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- Applied Rigaku Technologies, Inc
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NEX CG II Energy Dispersive X-ray Fluorescence Spectrometer
NEX CG II
Applied Rigaku Technologies, Inc
NEX CG II, a powerful second-generation energy dispersive X-ray fluorescence (EDXRF) spectrometer, delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types — from oils and liquids to solids, metals, polymers, powders, pastes, coatings, and thin films.
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Erbium Fiber Frequency Comb
Detailed description of item: The AOSense frequency comb is a low noise, polarization maintaining (PM) device. Key features include a PM fiber architecture centered at 1550nm with turnkey modelocking; a free-running linewidth of the carrier-envelope offset frequency of <200 kHz; a temperature-insensitive all-fiber f-2f interferometer exhibiting fceo beatnotes with SNR > 45dB (300kHz RBW); and dual fast/slow cavity length actuators with a bandwidth of >300 kHz. The repetition rate of the comb is factory set and allows matching across multiple combs for dual comb applications. The optics package incorporates an optical heterodyne module designed for locking to the comb to an ITU-specified laser reference. The comb is capable of supporting an Allan deviation of < 5 x 10-18 at 1 second and ~10-20 after 105 seconds. Add-on features include all fiber extensions to visible wavelengths corresponding to several atomic transitions. An integrated comb electronics package is currently under development.
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High-resolution Spectrometer
HR4000
Our next-generation high-resolution spectrometer is a novel combination of optics and electronics that is ideal for applications such as characterizing lasers, measuring gas absorbance, and determining atomic emission lines.
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NeaSNOM Microscope
Based on high-stability scanning-sample Atomic Force Microscope optimized for optical nanoscopyOptical focusing unit accepts visible, infrared and even terahertz illuminationTwo independent module bays allow imaging & spectroscopy at the same time
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Atomic Force Microscope
NaioAFM
The NaioAFM is the ideal atomic force microscope for nanoeducation and basic research on small samples. This all-in-one AFM system provides solid performance and easy handling, with a price tag and footprint that fit anyone and any place.
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Cold Vapor Atomic Fluorescence (CVAF) Mercury Analyzer
QuickTrace M‑8000
The QuickTrace® M-8000 Cold Vapor Atomic Fluorescence (CVAF) mercury analyzer is ideal for ultra-trace to sub-mg/L mercury quantitation. Due to the high sensitivity of the M-8000, it easily achieves the ultra-trace detection limit of <0.05 ng/L total mercury that is demanded by customers following EPA method 1631. The QuickTrace® M-8000 is also versatile enough to analyze samples >400 µg/L without dilution in a research or industrial setting.
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Atomic Force Microscope
AFM Heron
New, fully motorized AFM HERON (HERO of Nanotechnology) which allows to perfectly align a cantilever, laser and photodiode by just one click on a command button. The scanning settings and landing parameters are also automated that allows to avoid any time consuming adjustment operations, thus leaving more time to researcher for designing the experiment and performing more accurate measurements.
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Microscope Photoluminescence Spectrometer
Flex One
Photoluminescence (PL) is the light emission from a material under the excitation by ultraviolet, visible or near infrared radiation. In semiconductor luminescent property measurements, the sample (e.g. GaN, ZnO, GaAs etc.) was usually excited by a laser (with a wavelength of 325 nm, 532 nm, 785 nm etc.), and its PL spectrum is measured to analyze the optical physical properties, such as the band gap width etc.. Photoluminescence is a high sensitivity, non-destructive analysis method, which can provide the information about the structure, composition and surrounding atomic arrangement of materials. Therefore, it is widely used in physics, materials science, chemistry and molecular biology and other related fields.
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Ozone Generators & Systems
MKS offers a wide range of ozone generators and modular delivery systems which produce ultra-pure, reliable ozone gas. In the clean semiconductor environment, Ozone reacts with a wide range of precursor gases resulting in the creation of Al2O3, ZrO2, HfO2, and La2O3 metal oxides to enable thin film deposition processes like Atomic Layer Deposition (ALD) and Etch (ALE). MKS’ generator uses Grade 6 gas, enabling the creation of higher film density improving product yield. Photovoltaic and Display manufacturing leverage semiconductor best practices and utilize ozone to create enhanced thin film barriers, improving product performance and reliability.
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Analytical Services
Atomic Force Microscopy (AFM) allows for sub nanometer resolution imaging of surface topography and is able to quantify surface roughness at the angstrom scale. Our team can give you highly accurate measurements such as surface topography, dopant distribution, magnetic domain features, and a wide variety of other sample properties to give you the information you need to do great work.Park can provide measurements in the following areas:● Topography (surface roughness, grain size, step height, etc.)● Mechanical Properties (stiffness, etc.)● Electrical properties (capacitance, conductivity, etc.)● Thermal properties ● Magnetic properties These properties can be measured in air or liquid, depending on your needs.
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Nano Tribometer
NT-30
NT-30 enables user to study interactions at atomic level. Easy to interchange modules with advanced high precision mechanical design allows it to unfold new hidden mysteries in nanotechnology.
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Miniature Single-Stage Isolators – 780nm And 852nm
AOSense is excited to offer free-space optical isolators at 780 nm and 852 nm. The innovative, small package size enables integration into compact laser sources and amplifiers without sacrificing transmission efficiency. The low external magnetic field enables the isolator to tightly integrate into systems with high magnetic-field sensitivity such as atomic spectrometers, magnetometers, clocks, and cold-atom devices.
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Atomic Force Microscope
LensAFM
The Nanosurf LensAFM is an atomic force microscope that continues where optical microscopes and profilometers reach their resolution limits. It is mounted like a normal objective lens, thus extending the resolution and measuring capabilities of these instruments.
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Ozone Gas Generators
SEMOZON® Ozone gas generators and subsystems are the industry standard for compact, high concentration, ultra-clean ozone gas generation. Applications include Atomic Layer Deposition (ALD), Atomic Layer Etch (ALE), Chemical Vapor Deposition (CVD) and Wet Cleaning.
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Microwave Plasma Atomic Emission Spectroscopy / MP-AES Systems
Agilent’s industry-leading microwave plasma-atomic emission spectrometer (MP-AES) systems are powerful, cost-efficient and easy-to-use for a wide range of applications from routine analysis to complex precious metals analysis. By running on air, Agilent MP-AES systems both cost less and are safer than alternative methods that rely on flammable gases. The innovative Agilent 4210 MP-AES system offers higher sensitivity and faster throughput capabilities than flame atomic absorption.
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Desktop Spectrometer
Electro-Technic Products, Inc.
The RSpec Explorer is an educational tool which makes it possible for an entire class or lecture hall to study atomic emission spectra. This is a great device for hands-on student learning including having students identify the gas in an unknown spectrum tube. Your students will find the software (included) is easy to use right out of the box. Until now, it’s been nearly impossible to teach about light and color using traditional tools like diffraction gratings because you can’t determine if all your students are even seeing the same results of their experiments. But with the RSpec-Explorer’s camera and software system, you will be confident knowing that every student is seeing the same thing.
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Atomic Force Microscope
XE-PTR
Park Systems' PTR Series is a fully automatic industrial in-line AFM solution for, but not limited to, automatic Pole Tip Recession measurements on Rowbar-level, individual Slider-level, and HGA-level sliders. With sub-nano scale accuracy, repeatability, and throughput, the PTR Series is the metrology tool of choice for Slider manufacturers to improve their overall production yield.
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In-Situ Spectroscopic Ellipsometer for Real-Time Thin Film Monitoring
UVISEL Plus In-Situ
The UVISEL Plus in-situ spectroscopic ellipsometer can be easily mounted on process chambers (PECVD, MOCVD, sputter, evaporation, ALD, MBE) for the real-time control of thin film deposition or etch processes.The UVISEL Plus in-situ provides the unique combinations of very high speed, sensitivity, dynamic range and accuracy making the instrument able to control deposition / etch at the atomic layer thickness level, even for rapid processes.
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Atomic Force Microscope
3DM Serirs
Park Systems has introduced the revolutionary Park 3DM Series, the completely automated AFM system designed for overhang profiles, high-resolution sidewall imaging, and critical angle measurements. With the patented decoupled XY and Z scanning system with tilted Z-scanner, it overcomes the challenges of the normal and flare tip methods in accurate sidewall analysis. In utilizing our True Non-Contact Mode™, the Park 3DM Series enables non-destructive measurement of soft photoresist surfaces with high aspect ratio tips.
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Atomic Force Microscope
Flex-Mount
Flex-Mount is a unique AFM that can be configured to acquire high-resolution information on large, non-planar and demanding samples. The Flex-Mount solution combines the superior resolution and performance of the Nanosurf FlexAFM scan head with the integrability of the Nanosurf NaniteAFM.
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Chemical Downstream Plasma Source
The AX7610 is a microwave plasma source for remote plasma applications. With replaceable quartz or sapphire plasma tubes, the AX7610 downstream source offers configuration flexibility to meet the most demanding application process parameters. The quartz tube version is ideally suited for production of atomic oxygen, nitrogen or argon. The sapphire tube version is compatible with much more severe CF4 CHF3 and NF3 chemistries.
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Optical Emission Spectrometers
Optical emission spectrometers (OES) and the measuring principle of the atomic emission are the ideal method and provide the perfect instrumentation for metal analysis in all different industrial businesses and environments.
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Optical Lattice Clock
Our strontium lattice clock project aims to create the world’s first commercially available fully integrated optical frequency atomic clock. The clock will be compact, transportable, easy to use and based on optical lattice technology enabled by the SolsTiS. The strontium lattice clock will achieve frequency uncertainties below 10-17, a level unprecedented on the global market.
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Tribometers/Abrasion Testers
AEP Technology offers several ASTM, ISO DIN compliant friction and wear tester models optimized for various applications. The modular design allows it to run on one platform (rotary, linear reciprocating, linear, block-to-ring, etc.), and to ensure high repeatability, during the testing process our downward force friction and wear testing machine controls several standard tests. High-end electronics, multi-core 64-bit processor that allows it to use multiple in-situ sensing technologies (recording friction, wear, displacement, force, volume, temperature, humidity, position, speed, etc., during testing) with high resolution Embedded powerful platform imaging head (sections of atomic force microscopes, etc.). Ease of use and robust unique design make AEP Technology a powerful tool in friction and wear testing machine development and production environments.
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Atomic Clocks And Oscillators
Safran is a world leader in rubidium atomic clocks and oscillators, quartz crystal (OCXO), maser, integrated GPSGlobal Positioning System is a navigation satellite system. See also/GNSS, and related testing instrument technologies that rely on accurate atomic time and the rubidium standard. Whether you need short or long term stability, our decades of experience designing and manufacturing products is trusted by companies ranging from global enterprises to space initiatives.
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Atomic Absorption Spectrometer
Atomic absorption spectroscopy (AAS) determines the presence of metals in liquid samples. Metals include Fe, Cu, Al, Pb, Ca, Zn, Cd and many more. It also measures the concentrations of metals in the samples. Typical concentrations range in the low mg/L range.
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AFM for Large Samples
NaniteAFM
The unparalleled small footprint of the NaniteAFM scan head and its highprecision/quick lock mounting system make it the ideal atomic force microscopefor integration into automated industrial environments. With a resolution below one nanometer, the NaniteAFM is capable of detecting and visualizing even the smallest surface structures.
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Atomic Force Microscope
NX-Hivac
Park NX-Hivac allows failure analysis engineers to improve the sensitivity of their measurements through high vacuum Scanning Spreading Resistance Microscopy (SSRM). Because high vacuum scanning offers greater accuracy, better repeatability, and less tip and sample damage than ambient or dry N2 conditions, users can measure a wide range of dope concentration and signal response in failure analysis applications.
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Cold-Atom Frequency Standard
Rack-mount microwave atomic clock using laser-cooled 87Rb atoms. Production unit target specifications: Allan deviation 2×10-12 @ 1 s, 2×10-14 @ 104 s; flicker floor 1×10-14; absolute accuracy < 1×10-13.
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Nuclear Power Radiation Monitoring Systems
From continuous area monitors, radiation detectors, process monitors and remote indicators and alarms, featuring industry-standard technology, Victoreen instruments are the trusted source for radiation monitoring systems and quality assurance for nuclear power professionals. With a wide range of solutions for maintaining Code of Federal Regulations-compliant facilities, Victoreen delivers the safety, reliability and quality needed to guarantee top performance for the global atomic energy community.
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The Nanomotor®
The patented Nanomotor® is a piezo driven linear motor. It is a multifunctional basic part for many positioning and manipulation devices. It has a positioning stroke of up to more than a centimeter while operating with atomic resolution. The Nanomotor thus bridges eight orders of magnitude. The Nanomotor consists of a cylindrical housing and a slider with a free axial hole inside. It combines high resolution in the sub-nanometer range with a large positioning stroke. The Nanomotor utilizes a piezo tube for fine positioning and a shock wave produced by the same piezo tube for coarse movements. The small Nanomotor is half the size of a match stick. It can lift six times its own mass. Every point of its stroke can be reached with a speed of up to 1 mm/s. The Nanomotor also works in ultrahigh vacuum or even under water. It is driven by a PC card at a supply voltage of only ±15 volts.
