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Dust Test Chambers
simulate windy dusty environments testing UUT performance therein.
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Sand And Dust Test Chambers
Dongguan Amade Instruments Technology Co., Ltd
Sand and dust test chamber is also referred as dust-proof chamber, which is able to simulate the sand storm by putting the test piece in the chamber to judge the damage of sand-and-dust weather to products. Equipment is mainly applicable to determination of sealing performance of product shells based on the IPX5 and IPX6 degrees. Testing machine features a flow of air carrying dust in a vertical circulation, resulting in cycle use of sand during the test. Sand and dust testing has great significance to master the specimen’s performance to defend the penetration of dust particles, to withstand the abrasion of sands.
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Dust Test Chamber
CX-S56B
Shenzhen Chuangxin Instruments Co., Ltd.
Sand and Dust Test Chamber Sand and dust test chamber is designed and manufactured in accordance with the standard requirement of IEC60529.
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Dust Test Chamber
CX-SC56B
Shenzhen Chuangxin Instruments Co., Ltd.
Sand and dust test chamber is designed and manufactured in accordance with the standard requirement of IEC60529.
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Climate Test Chambers
Infinity Machine International Inc.
Climate Test Chambers by Infinity Machine International Inc. - for applications such as dust proof climate test chamber for lighting, dust climate chamber for lab, and more.
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Sand and Dust Environmental Test Chamber
Guangdong Bell Experiment Equipment Co.,Ltd
DGBell's Sand and dust test chamber is suitable for all kinds of automotive parts dust-proof, dust resistance test. Test components including automotive lights, instrumentation, electrical cover, switch system, door lock, etc., and test its sealing performance. Besides, it also has view window with illumination.
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Sand Dust Test Chamber
Guangdong Test EQ Equipment co., Ltd.
- Multi-Scenario Simulation: Replicates desert storms, industrial dust ingress, and abrasive wear with programmable wind/sand profiles.- Precision Particle Control: Cyclonic dispersion system ensures uniform particle distribution (ISO 12103-2025 certified).- Durability: Hard-coated aluminum interior, wear-resistant seals, and self-cleaning filter traps.- Smart Monitoring: Real-time particle counter, temperature/humidity logging, and AI-driven failure prediction.- Energy Efficiency: Recirculating airflow design reduces energy use by 35% (ENERGY STAR® 2025 compliant).
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Sand Test Chambers
Labodam sand and dust test chambers are corrosion resistant equipment that tests the stability, quality, reactivity, and characterists of products against the sand and dust exposed environmental conditions. These test chambers are carefully designed as per the CE and ISO standards and provide rpotection against current leakage, overload, over-current, short circuit, over temperature, motor overheating, and over pressure for safe and precise results.
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Dust Test Chamber
Sanwood Environmental Chambers Co ., Ltd.
Sand Dust chamber provide an environment to test the exposure of automotive and electronic components to concentrated levels of dust in order to validate product seal integrity.
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Dust Chamber Manufacturer
Wewon Environmental Chambers Co, Ltd.
Wewon Environmental Chambers Co., Ltd. is a good dust chamber manufacturer and made a 3380 liters blowing sand and dust test chamber for a Vietnam customer last week. The controller system of this 3380 liters dust test chamber can be connected to the computer.
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Climatic Test Chambers
Dongguan Amade Instruments Technology Co., Ltd
Climatic test chambers are also referred as environmental test chambers, which is the general name of various test chambers that simulate the natural climate environment of raining, high temperature, low temperature, constant temperature, illumination, dewing etc, products including constant temperature chamber, constant humidity chamber, ozone aging test chamber, UV accelerated weathering tester, vacuum hot air oven, salt spray chamber, steam aging tester, rain test chamber, dust proof test chamber, ventilation aging chamber, xenon lamp weathering test chamber and so on.
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NI Automated Test Software Suite
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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Test Workflow Pro
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Test Instruments
Test instrumentation from COTS to custom, including VXI, PXI and LXI-based platforms.
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NI Vehicle Radar Test System
VRTS provides automated radar measurement and obstacle simulation capabilities for 76 to 81 GHz automotive radar systems. With VRTS, you can perform precision RF measurements and simulate a wide range of test scenarios for radar hardware and software subsystems, including sensors, advanced driver assistance systems (ADAS), and embedded software. Use VRTS for all phases, from design to manufacturing, of ADAS and radar system test.
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EV Power Components End of Line Test Platform
Test and Validate all EV Power Electronics with One Flexible and Scalable Solution
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Semiconductor Testers
Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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Audio and Acoustic Functional Test Solution
With the growing popularity of Internet of Things devices worldwide, many electrical products are adopting voice commands as their user interface. This means that acoustic and audio test challenges are likely to impact more products than ever before. Test teams must meet extended test coverage requirements to ensure product quality while maintaining throughput and operational efficiency. For a solution to meet these sorts of demands, it must:
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VLSI Test System
3380
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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SoC Test Systems
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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NI's Electrical Functional Test Solution
PXI instrumentation ensures complete and accurate test coverage with a modular architecture mounted in ultra-reliable PXI chassis.TestStand and LabVIEW software provide rapid development of complex test steps and sequences. PXI systems conserve floorspace because of their small, light form factor. Order them preassembled and installed using NI ATE Core Configurations.SystemLink™ software deploys updates and democratizes data insights to optimize operational efficiency.
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PXI Semiconductor/IC Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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80 DIOs, 8AIs, 8AOs JTAG Boundary Scan Resources Unit Expansion
YAV9JTAH
80 DIOs8 Ais8 AOsCompatible with all JTAG vendors
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LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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Flight Control System Test Platform
The Flight Control System Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of Flight Control Systems (FCS) of both commercial and military aircraft. The system simulates control surface activities from multiple combinations of rudder, flaps, elevator, aileron, and engine controls to the FCS. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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In-Line Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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NI Semiconductor Test Systems
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
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NTS Platform
Manufacturers all over the world are leveraging our NTS platform for products with rotating or otherwise moving parts, or produce sounds. Typical applications include mass production of air conditioning units, pumps or small electric motors, where errors in assembly can cause malfunctions or significantly shorten service life. This test platform is customized to your specification and application. Feasibility studies are available to ensure your solution is exactly what you are looking for.
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Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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In-Circuit Test (ICT) Fixtures
At Forwessun we support and manufacture In-Circuit Test Fixtures for a range of Test Systems. We regularly build fixtures that are supported on a range of systems including - - HP3070- Agilent- Keysight- GenRad- TeradyneWith over 50 years in the industry, we provide a weatlth of knowledge and support to our customers. We are a global company and can support businesses all over the world with the help of over 30 experienced test engineers.
