Optive Parametric Tester. No more instruments, no switching matrix, no tricky software. The DC3 combines a high-precision DC-PMU and internal DUT supplies to test up to 2,048 pins, all in a single chassis with Multi-Site capability up to 64 sites. And every DC3 includes our Classic Curve Trace feature, allowing easy curve tracing on every pin.
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AC/DC CAT IV 600 A TRMS Navigator Clamp Meter
ACDC-52NAV
The ACDC-52NAV clamp-on power meter is the ideal choice for jobs that require AC/DC current measurements to 600 A, AC/DC voltage to 1000 V and wide jaws to accommodate large conductors.
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Triple Alarm CAT IV Non-Contact Voltage Detector with Flashlight
FLIR VP50-2
The FLIR VP50-2 is a durable, CAT IV-rated non-contact voltage detector featuring light, vibration, and beeper feedback alarms and a powerful LED flashlight. Use the VP50-2 to reliably check if an AC circuit is live before beginning work; detect voltage on exposed conducting parts or through insulation; identify live wires within electrical panels, switches, and outlets; or trace live wires and map circuits. With an ergonomic and drop-tested design, the FLIR VP50-2 is the right choice for professionals performing field troubleshooting and verification of electrical installations within residential, commercial, and industrial buildings.
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Flat Field and Imaging Gratings - Type IV
HORIBA Scientific produces a wide range of holographic master gratings from which high precision replicas are manufactured.Type IV aberration-corrected flat field and imaging gratings are designed to focus a spectrum onto a plane surface, making them ideal for use with linear or 2-D array detectors.These gratings are produced with grooves that are neither equis-paced nor parallel, and are computer optimized to form near-perfect images of the entrance slit on the detector plane.
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SENSOR FOR THICK & CURVED MATERIALS
S3
The smallest, simplest, most affordable high-precision non-contact sheet resistance sensor availableNon-contact measurement of Ohms/sq, Ohms-cm, resistivity, thickness, and moreChoose a sensor in one of four ranges, from .005 Ohms/sq to 100,000 Ohms/sqadd other sensors laterReads any conductive coatingon even the thickest nonconductive substratesOptions include PC-based productivity software, stage, and morePerformance limited by "lift off" phenomenonelevation of sensor above conductive layer must be carefully controlled
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In-Line Light I-V Testing for Solar Cells
FCT-750
In-line, light I-V and Suns-Voc measurements in a single flash at 2400 units per hour. Capability to accurately measure high-efficiency conventional or backside-contact solar cells.
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PathWave IV Curve Measurement Software
PW9251A
The PW9251A PathWave IV Curve Measurement software helps to control Keysight SMUs for easy test setup and to perform IV measurements without any programming.
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Single Long Pulse Solar Simulator & I-V Test System
TriSOL SLPSS
The OAI Test System for HIGH EFFICIENCY SOLAR CELLS overcomes the limitations of flash testing by providing a highly optimized pulse width and voltage sweep rate to match the cell’s dielectric response speed. As a result, the system produces extremely accurate measurements of solar cell efficiency leading to increased profitability.
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Parameter And Device Analyzers, Curve Tracers
Precision Current-Voltage Analyzer Series ensures accurate and efficient current-voltage measurements that give a clear insight into IV characteristics across a wide range of applications. The powerful characterization software and integrated source and measurements units (SMUs) make it much quicker and simpler to obtain accurate IV characterization. The EasyEXPERT group+ software supports all the characterization tasks such as measurement setup and execution, data analysis, data management and protection and so on, using the graphical intuitive user interface and mouse/keyboard operation. The Current Voltage Analyzers Series provides a wide selection of IV analyzers suitable to your specific current voltage measurement needs in the range from an economic model to the most advanced analyzer capable of supporting cutting-edge applications.
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IV Characteristics Measurement Device [
PECK2400-N
Easy-to-use measurement software supports IV measurement (software + source meter + connection cable) ● Compatible with Windows 10 ● RS-232C connection (PC is optional) ● Works with NI GPIB. ● Simultaneous use with IPCE PEC-S20 D type is possible. ● There is only one operation panel. done on one screen.
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Parametric Curve Tracer Configurations
Keithley PCT
Developing and using MOSFETS, IGBTs, diodes and other high power devices requires comprehensive device-level characterization such as breakdown voltage, on-state current and capacitance measurements. Keithley's line of high power Parametric Curve Tracer configurations supports the full spectrum of device types and test parameters. Keithley's Parametric Curve Tracer configurations include everything necessary for the characterization engineer to develop a complete test system quickly.
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Light I-V Testing for Modules
FMT-500
Advanced analysis of solar modules including light I-V and Suns-Voc data. Capability to accurately measure high-efficiency modules.
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IV Analyzer / 8 Slot Precision Measurement Mainframe
E5260A
Keysight E5260A IV Analyzer is the complete solution for current-voltage characterization of a wide range of materials and devices. The E5260A supports multiple SMUs (Source/Monitor Units) for voltage/current sourcing and voltage/current measurement with the best in the class current measurement performance as low as 5 pA. Its modular architecture allows you to configure or upgrade SMU modules for available eight slots. The EasyEXPERT group+ GUI based characterization software is furnished and available on your PC to support all the tasks required in the characterization from the measurement setup to the data analysis. Powerful integration of SMU’s versatile measurement capabilities and GUI based characterization software makes the E5260A the best solution for characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency.
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Curve Tracer
CS-10000 Series
Hi-voltage devicesDevelopment of new devices (SiC/GaN)Automotive Companies
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IV Characteristics Measurement Device Software
Keithley 2400, 2401 and Keithley 2450
*Windows 10, Windows 11 (Compatible) RS-232C (Keithley 2400, 2401), USB (Keithley 2450)*NI GPIB can also be used (optional)*IPCE PEC-S02 can be used simultaneously. operation panel. *Everything from condition setting to measurement can be done on one screen.
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Pre-configured Power Device Analyzer / Curve Tracer (B1505A with modules and fixture)
B1505AP
B1505AP provides eight different pre-configured packages that satisfy a wide variety of power device measurement requirements. The package can be selected according to voltage / current range and the requirement for capacitance measurement.
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IND AC/DC CAT IV TRMS Clamp Meter
ACDC-3400
The Amprobe ACDC-3400 clamp multimeter is CAT IV rated to add an extra level of safety for high voltage, industrial or utility testing applications. It is an AC/DC current clamp meter and a voltage meter all in one.
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Light I-V Testing for Solar Cells
FCT-650
Advanced analysis of solar cells including light I-V and Suns-Voc data.
