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Gigabit Ethernet Test
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Dual Channel Gigabit Ethernet Test & Simulation Instrument for PCI Express
PCIe-DCE
Avionics Interface Technologies
Dual channel, high precision Ethernet Test Instrument
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10 Gigabit Ethernet Test & Simulation Instrument for PXI Express
PXIe-10GE
Avionics Interface Technologies
Supports 10G and 1G Full Duplex Ethernet2 Network Interfaces (future expansion to 4 network interfaces)User controlled Ethernet frame transmissions with high precision timing and scheduling
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Dual Channel Gigabit Ethernet Test & Simulation Instrument for PXI Express
PXIe-DCE
Avionics Interface Technologies
Supports 10/100/1000 Mbit/s Full Duplex EthernetUtilizes SFPs to support both Copper and Optical interfacesUser controlled Ethernet frame transmissions with high precision timing and scheduling
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Dual Channel Gigabit Ethernet Test & Simulation Instrument for XMC
XMC-DCE
Avionics Interface Technologies
Dual channel, high precision Ethernet Test Instrument
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GAOTek Handheld Gigabit Ethernet Test Module
A0070008tek
GAOTek Handheld Gigabit Ethernet test module is a highly efficient test instrument which designed for Ethernet layout and integration tests which conforms to Ethernet test standards. This instrument is required for testing from physical layer to service layer of emerging (or next generation) networks. The Ethernet tester is the new Ethernet tester to qualify Ethernet service over LAN and RAN deployment. This is a highly efficient test instrument for service providers to ensure SLA KPIs with the subscribers.
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L2-7 10GbE Test Solutions
NGY 10GE SFP+ and 10G BASE-T Load Modules
Keysight Network Applications and Security
Ixia's 10 Gigabit Ethernet LSM10GXM test load modules delivers an industry-leading, high-density, affordable layer 2 through 7, 10 Gigabit Ethernet IP test solution. The NGY family supports both low port count layer 2/3 applications with limited project budgets and highest density test lab, QA, and system test applications. NGY is perfect for both converged data center infrastructure testing and 10GbE switch test beds. NGY load modules leverage Ixia's converged data center test applications to offer the high port scalability, virtual scalability, protocol coverage, with an affordable test solution for data communications testing.
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NI Automated Test Software Suite
The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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1553 to Ethernet Converter
eNet-1553
eNet is a small, rugged 1553 to Ethernet appliance/converter (~200 grams and about the size of a 4 stub coupler) and offers the same advanced BC, mRT and BM functions as our cards. In addition, eNet can provide an additional independent BM mode to auto bridge (transmit) 1553 messages on user defined IP/UDP packet header. The appliance can also auto-load setup images for fast auto start-up, which would be ideal for simple RT applications that wouldn’t even need an API interface (just a standard UDP interface – usually through simple socket programming).
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PXI Automotive Ethernet Interface Module
The PXI Automotive Ethernet Interface Module communicates with Automotive Ethernet so that you can use the NI‑XNET driver or standard networking drivers to develop applications that require Automotive Ethernet to test and validate automotive electronic control units (ECUs). It provides up to four independent endpoints or up to two network terminal access points (TAPs). With onboard hardware timestamping and the ability to act as 802.1AS masters or slaves, the PXI Automotive Ethernet Interface Module can synchronize with an external network as well as the rest of a PXI system.
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Test Workflow Pro
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Test Instruments
Test instrumentation from COTS to custom, including VXI, PXI and LXI-based platforms.
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PXI Ethernet Interface Module
PXI Ethernet Interface Modules equip PXI systems with high-bandwidth Ethernet-based connectivity with up to 40 Gb/s data rates per port. Featuring compatibility with industry-standard network and automatic cable polarity detection, these modules are ideal for high-performance data transfer and vision applications on the PXI platform. These modules have independent bandwidth to support two GigE Vision cameras with Power over Ethernet (PoE).
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NI Vehicle Radar Test System
VRTS provides automated radar measurement and obstacle simulation capabilities for 76 to 81 GHz automotive radar systems. With VRTS, you can perform precision RF measurements and simulate a wide range of test scenarios for radar hardware and software subsystems, including sensors, advanced driver assistance systems (ADAS), and embedded software. Use VRTS for all phases, from design to manufacturing, of ADAS and radar system test.
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EV Power Components End of Line Test Platform
Test and Validate all EV Power Electronics with One Flexible and Scalable Solution
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Semiconductor Testers
Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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Audio and Acoustic Functional Test Solution
With the growing popularity of Internet of Things devices worldwide, many electrical products are adopting voice commands as their user interface. This means that acoustic and audio test challenges are likely to impact more products than ever before. Test teams must meet extended test coverage requirements to ensure product quality while maintaining throughput and operational efficiency. For a solution to meet these sorts of demands, it must:
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VLSI Test System
3380
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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SoC Test Systems
Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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PXIe-8523, 4-Port, 100/1000BASE-T1 PXI Automotive Ethernet Interface Module
787311-01
PXIe, 4-Port, 100/1000BASE-T1 PXI Automotive Ethernet Interface Module - The PXIe-8523 is a 100/1000BASE-T1 unshielded twisted pair (UTP) PXI Automotive Ethernet Interface Module for developing applications with the NI‑XNET driver. With this hardware, you can develop applications … that require Automotive Ethernet to test and validate automotive electronic control units (ECUs). The PXIe-8523 provides up to four independent endpoints or up to two network terminal access points (TAPs). It features onboard hardware timestamping and can act as up to four separate 802.1AS masters or slaves, so it can synchronize with an external network as well as the rest of a PXI system. The PXIe-8523 also provides LEDs on the front panel to help you monitor the network link and activity.
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NI's Electrical Functional Test Solution
PXI instrumentation ensures complete and accurate test coverage with a modular architecture mounted in ultra-reliable PXI chassis.TestStand and LabVIEW software provide rapid development of complex test steps and sequences. PXI systems conserve floorspace because of their small, light form factor. Order them preassembled and installed using NI ATE Core Configurations.SystemLink™ software deploys updates and democratizes data insights to optimize operational efficiency.
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PXI Semiconductor/IC Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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80 DIOs, 8AIs, 8AOs JTAG Boundary Scan Resources Unit Expansion
YAV9JTAH
80 DIOs8 Ais8 AOsCompatible with all JTAG vendors
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LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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Flight Control System Test Platform
The Flight Control System Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of Flight Control Systems (FCS) of both commercial and military aircraft. The system simulates control surface activities from multiple combinations of rudder, flaps, elevator, aileron, and engine controls to the FCS. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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In-Line Test System
With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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NI Semiconductor Test Systems
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
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1553 EBR to Ethernet Converter
ENET-1553-EBR
ENET-1553-EBR-1D™ is an innovative product that provides “remoting” of 1553 AS5652 EBR operations on 10/100/1000 Ethernet IP/UDP local area networks (LAN). ENET-1553-EBR is a small, low-power, rugged device that provides connectivity for up to eight AS5652 RT devices, single BC or composite monitor.
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In-Line 1553 Ethernet Converter
NLINE-E1553
Full BC, RT, and BM 1553 Controls Built-in a Small, Rugged, In-Line package. Control and convert 1553 messages to/from Ethernet in real-time (<20 uSec). Auto-bridge 1553 messages (BM) to UDP Ethernet without any programming.
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NTS Platform
Manufacturers all over the world are leveraging our NTS platform for products with rotating or otherwise moving parts, or produce sounds. Typical applications include mass production of air conditioning units, pumps or small electric motors, where errors in assembly can cause malfunctions or significantly shorten service life. This test platform is customized to your specification and application. Feasibility studies are available to ensure your solution is exactly what you are looking for.
