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Data Pattern
Produce data patterns for the assurance of logic circuits and digital semiconductors.
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16-channel, 1GHz, 1Mb/ch USB Logic Analyzer Plus 8-Channel Pattern Generator
LA-Gold-16
A maximum sampling rate of 1 GHz is available on all channels. The LA-Gold-16 has a large data buffer of 1 Mega samples per channel for sampling rates of up to 500 MHz on all 16 channels. The large buffer allows long capture times at high sampling rates. The digital logger function is for capturing very slow varying signals, e.g. room temperature.
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Direct conversion from cycle driven simulation data
Test program generator
Direct conversion from cycle driven simulation data (ATPG scan patterns) (WGL/TDL/STIL) to tester. TDL/WGL/STIL to tester conversion Supports STIL ext 0,1,2 constructs Easy to use and cost effective conversion solution Optimize tester resources usage Supports advanced tester features (Such as Xmode, Multi-port etc’) Compress and minimize vectors count Allow direct tester binary patterns creation
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VME
One of the world's leading architectures for high reliability electronics applications is the VME platform.The VME standard is managed by the VME bus International Trade Association, VITA.Embedded computing's most successful bus standard, VME bus, shows no signs of slowing down as it maintains it's position as the industry's de facto standard into the 21st century. The foundation of VME's longevity, namely it's steady rate of technological evolution combined with a commitment to backward compatibility with legacy hardware and software, has been the linchpin of it's popularity for nearly twenty-five years. Today, innovative enhancements to the standard, through the VME Standards Organisation (VSO), continue to improve VME bus' speed, performance and reliability, strengthening it's position as the ideal solution for today's increasingly stringent commercial, industrial and military system requirements (Source: VITA).Data Patterns has implemented a number of standard VME boards, driven by Customer needs for Processor and I/O requirements in this platform. Today, standard modules are available covering the needs of:
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Microsoft Graph Data Connect
Microsoft Graph is the Microsoft 365 data that describes the patterns of productivity, identity, and security in an organization. Microsoft Graph Data Connect offers developers a highly secure, efficient way to copy Microsoft Graph datasets, at scale, into Azure Data Factory. It's an ideal way to train AI and machine learning models that uncover rich organizational insights and deliver new value to your productivity solutions.
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Pulse Pattern Generators
PPG
The Pulse Pattern Generator family (PPG), also knows as Serial Data Pattern Generator (SPG), is designed to generate a stream of binary information.
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EBSD Detector
Symmetry
Electron backscatter diffraction – is a powerful microanalysis technique that enables rigorous characterisation of the micro structural properties of crystalline materials. A high performance EBSD detector is critical for the effectiveness of the technique, influencing both speed and data quality. Symetry is Over 3000 indexed patterns per second (pps). Up to 30x faster than existing CCD-based detectors. Extreme sensitivity for low current and low kV analyses. Megapixel resolution for HR-EBSD applications. High resolution patterns (at least 156 x 128 pixels) at all speeds.
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Avionics Suite Tester
Based on order from the Navy, Data Patterns developed the complete Automated Test Equipment required for validating all the Line Replaceable Units (LRUs) utilized in the Seaking Helicopter. The upgrade was carried out at multiple Naval bases in India.
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PC-based logic analyser
Annie-USB
A top-quality 8-channel PC-based logic analyser with probably the highest specifications in its class, this Janatek product is excellent value for money. It captures data at a maximum rate of 500MHz, has a buffer depth of up to 1 Meg samples per channel, and incorporates an 8-bit pattern generator to aid debugging.
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kSA 400
The kSA 400 puts the power of Reflection High-Energy Electron Diffraction (RHEED) at your fingertips. Whether analyzing a static diffraction pattern, or acquiring data during high-speed substrate rotation, the kSA 400 helps you exploit the valuable wealth of information contained within the RHEED pattern.
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Delay Pattern Generator (six-channel Pulse Generator)
DG-8000
*Seamless change: The frequency, pulse width, and other settings can be seamlessly changed during oscillation.*Tracking function: Parameters can be changed at the same time for each channel.*Operation pattern control: The operation pattern option enables continuous operation testing.*Synchronization of multiple generators: The quick synchronization option enables three generators (18 channels) to synchronously output data.
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Video Pattern Signal Generator
Model A223800/01/02/03/04
Support 8K Super Hi-Vision (7680x4320/8192x4320)Independent graphics core for 8K Super Hi-Vision pattern with less than 200 msec. switch timeUp to 4 signal modules per unitUp to 4 resolution and pattern outputs.7 inch 1024x 600 high-resolution touch panel, GUI interfaceBMP file format supportUSB 3.0 data accessGigabit Ethernet high-speed network interfaceHDMI 2.0a signal module (Optional) - 8K x 4K 60 Hz (4 HDMI port) - 4K x 2K 60 Hz (1 HDMI port) - Pixel rate up to 600MHz (6Gbps TMDS rate) - RGB 4:4:4 / YCbCr 4:4:4 or 4:2:2 or 4:2:0 - HDCP 2.2 / 1.4 - Wide color gamut (ITU-R BT.2020/DCI-P3) - HDR (High Dynamic Range) Testing (HDR infoframe & metadata / EOTF) - SCDC (status & control data channel) Reader
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Count Down Test System
The Second Launch Pad Count Down system is implemented using VXI hardware designed by Data Patterns specific to the application requirements, featuring a redundant system handling upto 14000 I/O points.
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2.0 ~ 68.0 Gb/s Pulse Pattern Generator
CA9809
The UC INSTRUEMNTS CA9809 2.0 ~ 68.0 Gb/s Pulse Pattern Generator pulse pattern generator and error detector is a high performance, flexible and costeffective broad band data rate covered Pulse Pattern Generator that can operate from 2.0 Gb/s to 68 Gb/s. The CA9809 can be used with existing equipment to generate higher rate bit streams for use in telecom applications up to 68 Gb/s. Broadband test systems will benefit from the low power dissipation, precision connectors, and excellent output waveform characteristics. The compact size of the equipment allows the CA9809 to be placed at the measurement plane, reducing or eliminating artifacts related to long cables.
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AC Event Data Loggers
The Track-It™ AC Event Data Logger is a battery powered stand alone compact data logger that records up to 64,000 on/off cycles. Use the Track-It™ AC Event Data Logger to monitor cycle patterns of pumps, blowers and other electrical equipment powered by 120 or 240Vac.
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USB Reusable Temperature and Humidity Data Logger
This reusable logger can monitor temperature and humidity in facilities, storage and processing areas, clean rooms, labs, and during transport. It is equipped with an external sharp tip probe, providing the option to monitor internal core temperature. Data is available in PDF or spreadsheet format and used for various purposes, such as process or equipment verification and validation, thermal mapping, and documenting environmental conditions to meet GMP, GDP and regulatory compliance. Reports are analyzed to identify trends and patterns, and management decisions can be made to improve practices in areas such as processing and cold chain logistics. Data is easy to archive for record keeping, audits, and compliance with FDA, CDC, HACCP, FSMA and other regulatory requirements.
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Pin-Line™ Collet Socket with Solder Tail Pins
Series 0513
Pin-Line Collet Sockets with Solder Tail Pins. Features: Rows of socket strips may be mounted on any centers and are end-to-end or side-by-side stackable for .100 [2.54] grid or matrix patterns. Available with solder tail or wire wrap pins. Consult Data Sheet No. 12014 for wire wrap pins. Break feature allows strips to be cut to the number of positions desired.
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Telemetry Transmitter for FM with up to 3 Bands
LS-11-F
The LS-11-F portable FM test transmitter is designed for checkout and troubleshooting of telemetry receiving systems operating with FM modulation. For applications with any of the ARTM modulations (Tier 0, Tier I, or Tier II), please refer to the LS-11-M Data Sheet. Complete ground stations including the antenna with LNA, RF down-converter, IF receiver, bit synchronizer, and PCM decommutator can be tested and bit error tests performed. The design allows secure links to be tested with an external encryptor. The Test Transmitter contains an internal PCM Data Simulator and Pseudorandom patterngenerator that operates in a BERT mode. The device provides simulated clock and data (without transmitter enabled) and accepts external data for modulating the internal transmitter. Complete setup can be achieved locally through the keypad and two-line LCD display or remotely through the USB Interface. Operational parameters include the PCM format parameter database information (frame sync patterns, wavewords, etc…), pre-modulation filter selection, transmitter carrier frequency, transmitter deviation, and output power level. Output power can be selected from approx. -60 to +5 dBm in 5 dB steps. The Test Transmitter contains a LiFePO4 Battery (Lithium Iron Phosphate), which provides higher energy density at ¼ the weight of legacy lead-acid batteries. The unit also provides an internal battery charger and will operate for up to twelve hours on battery power having received on a full charge.
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8-Channel, 200MHz, 512Kb/channel, Data/Pattern Generator
Acute TD3008E
Model / Data Channel / Event Channel / Pattern DepthTD3008E / 8 / 3 / 512Kb/chTD3116B / 16 / 3 / 1Mb/chTD3216B / 16 / 3 / 256Mb/ch
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ATE & Test Systems
Data Patterns' core business for over 20 years has been the development of Automated Test Equipment for critical aerospace requirements. Data Patterns developed a Multi Programmer with associated test automation software in 1994. Christened the DP-800 this product was adopted for the implementation of test rigs for Navigation Platform Test Benches, Engine Test Bed Automation, Cable Harness Test Systems, etc. This product was effectively utilized in the development of test benches required by Indian Space Research Organisation (ISRO) for the Polar Satellite Launch Vechicle (PSLV) and Geo Stationary Launch Vehicle (GSLV). Based on this foundation, the next generation test benches were developed in the cPCI architecture. Presently, Data Patterns develops cPCI based test systems for Laboratory applications as well as VME based test systems for challenging environmental conditions. Examples of test solutions built by Data Patterns are indicated below.
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ATOS ScanBox
Series 7
The ATOS ScanBox Series 7 is mainly used in car manufacturing, in try-out toolmaking and in press shops. The optical 3D measuring system performs complete analysis measurements for comparison in the introductory phase or is used for quality control in production. Large parts such as automobile side panels and attached parts of up to 6 m in size can be measured. The full- field measuring data enable the analysis of hole pattern, trimming and character lines. Even heavy and large parts for other applications can be measured and inspected with the ATOS ScanBox Series 7.
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Digital Test Instrumentation
EDigital-Series™
Teradyne’s eDigital IVI driver controls all parallel digital functional test parameters, including per-pin timing, data formats, pattern data, and timing alignment on 64 channels (32 static + 32 dynamic or 32 differential)—each with an 8M pattern depth and results memory.
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PCIe-6536B, 32-Channel, 25 MHz, 100 MB/s Digital I/O Device
782630-01
The PCIe-6536 can continuously stream data over the PCI Express bus. It's an ideal solution for interfacing and testing image sensors or display panels. The module is also well-suited for other common digital applications such as pattern I/O, change detection, protocol emulation, or other custom digital interfacing. It features selectable voltage levels and per-channel directional control of the digital lines.
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Artificial Intelligence And Machine Learning Testing
AI and ML testing framework can efficiently recognize pitfalls and with constant updates to the algorithms, it is feasible to discover even the negligible error. Essentially, Artificial Intelligence (AI) and Machine Learning (ML) tech are well-trained to process data, identify schemes and patterns, form and evaluate tests without human support. This is made possible with deep learning and artificial neural networks when a machine self-educates based on the given data sets or data extracted from an external source such as the web.
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Central Office Line Simulator
AI-7280
The AI-7280 is a highly flexible central office line simulator. It is designed primarily for the testing and verification of common terminal equipment, including standard telephones, Caller ID devices, SMS (Short Message Service) capable equipment, and any device using an analog Tip/Ring interface circuit. Supplied with the TRsSim software for Windows, it can analyze a telephone''s DTMF characteristics, pulse dialing and flash timing, generate various network tones and ringing patterns. Both Type I (on-hook) and Type II (off-hook) Caller ID is supported using either FSK or DTMF data transmission. As an optional component, the TRsSim software can perform SMS testing to either the ETSI protocol 1 or protocol 2 standards.
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Flat Panel Display Test Solutions
Support 8K SHV (Super Hi-Vision 7680x4320 / 8192x4320)Support full 8K scrolling functionIndependent signal and power module designDual-core graphics processing architecture - Increase graphics and data transmission performance - 8K Super Hi-Vision images switch in less than 200msSupport 6/8/10/12 bits color depth (12 bit only in LUT mode)Support user edited test patterns - BMP pattern format - Maxi. 300 of 8Kx4K bmp patternsSupport VDIM and PWM dimming functionSupport cross coordinates defect positioning functionSupport auto flicker adjustment (with A712306)Support gigabit Ethernet control interfaceSupport USB port for data update
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Read-Write Analyzers
Guzik Read/Write Analyzers (RWA) work in conjunction with Spinstands to write data to the disk media and read back the signal for detailed analysis. We have two RWA-4000 series available for For Two Dimensional Magnetic Recording (TDMR) and non-TDMR technologies. The RWA 4000 series offer upto 8Gbit/sec maximum write data rate and 3.5 GHz analog bandwidth for all parametric measurements. Each RWA features a pattern generator with 1psec resolution of bit pre-compensation and supports PRML chip integration. Servo writing and processing is provided for Guzik Spinstand models. Select the pre-amplifier (UP14) as well as a variety of enhancements including programmable filters and PRML chip adapters.
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Bi-Sector Array Antennas
*Dual 33 degree beam antennas with a 65 degree pattern foot print*Multi-band capable*IIndependent tilt control for each beam**RemoteElectricalTilt (AISG 2.0)*Increase site capacity & data throughput
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Pattern Generator
PI-2005
As a test engineer or digital designer you must have state-of-the-art tools to test, characterize and verify your complex semiconductor devices and digital circuit boards. The PI-2005 Pattern Generator will generate a wide range of simple or complex digital patterns for any test application that requires a serial or parallel digital data stream. To meet the requirements of complex devices and digital circuits, the pattern generator can be configured from 16 to 64 output channels.
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Display Color Analyzer
Model 7123
Luminance and chromaticity measurement of Color Display0.005 cd/m2low luminance measurement (A712301)Wide luminance range: 0.0001 to 25,000 cd/m2 (A712301) 0.01 to 200,000 cd/m2 (A712302)High accuracy measurementMaximum 9 display modes: xyY, TΔuvY, u’ v’ Y, RGB, XYZ, Contrast, ProgramAble to control Video Pattern Generator and UUT (Unit Under Test)Built-in contrast measurement function to calculate the contrast ratio directlyEquipped with programmable test items that can complete the planned tests with one single buttonSupport USB flash disk that can copy the test procedures to other station for useJudgment function embedded to judge the test result automatically with one single buttonCalibration period setting and reminding functionMemory for storing 100 channels of standard color data and calibration dataBuilt-in flat display calibration data LCD-D65 & LED-D65* to be applied for chromaticity measurement instantlyOptional display white balance alignment system can be used to integrate all optical test stations to one single station
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Acute 112-Channel, 16-Event, 400Mbps, 256Mb/channel, Data/Pattern Generator
Acute DG3128B
Model / Data Channel / Event Channel / Pattern DepthDG3064B / 48 / 16 / 256Mb/ch (max)DG3096B / 80 / 16 / 256Mb/ch (max)DG3128B / 112 / 16 / 256Mb/ch (max)
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RF & Microwave
Data Patterns has a strong RF and Microwave engineering capability, featuring a team of enthusiastic engineering talent, substantial investments in RF test and measuring instruments, and attitude to utilise the latest technologies.An in-house manufacturing capability and an insatiable demand for fulfilling requirements of Radar, Electronic Warfare and Communication domains, Data Patterns has developed a whole line of building blocks including TR Modules, Up and Down Converters, Power Amplifiers, Transmitters, Combiners and Dividers for specific requirements. A list of products is given below.
