Integrated Development Environment
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Product
Test & Development
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Taking a new board-level product or system from concept to deliverable requires feature-rich development and testing tools. Elma has a varied selection of system development platforms to help you, from our E-Frame and smaller D-Frame to the L-Frame. Select the right backplane for the architecture you are developing on - CompactPCI, CompactPCI Serial, OpenVPX or SOSA - and either air-cooled or conduction-cooled guides to support the development boards.
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Compliance Test, Development and Test Service
DinoStor
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With its focus on solving critical backup problems associated with Network-Attached Storage (NAS), DinoStor delivers a broad range of products and services to benefit users and vendors of NAS solutions.
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Test Requirement Document for Developing and Documenting Strategy and Structure of Test Programs
TRD System
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The TRD System helps users develop and document the strategy and structure of test programs using TRD format screens, flowchart generation tools and documentation formats, all in accordance with the most popular military standard format ( MIL-STD-1519) or with unique custom formats. It also has the ability to automatically generate an ATLAS test program from the TRD information provided by the user.
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Calibrated, Integral Isolator Noise Sources
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Calibrated, Integral Isolator Noise Sources by Pasternack
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Precision Integrated Analog Front End, Controller, & PWM for Battery Test & Formation Systems
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The AD8452 combines a precision analog front-end controller and switch mode power supply (SMPS), pulse-width modulator (PWM) driver into a single silicon platform for high volume battery testing and formation manufacturing. A precision instrumentation amplifier (in-amp) measures the battery charge/discharge current to better than ±0.1% accuracy, while an equally accurate difference amplifier measures the battery voltage. Internal laser trimmed resistor networks establish the in-amp and difference amplifier gains (66 V/V and 0.4 V/V, respectively), and stabilize the AD8452 performance across the rated operating temperature range.
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Complete Solution for Developing & Testing Discrete Voltage-Level Interfaces
M4KDiscrete Module
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The M4KDiscrete module provides a complete solution for developing and testing discrete voltage-level interfaces. The M4KDiscrete contains control I/O registers that are memory-mapped and may be accessed in real time. The module supports twenty programmable I/O discretes that can record or control the external discretes that are connected to it. In addition, the module can record changes in the input discrete with an associated time tag via a built-in FIFO. Output discretes are open collector, capable of handling up to 32V with a maximum sink current of 100 mA each. Ordering Information:The user can set each discrete:• Either as input or output.• Either to TTL (0 – 5V) or Avionics (0 – 32V) voltage levels on inputs and• Either enable or disable external debounce on inputsThere is a 4092 Word FIFO (a string of 1023 discrete entries) containing the data and time tags.The M4KDiscrete module is supplied with C drivers, including source code and may be used with Exalt, Excalibur’s Analysis and Laboratory Tools, a Windows monitoring application.
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Product
Windows On Arm Development Kit
ROM-2860
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ROM-2860 (Qualcomm QCS6490 OSM) built-in MS Windows 11 IoT Enterprise O.S. with the cable kit,power Adapter and audio board.
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Product
SOSA Aligned 1-Slot 3U VPX Development Chassis for Quartz Products
Model 8257A
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- Ideal development platform for Mercury's- Model 5553 8-Channel A/D & D/A Zynq UltraScale+ RFSoC Gen 3 - Processor - SOSA Aligned 3U VPX- Model 5550 8-Channel A/D & D/A Zynq UltraScale+ RFSoC Processor - SOSA Aligned 3U VPX- Access to data and control planes provided through RTM- 1-slot, small footprint development chassis- Rear panel access to RF I/O, 100 GigE and chassis manager- Supports VITA-67.3C- Compatible with the Quartz product family- Pentek's Quartz Family of Xilinx Zynq UltraScale+ RFSoC FPGA Products Video- Live Signal Acquisition Video: Quartz Model 5950 and Model 6001 RFSoC boards- Pipeline Newsletter: Strategies for Deploying Xilinx's Zync UltraScale+ RFSoC- Please refer to the product datasheet for Installed FPGA IP Module details
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Probes With Integral Connectors
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Used when quick and easy removal and installation are important requirements at the measuring device. Available in quick-connect, terminal block, m8, m12, and other popular connector styles.
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Portable, Integrated O-Level Test Platform
Guardian™
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Guardian is a ruggedized automated testing platform that quickly and accurately verifies the operational readiness of complex electronics systems in aircraft, ships, and vehicles.
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Product
Miniature AE Sensor With Isolated Integral 30 DB
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The Guzik miniature AE sensor with isolated integral 30 dB preamplifier has a wide-band and excellent frequency response over the range of up-to 1 MHz. Its small size makes the sensor ideal for hard disk drive test or similar applications requiring very small size, low weight, wideband AE sensor response and high sensitivity. A small diameter, external flexible cable connects the sensor with a 3-pin JST connector on the other end.
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Class 2 Integrating Sound Level Meter and Analyzer
HD2010UC/A.kit2
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HD2010UC/A is a Class 2 integrating portable sound level meter performing either spectral or statistical analysis.
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Small-Size Integrated DIN-Rail IPC With Intel® Atom® E3940
UNO-137
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Intel® Atom® E3940 processor (1.6 GHz) with 8GB DDR3L memoryModular design for optional 1 x iDoor extensionWide operating temperature range (-40 ~ 70 °C/ -40 ~ 158 °F)Port isolation for 8 x DI, 8 x DO, 2 x COMMicrosoft Azure IoT Edge and Amazon AWS IoT Greengrass certified
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Test System Optimized for High Volume Production Testing of Integrated Circuits
ETS-364 / ETS-600
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The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture. The test system offers separate floating resources for each site, improving site isolation and measurement accuracy coupled with digital instrumentation enabling the most efficient, high-volume testing available. The system supports up to 240 analog pin channels, and offers 133 MVPS digital vector rate with up to 128 digital pin channels. Eagle's scalability includes the ability to double the capacity of an ETS-364, providing more than 480 analog pin channels and up to 256 digital I/O pin channels with the ETS-600.
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Hardware Development
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Our core competence is the conception and development of high quality electronic assemblies and their software. Are you looking for a complete solution for a new product or would you like to optimize an existing device? We advise you in detail and work in close cooperation to develop the optimal application solution that is in line with your catalog of requirements.
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PacStar Integrated Solutions
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Curtiss-Wright Defense Solutions
PacStar Integrated Solutions are turnkey tactical and expeditionary, based on the PacStar 400-Series, combined with IQ-Core Software, and a vast array of partner technologies — pre-integrated and ready to meet mission requirements.
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Powerful, Fully Integrated Workstationfor Emission Microscopy
PEM-1000
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The PEM-1000 emission microscope incorporates the latest technology in real time, high quantum efficiency, mega-pixel CCD detectors in a back-thinned cooled camera. A portable system, the PEM 1000 can interface with all analytical probe stations, ATE (automated test equipment) and bench top configurations for high speed functional testing.
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Development System
FE-W7
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* Emulates Winbond W77xxx or W78xxx Microcontrollers * 125K Code Memory * Real-Time Emulation * Frequency up to fmax at 1.8V to 5.5V * Wide Supply Voltage Support * MS-Windows Debugger For C And Assembler * Emulation Headers for PLCC, QFP and DIP * Target Board and Programmer Included * Serially Linked to IBM PC at 115Kbaud
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In-Circuit Tester Integration
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The benefits of boundary-scan are noticed in all phases of a product life cycle. By coupling the power of Corelis boundary-scan tools with an In-Circuit Tester (ICT), a complete, integrated solution is available that offers the best advantages of both technologies.Boundary-scan operates as the perfect companion to ICT. Boundary-scan is capable of testing areas of printed circuit board assemblies that are difficult to access due to physical space constraints and loss of physical access, which is often due to fine pitch components such as Ball Grid Array (BGA) devices. Conversely, the ICT is able to check the non-boundary-scan compatible portion of the unit under test (UUT) such as analog.
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Software Development Standards Compliance Solution
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The most comprehensive development compliance solution; FDA, DO-178B/C, MISRA, JSF, PCI-DSS, ISO, IEC, and more. ntegrate compliance policies into the SDLC and team workflow. Accurately and consistently automate verification and validation tasks
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Integrated Microwave Assemblies
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Skylink offers high quality Integrated Microwave Assemblies and multi-function modules to meet customer requirements. IMAs integrate microwave components such as attenuators, switches, oscillators, amplifiers, filters, couplers and mixers, with the associated electronic circuitry, into one overall assembly.Skylink's integrated microwave assemblies are designed for both commercial and military applications in the frequency range from 100MHz to 50GHz.
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Temperature Logger with Integral sensor and Probe
TV-4510
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Dual channel temperature recorder LCD display of current readings 30,000 readings capacity High accuracy and reading resolution Fast data offload Splashproof case Low battery monitor and battery low indicator Programmable alarms Optional audible alarm box USB and serial download cables
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Small-Size Integrated DIN-Rail IPC With Intel® Atom® X6413E And X6425RE
UNO-137 V2
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Intel® Atom® x6413E (1.5 GHz) and x6425RE (1.9GHz) processor with 8GB DDR4 memoryWide operating temperature range (-40 ~ 70 °C/-40 ~ 158 °F) and wide power input range (10 ~ 36 VDC)Port isolation for 8 x DI, 8 x DO, 2 x COMDP++ ensures HDMI/DVI compatibilityDual storage: 1 xM.2 M-key 2242 PCIe/NVMe or SATA/SSD and 1 x mSATAOnboard TPM 2.0 provides hardware-based securityModular design for optional iDoor extensionRuggedized DIN-rail kitCompliant with IEC 61010-1 safety requirements
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Starter Kit- An Integrated Sensor-To-Cloud Solution With 9 Sensors, Providing A Simple Way To Build IoT Condition Monitoring For Remote Facilities.
ADAM-6717SK
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All-in-one I/O gateway connecting OT and IT9 built-in sensors and actuators for diverse facility condition monitoringLow-code software ready with Node-RED graphic programmingFor the detailed specifications, please refer to the datasheet (PDF)
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Flying Probe Programming & Test Development
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Testing House offers full Flying Probe Programming and Test Development using its very own Seica Pilot LX Flying Probe Test Stations.
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Test Systems Integration
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Highly flexible test solutions that are cost effective offering basic tests that easily adapts to high product volumes and complicated tests. Mobile computer based test stations provide a wide variety of test solutions at efficient costs.
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Integration API
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Testdroid API is an easy-to-use gateway for managing your development and testing effort on real Android and iOS devices. As an alternative for an official Testdroid Cloud site, the API provides all infrastructure through different clients (e.g. Java, Python, Ruby) following the RESTful architecture paradigm and returning JSON with appropriate HTTP response codes.
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EMI Filters And Application-Specific Integrated Products (ASIP)
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An electromagnetic interference (EMI) filter is used in electronic circuits to improve system immunity against unwanted external electromagnetic signals from neighboring circuits and to avoid emitting radiation (“noise”) that may disturb the same nearby circuits by canceling unwanted frequencies.
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AI Developer Kit, Solution Kit & Peripheral
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AI developer kit & solution kit are open-frame systems designed with the test-then-design mindset, developers can use these kits to try their AI model.





























