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Capacitor Test
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Capacitance Meter, 120 Hz / 1 KHz / 1 MHz
E4981B
The E4981B capacitance meter offers a high speed with reliable measurements for ceramic capacitor testing in the production lines
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DC Hipot Testers
DPW Series
UDEYRAJ ELECTRICALS PRIVATE LIMITED
These portable testers have been designed to be used in testing high voltage equipment in power engineering. Routine testing of the insulation and leakage is a necessary requirement for surge arresters, cable breakdown testing, capacitor charging and other laboratory use.
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Rail Traction Inverter Test System
The rail inverter test system uses a pulse test methodology to verify proper operation of the IGBT switching elements in a subway car motor control. The system is designed to verify proper commutation of the switching elements. A large capacitor bank allows testing at DC voltages up to 1kV and peak currents of up to 3kA into reactive loads.The system also integrates self test capabilities and safe-to-turn-on (STTO) diagnostics to ensure no gross faults are present prior to the application of high voltages. Further the system includes dielectric withstand (hi-pot) test capability to ensure electrical safety.
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Transformer/Capacitor Test Sets
*Quick and easy check for opens or shorts on transformers or capacitors before energizing*Provides clear indications of open circuits, short connections and confirmation that the test results are OK*Tests overhead, pad-mount and other distribution transformers as well as capacitors and capacitor banks*Tests the primary and secondary sides of de-energized transformers and capacitors without disconnecting*Helps prevent line workers from installing a fuse on a shorted transformer or capacitor*Automatic self-test featureMagnet holds the tester in place while testing
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DC Hipot Testers
DPC series
UDEYRAJ ELECTRICALS PRIVATE LIMITED
DPC series hipots are used for proof testing of high voltage equipment in power engineering. Routine testing of the insulation and leakage is a necessary requirement for electrical equipments. Other areas include: Cable breakdown testing, capacitor charging and general laboratory use.
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Insulation Resistance Meter
SME1202
Scientific Mes-Technik Private Ltd
General purpose insulation resistance meter Analog indicator, High measurement speed Test voltage range: 10 V to 1000 V Suitable for Testing capacitor insulation test Easy operation
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Capacitor Leakage Current/IR Meter
Chroma 11200
Chroma Systems Solutions, Inc.
The 11200 Capacitor Leakage Current / IR Meter is mainly used for electrolytic capacitor leakage current testing and aluminum-foil withstand voltage testing (EIAJ RC-2364A). The 11200 can also be used for active voltage checking or leakage current testing of absorber, Zener diode, and Neon lamp etc. With the standard RS232 interface, optional GPIB & Handler interfaces, high speed and stable measurement capabilities, the Chroma 11200 can be used for both component evaluation on the production line and for fundamental leakage current or IR testing for bench top applications.
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Air Core Test Lab Reactors
Test Laboratory Reactors are designed for high voltage and high power test laboratories. They are designed to withstand the most extreme electrical service conditions during test periods. Design techniques are implemented in accordance with the most demanding service conditions. These reactors are used for various purposes in test laboratories such as current limiting and synthetic testing of circuit breakers, capacitor testing, artificial line simulation etc.
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Capacitance Meter
E4981A
The E4981A capacitance meter offers a high-speed with reliable measurements for ceramic capacitor testing in the production lines. The E4981A realizes the measurement capabilities of capacitance from small to large values with accurate measurements. The E4981A capacitance meter contributes improvements of the test throughput, while attaining excellent component quality for ceramic capacitor testing.
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Insulation Resistance Meters
Scientific Mes-Technik Private Ltd
General purpose insulation resistance meterAnalog indicator, High measurement speedTest voltage range: 10 V to 500 VSuitable for Test capacitor insulation testEasy operation
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Digital Insulation Mult-Meter
8010 IN
Standard Electric Works Co., Ltd
● Microprocessor controlled.● Four insulation test voltages (DC) : 125V, 250V, 500V, 1000V● The maximum insulation measurement range is 200G ohm @1000V.● 1mA test current on insulation test at nominal voltage.● With a hand strap for easier holding.● Large LCD (78 × 67mm)● Auto-ranging.● Bar-graph indication.● Backlight function.● REL(Auto-null) function.● Auto AC/DC voltmeter.● Capacitor test.● Auto-test stop & smart hold.● Supplied with high quality test leads.● Safety standard : EN 61010-1 CAT III 600V IEC 61557-1 IEC 61557-2 EN 61326-1
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Electrolytic Capacitor Test & Scanning System
DU-9001
Delta United Instrument Co., Ltd.
The 10 capacitor - LCC/DZ/R in order to automatically scan test improve the test reliability and test efficiencyEach test channel can be opened / short circuit return to zero with high precision.Wide range scan box can be used to test 3mm~35mm 10 capacitorsSuitable for high voltage capacitance test, 450V330uF 10 capacitors can be smooth test
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Cable Tracer and Phone Tester (2 in 1)
183 CB
Standard Electric Works Co., Ltd
Cable Tracer● Trace wires or cables.● Volume control.● Tip & Ring identification.● 2 bi-colored LEDs ( Line 1 & Line 2).● Tone speed selection : Fast & Slow.● A phone jack is designed for headset or handset. (Amplifier probe)Phone Tester● Continuity and resistance testing for voltage-free objects.● Check direct and alternating voltages.● Testing capacitors.● Testing diodes.● Power ON/OFF switch.● The indication of the LED lamp and the sound of the buzzer can occur at the same time.● The LED indication for Power ON status.
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Digital Insulation Mult-Meter
8005 IN
Standard Electric Works Co., Ltd
● Microprocessor controlled.● Four insulation test voltages (DC) : 50V, 100V, 250V, 500V● The maximum insulation measurement range is 200G ohm @500V.● Large LCD (78 × 67mm)● Auto-ranging.● Bar-graph indication.● Backlight function.● REL(Auto-null) function.● Auto AC/DC voltmeter.● Capacitor test.● Auto-test stop & smart hold.● Supplied with high quality test leads.● Safety standard : EN 61010-1 CAT III
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NI Automated Test Software Suite
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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Test Workflow Pro
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Test Instruments
Test instrumentation from COTS to custom, including VXI, PXI and LXI-based platforms.
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NI Vehicle Radar Test System
VRTS provides automated radar measurement and obstacle simulation capabilities for 76 to 81 GHz automotive radar systems. With VRTS, you can perform precision RF measurements and simulate a wide range of test scenarios for radar hardware and software subsystems, including sensors, advanced driver assistance systems (ADAS), and embedded software. Use VRTS for all phases, from design to manufacturing, of ADAS and radar system test.
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EV Power Components End of Line Test Platform
Test and Validate all EV Power Electronics with One Flexible and Scalable Solution
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Semiconductor Testers
Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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Audio and Acoustic Functional Test Solution
With the growing popularity of Internet of Things devices worldwide, many electrical products are adopting voice commands as their user interface. This means that acoustic and audio test challenges are likely to impact more products than ever before. Test teams must meet extended test coverage requirements to ensure product quality while maintaining throughput and operational efficiency. For a solution to meet these sorts of demands, it must:
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VLSI Test System
3380
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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SoC Test Systems
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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NI's Electrical Functional Test Solution
PXI instrumentation ensures complete and accurate test coverage with a modular architecture mounted in ultra-reliable PXI chassis.TestStand and LabVIEW software provide rapid development of complex test steps and sequences. PXI systems conserve floorspace because of their small, light form factor. Order them preassembled and installed using NI ATE Core Configurations.SystemLink™ software deploys updates and democratizes data insights to optimize operational efficiency.
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PXI Semiconductor/IC Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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80 DIOs, 8AIs, 8AOs JTAG Boundary Scan Resources Unit Expansion
YAV9JTAH
80 DIOs8 Ais8 AOsCompatible with all JTAG vendors
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LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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Flight Control System Test Platform
The Flight Control System Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of Flight Control Systems (FCS) of both commercial and military aircraft. The system simulates control surface activities from multiple combinations of rudder, flaps, elevator, aileron, and engine controls to the FCS. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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In-Line Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
