Eye Pattern
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Pattern Region of Interest Analysis System
PRIAS
PRIAS is a synergistic new imaging technique to visualize microstructure and provide exciting new views of your materials. PRIAS enables users to quickly characterize materials without requiring full EBSD pattern indexing. Through a novel use of the EBSD camera, PRIAS provides as many as 25 positional electron detectors to allow unprecedented flexibility in image collection and visualization. Applications of PRIAS include traditional EBSD materials such as metals, ceramics, semiconductors, and minerals as well as new analysis of plastics and glasses.
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ACCUplace Land Pattern Kit
APKIT-1
APPLIED IMAGE, in conjunction with Hewlett Packard Corp., has developed a unique, and extremely accurate, pick & place target set designed to check for accuracy and repeatability of your robotic system quickly and easily.
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PAL Standard Pattern Generator
PG315P
The MicroImage PG315 pattern generator is designed for simple size and geometry reference applications. The PG315 will overlay one of five standard patterns including a centered cross line, a centered cross hair, a centered target style symbol, a dot grid (cross dot) array, a hatch grid (crosshatch) array.
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16-channel, 1GHz, 1Mb/ch USB Logic Analyzer Plus 8-Channel Pattern Generator
LA-Gold-16
A maximum sampling rate of 1 GHz is available on all channels. The LA-Gold-16 has a large data buffer of 1 Mega samples per channel for sampling rates of up to 500 MHz on all 16 channels. The large buffer allows long capture times at high sampling rates. The digital logger function is for capturing very slow varying signals, e.g. room temperature.
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ACCUplace Land Pattern Plate
APLP-1
APPLIED IMAGE, in conjunction with Hewlett Packard Corp., has developed a unique, and extremely accurate, pick & place target set designed to check for accuracy and repeatability of your robotic system, quickly and easily.
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4ch, 1G to 30Gb/s Bit Error Ratio Tester (BERT) With Eye Checker
RB3004
*Low cost continuous 4ch, 1G to 30Gb/s Bit Error Ratio Tester (BERT) and Eye Checker
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Test Pattern Generator Delay & AV Sync Analyzer
VQDM-100
Versatile compact and robust multi-purpose tool for R&D and glass-to-glass QA/QC Instant visual-aural quality estimation plus automatic latency, AV sync and 3D LR sync measurement Multi-channel time-line analysis, including video frames continuity testing 4 Light Sensors with vacuum caps, 4 Audio inputs (standard line levels) 2 channels of AV timing analysis, simultaneous measurements of Video and Audio Latencies Real time multi-channel data acquisition via USB port Unique sophisticated set of static and dynamic test patterns up to 1080p@60fps - see more details in separate VQL page Source of VQDM, VQMA2, and VQMA3 Test Patterns for VideoQ Analyzers Multi-format digital and analog AV outputs: HDMI, YPrPb, S-video, SPDIF, LR analog audio Networkable unit, easy expansion with any external USB storage device: live clips, user content, etc.
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12 Channels 1.0 ~ 17.0 Gb/s (200Gbps) Pulse Pattern Generator and Error Detector
CA9806-12
The UC INSTRUEMNTS CA9806-12 is a highp erformance, flexible 12 channels Pulse Pattern Generator and Error Detector that can operate from 1.0 to 17.0 Gb/s (200 G). It is combined with three sets CA9806 4 CH 1.0 to 17.0 Gbps Pulse Pattern Generator and Error Detector that incorporates an external one by 4 rate clock synthesizer. Its small size allows it to be placed close to the device under test, it can also be placed further away using the TX driver pre and post emphasis controls features to compensate for cable and interconnect losses. It also has a non destructive, integrated eye outline capture feature along with a quick eye height and width measurement capability. Build-in 8.5 ~ 15 Gb/s eye diagram testing function.
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DSR Pattern Editor Software
M9192A
The Keysight M9192A DSR Pattern Editor Software adds additional advanced capability to the Keysight M9195A/B PXIe digital stimulus/response (PXI DSR) modules by providing a graphical user interface for the development system. M9195A/B error log files can be dragged-and-dropped into waveform editor which speeds up the debugging of tests; this gives immediate visibility of discrepancies between the expected state in the ATE patterns with that of the DUT.
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Pattern Generators
PG314P Series
The MicroImage PG314 series of pattern generators are for applications to display custom designed patterns on screen. The PG314 units will overlay the pattern or patterns on top of the video signal provided to the input of the device. While the PG311 can be factory programmed with only one unique pattern, the PG314 can hold up to four patterns and switch between them.
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ACCUplace Grid Indexing Pattern
AP-G Series
Ensuring precise motion and positional accuracy is critical for a number of video analysis systems and automated measuring instruments. The AP-G series is ideally suited for calibrating such elements, in addition to its uses in determining stage squareness, and travel distance image analysis and visual inspection systems where precise motion must be calibrated and measured. All AP-G targets have number/letter indexed columns and rows for easy calibration and are offered on four standard materials; Glass (CG) Opal (OP) Photopaper (RM) and Film (TM).
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Encoder Stress Pattern
ESP™
SRI's ESP is a sophisticated video clip consisting of specialized and complex artificial test patterns that stress various aspects of processing to quickly reveal television encoder deficiencies. Its unique motion sequences allow users to visually evaluate and objectively compare the quality and performance of standard- and high-definition encoders.
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4 Channel 1.0 ~ 17.0 Gb/s Pulse Pattern Generator and Error Detector
CA9806
The UC INSTRUEMNTS CA9806 is a high performance, flexible four channel Pulse Pattern Generator and Error Detector that can operate from 1.0 to 17.0 Gb/s (consult factory for higher or lower operation speeds). It is also a standalone Bit Error Rate test solution that incorporates an internal full rate clock synthesizer. Its small size allows it to be placed close to the device under test, it can also be placed further away using the TX driver pre and post emphasis controls features to compensate for cable and interconnect losses. It also has a non destructive, integrated eye outline capture feature along with a quick eye height and width measurement capability. Build‐in 8.5 ~ 15 Gb/s eye diagram testing function.
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EYE Super UV Tester
UV rays are the greatest cause of product deterioration. This unique system dramatically intensifies the deterioration acceleration caused by UV rays. It can achieve an acceleration factor greater than 100 times normal sunlight, producing material effects equivalent to extended outdoor exposure. Its compact size makes it ideal for research and development testing of paints, inks, pigments and fibers as well as plastics.
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Digital Pattern Generator
Wave Gen Xpress
A digital pattern generator is an essential stimulus source for almost every type of digital device: digital and mixed-signal ASIC, FPGA, microprocessors and microcontrollers. The digital pattern generator can be used early in the design cycle to substitute for system components that are not yet available.
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Pattern Generator
1B-SDI-PTG
The 1B-SDI-PTG 3G-HD/SD SDI Pattern Generator - advanced SDI pattern generator with multi-format and multi-pattern support. Supports still and moving video test patterns, and provides a lot of useful features like audio SMPTE-291M. 1B-SDI-PTG Pattern Generator supports up to 8 channels of AES compliant audio with 48KHz sample rate. Multitasking of 1B-SDI-PTG comes from bypassing HDMI input which allows user to use more testing patterns for connected display or use 1B-SDI-PTG as SDI converter with 3G support.
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Delay Pattern Generator (six-channel Pulse Generator)
DG-8000
*Seamless change: The frequency, pulse width, and other settings can be seamlessly changed during oscillation.*Tracking function: Parameters can be changed at the same time for each channel.*Operation pattern control: The operation pattern option enables continuous operation testing.*Synchronization of multiple generators: The quick synchronization option enables three generators (18 channels) to synchronously output data.
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Standard Pattern Generator Board
BL-PG315-01
The MicroImage PG315 pattern generator is designed for simple size and geometry reference applications. The PG315 will overlay one of five standard patterns including a centered cross line, a centered cross hair, a centered target style symbol, a dot grid (cross dot) array, a hatch grid (crosshatch) array.
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TMR Magnetic Pattern Recognition Sensors
MultiDimension Technology Co.,Ltd.
A type of 6 channels magnetic pattern recognition sensor built-in the signal conditioner and SPI interface Consists of TMR magneto-resistance sensor, high-quality magnet, high-strength plastic base and durable non-magnetic stainless steel cover; Are used for detecting the paper bills, bank notes and security documents with magnetic anti-counterfeiting consists.
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4 Channel 24.5~ 29.0 Gb/s Pulse Pattern Generator and Error Detector
CA9808
The UC INSTRUEMNTS CA9808 4 Channel 24.5 ~ 29.0 Gb/s (100Gb/s) Pulse Pattern Generator and Error Detector is a high performance, flexible and cost effective four channel Pulse Pattern Generator and Error Detector that can operate from 24.5 Gb/s to 29 Gb/s each Channel. 4 channel 29.0 Gb/s make it total up to over more than 100 Gb/s testing capacity. It is also a standalone Bit Error Rate test solution that incorporates an internal full rate clock synthesizer.
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Digital Waveform Acquisition, Digital I/O, Pattern Generators
Digital I/O cards, pattern or pulse generators and digital data acquisition cards are all focused on digital signals. Input and output signals have two logic levels called low state (0) and high state (1). The electrical representation of these logical levels depends on the logic family and the supported I/O standard.
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Jitter And Eye Diagram Analysis Tools
DPOJET
DPOJET is the premiere eye diagram, jitter and timing analysis package available for real-time oscilloscopes.Operating in the Tektronix DPO7000, DPO70000 and DSA70000 Series oscilloscopes. Jitter and Timing Analysis for Clocks and Data Signals. Real-Time Eye Diagram (RT-Eye™) Analysis*1. TekWizard™ Interface for One-Button and Guided Jitter Summaries.
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Pattern Conversion
Wave Wizard
Wave Wizard generates a test program according to device spec. It avoids the inherent problems that exist when trying to force an event-driven simulation into a constrained ATE test program, by considering device perspective.
