Pull Force
strength necessary to extract.
See Also: Force, Compression, Crimp Force, Pull off Force, Push Pull Force, Peeling, Tension, Gravity, Electrical, Magnetic
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ELECTRIC BRAKE FORCE METER WITH DYNAMIC LOAD SIMULATION AND CIRCUIT TESTING
MDTT9107
*Tests truck-side brake controller output and all towing-lighting functions without a trailer*Displays real-time brake controller output gain and timing*Quickly troubleshoots electrical circuits and ground condition*For use with aftermarket and integrated brake controllers*Microprocessor controlled; simulates trailer brake loads*25' cable allows one-man, in-cab testing of brake controller and all truck-side tow circuits*Use to verify that the vehicle’s adaptive (speed/load sensitive) brake-controller output is functioning properly
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Air Force
Alpha 4314 AF
4314AF introduces an added safety feature that prevents the possibility of having the charging adapter connected while using the instrument for measurements. A 6-pin Mil-Spec circular connector on the front panel of the 4314AF replaces the four-terminal banana jacks and the battery charger jack. Four of the front panel connector pins are used to mate with the measurement adapter cable and the other two pins are for the battery charging cable adapter. By using separate adapter cables for measurements and charging of the batteries, it ensures that the charge circuit cannot be activated at the same time as measurements are being made.
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High Power Temperature Forcing System
MaxTC G4
NEW G4– MaxTC is our premium Temperature Forcing System product, specifically designed for industry needs as a result of customer´s feedback from the Flex-TC. Its powerful cooling force (90W @ -40°C), rapid transition rates (75°C /min) and remote control capabilities will provide solutions to all semiconductor testing needs. MaxTC is compact, ultra quiet (55 d BA) and fits into any laboratory. A premium product at amazing value.
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Atomic Force Microscope
AFM
Atomic Force Microscopes are the most widely used SPM microscopes. They can be applied in fields that span from surface science, semiconductor technology, magnetic media, polymer science, optics to biology, chemistry and medicine.Absolute positioning with an accuracy of 2 nm.
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High Force Large Area Bond Tester
Sigma HF
- For high force and large area- Typically for IGBT, power modules and batteries up to 1000 kgf- High axis speed- Deep access up to 80 mm- SEMI S2 safety cabinet with visual feedback- Flexible positioning of multiple work holders
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ThermalAir Series Temperature Forcing System
ThermalAir TA-3000A
The ThermalAir TA-3000 high capacity thermal air stream system is used for temperature testing, fast thermal cycling, and device temperature characterization of components, hybrids, modules, PCBs, and other electronic and non-electronic assemblies at precise temperature from -65°C to +225°C. Compact! Plus Performance!
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Wire Damage Test Device For Pull Testing
IEC60884 FIG11
Shenzhen Chuangxin Instruments Co., Ltd.
IEC60884 FIG11 Wire damage test device for pull testingThe wire damage test device is a special test instrument designed and manufactured according to the requirements of IEC884 Figure 11, , etc. It is mainly used to judge whether the screw-clamp type terminal is in design and structure.
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High Force Type Probe For PCB, K100 Series 100mil Pitch, Type L, Ø1.50mm, 230gf
K100-L150230-SKAU
K100 Series, Pitch 100mil, Tip Style L, Tip Diameter Ø1.50mm, Spring force 230gf, Steel with Gold Plating.
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Benchtop Thermal Forcing System
Wewon Environmental Chambers Co, Ltd.
Benchtop thermal forcing system from Wewon Environmental Chambers Co., Ltd. has a mini body structure and affordable machine price. The machine can test a wide temperature range, Since no compressor is required for refrigeration, so the benchtop temperature forcing unit’s energy consumption is very low. The repeated resistance degree of the tested sample in the instantaneous extremely high temperature and extremely low temperature continuous environment can detect the chemical changes and physical damage caused by thermal expansion and cold contraction of the sample in the shortest time, so as to achieve the goal of confirming the quality of the tested sample.https://www.wewontech.com/benchtop-thermal-forcing-system/
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Universal PLCC ZIF (Zero-Insertion-Force) Test Socket
Series 537
Universal PLCC ZIF Test Socket Live Bug Type. This Universal PLCC ZIF (zero insertion force) Test Socket will take seven sizes of PLCC footprints with Aries insert plate, Part No. XX-537-20. Data Sheet No. 10012, available seperately.
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High Force Type Probe For PCB, K100 Series 100mil Pitch, Type E, Ø1.50mm, 230gf
K100-E150230-SKAU
K100 Series, Pitch 100mil, Tip Style E, Tip Diameter Ø1.50mm, Spring force 230gf, Steel with Gold Plating.
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Pull Thru Solutions
Allows pull through removal of connector modules and instrumentation from chassis backplane.
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High Force Type Probe For PCB, K100 Series 100mil Pitch, Type Q, Ø0.80mm, 305gf
K100-Q080305-SKAU
K100 Series, Pitch 100mil, Tip Style Q, Tip Diameter Ø0.80mm, Spring force 305gf, Steel with Gold Plating.
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Charge Amplifier for Outputs from Piezoelectric- or mV-type Accelerometers, Force Gauges, Microphones & Pressure Pickups
Trig-Tek™ 201AP
Amplify the outputs from piezoelectric- or mV-type accelerometers, force gauges, microphones, and pressure pickups
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High Force Type Probe For PCB, K100 Series 100mil Pitch, Type K, Ø1.50mm, 155gf
K100-K150155-SKAU
K100 Series, Pitch 100mil, Tip Style K, Tip Diameter Ø1.50mm, Spring force 155gf, Steel with Gold Plating.
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High Force Type Probe For PCB, K100 Series 100mil Pitch, Type I, Ø1.26mm, 305gf
K100-I126305-SKAU
K100 Series, Pitch 100mil, Tip Style I, Tip Diameter Ø1.26mm, Spring force 305gf, Steel with Gold Plating.
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High Force Type Probe For PCB, K100 Series 100mil Pitch, Type C, Ø1.50mm, 230gf
K100-C150230-SKAU
K100 Series, Pitch 100mil, Tip Style C, Tip Diameter Ø1.50mm, Spring force 230gf, Steel with Gold Plating.
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Atomic Force Microscope
NX-Hivac
Park NX-Hivac allows failure analysis engineers to improve the sensitivity of their measurements through high vacuum Scanning Spreading Resistance Microscopy (SSRM). Because high vacuum scanning offers greater accuracy, better repeatability, and less tip and sample damage than ambient or dry N2 conditions, users can measure a wide range of dope concentration and signal response in failure analysis applications.
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Data acquisition software RSIC for force gauges Centor
RSICW-C
With the RSIC data acquisition software, you can record hte measurements of your gauge Centor directly using MS Excel. It makes it easier to record results and ensure traceability and processing; these are the main advantages for using this simple yet powerful software.
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Force Transmitter
LKVE/i
The PIAB LKVE electronic overload protection system consists of a force transmitter with amplifier and an electronic signal processing unit. The PIAB LKVE force transmitter is attached to a stationary line part. The rope is deflected via a slight angle between the two wheels and the clamping jaw. When loaded, the rope tends to straighten and applies a force which is transmitted to the load cell. The load cell in the PIAB LKVE delivers a signal proportional to the force on the load cell. The signal is amplified and is converted to 4-20mA. This standardized signal (4-20mA) allows distances between the force transmitter and the electronic unit to be 500 m.
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Force and Material Testing
Starrett Force and Material test solutions range from simple hand-held measurements to highly advanced applications with extreme accuracy.
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Atomic Force Microscope
FlexAFM
For success in research, scientists depend on professional tools that can readily provide the information needed, regardless of the tasks at hand.
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48 Ω HMM Pulse Force Probe
PHD-HMM-48-1
High Power Pulse Instruments GmbH
*High current wafer-level and package-level 98 Ω HMM probing with grounded DUT*Built-in high surge 48 Ω pulse reflection suppression resistor up to 80 A peak*Fast rise time < 0.5 ns due to low inductance GND loop*Variable pitch from 50 µm to 5 mm*Tungsten replacement probe tips*SMA pulse force pigtail*Compatible to PHD-3001A interface*High reliability
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Force Sensors
HBK Force Sensors and Force Transducers with strain gauge or piezo technology measure static and dynamic tensile and compressive loads up to 20 MN - with virtually no displacement.
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Wire Crimp Pull Tester (Motorized)
WT3-201M
The WT3-201M motorized wire crimp pull tester is designed to measure pull-off forces of up to 200 lbF [1 kN] for wire and tube terminations. The tester conforms to numerous UL, ISO, ASTM, SAE, MIL, and other requirements for destructive testing. Non-destructive testing is also possible, such as pulling to a load or maintaining a load for a specified period of time, as per the requirements of UL 486A/B. Programmable pass/fail limits with red and green indicators and audio alerts help identify non-conforming samples.
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High Force Type Probe For PCB, K100 Series 100mil Pitch, Type G, Ø1.50mm, 230gf
K100-G150230-SKAU
K100 Series, Pitch 100mil, Tip Style G, Tip Diameter Ø1.50mm, Spring force 230gf, Steel with Gold Plating.
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Force Sensors, Load Cells, Shear Beam
INELTA Sensorsysteme GmbH & Co. KG
Exact force measurement and weight measurement
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Clamping Force Tester
KRD102
KRD102 series clamping force tester is an indispensable test method for improving products into high-quality fields. It is suitable for research, development, quality control and manufacturing of electronics, electromechanical, optoelectronic, automotive, toy, packaging and other industries. It can simulate the situation that the goods in the container are clamped when they are transported from the container to the warehouse. Whether the goods are damaged due to the clamping, so as to evaluate the anti- clamping ability of the packaging.
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Force Sensor Elements
The STL Force Sensing Tension Links are a series of unique force sensors. The Tension Links utilize the internal strain gage process sucessfully and are used in bolts, load pins and flat load cells. The sensing element consists of a strain gage bridge circuit internally installed in a small hole along the longitudinal axis. This unique arrangement provides a most effective means for the protective sealing of the internal electronics while minimizing the adverse effects of extraneous torsion and bending loads.
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Atomic Force Microscope
AFM Heron
New, fully motorized AFM HERON (HERO of Nanotechnology) which allows to perfectly align a cantilever, laser and photodiode by just one click on a command button. The scanning settings and landing parameters are also automated that allows to avoid any time consuming adjustment operations, thus leaving more time to researcher for designing the experiment and performing more accurate measurements.
