Test Programming
Consulting companies that provide/develop complete testing solutions or specific software capabilities or tools, and even end-product operation and maintenance training. Using a combination of original and generic capabilities, they save time, resources, and costs of the production company. (teradyne.com)
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HIRF Testing
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High Intensity Radiated Fields (HIRF) testing simulates high RF peak pulsed and average fields typical of radar environments and is integral to the certification of flight essential avionics systems. L3 Cincinnati Electronics (L3 CE) can perform HIRF testing from 400 MHz to 18 GHz (with traditional average field testing from 10 kHz to 40 GHz).
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Product
SMD Array Type LCR Test Fixture
16034H
Test Fixture
The 16034H is designed for impedance evaluations of array-type SMD.The minimum SMD size that this fixture is adapted to evaluate is 1.6(L)x0.8(W)[mm]. Since the tip of the measurement electrodes are very thin and the device holder is extremely flat, the device can be shifted and the measurement electrodes can contact each of the elements of the array-type component.
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Supercapacitor Test
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The CT3001A/C battery test systems are upgraded from CT2001A/C with higher precision and data logging rate. The tester can be used to run precision tests for coin cells, pouch cells, prismatic cells, and especially supercapacitors (ultra-capacitors). Each tester has 8 independent channel which can be programmed to run constant current charge/discharge, constant voltage charge, constant power discharge, constant resistant discharge, and direct current internal resistance (DCIR) tests.
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Transistor Testing
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Radiant is introducing an I2C digital-to-analog converter product that can be attached to the Precision Premier II and is controlled from Vision. The addition of this extra voltage source makes it possible for the Premier II to measure the performance of thin-ferroelectric-film gate transistors (TFFTs and MFSFETs). This document explains the theory for such testing and gives examples of such tests using Radiant's SFRAM transistors as examples.
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Battery Testing
BTS 200
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This testing and maintaining battery system allows to perform measurement of battery voltage, discharging current test and testing of battery capacity. BTS 200 can be connected with external load unit ELU 200.
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DDoS Testing
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DDoS testing missions enable enterprises, operators and governments to test their resilience against DDoS and evaluate their DDoS mitigation infrastructure.
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Temperature Test
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Function and safety under extreme conditions. In the field of environmental simulation, ENGMATEC offers a wide range of efficient systems for quality assurance, development and production.
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Environmental Testing
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DATASYST Engineering & Testing Services, Inc.
Simulate real-world environmental conditions to know how your product or component measures up. DATASYST evaluates how your product responds to environmental stressors, including temperature, thermal shock, humidity and altitude.
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Product
Microwave Testing
170
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The PICOPROBE® MODEL 170, a high performance microwave probe which incorporates a WR-6 waveguide with our patented coaxial design techniques, has inherent low loss and low dispersion characteristics.
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Loss Testing
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Count on Tempo Communications Optical Power Meters to test and maintain your fiber optic networks. Use to accurately ensure that signals are being transmitted at the correct power levels in your fiber network.
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Insulation Testing
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Measures the total resistance between any two points separated by electrical insulation.
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Ballistics Testing
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Dayton T. Brown, Inc.’s 100 m indoor shooting range is here to support your weapons, ammunition, and component testing needs – in accordance with ANSI/SAAMI specifications. Our range provides real-time environmental testing for small and medium caliber weapons.
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IoT Testing
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The Internet of Things (IoT) is the new buzzword, with predictions ranging from “it’s just another connected network” to “this is the new sliced bread of the generation”. Every new idea will cause change; radical ideas will have a greater impact, while revolutionary ideas change the course of humanity. IoT promises to be a revolutionary idea.
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Product
Detector Testing
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CI Systems' Optical Test benches are especially built to test many types of detector arrays used as the sensors of a camera, from visible to far infrared ranges. With CI Systems' expert know-how, these test benches can be tailored to a customer's design requirements. MTF, spectral response, crosstalk, NETD and sensitivity are some of the basic parameters that can be tested with CI's Optical Test benches during the design, manufacturing and integration of detector arrays.
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UAT testing
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A successful UAT is crucial for deploying systems with no errors and business risks. However, implementing UAT in an agile environment might lead to frequent and reduced cycles of testing. This mandates UAT testers to develop skills of optimized testing techniques, automation and work in collaboration with the development and QA teams.
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Product
Test System
ITC57300
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The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
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Testing Services
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We are professionals who deliver software testing services. We are able to boost your software testing, increase product quality and reduce costs.
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Product
Flash Memory In-System Programming File Generation
ScanExpress Flash Generator
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ScanExpress Flash Generator is a tool to quickly create Flash programming files for use with ScanExpress™ software. The application operates as a standalone utility or integrates into ScanExpress TPG for creation and reuse of boundary-scan test files for in-system programming (ISP).ScanExpress Flash Generator combines a board Netlist, scan chain description, and BSDL files to automatically create Flash Programming Information (FPI) files. These files include all information necessary for ScanExpress Runner™ or ScanExpress Programmer™ execution systems to perform read, write, erase, and verify operations—in-system using high performance Corelis hardware.
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Product
Test Probe
UE
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Qosmotec Software Solutions GmbH
Qosmotec UE Test Probe offers more flexibility to testers of mobile networks. It is a compact plug & play multi-UE test probe that allows for tests in UMTS, HSPA+ and LTE standards from any location. It can hold a custom set of up to 8 UEs.
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Environmental Testing
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Independent Testing Laboratories
Carefully conceived environmental testing can expose hidden product flaws, allowing you to make critical changes before releasing your product to market.
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Test Chambers
Anechoic
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Free Field Test Chamber for sound pressure level measurement, sound power level determination, acoustic research and audio measurement applications
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Twist Testing
STT
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The STT Shaft Twist Tester is a system designed for quickly testing of twist structures and/or twist-freed condition on shafts in seconds.
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Test Systems
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As new products emerge and change, the requirements for the industry also increase becoming more and more challenging. Complex products require demanding and versatile test systems, capable of performing complex test cycles. The ultimate goal is to ensure the validation of the final product during the different stages of the production process.
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Product
Climate Test
Series C
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With our CTS climatic test chambers, you can also simulate the stress factor humidity in your tests next to the temperature. The humidity is measured by a capacitive moisture sensor, which is characterized by high accuracy, long term stability and low maintenance.
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ATE & Test Systems
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Data Patterns' core business for over 20 years has been the development of Automated Test Equipment for critical aerospace requirements. Data Patterns developed a Multi Programmer with associated test automation software in 1994. Christened the DP-800 this product was adopted for the implementation of test rigs for Navigation Platform Test Benches, Engine Test Bed Automation, Cable Harness Test Systems, etc. This product was effectively utilized in the development of test benches required by Indian Space Research Organisation (ISRO) for the Polar Satellite Launch Vechicle (PSLV) and Geo Stationary Launch Vehicle (GSLV). Based on this foundation, the next generation test benches were developed in the cPCI architecture. Presently, Data Patterns develops cPCI based test systems for Laboratory applications as well as VME based test systems for challenging environmental conditions. Examples of test solutions built by Data Patterns are indicated below.
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Product
Test Leads
8000 Series
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The "SOFTIE" by Probe Master lets you say "goodbye" to hand fatigue and finger calluses. A soft probe that bends 90 degrees or more. A probe that conforms to the shape of your hand. This soft flexible probe bends gently to reduce wear and breakage of the lead. Many combinations are possible with the "screw on" accessories shown above. The 48" long, 18GA. test leads, are made of top quality silicone.
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Product
Test Bench
BERTA
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OPAL-RT’s BERTA test bench is a safe, reliable and portable test bench for speed governors, turbines, voltage regulators (AVR) and power system stabilizers (PSS). Equipped with a high-performance real-time simulator programmed with world-renowned RT-LAB software, the BERTA Test bench enables users to easily and comprehensively test real generating units in the power plant, synchronized and transmitting power to the main grid and/or on real controllers connected to a virtual generating unit in laboratory.
