Discrete Semiconductor
semiconductor typically having one circuit.
-
Product
Automated Discrete Semiconductor Tester (ATE)
5300HX
-
The Model 5300HX Automated Discrete Semiconductor Tester (ATE) is designed for fast, reliable testing of a wide range of discrete devices. Using an on-board Intel SBC, can provide stand alone testing capability or connected to a PC for intuitive test development and data capture.
-
Product
Automated Discrete Semiconductor Tester (ATE)
5000E
-
Same Proven Technology as all 5000 Series Testers. High Speed Single Test Measure. Capable of Testing Multiple and Mixed Devices. 1KV Standard, 2KV Optional. 1NA to 50A Standard, 100A Optional. 0.1NA Resolution. Complete Self Test. Auto-Calibration. RDSON to 0.1MOHM Resolution. Windows Application Software. Optional Scanner. Optional Wafer Mapping. Optional Curve Trace. MOSFET, IGBT, J-FETTriac, SCR, Sidac, Diac, Quadrac, STS, SBS Transistor, Diode, Opto, Zener Regulator, MOV, Relay. UNDER $23,000.00
-
Product
Parts Screening And Testing
-
DPA Components International performs 100% screening as well as qualification testing on electronic parts supplied to the high reliability Commercial, Industrial, Space, and U.S. Military sectors. We generate software and hardware to test microcircuits, discrete semiconductors, hybrids, PEMS, and other EEE electronic components to exact customer and military specifications.
-
Product
Impact Series Power Discrete Semiconductor Tester
-
The Impact Series Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.
-
Product
EEE Component Testing and Screening Services
-
DPACI performs 100% screening as well as qualification testing on electronic parts supplied to the high reliability commercial, industrial, space, and U.S. military sectors. We generate software and hardware to test microcircuits, discrete semiconductors, hybrids, PEMS, and other EEE electronic components to exact customer and military specifications. Our engineering experience in electronic parts screening, qualification, and in-house test fixture fabrication allows us to provide value added components in a timely manner.
-
Product
The Lorlin© Impact Series
-
Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results.
-
Product
Rebuilt Testers
-
Lorlin® manufacturers New and Rebuilt Discrete Component Semiconductor Test Systems for Transistors, Diodes, Zeners, Fets, IGBTs, SCRs, Triacs, Optos, Small Signal and Power Semiconductors. We measure, screen, test, analyze, characterize and sort the critical parameters of semiconductors devices including Leakage Current, Breakdown Voltage, Gain, Saturation Voltages, and offer a comprehensive test parameter library with an easy to use Windows based applications software. The systems us a Windows 10® 64-BIT Operating System with a USB 2.0 Interface. Engineering excellence, innovation, creativity and cutting edge technology has made Lorlin equipment well known for testing discrete components.
-
Product
ST/MT Family
-
MT System is a configurable test equipment suitable to verify static and dynamic parameters of power semiconductors (i.e. IGBT, MOSFET, DIODE, THYRISTOR, SiC, GaN, etc) packaged and unpackaged (discrete, module and substrate). ST System is a test equipment suitable to verify stability or drift of all static parameters of discrete power semiconductors.
-
Product
Semiconductor Test System
-
IST Information Scan Technology, Inc.
As power modules age, their performance degrades. Proper testing and maintenance of semiconductor devices used in power switching can ensure optimal performance and prevent down-time throughout a device’s lifecycle. The IST Model 8900 Series Discrete Semiconductor Test Systems allows you to effectively identify the percent of degradation in semiconductor devices by simulating the exact current and voltage of the parameters used by devices under real operating conditions.
-
Product
Programmable Parametic Tester
IST 878
-
IST Information Scan Technology, Inc.
The IST 878 is a low cost test instrument that provides in-circuit or out-circuit testing for a wide range of discrete semiconductors
-
Product
Programmable Parametric Tester For Discrete Semiconductors
IST-8800
-
IST Information Scan Technology, Inc.
The IST-8800 is a fully programmable, low cost tester that provides parameter measurements or parametric GO/NO GO test for transistors, diodes, MOS-FETs, Regulators, Triacs, Zeners, SCRs, and J-FETs. These devices can be tested up to 5 amps or 1200 volts with a measurement range down to the nano amp range. Only four universal test fixtures are required which can test the device across a wide range of packages.
-
Product
(AOI) Automated Optical Inspection Systems
-
For automated defect detection and high-accuracy measurements. VisionGauge Online High-Speed AOI systems are perfect solutions for demanding high-throughput, high-resolution applications. These systems are perfect for a wide range of applications including MicroElectroMechanical systems (for MEMS inspection or MEMS measurement), semiconductor & discrete device inspection and measurement.
-
Product
Semiconductor
-
Scientific Computing International
Materials which have a conductivity between conductors (generally metals) and nonconductors or insulators
-
Product
Semiconductor
DieMark
-
DieMark Inking Systems are available in Electric and Pneumatic models and utilize convenient, disposable DieMark Ink Cartridges to streamline and optimize the process of marking defective die. With models available for nearly every test platform and configuration, Xandex inking systems are in operation daily in every corner of the world where wafer sort is performed.
-
Product
Semiconductor
-
With state-of-the-art manufacturing facilities in the U.S., Europe and Asia, local sales offices throughout the world, and on-site applications support, FUJIFILM Electronic Materials is your global partner.
-
Product
Semiconductor Test
Ismeca NY20
-
20-position turret platform for semiconductor test, inspection and packaging, provides the highest quality yield and throughput. It integrates innovative hardware and software technology such as Intelligent Features that enable extended autonomous operation and productivity.
-
Product
16-CH Discrete Input 16-CH Discrete Output Module
HSL-DI16DO16-M-NN
Input/Output Module
- Input voltage: ±40 V (Max)- Output switching capacity: Single channel 500 mA; all channels 60 mA at 24 VDC- Photo couple isolation voltage: 2500 Vrms- Input impedance: 4.7 KΩ- Input current: ±10 mA (Max) , ±12.5 mA (Peak)- 16-CH digital input and 16-CH digital output. "NN" type for NPN sinking type sensor input or dry contact and NPN sinking type output- Slave ID consumption: 1
-
Product
Semiconductor Probe
-
Using the spring contact probes for semiconductor package inspection, customers can test various types of packages with LEENO's Total Interface Solution.
-
Product
Semiconductor Packaging System
-
Inspects the quality of finished cells by measuring the gap between the battery electrode laminate and aluminum can.
-
Product
Semiconductor Electrical Test
-
We conduct electric property test (final test) of the completed (packaged) LSI products. We will support testing of analog devices, logic devices, other electronic parts, modules, application products and so on. We will test according to customer's specification regardless of evaluation, trial production, mass production, by know-how cultivated with long-time mass production results. Test initial examination ~ From consistent correspondence up to selection and evaluation, individual correspondence such as design only is accepted.
-
Product
16-CH Discrete Input 16-CH Discrete Output Daughter Board Module
HSL-DI16DO16-DB-NN
Strain/Bridge Input Module
- Slave ID consumption: 1 16-CH NPN sinking type sensor inputs or dry contact and 16-CH - NPN sinking type outputs- Photo couple isolation voltage: 2500Vrms- Input impedance: 4.7KΩ- Input current: ??10mA(Max), ??12.5mA(Peak)- Input voltage: ??40V (Max)- Output switching capacity:300mA/ch at 24VDC- Terminal Base:HSL-TB64 or HSL-TB32-DIN- LED indicator: Power, Link and I/O status
-
Product
Semiconductor Curve Tracer
CS-10000 Series
-
This optional unit minimizes parameter variation on devices causedby heat. Pulse rise time can be configured for 1, 3, or 5ms; pulse duration from 1ms to 20ms; and pulse interval from 100ms to 2 seconds. This option is installed at the factory. Any changes desired after purchase will require return the unit back to IWATSUfactory.
-
Product
Semiconductor Thermal Analyzers
-
Analysis Tech Semiconductor Thermal Analyzers measure semiconductor junction temperatures using the electric method of junction temperature measurement on all types of semiconductor devices.
-
Product
Discrete & Power Modules
-
A product portfolio that offers full spectrum of high, medium and low voltage power discrete devices along with advanced power module solutions, including IGBT, MOSFET, SiC, Si/SiC Hybrid, Diode, SiC Diode, and Intelligent Power Modules (IPMs).
-
Product
Semiconductor Test Equipment
IC Tester
-
Equipment to determine the pass/fail of devices in the wafer inspection process and the final inspection process after packaging.
-
Product
Semiconductor Testing
-
Teradyne’s semiconductor test portfolio is transforming the way you test chipsets for automotive, industrial, communications, consumer, smartphones, and computer and electronic game applications. Semiconductor devices span a broad range of functionality, from very simple low-cost devices such as appliance microcontrollers, operational amplifiers or voltage regulators to complex digital signal processors and microprocessors as well as memory devices.
-
Product
Semiconductor Device Testers
-
are particularly suitable for certain semiconductor test requirements, but other models may also be of interest. Our knowledgeable application engineers can guide you to the most suitable model.
-
Product
Semiconductor
-
PackageFunctionSMV(2.9mm*2.8mm)AND GateUSV(2.0mm*2.1mm)NAND GateFM8(5.0mm*4.5mm)NOR GateSM8(2.9mm*4.0mm)OR GateUS8(2.0mm*3.1mm)INVERTER
-
Product
Semiconductor Test Software Solutions
-
The test engineering staff at Test Spectrum has developed hundreds of test software projects on all major ATE platforms for numerous product technologies.Whether you need to optimize a current test platform, convert to a lower cost test platform, or design a brand new program for a cutting edge product within incredible time constraints, the Test Spectrum team will exceed your program expectations with quality products and excellent results.
-
