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Burn-In
The application of current, typically at high temperatures, over periods of time to detect infant mortality.
See Also: Burn-In Boards, High Power Burn-in, Burn-In Sockets, PCB Inspection
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Burn-In Test Sockets
The selection of the test socket is critical to the performance of a device during qualification testing where electrical bias and signals are applied. Key factors such as mechanical compatibility, operating temperature, ability to withstand high moisture levels, signal speed and lead inductance/capacitance all need to be taken into account when selecting the best socket for the test application.
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Custom Fixtures
Joule mechanical design and manufacture capabilities allows us to create other custom projects to meet your test needs. Joule can design burn-in racks, jigs and stand-alone test station.
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Flame Ionization Detector
A flame ionization detector converts a hydrocarbon gas concentration into an electrical signal. The flame is hydrogen fueled and burns in hydrocarbon free combustion air. Either side of the flame are two electrodes between which an electric field is generated by means of a polarization voltage. The sample is pre-mixed with the fuel gas and heated in the flame to a temperature at which the hydrocarbon molecules ‘crack’ and CH fragments appear. These CH fragments are oxidated by the oxygen in the combustion air resulting in the formation of CHO+ ions. The ion current then passes to the electrodes and the resulting current measured is proportional to the quantity of C atoms derived from organic compounds.The Thermo-FID features two separate microprocessor controlled pressure compensations to avoid any influence from environmental or sample conditions. In addition, the complete Thermo-FID range of analyzers are equipped with a flame trap that is used as a heated sample inlet filter. The measurement chamber and all material in contact with the sample gas are heated between 120°C and 200°C to avoid condensation.
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Photonics Test Solutions
Chroma offers precision instruments such as laser drivers, photodetector monitoring, and temperature controllers. These lab class instruments are often intefrated into production solutions for wafer probe test, burn-in and device or module characterization with inspection, metrology, robotics, Industry 4.0 and more.
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Burn-in and Stress Screening Chambers
KDR
Supervise the operation of your product, electronic device, circuit board, or medical device while they are stress screened, burned-in, or temperature cycled inside a Bemco Kardburn or Koldburn glass front chamber. With a huge amount of testing or storage space within instant reach, KD Chambers provide a compact and attractive alternative to a walk-in chamber.
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Laser Diode Reliability Burn-In / Life-Test System
58602
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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Fully Filtered and Stabilized Battery Eliminators
Series TBC
Kepco's TBC are designed as battery chargers, for float-equalize service to maintain battery arrays such as are found in many telecommunication installations. The TBC are fully filtered and stabilized battery eliminators that also find application as burn-in power supplies. Nine models are available.
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Horizontal Flammability Tester
TF311
TESTEX Testing Equipment Systems Ltd.
Horizontal Flammability Tester, to determine the comparative burn rates and burn resistance of textiles, particularly those for automotive interior use. Horizontal flammability tester is safe and easy to operate, Comprises draft free stainless steel cabinet with observation window, sample holder and door mounted burner.
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RF Burn-In Services
Innovative Circuits Engineering, inc
There are many burn-in services that we offer such as HTOL, RFBL, ELFR, LTOL, etc and our focus on quality and customer service when providing burn-in custom solutions is second to none. We work closely with our customers to make sure we provide them with the best possible burn-in regardless of their lot size or pin count. We can also provide you with other electrical stress tests such as THB and HAST, and we can provide you with comprehensive status reports for your tests as they progress whether they be burn-in, THB, HAST or any other test.
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Continuity Tester, LED
26330
If the bulb lights up, continuity exists. If the bulb fails to light, the circuit is open. Not for use on live circuits, but incidental contact with 12V supply will not burn out LED bulb.
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Burn-in and Test Sockets
Loranger International Corporation
Loranger International Corporation designs and manufactures thousands of socket styles for the burn-in and test of semiconductors and electronic components. Some of the socket styles are listed below.
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6 Chip Detection and Burn Channels
CD1
The CD1 provides 6 Chip Detect and Fuzz Burn interface(s). A Chip Detector (CD) is a magnetic-electrical device that provides a reliable method of detecting impending failure of bearings and gears.
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QFN/QFP35 Sockets
Test sockets are designed for testing today’s high-performance QFN, QFP, DFN and SOIC devices. For development, characterization, at speed burn-in, and low volume production manual testing.
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Burn-In Test Fixtures
Burn-in generally involves the extended operation of a product in a temperature-controlled environment. With possible humidity and supply voltage margining - the burn-in process can then be extended to include power stress (levels and on/off cycles) tests, high humidity environmental simulation as well as the classic "four corner test" of high voltage + high temperature, high voltage + low temperature, low voltage + high temperature and low voltage + low temperature.
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System Level Test and Burn-in Solutions
System Level Test (SLT) is a paradigm shift from traditional structural and functional testing. The device is tested in a complete, integrated system to evaluate its compliance against specified requirements. The system approach allows for higher and more cost-effective test coverage especially for multi-function and non-deterministic devices. It also brings new integration and test challenges like: ..Designing test fixtures on Burn-in Boards with system components ...
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Cloud And Networking
From laser chips (EMLs, DMLs, and VCSELs) and pluggable coherent transceivers to pump lasers and TrueFlex® colorless/directionless/contentionless ROADMs, Lumentum’s comprehensive, vertically integrated portfolio lowers costs and speeds time-to-market. We optimize our components for best-in-class performance, creating flexible and scalable platforms that address ever-changing market conditions and product migrations. To ensure field reliability, Lumentum uses only the best materials and processes including stringent, proprietary burn-in processes during laser manufacturing.
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Fire & Flammability Test
Fire & Flammability testing: ASTM E119 [UL 263]; ASTM E152 [UL 10C]; ASTM E814 [UL 1479]; API 607, 6A; ASTM E108 [UL 790]; UL 1709; UL 1715; UL 2043; NFPA 286; UBC 26-2; UBC 26-3; ASTM E84 [NFPA 255, UL 723]; ASTM E162; ASTM E662 [NFPA 258]; ASTM D635; ASTM D1929; ASTM D2863; ASTM E1354; ASTM E1317; Room Burn Facility; CAL 133, 117, 129; UL 94 V/HB; IMO A.652 (16); IMO A.653 (16); ULVW I; ASTM D2859; AITM 2.0007; NFPA 701; FMVSS 302; FAA 25.853; IEEE 383
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High Power Burn-In Test
Easily test the reliability of your high power laser devices with the Y2000H burn-in and life-test system. It will quickly identify defective laser devices so you can prevent them reaching your customers. Y2000H's full automation and expandable capacity helps you work through your tests more productively. And its user-friendly software makes testing your devices easier than ever.
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Memory Burn-In Tester
H5620/H5620ES
As Server and Mobile applications have mainly led the Memory and market has also entered a super cycle that has completely withdrawn from the previous silicon cycle.Memory capacitance will continue to rise as the application of data processing and mobile communication occurs—however, revenue will not grow as ASP goes down. Suppliers need to reduce test costs and increase profits.H5620 contributes to reduction of test cost by integrating the test process of DRAM Burn-in and Core Test. This hybrid memory test solution solves the challenge of reducing test costs while increasing test efficiency in the expanding DRAM market.
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AC/DC Leakage Current Tester
228
Test for dangerous leakage current with the Simpson Model 228, designed to meet the latest UL, IEC, and ANSI specifications. The 228 detects both AC and DC leakage current and simulates human response at three different levels -- reaction, let-go, and burn hazard. Each Model 228 comes with test leads with alligator clips, manual, and batteries.
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Horizontal Flammability Tester
Part Number:
TESTEX Testing Equipment Systems Ltd.
Horizontal Flammability Tester, to determine the comparative burn rates and burn resistance of textiles, particularly those for automotive interior use. Horizontal flammability tester is safe and easy to operate, Comprises draft free stainless steel cabinet with observation window, sample holder and door mounted burner. Horizontal Flammability Tester complies with ISO 3795, ASTM D5132,FMVSS 302, etc.
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Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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Burn-In Board Tester
Focus-275
Focus275 is a tester for burn-in board.It can improve reliability of burn-in board by inspecting boards for burn-in test by Focus275 regularlyBoth short open test and component test can be done by sending electric signals for special socket contactor and edge part.
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6 ½ Digits Dual-Display Digital Multimeters
SDM3065X
The SIGLENT SDM3065X-SC includes a multiplexer that provides multi-point measurement capabilities. The scanner features 12 multi-purpose + 4 current channels and supports the following measurement functions: DCV, ACV, DCI, ACI, 2WR, 4WR, CAP, FREQ, DIODE, CONT and TEMP ( RTD and Thermocouple ). It provides a convenient and versatile solution for test applications that require multiple measurement points or signals and is an ideal tool for R&D burn-in and production testing.
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Power-Switching Test System
High Voltage Switching Test System
The Accel-RF Power-Switching Test System is capable of measuring reliability under a variety of conditions for switching power applications up to 1kV (off) and 25A (on) at rates up to 1MHz switching frequency, dependent on voltage. By leveraging technology developed for the RF burn-in tray platform with new fast switching measurement techniques, this system can support testing of multiple devices under elevated temperature stimulus in a small physical area, and offers the flexibility to test both soft- and hard-switching applications. The Accel-RF Power-Switching System is the most flexible and accurate power switching platform available.
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TI HDC1080 Humidity and Temperature Sensor Breakout Board
SEN-37001
Breakout board for the Texas Instruments HDC1080. This sensor is an extremely accurate temperature and humidity sensing device, with +/-0.2C temperature and +/-2% humidity accuracy typical. These specs far exceed the accuracy of ICs that came before it, including the HTU2x and SHT2x series, and improves upon the success of the HDC1050. In addition, the HDC1080 has a wide input voltage range of 3V-5V and includes temperature and airflow cutouts as recommended for the best operation. Finally, in the case of environmental changes that could cause light condensation, the HDC1080 has a built-in heater to burn off any condensate. Example code (Arduino platform) is available below.
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Test & Burn-In Socket for Devices up to 13mm Square
CSP/MicroBGA
Test & Burn-In Socket. Socket is easily mounted and removed to & from the BIB due to solderless pressure mount compression spring probes which, are accurately located by two molded plastic alignment pins and mounted with four stainless steel screws. Standard molded socket format can accommodate any device package of 13mm or smaller, by using machined (for small quantities) or custom molded (for large quantities) pressure pads and interposers.
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Medical Storage Chambers
KDM
The Bemco KDM is similar to the Bemco Koldburn KDR except it has a circular air flow conditioning system located on the chamber ceiling, and is optimized for shelf supported temperature cycling, burn-in, stress screening, and storage of valuable pharmaceutical products or medical devices.
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Disk Drive Test System
Saturn
The Saturn HD is the industry leader in 3.5” Near-Line Hard Disk Drive (HDD) testing. It provides maximum throughput while minimizing factory floor space and power consumption. The system is designed to perform single insertion of SSW, BDSW and Burn-In as well as drive configuration. Using Saturn HD on the production floor will reduce drive build times, enable greater responsiveness to data center demands and lower test costs per HDD unit.
