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- Pickering Interfaces Inc.
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Mass Interconnect
Mass Interconnect is a mechanical interface that simplifies connection between the power supplies, instruments and switching to the Device Under Test (DUT) in a test environment. In the illustration here, a test receiver is connected to the front of the modular instrumentation, in this case, a PXI chassis.
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DC Parametric Test System with Curve Trace
DC3
The wafer has been fully tested, cut and packaged. Today's IC manufacturers are finding tremendous cost savings in performing just fast DC tests on these packaged parts rather than running the full wafer tests all over again. Until now this required either an expensive full-power IC tester, or a "rack-n-stack" collection of instruments. Enter the HILEVEL DC3 Co-Optive Parametric Tester. No more instruments, no switching matrix, no tricky software. The DC3 combines a high-precision DC-PMU and internal DUT supplies to test up to 2,048 pins, all in a single chassis with Multi-Site capability up to 64 sites. And every DC3 includes our Classic Curve Trace feature, allowing easy curve tracing on every pin.
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High Temperature Operating Life
7000 Series
With ever decreasing geometries, the way we perform HTOL requires careful consideration. In lower geometry device leakage currents are not only higher but vary greatly. Temperature control at DUT level – required to achieve correct junction temperature at every DUT. For higher geometries, HTOL can be performed in a more traditional way but with devices consuming more power, the ambient temperatures required varies greatly. Multiple temperature zones are required – multi zones system or multiple smaller HTOL systems.
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TMS Test Management Software
LX TMS
To diagnose and analyze electronic components and devices, various tests are required in development, production and service. Equipped with all the necessary standard functions, the test sequencer developed by LXinstuments meets all criteria for a successful and smooth test process. The test item ( DUT ) is examined under various operating conditions for its properties, function and usability. Typical areas of application can be found where the usual complexity of test sequences has to be processed. The test sequencer is therefore suitable for small and medium-sized systems where special functions of other sequencers are not required. The free, cross-platform, open source developer platform .NET serves as a starting point. The integrated WPF (Windows Presentation Foundation) framework ensures a user-friendly program interface.
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Modulation Distortion For E5081A Up To 44 GHz
S960707B
The S960707B modulation distortion software application provides nonlinear DUT behavior tests (EVM, NPR, and ACPR) under modulated stimulus conditions.
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Digital I/O with Per Channel Programmable Logic Levels and PMU PXI Card
GX5295
The GX5295 offers outstanding digital test capabilities and channel density in a compact 3U PXI form factor. Offering both performance digital and analog test capabilities, the GX5295 provides a cost-effective, tester per pin architecture - making this card the ideal choice for high throughput, mixed-signal component test applications. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).
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Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196A
The 16196A surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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DC Automated Accelerated Reliability Test Station (AARTS)
DC-HTOL
The DC Automated Accelerated Reliability Test Station (AARTS) systems are designed to maximize channel density. The first systems developed by Accel-RF (ARF) were intended for RF and DC stimulus to the Device Under Test (DUT). However, there are some applications in which RF stimulus is not required.
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P-Series Dual Channel Power Meter
N1912A
30 MHz video bandwidth Single shot real time capture at 100 M sample/s per second Key Measurements: - peak, average, peak-to-average ratio, rise time, fall time and pulse width22 Predefined formats: WiMAX, DME, HSDPA, etc. One screen view for pulse measurement analysis: Auto Scale, Auto Gate, Rise/Fall Time, Duty Cycle, etc. Internal Zeroing and Calibration while connecting to the DUT Bench Vue software enabled
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35/50 GHz 2/4 Port TDR/TDT Remote Sampling Head for the 86100D DCA-X
N1055A
Bandwidth options: 35 or 50 GHz (upgradable)Edge speed (10-90%, typical): 18 ps (35 GHz) or 7 ps (50 GHz)Channel options: 2 or 4 per module (upgradable) with independent skew control and up to 16 channels per 86100D mainframe Ultra-thin remote head: 1.6 m phase-stable cable, 2.92 mm (35 GHz) or 1.85 mm (50 GHz) connectors, and integrated 67 GHz diode limiters for ESD/EOS protection TDR fixture de-embedding removes effects of fixtures, cables or probes connected between remote heads and DUT
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Functional Test Fixtures
Reliable connections to device under test (DUT) test points are essential for robust functional test. Bloomy provides rugged fixtures and cable sets (ITAs) built for thousands and thousands of cycles in manufacturing environments. With the industry’s best mass interconnects and internal electronic keying, our fixtures are easy to change out and are automatically recognized by the test system.
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Shield Boxes
Concentric Technology Solutions, Inc.
CTS can provide a customized integrated RF Shield Box or RF Enclosure Test Solution for manual or automatic testing at an off-the-shelf solution price. Many companies make RF Shield boxes, RF Enclosures or DUT fixtures, but only CTS bridges the gap by providing a complete integrated RF Shield Box or RF Enclosure testing solution for providing the RF shielding needed for repeatability within your budget and schedule.
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External Frontend
FE50DTR
The R&S®FE50DTR external frontend can extend the frequency range up to 50 GHz for Rohde&Schwarz signal and spectrum analyzers as well as signal generators. The R&S®FE50DTR enables signal up and downconversion directly at the device under test (DUT), lowering cable losses, increasing sensitivity and delivering more power at the antenna in an OTA environment. With a dual connector system, testing of active components is an easy task.
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DC Power Module, 60V, 5A, 300W
N6775A
The Keysight N6775A is a 300 W basic DC power module that provides programmable voltage and current, measurement and protection features at a very economical price, making these modules suitable to power the DUT or to provide power for ATE system resources such as fixture control.
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2-Quadrant Source/Measure Unit for Functional Test, 20 V, 1 A or 6 V, 3 A, 20 W
N6782A
The Keysight N6782A is a source/measure unit (SMU) designed specifically for advanced functional testing of a device. The ability to modulate the output up to 100 kHz along with capability to source and sink current (2-quadrant operation) makes the N6782A a perfect fit for advanced functional test of a variety of devices such as DC/DC converters, power management units, power amplifiers, and power management ICs. The input stage of the DUT can be stimulated by the fast sourcing and waveform capabilities. While the output stage can be loaded down and measured with the electronic load capabilities, providing a total test solution.
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Virtual tester
Emulate tester patterns in simulation environment with DUT simulation model. The simulation allows pre-silicon debug of test programs. Reads the actual ATE program and creates a Verilog /VHDL simulation test bench.
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PC Based Comprehensive Test Setup for Luminaires
Our zest for innovation has resulted in continuous upgrades in the existing line of products. Till now we used to manufacture 3 different equipments for Driver, MCPCB and Luminaires Component testing. We at SCR Elektroniks have developed our comprehensive tester to incorporate all the 3 systems in a single bench. Here in this tester one can test all the three DUT in a single bench. Since all the 3 testing procedures have many tests in common, we have incorporated all the tests in a single bench such that testing of Luminaire driver, Luminaire PCB and Final Luminaire set is performed in single test bench. Only these tests are performed over the DUT else other are disabled for them.
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Frontends & Converter
FExx Series
R&S®FExx external frontends extend the frequency ranges of Rohde & Schwarz signal and spectrum analyzers and signal generators up to 170 GHz. The R&S®FExx enables the up and down-conversion of the signal directly at the DUT. In an OTA environment it lowers cable losses, increases sensitivity and delivers more power at the antenna.
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DC Power Module, 20V, 5A, 100W
N6743B
The Keysight N6743B is a 100 W basic DC power module that provides programmable voltage and current, measurement and protection features at a very economical price, making these modules suitable to power the DUT or to provide power for ATE system resources such as fixture control.
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High Current SMU 1000 A
AXC7583
Generate extremely short, fully regulated current pulses from 300 µs up to 1000 A. At the same time, carry out measurements directly on the DUT with the integrated VMU and CMU. Perfect for rapid semiconductor tests during production.ven Bauteilen.
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Milli-OHM Meter
MR-30
*Double LCD Display*300,000 counts resolution*Measurement Range: 30mΩ~3MΩ*0.05% accuracy*20 Standard User setting memory sets*Sorting function and Relative percentage function*PASS/FAIL test result alarm*Computer Remote Manual and Auto Scan function*Manual and Auto Channel select*Sampling Rate: 30 sample/sec*High Resolution Temperature compensation and measurement*DUT Four-wire method*USB interface
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60 GHz Noise Figure Test Set
The Noisecom 60 GHz Noise Figure test set has 4 separate systems designed to perform Y-factor noise figure measurements using a high performance Spectrum Analyzer or a dedicated receiver. Each system contains a highly stable V-band noise source, isolator(s), optional waveguide to coaxial transitions and an optional pre-amplifier for use with a spectrum analyzer. The two standard calibration tables have ENR data points at 1 GHz intervals.* System ENR is measured before the DUT connector and at the final output stage allowing for pre-test calibration of the system.
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Sound Harmonics and Current Analyzer
H74050100
This analyzer is used as end of line control for electro mechanic components with electric motors, with or without mechanical reduction. While the motor is running at nominal speed, a spectrum and temporal analysis of the sound as well as a current consumption test is performed. Statistical analysis of the data acquired is also performed real-time, expediting the PASS/FAIL decision of the DUT.
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Multi-Channel Attenuation Control Unit (4-channels), DC to 18 GHz, 0 to 121 dB, 1 dB Step
J7204B
The J7204B is a multi-channel (4-channels) attenuation solution for signal attenuation and conditioning of up to 4 devices under test (DUT). Operating frequency from DC to 18 GHz, with 121 dB, 1 dB steps. Exceptional 0.03 dB insertion loss repeatability per section for the entire 5 million cycles and excellent attenuation accuracy and flatness, the J7204B reduces cost of ownership and provide the best measurement accuracy.
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PXIe-4113, 2-Channel, 10 V, 6 A PXI Programmable Power Supply
782857-02
The PXIe‑4113 is a programmable DC power supply with isolated outputs. It helps simplify the task of designing automated test systems for a wide range of applications—from aerospace and defense to automotive and component test—by eliminating the need to mix multiple instrumentation form factors in a given test rack. It also has standard output disconnect functionality that allows isolation from the device under test (DUT) when not in use, and remote sense to correct for losses in system wiring.
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DC Power Module, 5V, 20A, 100W
N6741B
The Keysight N6741B is a 100 W basic DC power module that provides programmable voltage and current, measurement and protection features at a very economical price, making these modules suitable to power the DUT or to provide power for ATE system resources such as fixture control.
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HV-Test System for Capacitor Packages
The system is used to characterize the leakage currents of capacitor packages. LXinstruments implemented a project-specific PCBA for the required HV switching. The measurement technology consists of Keithley source meters and USB based devices. The DUT adaptation with safety technology was realized in cooperation with ATX.
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PIM Chamber
Passive Intermodulation (PIM) occurs when two or more signals are present in a passive device (cable, connector, isolator, switch, etc.) that exhibits a nonlinear response.PIM chambers vary in size and design depending on the size of the DUT; a typical PIM requirement is -110dBc or more. Cuming Lehman Chambers has successfully provided PIM Chambers with measured levels in excess of 150dBc.
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SNR Noise Generator
CNG-EbNo
The CNG-EbNo is a fully automated precision signal to noise (AWGN) generator that sets, and maintains a highly accurate ratio between a user supplied carrier and internally generated noise, over a wide range of signal power levels and frequencies. The internal AWGN meter provides repeatable SNR waveforms for accurate signal generation. The instrument gives system, design, and test engineers in the telecommunications industry a single tool to generate precision signal to noise ratios. These signals are used to compare theoretical BER to SNR ratios, found in "waterfall" type graphs, with measured values from the DUT to evaluate different modulation schemes. Users can obtain higher yield through automated testing, plus increased confidence from repeatable, accurate test results. Standard units can be modified for specific customer requirements. Please consult the factory for pricing and availability of these requests.
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Pulsed IV-Curve Solutions
Pulsed IV-Curve Test and Analysis System is our new development for 2015. It is an advanced and compact pulsed IV-curve characterization system designed to simulate pulsed ESD events such as TLP, vf-TLP, HMM, HBM, EFT, and LV-Surge. It will monitor the transient voltage and current waveform during the pulse in ps or ns segment, and test the pre- and post-pulse status (leakage current, breakdown voltage, biasing current, static IV curve, etc) of the device under test (DUT), such as protection devices, semiconductors, circuit modules, touch panel sensor, etc.
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High Current SMU Family 2000 A
AXC76xx
Generate very short, fully regulated current pulses from 2 ms to DC with up to 2000 A. Carry out measurements directly on the DUT with the integrated CMU and VMU.
